FI935682A0 - Kaasuseosten analysointiin käytettävä mittausanturi ja mittausjärjestely - Google Patents

Kaasuseosten analysointiin käytettävä mittausanturi ja mittausjärjestely

Info

Publication number
FI935682A0
FI935682A0 FI935682A FI935682A FI935682A0 FI 935682 A0 FI935682 A0 FI 935682A0 FI 935682 A FI935682 A FI 935682A FI 935682 A FI935682 A FI 935682A FI 935682 A0 FI935682 A0 FI 935682A0
Authority
FI
Finland
Prior art keywords
gas mixtures
measuring
analyzing gas
measuring device
measuring sensor
Prior art date
Application number
FI935682A
Other languages
English (en)
Swedish (sv)
Other versions
FI98410C (fi
FI98410B (fi
FI935682A (fi
Inventor
Kurt Peter Weckstroem
Original Assignee
Instrumentarium Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Instrumentarium Oy filed Critical Instrumentarium Oy
Priority to FI935682A priority Critical patent/FI98410C/fi
Publication of FI935682A0 publication Critical patent/FI935682A0/fi
Priority to EP94309393A priority patent/EP0658759B1/en
Priority to US08/358,071 priority patent/US5570179A/en
Priority to DE69424382T priority patent/DE69424382T2/de
Priority to JP6313369A priority patent/JPH0850098A/ja
Publication of FI935682A publication Critical patent/FI935682A/fi
Application granted granted Critical
Publication of FI98410B publication Critical patent/FI98410B/fi
Publication of FI98410C publication Critical patent/FI98410C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal

Landscapes

  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI935682A 1993-12-16 1993-12-16 Kaasuseosten analysointiin käytettävä mittausanturi ja mittausjärjestely FI98410C (fi)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FI935682A FI98410C (fi) 1993-12-16 1993-12-16 Kaasuseosten analysointiin käytettävä mittausanturi ja mittausjärjestely
EP94309393A EP0658759B1 (en) 1993-12-16 1994-12-15 Measuring sensor and measuring arrangement for use in the analysis of gas mixtures
US08/358,071 US5570179A (en) 1993-12-16 1994-12-15 Measuring sensor and measuring arrangement for use in the analysis of gas mixtures
DE69424382T DE69424382T2 (de) 1993-12-16 1994-12-15 Messfühler und -einrichtung zur Verwendung in der Analysierung von Gasmischungen
JP6313369A JPH0850098A (ja) 1993-12-16 1994-12-16 ガス混合物の分析に用いる測定センサー及び測定装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI935682A FI98410C (fi) 1993-12-16 1993-12-16 Kaasuseosten analysointiin käytettävä mittausanturi ja mittausjärjestely
FI935682 1993-12-16

Publications (4)

Publication Number Publication Date
FI935682A0 true FI935682A0 (fi) 1993-12-16
FI935682A FI935682A (fi) 1995-06-17
FI98410B FI98410B (fi) 1997-02-28
FI98410C FI98410C (fi) 1997-06-10

Family

ID=8539138

Family Applications (1)

Application Number Title Priority Date Filing Date
FI935682A FI98410C (fi) 1993-12-16 1993-12-16 Kaasuseosten analysointiin käytettävä mittausanturi ja mittausjärjestely

Country Status (5)

Country Link
US (1) US5570179A (fi)
EP (1) EP0658759B1 (fi)
JP (1) JPH0850098A (fi)
DE (1) DE69424382T2 (fi)
FI (1) FI98410C (fi)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110243807A (zh) * 2019-07-10 2019-09-17 浙江农林大学 多功能气体传感器

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DE69800414T2 (de) * 1998-04-21 2001-04-12 Hewlett Packard Co Nachweis und Bestimmung von Edelgasen
EP0947825B1 (en) * 1998-04-21 2000-11-29 Hewlett-Packard Company Noble gas detection and determination
JP4024494B2 (ja) * 2001-03-29 2007-12-19 大陽日酸株式会社 ガス中の窒素測定方法及び装置
US6594010B2 (en) * 2001-07-06 2003-07-15 Praxair Technology, Inc. Emission spectrometer having a charge coupled device detector
US7281492B2 (en) * 2002-04-01 2007-10-16 Advanced Lighting Technologies, Inc. System and method for generating a discharge in gases
US7494326B2 (en) * 2003-12-31 2009-02-24 Honeywell International Inc. Micro ion pump
US20040245993A1 (en) * 2002-09-27 2004-12-09 Ulrich Bonne Gas ionization sensor
US7123361B1 (en) 2003-03-05 2006-10-17 Verionix Incorporated Microplasma emission spectrometer
US7184146B2 (en) * 2003-06-24 2007-02-27 Cardinal Ig Company Methods and apparatus for evaluating insulating glass units
US20040266013A1 (en) * 2003-06-30 2004-12-30 Erickson Gene P. Standard insulating glass units having known concentrations of a gas and methods for calibrating a measuring device using the standard insulating glass units
US7309842B1 (en) 2004-03-19 2007-12-18 Verionix Incorporated Shielded monolithic microplasma source for prevention of continuous thin film formation
DE602006014712D1 (de) * 2005-10-19 2010-07-15 Panalytique Inc Chromatographische systeme und verfahren zur beseitigung der störung durch störende agentien
US20070103686A1 (en) * 2005-11-08 2007-05-10 Niklas Tornkvist Apparatus for non-invasive analysis of gas compositions in insulated glass panes
WO2007098586A1 (en) * 2006-02-28 2007-09-07 Panalytique Inc. System and method of eliminating interference for impurities measurement in noble gases
US7835005B2 (en) * 2008-02-21 2010-11-16 Thermo Fisher Scientific Inc. Gas analyzer system
US9983354B1 (en) 2008-04-10 2018-05-29 The United States Of America, As Represented By The Secretary Of The Navy Complementary plasmonic device and method
DE102009057130A1 (de) 2009-12-08 2011-06-09 Heinrich-Heine-Universität Düsseldorf Verfahren zur Analyse der Zusammensetzung von Gasgemischen
DE102011050171A1 (de) 2011-05-06 2012-11-08 Heinrich-Heine-Universität Düsseldorf Verfahren und Anordnung zum Detektieren eines ersten Gases in einem wenigstens ein weiteres Gas umfassenden Gasgemisch
CN102809553A (zh) * 2012-08-04 2012-12-05 重庆特瑞尔分析仪器有限公司 多气体浓度定性定量测量装置及其测量方法
US9310308B2 (en) 2012-12-07 2016-04-12 Ldetek Inc. Micro-plasma emission detector unit and method
DE102014202595B4 (de) 2014-02-13 2023-06-07 Robert Bosch Gmbh Verfahren und Vorrichtung zur Sauerstoffbestimmung in einem abgeschlossenen Behälter
EP3265786B1 (en) * 2015-03-06 2021-10-20 Mécanique Analytique Inc. Plasma-based optical emission gas detector with plasma localization
WO2016141470A1 (en) * 2015-03-06 2016-09-15 Mécanique Analytique Inc. Discharge-based photo ionisation detector for use with a gas chromatography system
JP6613402B2 (ja) * 2015-03-13 2019-12-04 Ｖｉｓｔａ株式会社 真空排気監視装置
JP2018521316A (ja) 2015-07-15 2018-08-02 メカニック・アナリティック・インコーポレーテッド キャピラリーガスクロマトグラフィーのための発光ベース検出器
DE102016200517A1 (de) * 2016-01-18 2017-07-20 Robert Bosch Gmbh Mikroelektronische Bauelementanordnung und entsprechendes Herstellungsverfahren für eine mikroelektronische Bauelementanordnung
US10126278B2 (en) 2016-03-04 2018-11-13 Ldetek Inc. Thermal stress resistant micro-plasma emission detector unit
WO2019144228A1 (en) 2018-01-23 2019-08-01 Ldetek Inc. Valve assembly for a gas chromatograph
US11083494B2 (en) * 2018-06-05 2021-08-10 Conmed Corporation System and method for controlling gas composition in a surgical cavity during endoscopic surgical procedures
US11567022B2 (en) 2019-06-05 2023-01-31 General Electric Company Sensing system and method
CN114424039A (zh) * 2019-09-20 2022-04-29 英福康有限公司 确定压力的方法和压力传感器
DE102019128706B3 (de) 2019-10-24 2021-02-11 Georg-August-Universität Göttingen Stiftung Öffentlichen Rechts Verfahren und Messkopf zum plasmagestützten Messen eines Körpers

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FR1407759A (fr) * 1964-06-23 1965-08-06 Air Liquide Cellule pour l'analyse d'un gaz par décharge à haute fréquence dans ce gaz
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FI91021C (fi) * 1988-11-04 1994-04-25 Instrumentarium Oy Laite kaasujen tunnistamiseksi ja pitoisuuden mittaamiseksi sekä menetelmä kaasujen tunnistamiseksi
US4898465A (en) * 1989-01-30 1990-02-06 Medical Graphics Corporation Gas analyzer apparatus
US5118989A (en) * 1989-12-11 1992-06-02 Fusion Systems Corporation Surface discharge radiation source
US5333487A (en) * 1991-11-15 1994-08-02 Hughes Aircraft Company Spark-excited fluorescence sensor
US5412467A (en) * 1993-03-24 1995-05-02 Praxair Technology, Inc. Gas emission spectrometer and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110243807A (zh) * 2019-07-10 2019-09-17 浙江农林大学 多功能气体传感器

Also Published As

Publication number Publication date
FI98410C (fi) 1997-06-10
EP0658759B1 (en) 2000-05-10
US5570179A (en) 1996-10-29
EP0658759A1 (en) 1995-06-21
DE69424382D1 (de) 2000-06-15
JPH0850098A (ja) 1996-02-20
FI98410B (fi) 1997-02-28
DE69424382T2 (de) 2001-02-08
FI935682A (fi) 1995-06-17

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