FI916001A0 - Foerfarande foer anskaffning av precis kompositional information fraon flerskiktskompositioner. - Google Patents

Foerfarande foer anskaffning av precis kompositional information fraon flerskiktskompositioner.

Info

Publication number
FI916001A0
FI916001A0 FI916001A FI916001A FI916001A0 FI 916001 A0 FI916001 A0 FI 916001A0 FI 916001 A FI916001 A FI 916001A FI 916001 A FI916001 A FI 916001A FI 916001 A0 FI916001 A0 FI 916001A0
Authority
FI
Finland
Prior art keywords
kompositional
flerskiktskompositioner
anskaffning
precis
fraon
Prior art date
Application number
FI916001A
Other languages
English (en)
Inventor
Warren D Vidrine
Original Assignee
Measurex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Measurex Corp filed Critical Measurex Corp
Publication of FI916001A0 publication Critical patent/FI916001A0/fi

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
FI916001A 1989-06-22 1991-12-19 Foerfarande foer anskaffning av precis kompositional information fraon flerskiktskompositioner. FI916001A0 (fi)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/370,420 US4943721A (en) 1989-06-22 1989-06-22 Method of obtaining accurate compositional information of multi-layer compositions
PCT/US1990/003462 WO1991000513A1 (en) 1989-06-22 1990-06-22 Method of obtaining accurate compositional information of multilayer compositions

Publications (1)

Publication Number Publication Date
FI916001A0 true FI916001A0 (fi) 1991-12-19

Family

ID=23459584

Family Applications (1)

Application Number Title Priority Date Filing Date
FI916001A FI916001A0 (fi) 1989-06-22 1991-12-19 Foerfarande foer anskaffning av precis kompositional information fraon flerskiktskompositioner.

Country Status (7)

Country Link
US (1) US4943721A (fi)
EP (1) EP0478690A4 (fi)
JP (1) JPH04506572A (fi)
KR (1) KR920702773A (fi)
CA (1) CA2062752A1 (fi)
FI (1) FI916001A0 (fi)
WO (1) WO1991000513A1 (fi)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5091647A (en) * 1990-12-24 1992-02-25 Ford Motor Company Method and apparatus for measuring the thickness of a layer on a substrate
US5099118A (en) * 1991-05-30 1992-03-24 Francis Kenneth E Dual sensor scanner for measuring weight of paper and related sheet products
US5250811A (en) * 1991-12-20 1993-10-05 Eastman Kodak Company Method for determining compositional information of a multilayer web
US5516564A (en) * 1993-04-28 1996-05-14 Costar Corporation Sterile irradiated hydrophobic pipette tip
US6284986B1 (en) * 1999-03-15 2001-09-04 Seh America, Inc. Method of determining the thickness of a layer on a silicon substrate
US8021517B2 (en) * 2008-02-28 2011-09-20 Honeywell Asca Inc. Use of fluorescent nanoparticles to make on-line measurements of cross-web and machine-direction component and property variations in paper and continuous web products
US7858953B2 (en) * 2008-05-23 2010-12-28 Honeywell Asca Inc. Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices
EP2477798B8 (en) * 2009-09-15 2016-07-27 Sidel Participations S.A.S. Method of heating a preform, a driving arrangement and a preform heating system
US9606048B2 (en) * 2014-06-30 2017-03-28 Momentive Performance Materials Inc. Method for determining the weight and thickness of a passivation or conversion coating on a substrate
DE102014014511B4 (de) * 2014-10-06 2023-10-19 Reifenhäuser GmbH & Co. KG Maschinenfabrik Coextrusionsvorrichtung, Einschichtextrusionsvorrichtung und Nachrüstkit sowie Verfahren zum Messen einer Schichtdicke, zum Herstellen einer Kunststofffolie und zum Nachrüsten einer Extrusionsvorrichtung
US11879765B2 (en) * 2018-09-26 2024-01-23 Honeywell International Inc. Apparatus for composite sheet weight determinations
US11333544B2 (en) * 2019-06-17 2022-05-17 Honeywell International Inc. Apparatus for simultaneously determining weights of composite sheets
US11826773B2 (en) 2021-03-29 2023-11-28 Honeywell International Inc. Correlate thermographic image data to online scanning basis weight measurement

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB887267A (en) * 1957-02-20 1962-01-17 Industrial Nucleonics Corp Improvements in or relating to control systems
JPS589362B2 (ja) * 1978-03-10 1983-02-21 旭化成株式会社 赤外線多層フイルム膜厚測定方法及びその測定装置
US4289964A (en) * 1980-01-24 1981-09-15 Intec Corporation Radiation inspection system for a material making apparatus and method using a beta ray gauge
US4574194A (en) * 1983-11-01 1986-03-04 Fife Corporation Method and apparatus for monitoring the manufacture of a two-component web
DE3643764A1 (de) * 1986-12-20 1988-06-30 Lippke Gmbh Co Kg Paul Verfahren zur selektiven fuellstoffmessung an laufenden materialbahnen, insbesondere papierbahnen

Also Published As

Publication number Publication date
EP0478690A4 (en) 1992-09-02
KR920702773A (ko) 1992-10-06
WO1991000513A1 (en) 1991-01-10
EP0478690A1 (en) 1992-04-08
CA2062752A1 (en) 1990-12-23
JPH04506572A (ja) 1992-11-12
US4943721A (en) 1990-07-24

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