FI916001A0 - Foerfarande foer anskaffning av precis kompositional information fraon flerskiktskompositioner. - Google Patents
Foerfarande foer anskaffning av precis kompositional information fraon flerskiktskompositioner.Info
- Publication number
- FI916001A0 FI916001A0 FI916001A FI916001A FI916001A0 FI 916001 A0 FI916001 A0 FI 916001A0 FI 916001 A FI916001 A FI 916001A FI 916001 A FI916001 A FI 916001A FI 916001 A0 FI916001 A0 FI 916001A0
- Authority
- FI
- Finland
- Prior art keywords
- kompositional
- flerskiktskompositioner
- anskaffning
- precis
- fraon
- Prior art date
Links
- 241001237728 Precis Species 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/370,420 US4943721A (en) | 1989-06-22 | 1989-06-22 | Method of obtaining accurate compositional information of multi-layer compositions |
PCT/US1990/003462 WO1991000513A1 (en) | 1989-06-22 | 1990-06-22 | Method of obtaining accurate compositional information of multilayer compositions |
Publications (1)
Publication Number | Publication Date |
---|---|
FI916001A0 true FI916001A0 (fi) | 1991-12-19 |
Family
ID=23459584
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI916001A FI916001A0 (fi) | 1989-06-22 | 1991-12-19 | Foerfarande foer anskaffning av precis kompositional information fraon flerskiktskompositioner. |
Country Status (7)
Country | Link |
---|---|
US (1) | US4943721A (fi) |
EP (1) | EP0478690A4 (fi) |
JP (1) | JPH04506572A (fi) |
KR (1) | KR920702773A (fi) |
CA (1) | CA2062752A1 (fi) |
FI (1) | FI916001A0 (fi) |
WO (1) | WO1991000513A1 (fi) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5091647A (en) * | 1990-12-24 | 1992-02-25 | Ford Motor Company | Method and apparatus for measuring the thickness of a layer on a substrate |
US5099118A (en) * | 1991-05-30 | 1992-03-24 | Francis Kenneth E | Dual sensor scanner for measuring weight of paper and related sheet products |
US5250811A (en) * | 1991-12-20 | 1993-10-05 | Eastman Kodak Company | Method for determining compositional information of a multilayer web |
US5516564A (en) * | 1993-04-28 | 1996-05-14 | Costar Corporation | Sterile irradiated hydrophobic pipette tip |
US6284986B1 (en) * | 1999-03-15 | 2001-09-04 | Seh America, Inc. | Method of determining the thickness of a layer on a silicon substrate |
US8021517B2 (en) * | 2008-02-28 | 2011-09-20 | Honeywell Asca Inc. | Use of fluorescent nanoparticles to make on-line measurements of cross-web and machine-direction component and property variations in paper and continuous web products |
US7858953B2 (en) * | 2008-05-23 | 2010-12-28 | Honeywell Asca Inc. | Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices |
EP2477798B8 (en) * | 2009-09-15 | 2016-07-27 | Sidel Participations S.A.S. | Method of heating a preform, a driving arrangement and a preform heating system |
US9606048B2 (en) * | 2014-06-30 | 2017-03-28 | Momentive Performance Materials Inc. | Method for determining the weight and thickness of a passivation or conversion coating on a substrate |
DE102014014511B4 (de) * | 2014-10-06 | 2023-10-19 | Reifenhäuser GmbH & Co. KG Maschinenfabrik | Coextrusionsvorrichtung, Einschichtextrusionsvorrichtung und Nachrüstkit sowie Verfahren zum Messen einer Schichtdicke, zum Herstellen einer Kunststofffolie und zum Nachrüsten einer Extrusionsvorrichtung |
US11879765B2 (en) * | 2018-09-26 | 2024-01-23 | Honeywell International Inc. | Apparatus for composite sheet weight determinations |
US11333544B2 (en) * | 2019-06-17 | 2022-05-17 | Honeywell International Inc. | Apparatus for simultaneously determining weights of composite sheets |
US11826773B2 (en) | 2021-03-29 | 2023-11-28 | Honeywell International Inc. | Correlate thermographic image data to online scanning basis weight measurement |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB887267A (en) * | 1957-02-20 | 1962-01-17 | Industrial Nucleonics Corp | Improvements in or relating to control systems |
JPS589362B2 (ja) * | 1978-03-10 | 1983-02-21 | 旭化成株式会社 | 赤外線多層フイルム膜厚測定方法及びその測定装置 |
US4289964A (en) * | 1980-01-24 | 1981-09-15 | Intec Corporation | Radiation inspection system for a material making apparatus and method using a beta ray gauge |
US4574194A (en) * | 1983-11-01 | 1986-03-04 | Fife Corporation | Method and apparatus for monitoring the manufacture of a two-component web |
DE3643764A1 (de) * | 1986-12-20 | 1988-06-30 | Lippke Gmbh Co Kg Paul | Verfahren zur selektiven fuellstoffmessung an laufenden materialbahnen, insbesondere papierbahnen |
-
1989
- 1989-06-22 US US07/370,420 patent/US4943721A/en not_active Expired - Fee Related
-
1990
- 1990-06-22 EP EP19900910998 patent/EP0478690A4/en not_active Withdrawn
- 1990-06-22 KR KR1019910701949A patent/KR920702773A/ko not_active Application Discontinuation
- 1990-06-22 CA CA002062752A patent/CA2062752A1/en not_active Abandoned
- 1990-06-22 WO PCT/US1990/003462 patent/WO1991000513A1/en not_active Application Discontinuation
- 1990-06-22 JP JP2510370A patent/JPH04506572A/ja active Pending
-
1991
- 1991-12-19 FI FI916001A patent/FI916001A0/fi unknown
Also Published As
Publication number | Publication date |
---|---|
EP0478690A4 (en) | 1992-09-02 |
KR920702773A (ko) | 1992-10-06 |
WO1991000513A1 (en) | 1991-01-10 |
EP0478690A1 (en) | 1992-04-08 |
CA2062752A1 (en) | 1990-12-23 |
JPH04506572A (ja) | 1992-11-12 |
US4943721A (en) | 1990-07-24 |
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