FI862222A0 - METHOD FOER MAETNING AV GLANS OCH APPARATUR FOER TILLAEMPNING AV METODEN. - Google Patents

METHOD FOER MAETNING AV GLANS OCH APPARATUR FOER TILLAEMPNING AV METODEN.

Info

Publication number
FI862222A0
FI862222A0 FI862222A FI862222A FI862222A0 FI 862222 A0 FI862222 A0 FI 862222A0 FI 862222 A FI862222 A FI 862222A FI 862222 A FI862222 A FI 862222A FI 862222 A0 FI862222 A0 FI 862222A0
Authority
FI
Finland
Prior art keywords
foer
metoden
glans
tillaempning
maetning
Prior art date
Application number
FI862222A
Other languages
Finnish (fi)
Other versions
FI78355B (en
FI862222A (en
FI78355C (en
Inventor
Pertti Puumalainen
Reijo Kuusela
Original Assignee
Puumalaisen Tutkimuslaitos Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Puumalaisen Tutkimuslaitos Oy filed Critical Puumalaisen Tutkimuslaitos Oy
Priority to FI862222A priority Critical patent/FI78355C/en
Publication of FI862222A0 publication Critical patent/FI862222A0/en
Priority to DE19873790279 priority patent/DE3790279T1/en
Priority to PCT/FI1987/000069 priority patent/WO1987007381A1/en
Publication of FI862222A publication Critical patent/FI862222A/en
Publication of FI78355B publication Critical patent/FI78355B/en
Application granted granted Critical
Publication of FI78355C publication Critical patent/FI78355C/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4702—Global scatter; Total scatter, excluding reflections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4714—Continuous plural angles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/556—Measuring separately scattering and specular
FI862222A 1986-05-27 1986-05-27 METHOD FOER MAETNING AV GLANS OCH APPARATUR FOER TILLAEMPNING AV METODEN. FI78355C (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI862222A FI78355C (en) 1986-05-27 1986-05-27 METHOD FOER MAETNING AV GLANS OCH APPARATUR FOER TILLAEMPNING AV METODEN.
DE19873790279 DE3790279T1 (en) 1986-05-27 1987-05-27 METHOD FOR GLOSS MEASUREMENT AND DEVICE FOR APPLYING THE METHOD
PCT/FI1987/000069 WO1987007381A1 (en) 1986-05-27 1987-05-27 Method for measuring of gloss and equipment for application of method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI862222A FI78355C (en) 1986-05-27 1986-05-27 METHOD FOER MAETNING AV GLANS OCH APPARATUR FOER TILLAEMPNING AV METODEN.
FI862222 1986-05-27

Publications (4)

Publication Number Publication Date
FI862222A0 true FI862222A0 (en) 1986-05-27
FI862222A FI862222A (en) 1987-11-28
FI78355B FI78355B (en) 1989-03-31
FI78355C FI78355C (en) 1989-07-10

Family

ID=8522694

Family Applications (1)

Application Number Title Priority Date Filing Date
FI862222A FI78355C (en) 1986-05-27 1986-05-27 METHOD FOER MAETNING AV GLANS OCH APPARATUR FOER TILLAEMPNING AV METODEN.

Country Status (2)

Country Link
FI (1) FI78355C (en)
WO (1) WO1987007381A1 (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4886355A (en) * 1988-03-28 1989-12-12 Keane Thomas J Combined gloss and color measuring instrument
DE8915535U1 (en) * 1989-03-02 1990-10-25 Fa. Carl Zeiss, 7920 Heidenheim, De
FR2716974B1 (en) * 1994-03-02 1996-06-21 Epsilon Sa Apparatus for optical characterization of materials.
ES2114821B1 (en) * 1996-06-11 1999-02-16 Invest De Las Ind Ceramicas A DEVICE FOR EVALUATION OF NON-SPECULAR BRIGHTNESS.
NL1010613C2 (en) * 1998-11-20 2000-05-23 Hoogovens Corporate Services B Inspecting foreign matter on tin plated steel, by shining light onto surface at different angles and collecting data on the reflected light
FR2840990B1 (en) * 2002-06-18 2005-07-29 France Etat Ponts Chaussees DEVICE FOR MEASURING PHOTOMETRIC CHARACTERISTICS OF A MATERIAL
JP2007507722A (en) 2003-10-07 2007-03-29 イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー Method and apparatus for measuring the orientation of effect particles in a film or coating
US8017927B2 (en) 2005-12-16 2011-09-13 Honeywell International Inc. Apparatus, system, and method for print quality measurements using multiple adjustable sensors
US7688447B2 (en) 2005-12-29 2010-03-30 Honeywell International Inc. Color sensor
US7548317B2 (en) * 2006-05-05 2009-06-16 Agc Flat Glass North America, Inc. Apparatus and method for angular colorimetry
DE602006005820D1 (en) * 2006-10-17 2009-04-30 Fiat Ricerche Method of analyzing the visible color and gonio reflection of an object
US7880156B2 (en) 2006-12-27 2011-02-01 Honeywell International Inc. System and method for z-structure measurements using simultaneous multi-band tomography
US8401809B2 (en) 2010-07-12 2013-03-19 Honeywell International Inc. System and method for adjusting an on-line appearance sensor system
DE102010032600A1 (en) * 2010-07-28 2012-02-02 Byk-Gardner Gmbh Apparatus and method for the determination of surface properties with multiple measurement
JP6422191B2 (en) * 2016-06-30 2018-11-14 株式会社パパラボ Oblique illumination imaging device

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1917379A (en) * 1928-08-02 1933-07-11 Eastman Kodak Co Automatic gloss meter
DE2402127C3 (en) * 1974-01-17 1978-04-06 Pluess-Staufer Ag, Oftringen (Schweiz) Device for measuring the haze of surfaces
US3999864A (en) * 1975-11-17 1976-12-28 International Business Machines Corporation Gloss measuring instrument
GB2004061B (en) * 1977-09-09 1982-03-10 Rank Organisation Ltd Optical sensing instrument
AT351295B (en) * 1977-12-09 1979-07-10 Vianova Kunstharz Ag ARRANGEMENT FOR MEASURING THE GLOSSITY OF SURFACES, IN PARTICULAR ORGANIC COATINGS
US4319847A (en) * 1979-12-05 1982-03-16 Measurex Corporation Apparatus to measure select properties of a moving sheet with improved standardization means
EP0065517B1 (en) * 1980-11-17 1988-12-28 Caterpillar Inc. Surface roughness gauge
DD208670A1 (en) * 1982-06-29 1984-04-04 Pentacon Dresden Veb DEVICE FOR QUICKLY MEASURING THE GLOSS OF ANY SURFACE

Also Published As

Publication number Publication date
FI78355B (en) 1989-03-31
FI862222A (en) 1987-11-28
WO1987007381A1 (en) 1987-12-03
FI78355C (en) 1989-07-10

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Legal Events

Date Code Title Description
MM Patent lapsed

Owner name: PUUMALAISEN TUTKIMUSLAITOS OY