FI844785A0 - FOERFARANDE FOER MAETNING AV TVAERPROFILEN AV EGENSKAPER HOS KONTINUERLIG MATERIALBANA. - Google Patents

FOERFARANDE FOER MAETNING AV TVAERPROFILEN AV EGENSKAPER HOS KONTINUERLIG MATERIALBANA.

Info

Publication number
FI844785A0
FI844785A0 FI844785A FI844785A FI844785A0 FI 844785 A0 FI844785 A0 FI 844785A0 FI 844785 A FI844785 A FI 844785A FI 844785 A FI844785 A FI 844785A FI 844785 A0 FI844785 A0 FI 844785A0
Authority
FI
Finland
Prior art keywords
tvaerprofilen
materialbana
kontinuerlig
foerfarande foer
foer maetning
Prior art date
Application number
FI844785A
Other languages
Finnish (fi)
Other versions
FI73319B (en
FI73319C (en
FI844785L (en
Inventor
Pertti Puumalainen
Original Assignee
Pertti Puumalainen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pertti Puumalainen filed Critical Pertti Puumalainen
Priority to FI844785A priority Critical patent/FI73319C/en
Publication of FI844785A0 publication Critical patent/FI844785A0/en
Priority to PCT/FI1986/000056 priority patent/WO1987007364A1/en
Priority to SE8602424A priority patent/SE453691B/en
Priority to DE19863618518 priority patent/DE3618518A1/en
Publication of FI844785L publication Critical patent/FI844785L/en
Publication of FI73319B publication Critical patent/FI73319B/en
Application granted granted Critical
Publication of FI73319C publication Critical patent/FI73319C/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FI844785A 1984-12-04 1984-12-04 Method for measuring the properties of a cross profile of a continuous material web. FI73319C (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI844785A FI73319C (en) 1984-12-04 1984-12-04 Method for measuring the properties of a cross profile of a continuous material web.
PCT/FI1986/000056 WO1987007364A1 (en) 1984-12-04 1986-05-27 Method for measuring of the thickness profile of plastic films
SE8602424A SE453691B (en) 1984-12-04 1986-05-28 PROCEDURE FOR SEATING PROPERTIES IN A CROSS PROFILE WITH A CONTINUOUS MATERIAL MATCH
DE19863618518 DE3618518A1 (en) 1984-12-04 1986-06-02 METHOD FOR MEASURING PROPERTIES OF A CONTINUOUS MATERIAL RAIL IN THE CROSS-PROFILE

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI844785 1984-12-04
FI844785A FI73319C (en) 1984-12-04 1984-12-04 Method for measuring the properties of a cross profile of a continuous material web.

Publications (4)

Publication Number Publication Date
FI844785A0 true FI844785A0 (en) 1984-12-04
FI844785L FI844785L (en) 1986-06-05
FI73319B FI73319B (en) 1987-05-29
FI73319C FI73319C (en) 1987-09-10

Family

ID=8520009

Family Applications (1)

Application Number Title Priority Date Filing Date
FI844785A FI73319C (en) 1984-12-04 1984-12-04 Method for measuring the properties of a cross profile of a continuous material web.

Country Status (4)

Country Link
DE (1) DE3618518A1 (en)
FI (1) FI73319C (en)
SE (1) SE453691B (en)
WO (1) WO1987007364A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4239270A1 (en) * 1992-11-23 1994-05-26 Siemens Ag Process for actuator identification in the cross-profile control of a continuously generated material web
DE4302137C2 (en) * 1993-01-27 1999-09-02 Micro Perforation Engineering Method and device for optical porosity measurement on a running web
DE19515373C2 (en) * 1995-05-02 1999-02-04 Qualico Prozesueberwachungssys Device for receiving radiation directed from a radiation source onto a band-shaped running sample and reflected by the sample or transmitted by the sample
DE19616018C2 (en) * 1996-04-23 2002-10-24 Mpe Micro Perforation Engineer Method and device for optical porosity measurement in a running web
DE19729005A1 (en) * 1997-07-07 1999-02-04 Siemens Ag Device for measuring cross profiles of certain properties of a running material web, in particular made of paper or cardboard
DE19814490A1 (en) * 1998-04-01 1999-10-07 Voith Sulzer Papiertech Patent Stoppage avoiding method for nozzle, especially for paper web or cardboard in applying glue, pigments or coatings with color stripes, through fountain applicator
FI120053B (en) 2000-12-22 2009-06-15 Metso Automation Oy Method and apparatus for adjusting the moisture profile of a moving paper web
DE10355610B4 (en) * 2003-11-28 2008-04-03 Siemens Ag Arrangement for backlighting a viewing element
DE202018006144U1 (en) * 2018-03-01 2019-04-29 Sikora Ag Device for measuring a tubular strand

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2724919C3 (en) * 1977-06-02 1979-12-06 Paul Lippke Gmbh & Co Kg, 5450 Neuwied Method for measuring physical properties of thin bodies with the aid of ultrared radiation, e.g. for thickness measurement or moisture measurement
DE2938243A1 (en) * 1979-09-21 1981-04-09 Paul Lippke Gmbh & Co Kg, 5450 Neuwied DEVICE FOR MEASURING THE THICKNESS OR ANY OTHER PARAMETER OF A PLASTIC FILM MADE BY EXTRUSION BLOWERS
JPS5857911U (en) * 1981-10-17 1983-04-19 富士電機株式会社 Infrared film thickness meter
DE3336659C2 (en) * 1982-10-12 1993-10-07 Sentrol Systems Ltd Measuring device for determining the profile of the moisture content of a material web transversely to its running direction

Also Published As

Publication number Publication date
SE8602424L (en) 1987-11-29
FI73319B (en) 1987-05-29
DE3618518A1 (en) 1987-12-03
FI73319C (en) 1987-09-10
SE453691B (en) 1988-02-22
WO1987007364A1 (en) 1987-12-03
FI844785L (en) 1986-06-05
SE8602424D0 (en) 1986-05-28

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Legal Events

Date Code Title Description
MM Patent lapsed
MM Patent lapsed

Owner name: PUUMALAINEN, PERTTI