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Application filed by Martti Eelis Tiuri, Ebbe Gustaf Nyfors, Vainikainen Pertti Veli, Stig Harald StaohlfiledCriticalMartti Eelis Tiuri
Priority to FI834064ApriorityCriticalpatent/FI73084C/en
Publication of FI834064A0publicationCriticalpatent/FI834064A0/en
Publication of FI834064ApublicationCriticalpatent/FI834064A/en
Application grantedgrantedCritical
Publication of FI73084BpublicationCriticalpatent/FI73084B/en
Publication of FI73084CpublicationCriticalpatent/FI73084C/en
FI834064A1983-11-041983-11-04
MAETMETOD OCH -APPARAT FOER MAETNING AV EGENSKAPERNA AV ETT MATERIESKIKT VARS ELEKTRISKA KONDUCTIVITET AER LAOG
FI73084C
(en)