FI20225897A1

FI20225897A1 - Measurement device and method for measuring properties of target

Info

Publication number: FI20225897A1
Application number: FI20225897A
Authority: FI
Inventors: Jussi Pukki
Original assignee: Icare Finland Oy
Priority date: 2022-10-05
Filing date: 2022-10-05
Publication date: 2024-04-06
Also published as: WO2024074758A1

Abstract

Disclosed is measurement device (100, 200, 300, 400, 500) for measuring properties of target (102, 202, 502). The measurement device comprises housing (104) comprising hollow tube (106, 318) comprising proximal end (106A) and distal end (106B), hollow tube formed by first electrode (314, 420, 608) and second electrode (316, 422, 610); probe (108, 208, 304, 402, 600), probe comprising elongated body (304A, 402A) comprising electrically conducting pin (404, 606), insulating layer (406, 612), and electrically conducting layer (410, 604), and probe head (110, 408) comprising sensor (112, 206) configured to measure properties of target, sensor, communicatively connected to electrically conducting layer and electrically conducting pin, to provide measurement signal (602); ejection means (302) operable to eject probe, and provide measurement signal as first voltage difference between electrically conducting layer and electrically conducting pin; and controller (116) arranged to measure second voltage difference between first electrode and second electrode.

Description

MEASUREMENT DEVICE AND METHOD FOR MEASURING PROPERTIES OF

TARGET

TECHNICAL FIELD

The present disclosure relates to a measurement device for measuring properties of a target. The present disclosure also relates to a method for measuring properties of a target.

BACKGROUND

Over the past few millennia, measurement devices have gained popularity in various disciplines such as medicine, engineering, and the like.

Particularly, in the medicine, measurement devices are employed to measure properties of a target of a living subject, diagnose ailments associated with the target, and so forth.

Conventionally, in medicine, one type of measurement devices uses a contactless measuring or imaging sensor for examining some properties of a target of a subject.

Alternatively, a second type of measurement devices uses a sensor that is kept in contact with the subject for a substantially long time with a

N substantially big force for examining some other properties of a target.

N

O

N

A Alternatively, a third type of measurement devices uses a movable probe = 20 that can be used in conjunction with a separate sensor for measuring the

O

- properties of a target during a brief contact between the probe and the jami > subject. In this regard, if the probe is small and light weight, it can be

Nn 8 deployed with a very low impact force, but it cannot accommodate a sensor

N that reguires electricity for functioning thereof. Conventionally, such probe

N is passive and must be used with a separate sensor that measures the probe speed and acceleration.

The third type of measurement devices can in many applications be used to measure the same properties as the second type of measurement devices, which have the disadvantage that they are so big and heavy, and measuring time is so long, that their use necessitates applying of local anaesthesia to avoid pain on the subject.

Therefore, in light of the foregoing discussion, there exists a need to overcome the aforementioned drawbacks associated with existing means for determining properties of the target.

SUMMARY

The present disclosure seeks to provide a measurement device for measuring properties of a target. The present disclosure also seeks to provide a method for measuring properties of a target. An aim of the present disclosure is to provide a solution that overcomes at least partially the problems encountered in prior art.

In one aspect, an embodiment of the present disclosure provides a measurement device for measuring properties of a target, the measurement

N device comprising: 5 20 -ahousing comprising: = - a hollow tube comprising a proximal end and a distal end, the hollow 7 tube formed by a - a first electrode extending a first distance (L1) from the distal > end of the hollow tube, and a 25 - a second electrode extending a second distance (L2) towards

N the proximal end of the hollow tube;

- a probe arranged at least partly inside the hollow tube, the probe being operable to be ejected towards the target, the probe comprising - an elongated body comprising - an electrically conducting pin, - an insulating layer surrounding the electrically conducting pin from a probe head to a third distance (L3), and - an electrically conducting layer surrounding the insulating layer from the probe head to a fourth distance (L4), and - the probe head comprising a sensor configured to measure properties of the target, - the sensor, communicatively connected to the electrically conducting layer and the electrically conducting pin, to provide a measurement signal; - an ejection means operable to eject the probe from a first position into a second position towards the target, retract the probe back to the first position, wherein the sensor is operable to - measure a signal associated with the properties of the target at the second position, and - provide measurement signal as a first voltage difference between the electrically conducting layer and the electrically conducting pin; and 3 - a controller arranged to measure a second voltage difference between the

O first electrode and the second electrode, wherein the second voltage o difference is induced capacitively by the first voltage difference.

E 25 In another aspect, an embodiment of the present disclosure provides a

S method for measuring properties of a target, the method comprising: a - arranging a probe at least partly inside a hollow tube, the hollow tube

NN comprising a proximal end and a distal end, the hollow tube formed by

- a first electrode extending a first distance (L1) from the distal end of the hollow tube, and - a second electrode extending a second distance (L2) towards the proximal end of the hollow tube, wherein the probe being operable to be ejected towards the target (102), the probe comprising - an elongated body comprising - an electrically conducting pin, - an insulating layer surrounding the electrically conducting pin from a probe head to a third distance (L3), and - an electrically conducting layer surrounding the insulating layer from the probe head to a fourth distance (L4), and - the probe head comprising a sensor configured to measure properties of the target, - the sensor, communicatively connected to the electrically conducting layer and the electrically conducting pin, to provide a measurement signal; - operating an ejection means to eject the probe from a first position into a second position towards the target, retract the probe back to the first position, wherein the sensor is operable to 3 - measure a signal associated with the properties of the target at

O the second position, and o - provide measurement signal as a first voltage difference z 25 between the electrically conducting layer and the electrically

N conducting pin; and 8 - arranging a controller to measure a second voltage difference between

N the first electrode and the second electrode, wherein the second voltage

N difference is induced capacitively by the first voltage difference.

Embodiments of the present disclosure substantially eliminate or at least partially address the aforementioned problems in the prior art, and enable an improved, accurate, reliable and efficient measurement device for measuring properties of a target. Beneficially, the measurement device 5 enables a fast and an automatic measurement of properties of the target, without requiring a frequent (or constant) human intervention. Moreover, the measurement device enables an efficient and wireless transfer of a measurement signal, without distorting the waveform thereof, using the sensor.

Additional aspects, advantages, features and objects of the present disclosure would be made apparent from the drawings and the detailed description of the illustrative embodiments construed in conjunction with the appended claims that follow.

It will be appreciated that features of the present disclosure are susceptible to being combined in various combinations without departing from the scope of the present disclosure as defined by the appended claims.

BRIEF DESCRIPTION OF THE DRAWINGS

The summary above, as well as the following detailed description of

N illustrative embodiments, is better understood when read in conjunction

O 20 with the appended drawings. For the purpose of illustrating the present

O disclosure, exemplary constructions of the disclosure are shown in the 0 drawings. However, the present disclosure is not limited to specific methods

E and instrumentalities disclosed herein. Moreover, those skilled in the art will

N understand that the drawings are not to scale. Wherever possible, like

E 25 elements have been indicated by identical numbers.

QA

N

Embodiments of the present disclosure will now be described, by way of example only, with reference to the following diagrams wherein:

FIGs. 1A and 1B are schematic illustrations of a measurement device for measuring properties of a target, in accordance with an embodiment of the present disclosure;

FIG. 2 is another schematic illustration of a measurement device for measuring properties of a target, in accordance with an embodiment of the present disclosure;

FIG. 3 is a cross-sectional view of a measurement device for measuring properties of a target, in accordance with an embodiment of the present disclosure;

FIG. 4, is an exploded view of a measurement device, in accordance with an embodiment of the present disclosure;

FIG. 5, is an exemplary implementation of a measurement device for measuring properties of a target, in accordance with an embodiment of the present disclosure;

FIG. 6, is a cross-sectional view of a probe providing a measurement signal,

N in accordance with an embodiment of the present disclosure;

N

O

N

A FIG. 7, is an X-Y graph depicting an experimental data obtained from an = 20 embodiment of a measurement device for measuring properties of a target,

O r in accordance with an embodiment of the present disclosure; and jami 5 FIG. 8 is a flowchart depicting steps of a method for measuring properties 00

O of a target, in accordance with an embodiment of the present disclosure.

N

O

N

In the accompanying drawings, an underlined number is employed to represent an item over which the underlined number is positioned or an item to which the underlined number is adjacent. A non-underlined number relates to an item identified by a line linking the non-underlined number to the item. When a number is non-underlined and accompanied by an associated arrow, the non-underlined number is used to identify a general item at which the arrow is pointing.

DETAILED DESCRIPTION OF EMBODIMENTS

The following detailed description illustrates embodiments of the present disclosure and ways in which they can be implemented. Although some modes of carrying out the present disclosure have been disclosed, those skilled in the art would recognize that other embodiments for carrying out or practising the present disclosure are also possible.

In one aspect, an embodiment of the present disclosure provides a measurement device for measuring properties of a target, the measurement device comprising: - a housing comprising: - a hollow tube comprising a proximal end and a distal end, the hollow tube formed by

N 20 - a first electrode extending a first distance (L1) from the distal

N end of the hollow tube, and 7 - a second electrode extending a second distance (L2) towards 7 the proximal end of the hollow tube;

E - a probe arranged at least partly inside the hollow tube, the probe being

S 25 operable to be ejected towards the target, the probe comprising a - an elongated body comprising

N - an electrically conducting pin,

- an insulating layer surrounding the electrically conducting pin from a probe head to a third distance (L3), and - an electrically conducting layer surrounding the insulating layer from the probe head to a fourth distance (L4), and - the probe head comprising a sensor configured to measure properties of the target, - the sensor, communicatively connected to the electrically conducting layer and the electrically conducting pin, to provide a measurement signal; - an ejection means operable to eject the probe from a first position into a second position towards the target, retract the probe back to the first position, wherein the sensor is operable to - measure a signal associated with the properties of the target at the second position, and - provide measurement signal as a first voltage difference between the electrically conducting layer and the electrically conducting pin; and - a controller arranged to measure a second voltage difference between the first electrode and the second electrode, wherein the second voltage difference is induced capacitively by the first voltage difference.

N In another aspect, an embodiment of the present disclosure provides a

N method for measuring properties of a target, the method comprising: 2 - arranging a probe at least partly inside a hollow tube, the hollow tube

S comprising a proximal end and a distal end, the hollow tube formed by

E 25 - a first electrode extending a first distance (L1) from the distal end

S of the hollow tube, and a - a second electrode extending a second distance (L2) towards the

NN proximal end of the hollow tube,

wherein the probe being operable to be ejected towards the target, the probe comprising - an elongated body comprising - an electrically conducting pin, - an insulating layer surrounding the electrically conducting pin from a probe head to a third distance (L3), and - a electrically conducting layer surrounding the insulating layer from the probe head to a fourth distance (L4), and - the probe head comprising a sensor configured to measure properties of the target, - the sensor, communicatively connected to the electrically conducting layer and the electrically conducting pin, to provide a measurement signal; - operating an ejection means to eject the probe from a first position into a second position towards the target, retract the probe back to the first position, wherein the sensor is operable to - measure a signal associated with the properties of the target at the second position, and - provide measurement signal as a first voltage difference between the electrically conducting layer and the electrically 3 conducting pin; and

O - arranging a controller to measure a second voltage difference between o the first electrode and the second electrode, wherein the second voltage z 25 difference is induced capacitively by the first voltage difference.

S The present disclosure provides the aforementioned measurement device a and the aforementioned method that is robust, fast, effective, reliable,

NN energy efficient and user friendly. Advantageously, the aforementioned measurement device enables a precise coupling of the components thereof.

In this regard, the aforementioned measurement device significantly speeds up the measurement of properties of the target, provides painless measurement, and provides a more reliable estimation thereof. Moreover, the measurement device enables a transfer of the measurement signals wirelessly, and also reduces distortion of the measurement signals.

Pursuant to the embodiments of the present disclosure, the term "target" as used herein refers to an element of a human or an animal body, such as a body part, the properties refer to physiological parameters associated with the target.

In one embodiment, the target on the body is the eye. Herein, the eye may be measured for several properties, such as touch sensitivity, intra-ocular pressure, dimensions of: cornea, iris, pupil, aqueous humor, lens, vitreous humor, retina, and optic nerve, and the like.

Notably, the intra-ocular pressure is determined to maintain overall eye health and function. It will be appreciated that the measurement of the intraocular pressure enables a diagnosis and treatment of ocular hypertension before the development of eye-related conditions. Moreover, the dimensions are determined for diagnosing eye growth regulation and

N 20 the touch sensitivity is determined for treatment of eye-related conditions a such as conjunctivitis, corneal infections, glaucoma, dry-eye and so forth. 0 The measurement device comprises a housing. The term "housing" as used

E herein refers to a protective layer that is configured to encircle (or surround)

N various components of the device at least partly or completely. In other

E 25 words, the housing is adapted to accommodate the components of the

O measurement device. It will be appreciated that the components of the measurement device could be arranged (namely, held or attached) in the housing via mechanical means, magnetic means, and the like. In an implementation, the components of the measurement device could be manufactured individually, and then could be assembled in the housing. In another implementation, the components of the measurement device could be manufactured as an integral part of the housing.

The housing of the measurement device comprises a hollow tube. The term "hollow tube" as used herein refers to a chassis of the measurement device.

Moreover, fixed to the hollow tube are a tubular cavity for a probe with a first electrode and a second electrode, a probe ejection mechanism and a power supply contact mechanism. Moreover, the hollow tube comprises a proximal end and a distal end. It will be appreciated that the proximal end may refer to a nearer end and the distal end may refer to a farther end of the hollow tube.

The terms "first electrode" and "second electrode" as used herein refer to a piece of electrically conducting material that is used to exchange energy with another piece of electrically conducting material, either via a direct contact or via an electromagnetic field. In this regard, the first electrode extends a first distance from the distal end of the hollow tube and the second electrode extends a second distance towards the proximal end of the hollow

N 20 tube. Moreover, the optimum second probe position i.e. the optimum

O distance between the measurement device and the target is where the end

O of the electrically conducting layer of the ejected probe coincides with the 0 division between the first electrode and the second electrode. It will be = appreciated that, when in operation, the probe sensor induces, capacitively,

N 25 a voltage between the first electrode and the second electrode.

X The term "probe" as used herein refers to a tool employed for determining

S properties of the target. Moreover, the probe is arranged at least partly inside the hollow tube of the measurement device. In this regard, the probe is operable to be ejected towards the target. Optionally, the probe is a rebound probe. The term "rebound probe" as used herein refers to a probe that uses rebound movement. The rebound movement occurs when the probe bounces off the surface of a target (such as the eye) after making a momentary contact therewith. Beneficially, a gentle momentary contact of a rebound probe eliminates the need of local anaesthesia, when in operation.

Moreover, the probe comprises an elongated body. Optionally, the elongated body has a first end that protrudes outside the hollow tube, when in use.

Optionally, the elongated body has a second end, such that the second end is inside the hollow tube. It will be appreciated that the first electrode and the second electrode are arranged to partly surround the elongated body of the probe.

The term "electrically conducting pin" as used herein refers to a part of the elongated body of a probe, a pin fabricated of a thin wire of a conducting material such as a metal. Optionally the electrically conducting pin is used to supply electricity to the probe. Optionally, the electrically conducting pin of the elongated body is also of magnetic material such as a ferromagnetic material, thus generates a mechanical force when a magnetic field is applied

N 20 thereto by an ejection mechanism. The said magnetic field generates a force

O that ejects the probe towards the target and then returns the probe after

O property measurement has been completed.

LO

7 The term "insulating layer" as used herein refers to a layer that produces an

E electrical isolation and can be used as a protective coating for conducting

S 25 parts. Optionally, the insulating layer is fabricated using a plastic material a such as a polytetrafluoroethane, a natural rubber, a polyvinyl chloride, and

S the like. The electrically conducting pin is surrounded by the insulating layer from a probe head to a third distance. Herein, the third distance is the distance between the probe head and the charging contact at the second end of the electrically conducting pin.

The term "probe head" as used herein refers to a part of the probe that is implemented as an element of rotationally symmetric form. In this regard, the probe head is connected to the first end of the elongated body.

Beneficially, such element increases surface area of the probe head, thereby reducing an impact pressure of the probe head on a target surface. Notably, the target acts as an interface between the functioning eye and external environment. It will be appreciated that when in use, the probe head collides with the target to measure the properties thereof and then bounces back.

Optionally, the probe head is made from a bio-compatible material that may impact the target, when in use. Optionally, beneficially, the probe head being made of bio-compatible material enables the probe to function in intimate contact with living tissues. Optionally, the bio-compatible material is free from carcinogenicity, toxicity, and is resistive to corrosion.

The term "electrically conducting layer" as used herein refers to a part of the elongated body of a probe, a thin material layer on top of an insulating layer, fabricated of a conducting material such as a metal. The electrically

N 20 conducting layer surrounds the insulating layer from the probe head to a

N fourth distance. Herein, the fourth distance is the distance from end of the 7 probe to a length designed to be optimal, namely such that the end of the 7 electrically conducting layer coincides with the division between the first

E electrode and the second electrode, when the probe head touches the

S 25 target. Beneficially, a variation of the distance between the measuring a device and the target only effects the amplitude of the second voltage, and

N does not deform the waveform. Moreover, in a typical implementation, the amplitude attenuation is less than 50% if the distance is within -5 to +4 mm of the optimal distance. Optionally, the distance is in a range from -20, -15, -10, -5, -4,-3,-2,-1,0,1, 2, 3,4, 5 up to -15, -10, -5, -4, -3,-2,-1,0, 1, 2,3,4,5,10, 20 mm.

Optionally, the electrically conducting pin is surrounded at least partly with the first electrode when the probe is ejected. In this regard, a part of the electrically conducting layer which is inside of the hollow tube is surrounded by the second electrode. Beneficially, the said arrangement enables an efficient coupling of the probe with other components of the measurement device, when in operation.

The term "sensor" as used herein refers to an electronic device that is designed to detect and measure properties of a target. In this regard, the probe head comprises the sensor to measure properties of the target when not in contact with the charging contacts. Optionally, the sensor may measure the properties of the target when the probe is stationary.

Optionally, the sensor may measure the properties of the target when not in the retracted position, where it is charged via the charging contacts. It will be appreciated that the sensor could take measurement readings when the probe head is in contact with the target.

N 20 Optionally, the sensor is an ultrasonic sensor. Herein, the ultrasonic sensor

N refers to an electronic device, that measures, by emitting sound waves, and 7 converting the reflected sound into an electrical signal, at least one of: 7 attenuation of ultrasound waves in a target medium; one or more distances

E between acoustic layer boundaries in a target medium. Typically, the

S 25 ultrasonic sensor comprises a transmitter that emits the sound using a a transducer (piezoelectric crystal, MEMS and the like) and a receiver that

S receives the sound using a transducer (piezoelectric crystal, MEMS and the like). In an implementation, the ultrasonic sensor transmits and receives sound waves using the same transducer, first transmitting a sound burst, then waiting to receive echoes from various acoustic boundaries within the target. The travel times of the echoes are then used to calculate dimensions of the target. Optionally, the sensor is a force sensor, a camera, and so forth.

Moreover, the sensor is communicatively connected to the electrically conducting layer and the electrically conducting pin, to provide a measurement signal. The term "measurement signal" as used herein refers to a parameter or a variable quantity whose variations represent information. In an example, an amplitude, a frequency, a phase or a coded sequence of voltage, current, electric field strength, sound, and so forth, may be signals representing the measurement data.

Optionally, the measurement signal may be amplified or otherwise modified — prior to transfer, to enable accurate communication between a sensor and a controller, without dependency on ability to transfer absolute amplitude.

Optionally, a reference value may be transmitted periodically, to correct for attenuation of transferred signal amplitude.

The term "ejection means" as used herein refers to a means that is used to

N 20 eject the probe from first position in the hollow tube in a controlled manner

N to a second position and to return the probe after contacting with the target. 7 In this regard, the ejection means ejects the probe from a first position into 7 a second position towards the target and retracts the probe back to the first

E position. Herein, the first position refers to a position when the probe is not

S 25 colliding with target. Moreover, the second position refers to a position of a the probe when it is colliding with the target. Advantageously, the ejection

S means enables an efficient and accurate movement of the probe, when in use. Optionally, the ejection means is selected from at least one of electromagnetic induction, air pressure, spring force, piezoelectric force, and the like.

The term "electromagnetic induction coil" as used herein refers to an electrical winding on a core, that is used to produce an electromagnetic field from an electric current, and in return an electric current from an electromagnetic field. In this regard, the ejection means may be implemented utilizing an electromagnetic induction coil. In an implementation, the electromagnetic induction coil may be arranged as part of the hollow tube, around the first electrode and the second electrode, to provide motion to the probe, when in use.

Optionally, the electromagnetic induction coil is used for measuring speed and acceleration of the probe while the probe is ejected, touches the target and bounces back.

Optionally, the electromagnetic induction coil is beneficially designed to generate the electromagnetic field used to move the probe in such a form, that the field suspends the probe, and the probe does not touch the hollow tube while the probe is ejected, touches the target and bounces back, thus eliminating friction between the probe and the rest of the measurement

N 20 device when the probe is not in the first position. a 2 Theterm "air pressure" as used herein refers to a force per unit area exerted 0 by gas molecules inside a vessel. In this regard, air pressure is used to

E produce the ejection/retraction force in order to enable movement of the = probe towards the target. >

N 25 Theterm "spring" as used herein refers to an elastic machine element that

N possesses an ability to deflect under an action of a loading force, and to return to an original shape when the force is removed. In other words, a spring is an elastic object that stores mechanical energy. Moreover, the loading force is the spring force. Optionally, a spring is fabricated using metal. Optionally, a spring is fabricated using elastomer plastic. Optionally, the spring is a coil spring, a tension spring, and the like.

Moreover, the sensor is further operable to measure the signal associated with the properties of the target - when the probe is ejected from the first position into the second position; - when the probe is in the second position; and - when the probe is retracted back to the first position.

The term "signal" as used herein refers to an electric current or an electromagnetic field that is used to convey data from one place to another.

Optionally, the data may be the properties of the target. In this regard, when the probe head collides with the target, the sensor performs measurements and generates signal as a result. The said signal is based on the properties associated with the target. Subsequently, the said property of the target is coded in the form of the corresponding electric value or the signal. Moreover, the said measurement signal is provided as a change in the electric potential between the electrically conducting layer and the

N 20 electrically conducting pin to a controller.

QA

N Optionally, the measurement signal is selected from at least one of: an 7 analog signal, a digital signal. The term "analog signal" as used herein refers 7 to any continuous signal representing some other quantity, i.e., analogous

E to another guantity. In an example, herein the instantaneous signal voltage,

S 25 current, freguency or phase may vary continuously with the change in the a measurement signal. The term "digital signal" as used herein refers to a

S signal that represents data as a seguence of discrete values. It will be appreciated that digital signals may convey information with less noise, distortion, and interference. In this regard, the measurement signal is in the form of an analog signal and of a digital signal. Moreover, the measurement signal is provided to a controller either as an analog signal or a digital signal, controlling the electric waveform between the first electrode and the second electrode.

Optionally, the sensor is configured to amplify or otherwise modify the measurement signal prior to providing the measurement signal as the first voltage difference waveform between the electrically conducting layer and the electrically conducting pin. In this regard, the sensor measures the property when in contact with the target, and amplifies or otherwise modifies the result to produce a measurement signal, that it uses to modulate the first voltage difference (an electric potential) between the electrically conducting pin and the electrically conducting layer. It will be appreciated that the modulation of the first voltage difference causes changes in voltage in the second electrode in respect to voltage of the first electrode. Beneficially, the said arrangement enables the measurement signal to be provided from the sensor to a controller wirelessly, without direct contact to the measurement device. Advantageously, the sensor may modify the signal to not transfer information coded in an absolute voltage,

N or may transfer a reference voltage that the controller uses to correct for

N any attenuation of voltage caused by the second position distance deviating 7 from optimal distance.

O

= Optionally, the sensor is further operable to:

N 25 - measure a signal associated with the properties of the target at the 8 second position, and

N - provide measurement signal as a first voltage difference between the - electrically conducting layer and the electrically conducting pin.

It will be appreciated that the sensor is operable to measure the signal associated with the properties of the target efficiently at various positions throughout the operation. Beneficially, the said arrangement enables the measurement device to be user-friendly, thereby eliminating a need of the medical professional to perform the diagnosis or measure the properties of the target.

Optionally, the sensor is configured to measure properties of the target during movement of the probe. The probe is ejected from a first position to a second position towards a target and retract the probe back to the first position. During movement of the probe, the signal is received. The movement of the probe is considered during ejecting the probe, touching the target and bouncing back to the first position. This means, that properties of the target are measured while the probe is not in the first position.

Optionally, the sensor and the controller are communicable coupled via a wireless communication interface. The term "wireless communication interface" as used herein refers to a device that possesses the ability to transmit information from one point to other, without using any connection like wires, cables or any physical medium. In this regard, the measurement

N 20 signal is transmitted from the sensor and received by a controller using

O capacitive induction. Advantageously, the wireless communication interface

O enables an efficient transferring of the measurement signal, when in 0 operation. = a The measurement device comprises a controller arranged to measure a

S 25 second voltage difference between the first electrode and the second a electrode, wherein the second voltage difference is induced capacitively by

S the first voltage difference. The term "controller" as used herein refers to a computational device that is operable for controlling the overall operation of the measurement device. In this regard, the controller, in operation, performs tasks such as, but not limited to, measuring the second voltage difference between the first electrode and the second electrode, controlling movement of the probe, and responding to and processing information. In an example, the controller may be an embedded microcontroller, a microprocessor, and the like. Optionally, the controller may be implemented as an internal component of the measurement device. Optionally, the second voltage difference is induced due to the difference in the electric potential value of the first electrode and the second electrode.

Optionally, the controller is operable to receive the measurement signal when the probe is ejected in a range from 0.5 cm to 2 cm from the first position into the second position. Optionally, the probe is ejected in a range from 0.5, 0.6, 0.7, 0.8, 0.9, 1.0, 1.2, 1.3, 1.4, 1.5, 1.6, 1.7, 1.8, or 1.9 upto 0.6, 0.7, 0.8, 0.9, 1.0, 1.2, 1.3, 1.4, 1.5, 1.6, 1.7, 1.8, 1.9 or 2.0 cm. It will be appreciated that, when in use (i.e., at the time of impact) the probe is ejected from the hollow tube defined by the first electrode and the second electrode to an extent that the electrically conducting layer is not surrounded with the first electrode (or is surrounded only a few millimeters).

Moreover, a part of the electrically conducting layer which is inside of the

N hollow tube is surrounded by the second electrode. Beneficially, when the

N distance between the measuring device and the target deviates only a little = from the designed optimum distance, the controller is able to receive the

S measurement signal form accurately, although with some attenuation. Thus,

E 25 the received measurement signal must be amplitude corrected or the

S amplitude must not be used to transfer information. Optionally, the a controller is operable to receive the measurement signal of 5 MHz to 20 MHz

O

N when the probe is ejected in a range from 1 cm to 2 cm from the first position into the second position.

The measurement device further comprises a power source for charging the sensor, wherein the power source is electrically connected to a first charging contact and a second charging contact of the measurement device. The term "power source" as used herein refers to an electrical device that supplies electric power to an electrical load. In this regard, the power source is used to charge the sensor arranged in the probe head. The term "first charging contact" and "second charging contact" as used herein refers to electronic components that connect the measurement device with the power source, during a first operational stage.

Optionally, the first charging contact and the second charging contact are operable to form communication with at least one of selected from the sensor of the probe or a calculation unit of the probe. In this regard, the first charging contact and the second charging contact is communicably coupled with the sensor and the calculation unit of the probe to communicate the measurement signal measured thereby efficiently.

Optionally, the power source is configured to be in:

N 20 - a first operational stage when first charging contact and the second

O charging contact are arranged to contact a first electrical contact and a

O second electrical contact of the probe, respectively; and 0 - a second operational stage when the first charging contact and the second = charging contact are not in contact with the first electrical contact and the

N 25 second electrical contact of the probe, respectively.

X In this regard, the power source is electrically connected to the first charging

N contact and the second charging contact. Moreover, the first charging contact and the second charging contact are arranged to be in contact with respective first electrical contact and second electrical contact of the probe, when in the first operational stage. It will be appreciated that during the first operational stage the power source enables an efficient charging of the electrical storage of the sensor. Furthermore, during the second operational stage the friction between the charging contacts of the power source and the electrical contacts of the probe is removed, thereby enabling a free moving motion or ejection of the probe towards the target.

Beneficially, the aforementioned charging stages eliminate friction that is caused when a first charging point and a second charging point is physically in contact with a first electrical contact and a second electrical contact.

Optionally, the probe comprises an electrical storage.

The term "electrical storage" as used herein refers to a device that is used to store an electrical charge for use at a later time to reduce imbalances between energy demand and energy production. It will be appreciated that the probe comprises an electrical storage for operating the sensor of the probe head. Moreover, the electrical storage is charged using the power source during the first operational stage. Optionally, the electrical storage is a capacitor. In this regard, the capacitor is a device that stores electrical

N 20 energy in an electric field. Typically, the capacitors contain at least two

N electrical conductors separated by a dielectric medium therebetween. In an 7 implementation, when an electric potential difference, a voltage, is applied 7 across the terminals of the capacitor, for example when the capacitor is

E connected across the power source, the electric field develops across the

S 25 dielectric, causing a net positive charge to collect on one plate and net a negative charge to collect on the other plate of the capacitor.

O

N

The present disclosure also relates to the method as described above.

Various embodiments and variants disclosed above apply mutatis mutandis to the method.

Optionally, the method further comprises arranging a power source for charging the sensor, wherein the power source is electrically connected to a first charging contact and a second charging contact of the measurement device.

Optionally, the method comprises operating the power source in: - a first operational stage when first charging contact and the second charging contact are arranged to contact the electrically conducting pin and the electrically conducting layer of the probe, respectively; and - a second operational stage when the first charging contact and the second charging contact are not in contact with the first electrical contact and the second electrical contact of the probe.

Optionally, the ejection means ejects the probe towards the target by using at least one of selected from electromagnetic induction, air pressure, spring force, piezoelectric force, and the like.

Optionally, the method comprises amplifying or otherwise modifying the

N measurement signal prior to providing the measurement signal as the first

O 20 voltage difference between the electrically conducting layer and the 2 electrically conducting pin.

S

I Optionally, the method comprises operating the sensor to: a - measure the signal associated with the properties of the target at the 3 second position, and

N 25 - provide measurement signal as a first voltage difference between the

N electrically conducting layer and the electrically conducting pin.

Optionally, the method comprises arranging the electrically conducting pin such that it is surrounded at least partly with the first electrode when the probe is ejected.

Optionally, the method further comprises receiving the measurement signal by the controller when the probe is ejected in a range from 0.5 cm to 2 cm from the first position into the second position.

DETAILED DESCRIPTION OF THE DRAWINGS

Referring to FIGs. 1A and 1B, shown are schematic illustrations of a measurement device 100 for measuring properties of a target 102, in accordance with an embodiment of the present disclosure. As shown in FIG. 1A, the measurement device 100 comprises a housing 104, a hollow tube 106 comprising a proximal end 106A and a distal end 106B. Moreover, the hollow tube 106 is formed by a first electrode (not shown) extending from the distal end 106B to a first distance (not shown) of the hollow tube 106, and a second electrode (not shown) extending from a second distance (not shown) towards the proximal end 106A of the hollow tube 106.

Furthermore, the measurement device 100 comprises a probe 108 arranged at least partly inside the hollow tube 106, the probe being

N 20 operable to be ejected towards the target 102. Additionally, the probe 106

O comprises the probe head 110 comprising a sensor 112 configured to

O measure properties of the target 102 108 and a calculation unit 120 to 0 communicate the measurement signal measured thereby efficiently.

E As shown in FIG. 1B, the probe 108 is ejected from the first position into

S 25 the second position. At the second position the sensor 112 of the probe a head 110 collides with the target 102. Moreover, the sensor 112 is operable

S to measure a signal 114 associated with the properties of the target 102 at a second position, and provide measurement signal as a first voltage difference (not shown) between the electrically conducting layer and the electrically conducting pin. Furthermore, the measurement device 100 comprises a controller 116 arranged to measure a second voltage difference (not shown) between the first electrode and the second electrode, wherein the second voltage difference is induced capacitively by the first voltage difference. Additionally, the measurement device 100 further comprises a power source 118 for charging the sensor 112. As shown, at the second position the probe 106 is detached from the power source 118.

Referring to FIG. 2, shown is another schematic illustration of a measurement device 200 for measuring properties of a target 202, in accordance with an embodiment of the present disclosure. As shown, the measurement device 200 further comprises a power source 204 for charging a sensor 206 and a calculation unit 214 of a probe 208, wherein the power source 204 is electrically connected to a first charging contact 210 and a second charging contact 212 of the measurement device 200.

Referring to FIG. 3, shown is a cross-sectional view of a measurement device 300 for measuring properties of a target (not shown), in accordance with an embodiment of the present disclosure. As shown, the measurement

N 20 device 300 comprisesan ejection means 302 operable to eject a probe 304

O from a first position into a second position towards the target and retract

O the probe 304 back to the first position. The probe 304 comprises an 0 elongated body 304A. Moreover, the power source (not shown) is = configured to be in a first operational stage when first charging contact 306

N 25 and the second charging contact 308 are arranged to contact a first & electrical contact 310 and a second electrical contact 312 of the probe 304,

N respectively. Furthermore, a controller (not shown) is arranged to measure - a second voltage difference between a first electrode 314 and a second electrode 316; the first electrode 314 extends a first distance (L1) from the distal end of a hollow tube 318 of the measurement device, and the second electrode 316 extends a second distance (L2) towards the proximal end of the hollow tube 318.

Referring to FIG. 4, shown is an exploded view of a measurement device 400, in accordance with an embodiment of the present disclosure. As shown, the measurement device 400 comprises a probe 402 arranged at least partly inside a hollow tube (not shown), the probe 402 being operable to be ejected towards the target (not shown). The probe 402 comprises an elongated body 402A comprising an electrically conducting pin 404, an insulating layer 406 surrounding the electrically conducting pin 404 from a probe head 408 to a third distance (L3), and an electrically conducting layer 410 surrounding the insulating layer 406 from the probe head 408 to a fourth distance (L4). Moreover, herein, the measurement device 400 is at a second operational stage when a first charging contact 412 and a second charging contact 414 are not in contact with a first electrical contact 416 and the second electrical contact 418 of the probe 402, respectively.

Furthermore, the electrically conducting pin 404 is surrounded at least partly with a first electrode 420 when the probe 402 is ejected. Additionally, a second electrode 422 is extended a second distance (L2) towards the

N proximal end of the hollow tube.

O

N

O Referring to FIG. 5, shown is an exemplary implementation of a 0 measurement device 500 for measuring properties of a target 502, in = accordance with an embodiment of the present disclosure. As shown, a

N 25 probe head 504 is contacting the target 502. Moreover, a first charging 8 contact 506 and a second charging contact 508 are detached with a probe ä 510 when a sensor (not shown) of the probe head 504 is ejected towards target, in order to eliminate a friction therebetween.

Referring to FIG. 6, shown is a cross-sectional view of a probe 600 providing a measurement signal 602, in accordance with an embodiment of the present disclosure. As shown, a sensor (not shown) is communicatively connected to an electrically conducting layer 604 and an electrically conducting pin 606, to provide the measurement signal 602. Moreover, the sensor is configured to amplify or otherwise modify the measurement signal 602 prior to providing the measurement signal 602 as the first voltage difference between the electrically conducting layer 604 and the electrically conducting pin 606. Furthermore, a controller (not shown) is arranged to measure a second voltage difference between a first electrode 608 and a second electrode 610, wherein the second voltage difference is induced capacitively by the first voltage difference. Additionally, an insulating layer 612 surrounds the electrically conducting pin 606 from a probe head to a third distance.

Referring to FIG. 7, shown is an X-Y graph 700 depicting an experimental data obtained from an embodiment of a measurement device for measuring properties of a target, in accordance with an embodiment of the present disclosure. Herein, the x-axis (horizontal axis) denotes distance, in millimetres, between the measurement device and the target at the time when the probe of the measurement device collides with the target. As

N shown, at the origin of the x-axis the measurement signal has the optimal

N i.e. minimum attenuation. Moreover, the y-axis (vertical axis) denotes the = relative signal amplitude of a second voltage difference between a first

S electrode and a second electrode, as a function of the deviation from optimal

E: 25 distance x, in the longer (+) or shorter (-) direction. Furthermore, the

S optimal amplitude at X = O is denoted as Y = 1. It will be appreciated that a the diameter of the electrically conducting pin of the probe used to obtain

NN the aforementioned relative signal amplitude values is 0.3mm and the frequency of the transferred signal is 5 MHz. It has been observed, that waveform of the second voltage has little effect to the attenuation. As shown, when in operation, a shape of the measurement signal is maintained, only the amplitude changes with distance x.

Referring to FIG. 8, shown is a flowchart 800 depicting steps of a method for measuring properties of a target, in accordance with an embodiment of the present disclosure. At step 802, a probe is arranged at least partly inside a hollow tube, the hollow tube comprising a proximal end and a distal end, the hollow tube formed by a first electrode extending a first distance from the distal end of the hollow tube, and a second electrode extending a second distance towards the proximal end of the hollow tube, wherein the probe being operable to be ejected towards the target, the probe comprising an elongated body comprising an electrically conducting pin, an insulating layer surrounding the electrically conducting pin from a probe head to a third distance, and an electrically conducting layer surrounding the insulating layer from the probe head to a fourth distance, and the probe head comprising a sensor configured to measure properties of the target, the sensor, communicatively connected to the electrically conducting layer and the electrically conducting pin, to provide a measurement signal. At step 804, an ejection means is operated to eject the probe from a first position

N into a second position towards the target, retract the probe back to the first

N position, wherein the sensor is operable to measure a signal associated with 2 the properties of the target at the second position, and provide

S measurement signal as a first voltage difference between the electrically

E 25 conducting layer and the electrically conducting pin. At step 806, a

S controller is arranged to measure a second voltage difference between the a first electrode and the second electrode, wherein the second voltage

NN difference is induced capacitively by the first voltage difference

The steps 802, 804 and 806 are only illustrative and other alternatives can also be provided where one or more steps are added, one or more steps are removed, or one or more steps are provided in a different sequence without departing from the scope of the claims herein.

Modifications to embodiments of the present disclosure described in the foregoing are possible without departing from the scope of the present disclosure as defined by the accompanying claims. Expressions such as "including", "comprising", "incorporating", "have", "is" used to describe and claim the present disclosure are intended to be construed in a non-exclusive manner, namely allowing for items, components or elements not explicitly described also to be present. Reference to the singular is also to be construed to relate to the plural.

Ql

N

O

N

O

LO

O

I

=

NN o 00

LO

N

O

N

Claims

CLAIMS:

1. A measurement device (100, 200, 300, 400, 500) for measuring properties of a target (102, 202, 502), the measurement device comprising: - a housing (104) comprising: - a hollow tube (106, 318) comprising a proximal end (106A) and a distal end (106B), the hollow tube formed by - a first electrode (314, 420, 608) extending a first distance (L1) from the distal end of the hollow tube, and - a second electrode (316, 422, 610) extending a second distance (L2) towards the proximal end of the hollow tube; - a probe (108, 208, 304, 402, 600) arranged at least partly inside the hollow tube, the probe being operable to be ejected towards the target (102), the probe comprising - an elongated body (304A, 402A) comprising - an electrically conducting pin (404, 606), - an insulating layer (406, 612) surrounding the electrically conducting pin from a probe head (110, 408) to a third distance (L3), and - an electrically conducting layer (410, 604) surrounding the insulating layer from the probe head to a fourth N distance (L4), and N - the probe head comprising a sensor (112, 206) configured to 2 measure properties of the target, S - the sensor, communicatively connected to the E 25 electrically conducting layer and the electrically S conducting pin, to provide a measurement signal (602); LO N S

- an ejection means (302) operable to eject the probe from a first position into a second position towards the target, retract the probe back to the first position, wherein the sensor is operable to measure a signal (114) associated with the properties of the target at the second position, and provide measurement signal as a first voltage difference between the electrically conducting layer and the electrically conducting pin; and - a controller (116) arranged to measure a second voltage difference between the first electrode and the second electrode, wherein the second voltage difference is induced capacitively by the first voltage difference.

2. A measurement device (100, 200, 300, 400, 500) according to claim 1 further comprising a power source (118, 204) for charging the sensor (112, 206), wherein the power source is electrically connected to a first charging contact (210, 306, 412, 506) and a second charging contact (212, 308, 414, 508) of the measurement device.

3. A measurement device (100, 200, 300, 400, 500) according to claim N 20 2, wherein the first charging contact (210, 306, 412, 506) and the second O charging contact (212, 308, 414, 508) are operable to form communication O with at least one of selected from the sensor (112, 206) or a calculation unit 0 (120, 214) of the probe (112, 206).

E 4. A measurement device (100, 200, 300, 400, 500) according to claim S 25 2, wherein the power source (118, 204) is configured to be in: a - a first operational stage when the first charging contact (210, 306, 412, S 506) and the second charging contact (212, 308, 414, 508) are arranged to contact the electrically conducting pin (310, 404) and the electrically conducting layer (312, 410) of the probe (108, 208, 304, 402, 600), respectively; and - a second operational stage when the first charging contact and the second charging contact are not in contact with electrical contacts of the probe.

5. A measurement device (100, 200, 300, 400, 500) according to any of the preceding claims, wherein the probe (108, 208, 304, 402, 600) is a rebound probe.

6. A measurement device (100, 200, 300, 400, 500) according to any of the preceding claims, wherein the sensor (112, 206) is an ultrasonic sensor.

7. A measurement device (100, 200, 300, 400, 500) according to any of the preceding claims, wherein the probe (108, 208, 304, 402, 600) comprises an electrical storage.

8. A measurement device (100, 200, 300, 400, 500) according to any of the preceding claims, wherein the ejection means (302) is selected from at least one of electromagnetic induction coil, air pressure, spring forces, and the like.

9. A measurement device (100, 200, 300, 400, 500) according to any of N the preceding claims, wherein the sensor (112, 206) and the controller 5 20 (116) are communicable coupled via a wireless communication interface. 3

10. A measurement device (100, 200, 300, 400, 500) according to any of E the preceding claims, wherein the measurement signal (602) is selected > from at least one of: an analog signal, a digital signal. 00 LO N

11. A measurement device (100, 200, 300, 400, 500) according to any of N 25 the preceding claims, wherein the sensor (112, 206) is configured to amplify or otherwise modify the measurement signal (602) prior to providing the measurement signal as the first voltage difference between the electrically conducting layer (410, 604) and the electrically conducting pin (404, 606).

12. A measurement device (100, 200, 300, 400, 500) according to any of the preceding claims, wherein the sensor (112, 206) is further operable to measure the signal (114) associated with the properties of the target (102, 202, 502) - when the probe (108, 208, 304, 402, 600) is ejected from the first position into the second position; - when the probe (108, 208, 304, 402, 600) is in the second position; and - when the probe is retracted back to the first position.

13. A measurement device (100, 200, 300, 400, 500) according to any of the preceding claims, wherein the electrically conducting pin (404, 606) is surrounded at least partly with the first electrode (314, 420, 608) when the probe (108, 208, 304, 402, 600) is ejected.

14. A measurement device (100, 200, 300, 400, 500) according to claim 13, wherein the controller (116) is operable to receive a measurement signal (602) when the probe (108, 208, 304, 402, 600) is ejected in a range from

0.5 cm to 2 cm from the first position into the second position. 3 20

15. A method for measuring properties of a target (102, 202, 502), the O method comprising: 0 - arranging a probe (108, 208, 304, 402, 600) at least partly inside a E hollow tube (106, 318), the hollow tube comprising a proximal end (106A) N and a distal end (106B), the hollow tube formed by E 25 - a first electrode (314, 420, 608) extending a first distance (L1) from O the distal end of the hollow tube, and

- a second electrode (316, 422, 610) extending a second distance (L2) towards the proximal end of the hollow tube, wherein the probe being operable to be ejected towards the target, the probe comprising - an elongated body (304A, 402A) comprising - an electrically conducting pin (404, 606), - an insulating layer (406, 612) surrounding the electrically conducting pin from a probe head (108, 408) to a third distance (L3), and - an electrically conducting layer (410, 604) surrounding the insulating layer from the probe head to a fourth distance (L4), and - the probe head comprising a sensor (112, 206) configured to measure properties of the target, - the sensor, communicatively connected to the electrically conducting layer and the electrically conducting pin, to provide a measurement signal (602); - operating an ejection means (302) to eject the probe from a first position into a second position towards the target, retract the probe back to the first position, wherein the sensor is operable to - measure a signal (114) associated with the properties of the 3 target at the second position, and O - provide measurement signal as a first voltage difference o between the electrically conducting layer and the electrically z 25 conducting pin; and N - arranging a controller (116) to measure a second voltage difference 8 between the first electrode and the second electrode, wherein the second ä voltage difference is induced capacitively by the first voltage difference.

16. A method according to claim 15 further comprising arranging a power source (118, 204) for charging the sensor (112, 206), wherein the power source is electrically connected to a first charging contact (210, 306, 412, 506) and a second charging contact (212, 308, 414, 508) of the measurement device.

17. A method according to claim 16, wherein the method comprises operating the power source (118, 204) in: - a first operational stage when first charging contact (210, 306, 412, 506) and the second charging contact (212, 308, 414, 508) are arranged to contact the electrically conducting pin (310, 404) and the electrically conducting layer (312, 410) of the probe (106, 208, 304, 402, 600), respectively; and - a second operational stage when the first charging contact and the second charging contact are not in contact with the electrical contact and the second electrical contact of the probe.

18. A method according to claim 15 to 17, wherein the ejection means (302) ejects the probe towards the target (102, 202, 502) by using at least one of selected from electromagnetic induction coil, air pressure, spring forces, piezoelectric force, and the like. N 20

19. Amethod according to claim 15 to 18, wherein the method comprises N amplifying or otherwise modifying the measurement signal (602) prior to 7 providing the measurement signal as the first voltage difference between 7 the electrically conducting layer (410, 604) and the electrically conducting & pin (404, 606). 5 LO 25

20. Amethod according to claim 15 to 19, wherein the method comprises O operating the sensor (112, 206) to:

- measure the signal (114) associated with the properties of the target (102, 202, 502) at the second position, and - provide measurement signal as a first voltage difference between the electrically conducting layer and the electrically conducting pin.

21. A method according to claim 15 to 20, wherein the method comprises arranging the electrically conducting pin (404, 606) such that it is surrounded at least partly with the first electrode (314, 420, 608) when the probe (108, 208, 304, 402, 600) is ejected.

22. A method according to claim 15 to 21, further comprising receiving the measurement signal (602) by the controller (116) when the probe (108, 208, 304, 402, 600) is ejected in a range from 0.5 cm to 2 cm from the first position into the second position. Ql N O N O LO O I = NN o 00 LO N N O N