FI20155524A - System and method to measure artificial surface - Google Patents

System and method to measure artificial surface

Info

Publication number
FI20155524A
FI20155524A FI20155524A FI20155524A FI20155524A FI 20155524 A FI20155524 A FI 20155524A FI 20155524 A FI20155524 A FI 20155524A FI 20155524 A FI20155524 A FI 20155524A FI 20155524 A FI20155524 A FI 20155524A
Authority
FI
Finland
Prior art keywords
artificial surface
measure artificial
measure
artificial
Prior art date
Application number
FI20155524A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI126853B (en
Inventor
Ari Kilpelä
Veijo Lyöri
Juha Häkkinen
Original Assignee
Dimense Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dimense Oy filed Critical Dimense Oy
Priority to FI20155524A priority Critical patent/FI126853B/en
Publication of FI20155524A publication Critical patent/FI20155524A/en
Application granted granted Critical
Publication of FI126853B publication Critical patent/FI126853B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C7/00—Tracing profiles
    • G01C7/02—Tracing profiles of land surfaces
    • G01C7/04—Tracing profiles of land surfaces involving a vehicle which moves along the profile to be traced
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G01B5/285—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces for controlling eveness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
    • G01B7/345—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces for measuring evenness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FI20155524A 2015-07-03 2015-07-03 System and method to measure artificial surface FI126853B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FI20155524A FI126853B (en) 2015-07-03 2015-07-03 System and method to measure artificial surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20155524A FI126853B (en) 2015-07-03 2015-07-03 System and method to measure artificial surface

Publications (2)

Publication Number Publication Date
FI20155524A true FI20155524A (en) 2017-01-04
FI126853B FI126853B (en) 2017-06-30

Family

ID=58687208

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20155524A FI126853B (en) 2015-07-03 2015-07-03 System and method to measure artificial surface

Country Status (1)

Country Link
FI (1) FI126853B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11326879B2 (en) * 2019-04-01 2022-05-10 Appareo Systems, Llc Inclinometer-based surface profilometry

Also Published As

Publication number Publication date
FI126853B (en) 2017-06-30

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