FI20086117A0 - A new device and method for forensic applications - Google Patents
A new device and method for forensic applicationsInfo
- Publication number
- FI20086117A0 FI20086117A0 FI20086117A FI20086117A FI20086117A0 FI 20086117 A0 FI20086117 A0 FI 20086117A0 FI 20086117 A FI20086117 A FI 20086117A FI 20086117 A FI20086117 A FI 20086117A FI 20086117 A0 FI20086117 A0 FI 20086117A0
- Authority
- FI
- Finland
- Prior art keywords
- new device
- forensic applications
- forensic
- applications
- new
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02057—Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20086117A FI20086117A0 (en) | 2008-11-24 | 2008-11-24 | A new device and method for forensic applications |
PCT/FI2009/050952 WO2010058090A1 (en) | 2008-11-24 | 2009-11-24 | Novel method and apparatus for forensic applications |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20086117A FI20086117A0 (en) | 2008-11-24 | 2008-11-24 | A new device and method for forensic applications |
Publications (1)
Publication Number | Publication Date |
---|---|
FI20086117A0 true FI20086117A0 (en) | 2008-11-24 |
Family
ID=40097361
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20086117A FI20086117A0 (en) | 2008-11-24 | 2008-11-24 | A new device and method for forensic applications |
Country Status (2)
Country | Link |
---|---|
FI (1) | FI20086117A0 (en) |
WO (1) | WO2010058090A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111412861B (en) * | 2020-03-31 | 2022-02-11 | 天津大学 | Linear white light surface profile measuring method |
-
2008
- 2008-11-24 FI FI20086117A patent/FI20086117A0/en not_active Application Discontinuation
-
2009
- 2009-11-24 WO PCT/FI2009/050952 patent/WO2010058090A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2010058090A1 (en) | 2010-05-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FD | Application lapsed |