FI20065044A - Testing apparatus and method for testing the apparatus - Google Patents

Testing apparatus and method for testing the apparatus Download PDF

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Publication number
FI20065044A
FI20065044A FI20065044A FI20065044A FI20065044A FI 20065044 A FI20065044 A FI 20065044A FI 20065044 A FI20065044 A FI 20065044A FI 20065044 A FI20065044 A FI 20065044A FI 20065044 A FI20065044 A FI 20065044A
Authority
FI
Finland
Prior art keywords
testing
testing apparatus
Prior art date
Application number
FI20065044A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI20065044A0 (en
FI118578B (en
Inventor
Mika Pollari
Original Assignee
Mika Pollari
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mika Pollari filed Critical Mika Pollari
Priority to FI20065044A priority Critical patent/FI118578B/en
Publication of FI20065044A0 publication Critical patent/FI20065044A0/en
Priority to PCT/FI2007/050036 priority patent/WO2007083001A1/en
Publication of FI20065044A publication Critical patent/FI20065044A/en
Application granted granted Critical
Publication of FI118578B publication Critical patent/FI118578B/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Tests Of Electronic Circuits (AREA)
FI20065044A 2006-01-23 2006-01-23 Testing apparatus and method for testing the apparatus FI118578B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20065044A FI118578B (en) 2006-01-23 2006-01-23 Testing apparatus and method for testing the apparatus
PCT/FI2007/050036 WO2007083001A1 (en) 2006-01-23 2007-01-23 A test apparatus and a method for testing an apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20065044A FI118578B (en) 2006-01-23 2006-01-23 Testing apparatus and method for testing the apparatus
FI20065044 2006-01-23

Publications (3)

Publication Number Publication Date
FI20065044A0 FI20065044A0 (en) 2006-01-23
FI20065044A true FI20065044A (en) 2007-07-24
FI118578B FI118578B (en) 2007-12-31

Family

ID=35883941

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20065044A FI118578B (en) 2006-01-23 2006-01-23 Testing apparatus and method for testing the apparatus

Country Status (2)

Country Link
FI (1) FI118578B (en)
WO (1) WO2007083001A1 (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010112250A (en) * 1999-01-21 2001-12-20 추후제출 A system and method for testing and validating devices having an embedded operating system
US20060265475A9 (en) * 2001-03-19 2006-11-23 Thomas Mayberry Testing web services as components
US7010782B2 (en) * 2002-04-04 2006-03-07 Sapphire Infotech, Inc. Interactive automatic-test GUI for testing devices and equipment using shell-level, CLI, and SNMP commands
US7296190B2 (en) * 2003-01-29 2007-11-13 Sun Microsystems, Inc. Parallel text execution on low-end emulators and devices
TW200407711A (en) * 2003-10-17 2004-05-16 Via Tech Inc Testing apparatus
US7346808B2 (en) * 2004-06-09 2008-03-18 Hewlett-Packard Development Company, L.P. Diagnostic method, system, and program that isolates and resolves partnership problems between a portable device and a host computer

Also Published As

Publication number Publication date
WO2007083001A1 (en) 2007-07-26
FI20065044A0 (en) 2006-01-23
FI118578B (en) 2007-12-31

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