FI20055326A - Menetelmä ja mittalaite mitata mikroaalloilla - Google Patents
Menetelmä ja mittalaite mitata mikroaalloilla Download PDFInfo
- Publication number
- FI20055326A FI20055326A FI20055326A FI20055326A FI20055326A FI 20055326 A FI20055326 A FI 20055326A FI 20055326 A FI20055326 A FI 20055326A FI 20055326 A FI20055326 A FI 20055326A FI 20055326 A FI20055326 A FI 20055326A
- Authority
- FI
- Finland
- Prior art keywords
- measuring device
- microwave measurement
- microwave
- measurement
- measuring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2623—Measuring-systems or electronic circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
- G01R27/2658—Cavities, resonators, free space arrangements, reflexion or interference arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P7/00—Resonators of the waveguide type
- H01P7/06—Cavity resonators
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20055326A FI119744B (fi) | 2005-06-17 | 2005-06-17 | Menetelmä ja mittalaite mitata mikroaalloilla |
PCT/FI2006/050266 WO2006134237A1 (en) | 2005-06-17 | 2006-06-16 | Method and measuring device for measuring with microwaves |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20055326 | 2005-06-17 | ||
FI20055326A FI119744B (fi) | 2005-06-17 | 2005-06-17 | Menetelmä ja mittalaite mitata mikroaalloilla |
Publications (3)
Publication Number | Publication Date |
---|---|
FI20055326A0 FI20055326A0 (fi) | 2005-06-17 |
FI20055326A true FI20055326A (fi) | 2006-12-18 |
FI119744B FI119744B (fi) | 2009-02-27 |
Family
ID=34778462
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20055326A FI119744B (fi) | 2005-06-17 | 2005-06-17 | Menetelmä ja mittalaite mitata mikroaalloilla |
Country Status (2)
Country | Link |
---|---|
FI (1) | FI119744B (fi) |
WO (1) | WO2006134237A1 (fi) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7982469B2 (en) | 2006-06-22 | 2011-07-19 | Senfit Oy | Method and measuring device for radio wave measuring |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011092889A1 (ja) | 2010-01-28 | 2011-08-04 | 王子製紙株式会社 | 坪量及び水分量の測定方法と装置 |
US9797703B2 (en) * | 2016-03-07 | 2017-10-24 | Duke University | Non-invasive thickness measurement using resonant frequency shift |
CN111433556A (zh) | 2017-06-05 | 2020-07-17 | 杜克大学 | 使用固定频率的非侵入性厚度测量 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1351107A (en) * | 1953-10-23 | 1974-04-24 | Emi Ltd | Range sensitive devices |
BE759483R (fr) * | 1969-12-08 | 1971-04-30 | Commissariat Energie Atomique | Procede de mesure d'un deplacement et dispositif en faisant applicatio |
US6297648B1 (en) * | 1996-08-16 | 2001-10-02 | The Boeing Company | Oscillating cavity paint meter |
FI119005B (fi) * | 2004-09-20 | 2008-06-13 | Senfit Oy | Menetelmä mitata mikroaalloilla, mittalaite ja oskillaattori |
-
2005
- 2005-06-17 FI FI20055326A patent/FI119744B/fi not_active IP Right Cessation
-
2006
- 2006-06-16 WO PCT/FI2006/050266 patent/WO2006134237A1/en active Application Filing
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7982469B2 (en) | 2006-06-22 | 2011-07-19 | Senfit Oy | Method and measuring device for radio wave measuring |
Also Published As
Publication number | Publication date |
---|---|
FI119744B (fi) | 2009-02-27 |
FI20055326A0 (fi) | 2005-06-17 |
WO2006134237A1 (en) | 2006-12-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Transfer of assignment of patent |
Owner name: SENFIT OY Free format text: SENFIT OY |
|
FG | Patent granted |
Ref document number: 119744 Country of ref document: FI |
|
MM | Patent lapsed |