FI19992622A - Procedure for testing an electronics product, a procedure for targeting an electronics product and a product palette - Google Patents

Procedure for testing an electronics product, a procedure for targeting an electronics product and a product palette

Info

Publication number
FI19992622A
FI19992622A FI992622A FI19992622A FI19992622A FI 19992622 A FI19992622 A FI 19992622A FI 992622 A FI992622 A FI 992622A FI 19992622 A FI19992622 A FI 19992622A FI 19992622 A FI19992622 A FI 19992622A
Authority
FI
Finland
Prior art keywords
product
procedure
palette
electronics
targeting
Prior art date
Application number
FI992622A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI112546B (en
Inventor
Jyri Tolonen
Original Assignee
Jot Automation Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FI992622A priority Critical patent/FI112546B/en
Application filed by Jot Automation Oy filed Critical Jot Automation Oy
Priority to PCT/FI2000/001076 priority patent/WO2001042800A1/en
Priority to AU23747/01A priority patent/AU2374701A/en
Priority to DE60039787T priority patent/DE60039787D1/en
Priority to AT00987496T priority patent/ATE403879T1/en
Priority to EP00987496A priority patent/EP1257833B1/en
Priority to US10/148,197 priority patent/US7088998B2/en
Priority to DK00987496T priority patent/DK1257833T3/en
Priority to ES00987496T priority patent/ES2309009T3/en
Publication of FI19992622A publication Critical patent/FI19992622A/en
Application granted granted Critical
Publication of FI112546B publication Critical patent/FI112546B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Liquid Developers In Electrophotography (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Automatic Assembly (AREA)

Abstract

A product palette for carrying an electronics product on a production line for electronics products. The product palette includes a signal interface for establishing a signal connection between the product palette and the product, and a test arrangement connected to the signal interface. The test arrangement is used for subjecting the product to one or more test operations on the product palette by the signal interface.
FI992622A 1999-12-07 1999-12-07 Method for Testing an Electronic Product, Method for Targeting an Electronic Product, and Product Palette FI112546B (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
FI992622A FI112546B (en) 1999-12-07 1999-12-07 Method for Testing an Electronic Product, Method for Targeting an Electronic Product, and Product Palette
AU23747/01A AU2374701A (en) 1999-12-07 2000-12-07 Method and product palette for testing electronic products
DE60039787T DE60039787D1 (en) 1999-12-07 2000-12-07 METHOD AND RANGE FOR CHECKING ELECTRONIC PRODUCTS
AT00987496T ATE403879T1 (en) 1999-12-07 2000-12-07 METHOD AND PRODUCT RANGE FOR TESTING ELECTRONIC PRODUCTS
PCT/FI2000/001076 WO2001042800A1 (en) 1999-12-07 2000-12-07 Method and product palette for testing electronic products
EP00987496A EP1257833B1 (en) 1999-12-07 2000-12-07 Method and product palette for testing electronic products
US10/148,197 US7088998B2 (en) 1999-12-07 2000-12-07 Method and product palette for testing electronic products
DK00987496T DK1257833T3 (en) 1999-12-07 2000-12-07 Process and product palette for testing electronic products
ES00987496T ES2309009T3 (en) 1999-12-07 2000-12-07 PROCEDURE AND PALLET TO TEST ELECTRONIC PRODUCTS.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI992622A FI112546B (en) 1999-12-07 1999-12-07 Method for Testing an Electronic Product, Method for Targeting an Electronic Product, and Product Palette
FI992622 1999-12-07

Publications (2)

Publication Number Publication Date
FI19992622A true FI19992622A (en) 2001-06-08
FI112546B FI112546B (en) 2003-12-15

Family

ID=8555708

Family Applications (1)

Application Number Title Priority Date Filing Date
FI992622A FI112546B (en) 1999-12-07 1999-12-07 Method for Testing an Electronic Product, Method for Targeting an Electronic Product, and Product Palette

Country Status (9)

Country Link
US (1) US7088998B2 (en)
EP (1) EP1257833B1 (en)
AT (1) ATE403879T1 (en)
AU (1) AU2374701A (en)
DE (1) DE60039787D1 (en)
DK (1) DK1257833T3 (en)
ES (1) ES2309009T3 (en)
FI (1) FI112546B (en)
WO (1) WO2001042800A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE498276T1 (en) * 2006-07-24 2011-02-15 Harman Becker Automotive Sys SYSTEM AND METHOD FOR CALIBRATING A HANDS-FREE SYSTEM
EP2385383A1 (en) * 2010-05-06 2011-11-09 Siemens Aktiengesellschaft Workpiece holder and method for producing an electronic assembly
CN102332237A (en) * 2011-08-05 2012-01-25 三一重机有限公司 Detecting system for display screen
US9448279B2 (en) 2011-09-02 2016-09-20 Apple Inc. Test systems for electronic devices with wireless communications capabilities
CN104380077B (en) 2012-05-29 2018-03-27 Avl测试系统公司 Intelligent bag for exhaust gas sampling system is filled
CN106872836A (en) * 2015-12-11 2017-06-20 研祥智能科技股份有限公司 Distributed automatization detecting system and method on production line
US10188207B2 (en) 2016-03-23 2019-01-29 Communications Test Design, Inc. Apparatus and method for simultaneously testing a plurality of mobile devices

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3515698A1 (en) * 1985-05-02 1986-11-06 Robert Bosch Gmbh, 7000 Stuttgart CONTROL SYSTEM FOR MOBILE TRANSPORT UNITS ON TRANSPORT ROADS
FR2619232B1 (en) * 1987-08-07 1994-04-29 Muller & Cie Ets M DATA ACQUISITION AND PROCESSING EQUIPMENT FOR AUTOMOTIVE TECHNICAL CONTROL CENTER
US5872458A (en) * 1996-07-08 1999-02-16 Motorola, Inc. Method for electrically contacting semiconductor devices in trays and test contactor useful therefor
US6127836A (en) * 1996-07-22 2000-10-03 Micro Instrument Company Electronic test apparatus
EP0914617B1 (en) * 1996-07-24 2005-05-11 Infineon Technologies AG Process for testing a product and equipment for carrying out the process
DE19652035C2 (en) 1996-12-13 1999-07-22 Rohde & Schwarz Test station and method for electronic components, in particular mobile telephones
US5935264A (en) * 1997-06-10 1999-08-10 Micron Technology, Inc. Method and apparatus for determining a set of tests for integrated circuit testing
KR100292028B1 (en) * 1997-12-05 2001-06-01 윤종용 Real time control method of semiconductor equipment
US6476629B1 (en) * 2000-02-23 2002-11-05 Micron Technology, Inc. In-tray burn-in board for testing integrated circuit devices in situ on processing trays

Also Published As

Publication number Publication date
DE60039787D1 (en) 2008-09-18
EP1257833B1 (en) 2008-08-06
EP1257833A1 (en) 2002-11-20
US7088998B2 (en) 2006-08-08
WO2001042800A1 (en) 2001-06-14
DK1257833T3 (en) 2008-10-27
ES2309009T3 (en) 2008-12-16
US20030109224A1 (en) 2003-06-12
AU2374701A (en) 2001-06-18
FI112546B (en) 2003-12-15
ATE403879T1 (en) 2008-08-15

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Legal Events

Date Code Title Description
PC Transfer of assignment of patent

Owner name: JOT AUTOMATION OY

Free format text: JOT AUTOMATION OY

MM Patent lapsed