ES8308073A1 - "perfeccionamientos introducidos en un aparato para detectar defectos en objetos". - Google Patents

"perfeccionamientos introducidos en un aparato para detectar defectos en objetos".

Info

Publication number
ES8308073A1
ES8308073A1 ES508169A ES508169A ES8308073A1 ES 8308073 A1 ES8308073 A1 ES 8308073A1 ES 508169 A ES508169 A ES 508169A ES 508169 A ES508169 A ES 508169A ES 8308073 A1 ES8308073 A1 ES 8308073A1
Authority
ES
Spain
Prior art keywords
data signals
inspection device
video signals
comparing data
comparison signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES508169A
Other languages
English (en)
Spanish (es)
Other versions
ES508169A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OI Glass Inc
Original Assignee
Owens Illinois Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Owens Illinois Inc filed Critical Owens Illinois Inc
Publication of ES508169A0 publication Critical patent/ES508169A0/es
Publication of ES8308073A1 publication Critical patent/ES8308073A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/40—Picture signal circuits
    • H04N1/401—Compensating positionally unequal response of the pick-up or reproducing head

Landscapes

  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
ES508169A 1980-12-22 1981-12-21 "perfeccionamientos introducidos en un aparato para detectar defectos en objetos". Expired ES8308073A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/218,996 US4437116A (en) 1980-12-22 1980-12-22 Method and apparatus for comparing data signals in a container inspection device

Publications (2)

Publication Number Publication Date
ES508169A0 ES508169A0 (es) 1983-07-16
ES8308073A1 true ES8308073A1 (es) 1983-07-16

Family

ID=22817358

Family Applications (2)

Application Number Title Priority Date Filing Date
ES508169A Expired ES8308073A1 (es) 1980-12-22 1981-12-21 "perfeccionamientos introducidos en un aparato para detectar defectos en objetos".
ES519989A Expired ES8406733A1 (es) 1980-12-22 1983-02-22 Un metodo para generar una senal de comparacion que representa la diferencia de magnitud entre dos senales de video.

Family Applications After (1)

Application Number Title Priority Date Filing Date
ES519989A Expired ES8406733A1 (es) 1980-12-22 1983-02-22 Un metodo para generar una senal de comparacion que representa la diferencia de magnitud entre dos senales de video.

Country Status (13)

Country Link
US (1) US4437116A (OSRAM)
JP (1) JPS57132011A (OSRAM)
AU (1) AU526942B2 (OSRAM)
BR (1) BR8108298A (OSRAM)
DE (1) DE3149169A1 (OSRAM)
ES (2) ES8308073A1 (OSRAM)
FR (1) FR2496920A1 (OSRAM)
GB (1) GB2089977A (OSRAM)
GR (1) GR77288B (OSRAM)
IT (1) IT1145473B (OSRAM)
NL (1) NL8105581A (OSRAM)
PT (1) PT74147B (OSRAM)
ZA (1) ZA818355B (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4432013A (en) * 1981-11-23 1984-02-14 Owens-Illinois, Inc. Method and apparatus for comparing data signals in a container inspection device
US4488648A (en) * 1982-05-06 1984-12-18 Powers Manufacturing, Inc. Flaw detector
DE3325127C1 (de) * 1983-07-12 1985-01-31 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Schaltungsanordnung zum Ausgleich von Amplitudenschwankungen eines Empfangssignals bei einer optischen Abtastvorrichtung
JPH0616013B2 (ja) * 1984-11-22 1994-03-02 肇産業株式会社 自動検査装置
GB2197463B (en) * 1986-10-30 1990-10-31 Charles Thomas Austin Hardness testing machine
DE3738612A1 (de) * 1987-11-13 1989-05-24 Grundig Emv Verfahren zur gewinnung eines regelsignals fuer eine automatische spurnachfuehrung

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3379826A (en) 1965-05-05 1968-04-23 Sylvania Electric Prod Video processing system providing correction for changes in the light source intensity and for light fluctuations due to different page reflectivities
AR207635A1 (es) * 1973-06-27 1976-10-22 Connor B O Aparato para senalar la presencia de materia extrana y/o grietas en envases translucidos
FR2238303A1 (en) * 1973-07-19 1975-02-14 Serviat Nicole Facsimile transceiver with optical fibres - connecting document to photodetectors and A-D converter as comparator generating black or white signals
US3877821A (en) * 1973-07-23 1975-04-15 Inex Inc Apparatus for detecting flaws using an array of photo sensitive devices
GB1496765A (en) 1974-12-19 1978-01-05 Ciba Geigy Ag Examining sheet material photoelectrically
JPS5215385A (en) * 1975-07-25 1977-02-04 Hitachi Ltd Image recognizer
JPS52130384A (en) * 1976-04-26 1977-11-01 Fuji Electric Co Ltd Scratch measuring method
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
US4246606A (en) 1979-04-17 1981-01-20 Hajime Industries Ltd. Inspection apparatus
US4467350A (en) * 1980-11-07 1984-08-21 Owens-Illinois, Inc. Method and apparatus for rapidly extracting significant data from a sparse object

Also Published As

Publication number Publication date
BR8108298A (pt) 1982-10-05
IT8149971A0 (it) 1981-12-21
GB2089977A (en) 1982-06-30
AU7770481A (en) 1982-08-12
ES519989A0 (es) 1984-07-01
ES8406733A1 (es) 1984-07-01
PT74147A (en) 1982-01-01
IT1145473B (it) 1986-11-05
FR2496920A1 (fr) 1982-06-25
US4437116A (en) 1984-03-13
PT74147B (en) 1983-07-21
JPS57132011A (en) 1982-08-16
AU526942B2 (en) 1983-02-10
ES508169A0 (es) 1983-07-16
DE3149169A1 (de) 1982-07-01
NL8105581A (nl) 1982-07-16
ZA818355B (en) 1982-11-24
GR77288B (OSRAM) 1984-09-11

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