ES443795A1 - Mejoras en los cables de fibras opticas protegidos. - Google Patents

Mejoras en los cables de fibras opticas protegidos.

Info

Publication number
ES443795A1
ES443795A1 ES75443795A ES443795A ES443795A1 ES 443795 A1 ES443795 A1 ES 443795A1 ES 75443795 A ES75443795 A ES 75443795A ES 443795 A ES443795 A ES 443795A ES 443795 A1 ES443795 A1 ES 443795A1
Authority
ES
Spain
Prior art keywords
translation
machine
legally binding
google translate
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES75443795A
Other languages
English (en)
Spanish (es)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nokia Spain SA
Original Assignee
Alcatel Espana SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Espana SA filed Critical Alcatel Espana SA
Publication of ES443795A1 publication Critical patent/ES443795A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Insulated Conductors (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
ES75443795A 1974-12-27 1975-12-23 Mejoras en los cables de fibras opticas protegidos. Expired ES443795A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7442981A FR2296181A1 (fr) 1974-12-27 1974-12-27 Systeme de test de matrice a diodes

Publications (1)

Publication Number Publication Date
ES443795A1 true ES443795A1 (es) 1977-04-16

Family

ID=9146682

Family Applications (2)

Application Number Title Priority Date Filing Date
ES75443795A Expired ES443795A1 (es) 1974-12-27 1975-12-23 Mejoras en los cables de fibras opticas protegidos.
ES443796A Expired ES443796A1 (es) 1974-12-27 1975-12-23 Un sistema para probar una matriz de diodos.

Family Applications After (1)

Application Number Title Priority Date Filing Date
ES443796A Expired ES443796A1 (es) 1974-12-27 1975-12-23 Un sistema para probar una matriz de diodos.

Country Status (2)

Country Link
ES (2) ES443795A1 (enExample)
FR (1) FR2296181A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2530055B1 (fr) * 1982-07-07 1986-07-04 Agence Centrale De Services Dispositif d'interrogation et de lecture de l'etat de contacts electriques
US4595875A (en) * 1983-12-22 1986-06-17 Monolithic Memories, Incorporated Short detector for PROMS
US4670708A (en) * 1984-07-30 1987-06-02 Monolithic Memories, Inc. Short detector for fusible link array using a pair of parallel connected reference fusible links

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3713019A (en) * 1971-08-05 1973-01-23 Gte Automatic Electric Lab Inc Electronic scanpoint matrix having means for detecting electrical failures therein

Also Published As

Publication number Publication date
FR2296181A1 (fr) 1976-07-23
FR2296181B1 (enExample) 1979-08-10
ES443796A1 (es) 1977-04-16

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 19970601