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Individual
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Individual
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Application filed by IndividualfiledCriticalIndividual
Priority to ES0041275UpriorityCriticalpatent/ES41275Y/es
Publication of ES41275UpublicationCriticalpatent/ES41275U/es
Application grantedgrantedCritical
Publication of ES41275YpublicationCriticalpatent/ES41275Y/es
Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means
(AREA)
Abstract
Nuevo nivel métrico múltiple, caracterizado por un dispositivo que mide simultáneamente las inclinaciones de planos o superficies incidentes, con respecto a la horizontal, a la vertical, o bien cuando forman ángulo diedro, midiendo sus inclinaciones y desniveles respectivos en grados o en tantos por cientos de pendiente, y poderse emplear como nivel o plomada.
ES0041275U1954-03-301954-03-30Nuevo nivel métrico mútiple
ExpiredES41275Y
(es)