ES2571330T3 - Método para determinar características del material de un objeto - Google Patents

Método para determinar características del material de un objeto

Info

Publication number
ES2571330T3
ES2571330T3 ES11710506T ES11710506T ES2571330T3 ES 2571330 T3 ES2571330 T3 ES 2571330T3 ES 11710506 T ES11710506 T ES 11710506T ES 11710506 T ES11710506 T ES 11710506T ES 2571330 T3 ES2571330 T3 ES 2571330T3
Authority
ES
Spain
Prior art keywords
measurement
spectra
spectrally selective
data
confocal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES11710506T
Other languages
English (en)
Inventor
Thomas Ertl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dentsply Sirona Inc
Original Assignee
Dentsply International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dentsply International Inc filed Critical Dentsply International Inc
Application granted granted Critical
Publication of ES2571330T3 publication Critical patent/ES2571330T3/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61C—DENTISTRY; APPARATUS OR METHODS FOR ORAL OR DENTAL HYGIENE
    • A61C19/00—Dental auxiliary appliances
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Epidemiology (AREA)
  • Dentistry (AREA)
  • Oral & Maxillofacial Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

Método para determinar características del material de un objeto que son propiedades ópticas del objeto, donde son determinadas utilizando un sistema de medición 3D confocal para determinar datos de medición espectralmente selectivos del objeto, caracterizado porque se utiliza un sistema de medición 3D confocal de dispersión de color, y porque los datos de medición del objeto espectralmente selectivos, determinados con el sistema de medición 3D confocal, se computan con datos espectralmente selectivos de un cuerpo de referencia, donde en base a los mismos puntos de medición se determinan varios datos espectralmente selectivos, donde el sistema de medición 3D, a distancias que difieren unas de otras con respecto al objeto, registra y almacena espectros del punto de medición, y a los datos medidos, espectralmente selectivos, del punto de medición, se aplica un factor de corrección que se determina en base a espectros del cuerpo de referencia, cuya reflexión se mide sin condiciones de medición confocales o cuyos espectros son tomados de una biblioteca almacenada en un ordenador, donde los espectros de medición, considerando el factor de corrección, se comparan con espectros guardados en tablas de consulta, los cuales son representativos para características del material.
ES11710506T 2010-03-26 2011-03-28 Método para determinar características del material de un objeto Active ES2571330T3 (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE102010016174 2010-03-26
DE102010016904 2010-05-11
DE102010036447A DE102010036447A1 (de) 2010-03-26 2010-07-16 Verfahren zur Ermittlung von Materialcharakteristika
PCT/EP2011/054738 WO2011117420A1 (de) 2010-03-26 2011-03-28 Verfahren zur ermittlung von materialcharakteristika eines objekts

Publications (1)

Publication Number Publication Date
ES2571330T3 true ES2571330T3 (es) 2016-05-24

Family

ID=44586172

Family Applications (1)

Application Number Title Priority Date Filing Date
ES11710506T Active ES2571330T3 (es) 2010-03-26 2011-03-28 Método para determinar características del material de un objeto

Country Status (8)

Country Link
US (1) US9025164B2 (es)
EP (1) EP2553428B8 (es)
JP (1) JP5934180B2 (es)
CN (1) CN102939531B (es)
CA (1) CA2793766C (es)
DE (1) DE102010036447A1 (es)
ES (1) ES2571330T3 (es)
WO (1) WO2011117420A1 (es)

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CN104937386B (zh) * 2013-03-29 2017-07-04 松下电器（美国）知识产权公司 推断装置、推断方法、集成电路以及程序
US9599457B2 (en) * 2014-12-09 2017-03-21 Toyota Motor Engineering & Manufacturing North America, Inc. Tear line 3D measurement apparatus and method
CN105807580B (zh) * 2014-12-31 2019-12-24 上海微电子装备（集团）股份有限公司 一种工件六自由度位置和姿态测量传感器装置
CN106154760B (zh) * 2015-04-15 2019-01-29 上海微电子装备（集团）股份有限公司 一种曝光装置及曝光方法
US10168144B2 (en) * 2016-03-25 2019-01-01 Sony Corporation Optical apparatus for 3D data collection
DE102016123154A1 (de) * 2016-11-30 2018-05-30 Carl Zeiss Microscopy Gmbh Bestimmung der Anordnung eines Probenobjekts mittels winkelselektiver Beleuchtung
EP3361235A1 (en) * 2017-02-10 2018-08-15 VoxelGrid GmbH Device and method for analysing objects
WO2018151532A1 (ko) * 2017-02-16 2018-08-23 주식회사 덴티움 치아 스캐닝 장치
KR101859505B1 (ko) * 2017-05-16 2018-05-21 한국광기술원 공초점 방식을 이용한 3차원 구강 스캐너
KR101977815B1 (ko) * 2018-01-12 2019-05-13 주식회사 덴티움 치아 스캐닝 장치
FR3086748B1 (fr) * 2018-10-02 2023-10-13 Sciences Et Techniques Ind De La Lumiere Comparateur optique avec dynamisation du point de mesure
CN109758123A (zh) * 2019-03-28 2019-05-17 长春嵩韵精密仪器装备科技有限责任公司 一种手持式口腔扫描仪
CN110441311B (zh) * 2019-07-22 2021-10-08 中国科学院上海光学精密机械研究所 用于多物面成像的多轴多焦镜头
ES3058191T3 (en) * 2023-03-09 2026-03-09 Lmi Tech Inc An optical sensor apparatus
WO2025242953A1 (en) * 2024-05-24 2025-11-27 Lmi Technologies Inc. Optical sensor for simultaneous displacement sensing and multi/hyperspectral imaging
WO2025248163A1 (en) * 2024-05-31 2025-12-04 Lmi Technologies Inc. 3d sensor

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AU598418B2 (en) * 1988-06-04 1990-06-21 Fujitsu Limited Optical system for detecting three-dimensional shape
JP3923080B2 (ja) * 1995-08-01 2007-05-30 メディスペクトラ・インコーポレーテッド 光学的微細プローベ及び材料のスペクトル分析方法
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Also Published As

Publication number Publication date
US9025164B2 (en) 2015-05-05
JP2013524188A (ja) 2013-06-17
CN102939531A (zh) 2013-02-20
US20130050711A1 (en) 2013-02-28
JP5934180B2 (ja) 2016-06-15
CN102939531B (zh) 2015-07-15
DE102010036447A1 (de) 2011-09-29
CA2793766A1 (en) 2011-09-29
EP2553428B1 (de) 2016-02-10
EP2553428A1 (de) 2013-02-06
WO2011117420A1 (de) 2011-09-29
CA2793766C (en) 2018-10-16
EP2553428B8 (de) 2016-03-16

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