ES2498592B2 - Portable device for measuring surface displacement maps in the three spatial directions - Google Patents

Portable device for measuring surface displacement maps in the three spatial directions Download PDF

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Publication number
ES2498592B2
ES2498592B2 ES201330411A ES201330411A ES2498592B2 ES 2498592 B2 ES2498592 B2 ES 2498592B2 ES 201330411 A ES201330411 A ES 201330411A ES 201330411 A ES201330411 A ES 201330411A ES 2498592 B2 ES2498592 B2 ES 2498592B2
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ES
Spain
Prior art keywords
subsystem
spatial directions
portable device
measuring surface
surface displacement
Prior art date
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Active
Application number
ES201330411A
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Spanish (es)
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ES2498592A1 (en
Inventor
Philip Siegmann
Francisco A. DÍAZ GARRIDO
Luis FELIPE SESÉ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universidad de Alcala de Henares UAH
Universidad de Jaen
Original Assignee
Universidad de Alcala de Henares UAH
Universidad de Jaen
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Application filed by Universidad de Alcala de Henares UAH, Universidad de Jaen filed Critical Universidad de Alcala de Henares UAH
Priority to ES201330411A priority Critical patent/ES2498592B2/en
Publication of ES2498592A1 publication Critical patent/ES2498592A1/en
Application granted granted Critical
Publication of ES2498592B2 publication Critical patent/ES2498592B2/en
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02094Speckle interferometers, i.e. for detecting changes in speckle pattern
    • G01B9/02095Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20Image signal generators
    • H04N13/204Image signal generators using stereoscopic image cameras
    • H04N13/246Calibration of cameras
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20Image signal generators
    • H04N13/296Synchronisation thereof; Control thereof

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Dispositivo optoelectrónico portátil como el mostrado en la Figura 1, que permite realizar medidas de desplazamientos de campo completo de una superficie en las tres direcciones espaciales. Consiste en un subsistema de adquisición de imágenes que visualiza la superficie a medir, un subsistema de iluminación que proyecta luz estructurada sobre dicha superficie, un subsistema de alineación y calibración, y un subsistema de procesado y control que controla el dispositivo y realiza un procesado de las imágenes. El dispositivo se basa en la combinación de dos técnicas, una para obtener la deformación fuera de plano (por ejemplo proyección de franjas) y otra para obtener la deformación en el plano (por ejemplo correlación digital de imágenes 2D). La novedad del dispositivo es que permite hacer un alineamiento, una calibración y una corrección de los desplazamientos necesarios para obtener resultados cuantitativos y veraces.Portable optoelectronic device as shown in Figure 1, which allows measurements of full-field displacements of a surface in the three spatial directions. It consists of an image acquisition subsystem that visualizes the surface to be measured, a lighting subsystem that projects structured light on said surface, an alignment and calibration subsystem, and a processing and control subsystem that controls the device and performs a processing of the images. The device is based on the combination of two techniques, one to obtain the out-of-plane deformation (for example strip projection) and another to obtain the deformation in the plane (for example digital correlation of 2D images). The novelty of the device is that it allows alignment, calibration and correction of the displacements necessary to obtain quantitative and truthful results.

Description



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Claims (1)



imagen1image 1 imagen2image2 imagen3image3 imagen4image4 imagen5image5 imagen6image6 imagen7image7 imagen8image8
ES201330411A 2013-03-21 2013-03-21 Portable device for measuring surface displacement maps in the three spatial directions Active ES2498592B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES201330411A ES2498592B2 (en) 2013-03-21 2013-03-21 Portable device for measuring surface displacement maps in the three spatial directions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES201330411A ES2498592B2 (en) 2013-03-21 2013-03-21 Portable device for measuring surface displacement maps in the three spatial directions

Publications (2)

Publication Number Publication Date
ES2498592A1 ES2498592A1 (en) 2014-09-24
ES2498592B2 true ES2498592B2 (en) 2015-02-11

Family

ID=51565040

Family Applications (1)

Application Number Title Priority Date Filing Date
ES201330411A Active ES2498592B2 (en) 2013-03-21 2013-03-21 Portable device for measuring surface displacement maps in the three spatial directions

Country Status (1)

Country Link
ES (1) ES2498592B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110847259A (en) * 2019-12-17 2020-02-28 大连理工大学 Anti-slide pile-transparent soil slope system test device based on PIV and close-range photography technology and deformation measurement method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8529429D0 (en) * 1985-11-29 1986-01-08 Preater R W T Test apparatus
US6097477A (en) * 1994-05-27 2000-08-01 American Research Corporation Of Virginia Laser speckle strain and deformation sensor using linear array image cross-correlation method for specifically arranged triple-beam triple-camera configuration
US6128082A (en) * 1998-09-18 2000-10-03 Board Of Trustees Operating Michigan State University Technique and apparatus for performing electronic speckle pattern interferometry
US8767049B2 (en) * 2008-07-21 2014-07-01 University Of South Carolina Membrane-deformation mapping technique

Also Published As

Publication number Publication date
ES2498592A1 (en) 2014-09-24

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