ES2498592B2 - Portable device for measuring surface displacement maps in the three spatial directions - Google Patents
Portable device for measuring surface displacement maps in the three spatial directions Download PDFInfo
- Publication number
- ES2498592B2 ES2498592B2 ES201330411A ES201330411A ES2498592B2 ES 2498592 B2 ES2498592 B2 ES 2498592B2 ES 201330411 A ES201330411 A ES 201330411A ES 201330411 A ES201330411 A ES 201330411A ES 2498592 B2 ES2498592 B2 ES 2498592B2
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- ES
- Spain
- Prior art keywords
- subsystem
- spatial directions
- portable device
- measuring surface
- surface displacement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern
- G01B9/02095—Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
- G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/204—Image signal generators using stereoscopic image cameras
- H04N13/246—Calibration of cameras
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/296—Synchronisation thereof; Control thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Dispositivo optoelectrónico portátil como el mostrado en la Figura 1, que permite realizar medidas de desplazamientos de campo completo de una superficie en las tres direcciones espaciales. Consiste en un subsistema de adquisición de imágenes que visualiza la superficie a medir, un subsistema de iluminación que proyecta luz estructurada sobre dicha superficie, un subsistema de alineación y calibración, y un subsistema de procesado y control que controla el dispositivo y realiza un procesado de las imágenes. El dispositivo se basa en la combinación de dos técnicas, una para obtener la deformación fuera de plano (por ejemplo proyección de franjas) y otra para obtener la deformación en el plano (por ejemplo correlación digital de imágenes 2D). La novedad del dispositivo es que permite hacer un alineamiento, una calibración y una corrección de los desplazamientos necesarios para obtener resultados cuantitativos y veraces.Portable optoelectronic device as shown in Figure 1, which allows measurements of full-field displacements of a surface in the three spatial directions. It consists of an image acquisition subsystem that visualizes the surface to be measured, a lighting subsystem that projects structured light on said surface, an alignment and calibration subsystem, and a processing and control subsystem that controls the device and performs a processing of the images. The device is based on the combination of two techniques, one to obtain the out-of-plane deformation (for example strip projection) and another to obtain the deformation in the plane (for example digital correlation of 2D images). The novelty of the device is that it allows alignment, calibration and correction of the displacements necessary to obtain quantitative and truthful results.
Description
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ES201330411A ES2498592B2 (en) | 2013-03-21 | 2013-03-21 | Portable device for measuring surface displacement maps in the three spatial directions |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ES201330411A ES2498592B2 (en) | 2013-03-21 | 2013-03-21 | Portable device for measuring surface displacement maps in the three spatial directions |
Publications (2)
Publication Number | Publication Date |
---|---|
ES2498592A1 ES2498592A1 (en) | 2014-09-24 |
ES2498592B2 true ES2498592B2 (en) | 2015-02-11 |
Family
ID=51565040
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES201330411A Active ES2498592B2 (en) | 2013-03-21 | 2013-03-21 | Portable device for measuring surface displacement maps in the three spatial directions |
Country Status (1)
Country | Link |
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ES (1) | ES2498592B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110847259A (en) * | 2019-12-17 | 2020-02-28 | 大连理工大学 | Anti-slide pile-transparent soil slope system test device based on PIV and close-range photography technology and deformation measurement method |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8529429D0 (en) * | 1985-11-29 | 1986-01-08 | Preater R W T | Test apparatus |
US6097477A (en) * | 1994-05-27 | 2000-08-01 | American Research Corporation Of Virginia | Laser speckle strain and deformation sensor using linear array image cross-correlation method for specifically arranged triple-beam triple-camera configuration |
US6128082A (en) * | 1998-09-18 | 2000-10-03 | Board Of Trustees Operating Michigan State University | Technique and apparatus for performing electronic speckle pattern interferometry |
US8767049B2 (en) * | 2008-07-21 | 2014-07-01 | University Of South Carolina | Membrane-deformation mapping technique |
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2013
- 2013-03-21 ES ES201330411A patent/ES2498592B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
ES2498592A1 (en) | 2014-09-24 |
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