ES2402722B1 - Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe. - Google Patents

Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe. Download PDF

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Publication number
ES2402722B1
ES2402722B1 ES201131750A ES201131750A ES2402722B1 ES 2402722 B1 ES2402722 B1 ES 2402722B1 ES 201131750 A ES201131750 A ES 201131750A ES 201131750 A ES201131750 A ES 201131750A ES 2402722 B1 ES2402722 B1 ES 2402722B1
Authority
ES
Spain
Prior art keywords
array probe
sensors
mux
array
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES201131750A
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Spanish (es)
Other versions
ES2402722A2 (en
ES2402722R1 (en
Inventor
Jerónimo HERNÁNDEZ RIOJA
Jorge RODRIGO GARCÍA
Efrén LEÓN CALSO
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tecnatom SA
Original Assignee
Tecnatom SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tecnatom SA filed Critical Tecnatom SA
Priority to ES201131750A priority Critical patent/ES2402722B1/en
Publication of ES2402722A2 publication Critical patent/ES2402722A2/en
Publication of ES2402722R1 publication Critical patent/ES2402722R1/en
Application granted granted Critical
Publication of ES2402722B1 publication Critical patent/ES2402722B1/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

Se proporciona una sonda array que comprende al menos un array de sensores (2), con un conjunto de sensores individuales (S) formados en capas (Ci) de un substrato de capas múltiples (SCn) y dispuestos alineados en al menos dos filas (3, 4), estando adaptados estos sensores para conmutar entre un estado emisor y un estado receptor mediante un respectivo bloque multiplexor transmisor/receptor (MUX TX, MUX RX) gobernados por medio de un circuito de control (CTRL). La sonda comprende una primera parte flexible (5), esencialmente laminar, portante del array de sensores (2) y una primera parte rígida (6), también esencialmente laminar, que integra los bloques multiplexores, el circuito de control y un dispositivo amplificador (AMP) para elevar el nivel de señal procedente del bloque multiplexor receptor (MUX RX); y estando dicha parte flexible y dicha rígida unidas formando un solo conjunto de circuito de tipo rigiflex.An array probe is provided comprising at least one array of sensors (2), with a set of individual sensors (S) formed in layers (Ci) of a multilayer substrate (SCn) and arranged aligned in at least two rows ( 3, 4), these sensors being adapted to switch between a sending state and a receiving state by means of a respective transmitter / receiver multiplexer block (MUX TX, MUX RX) governed by means of a control circuit (CTRL). The probe comprises a first flexible part (5), essentially laminar, bearing the array of sensors (2) and a first rigid part (6), also essentially laminar, which integrates the multiplexer blocks, the control circuit and an amplifying device ( AMP) to raise the signal level from the receiver multiplexer block (MUX RX); and said flexible part and said rigid being joined together forming a single circuit assembly of the rigiflex type.

Description

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Claims (1)

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ES201131750A 2011-10-31 2011-10-31 Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe. Expired - Fee Related ES2402722B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES201131750A ES2402722B1 (en) 2011-10-31 2011-10-31 Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES201131750A ES2402722B1 (en) 2011-10-31 2011-10-31 Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe.

Publications (3)

Publication Number Publication Date
ES2402722A2 ES2402722A2 (en) 2013-05-08
ES2402722R1 ES2402722R1 (en) 2013-09-26
ES2402722B1 true ES2402722B1 (en) 2014-07-18

Family

ID=48128649

Family Applications (1)

Application Number Title Priority Date Filing Date
ES201131750A Expired - Fee Related ES2402722B1 (en) 2011-10-31 2011-10-31 Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe.

Country Status (1)

Country Link
ES (1) ES2402722B1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6344739B1 (en) * 1999-02-12 2002-02-05 R/D Tech Inc. Eddy current probe with multi-use coils and compact configuration
US6812697B2 (en) * 2002-09-24 2004-11-02 General Electric Company Molded eddy current array probe
US7557570B2 (en) * 2005-11-03 2009-07-07 The Clock Spring Company L.P. System and method for producing color contour maps of surface defects of high pressure pipelines

Also Published As

Publication number Publication date
ES2402722A2 (en) 2013-05-08
ES2402722R1 (en) 2013-09-26

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