ES2184580A1 - Procedure for structural verification of analogue integrated circuits based on the internal and concurrent observation of temperature - Google Patents
Procedure for structural verification of analogue integrated circuits based on the internal and concurrent observation of temperatureInfo
- Publication number
- ES2184580A1 ES2184580A1 ES200002735A ES200002735A ES2184580A1 ES 2184580 A1 ES2184580 A1 ES 2184580A1 ES 200002735 A ES200002735 A ES 200002735A ES 200002735 A ES200002735 A ES 200002735A ES 2184580 A1 ES2184580 A1 ES 2184580A1
- Authority
- ES
- Spain
- Prior art keywords
- temperature
- procedure
- integrated circuits
- internal
- circuits based
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Procedure for structural verification of analogue integrated circuits based on the internal and concurrent observation of temperature. Procedure for detecting structural anomalies in analogue integrated circuits (2) consistent in the dynamic measurement (in time) of the temperature at various points (3, 4) of the surface of the semiconductor glass (1), carried out using temperature sensor circuits (5) integrated into the glass itself (1) of the circuit (2) being verified. The information from these sensors (6) is used to discriminate the defective circuits and its possible diagnosis and/or correction.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ES200002735A ES2184580B2 (en) | 2000-11-03 | 2000-11-03 | PROCEDURE FOR STRUCTURAL VERIFICATION OF INTEGRATED ANALOG CIRCUITS BASED ON INTERNAL AND CONCURRENT TEMPERATURE OBSERVATION. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ES200002735A ES2184580B2 (en) | 2000-11-03 | 2000-11-03 | PROCEDURE FOR STRUCTURAL VERIFICATION OF INTEGRATED ANALOG CIRCUITS BASED ON INTERNAL AND CONCURRENT TEMPERATURE OBSERVATION. |
Publications (2)
Publication Number | Publication Date |
---|---|
ES2184580A1 true ES2184580A1 (en) | 2003-04-01 |
ES2184580B2 ES2184580B2 (en) | 2004-03-16 |
Family
ID=8495641
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES200002735A Expired - Fee Related ES2184580B2 (en) | 2000-11-03 | 2000-11-03 | PROCEDURE FOR STRUCTURAL VERIFICATION OF INTEGRATED ANALOG CIRCUITS BASED ON INTERNAL AND CONCURRENT TEMPERATURE OBSERVATION. |
Country Status (1)
Country | Link |
---|---|
ES (1) | ES2184580B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102012200384A1 (en) | 2011-12-29 | 2013-07-04 | Continental Automotive Gmbh | On a carrier arranged circuit arrangement with temperature monitoring and method for detecting an overtemperature |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5436494A (en) * | 1994-01-12 | 1995-07-25 | Texas Instruments Incorporated | Temperature sensor calibration wafer structure and method of fabrication |
US5994752A (en) * | 1995-09-18 | 1999-11-30 | Siemens Aktiengesellschaft | Field-effect-controllable semiconductor component with a plurality of temperature sensors |
-
2000
- 2000-11-03 ES ES200002735A patent/ES2184580B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5436494A (en) * | 1994-01-12 | 1995-07-25 | Texas Instruments Incorporated | Temperature sensor calibration wafer structure and method of fabrication |
US5994752A (en) * | 1995-09-18 | 1999-11-30 | Siemens Aktiengesellschaft | Field-effect-controllable semiconductor component with a plurality of temperature sensors |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102012200384A1 (en) | 2011-12-29 | 2013-07-04 | Continental Automotive Gmbh | On a carrier arranged circuit arrangement with temperature monitoring and method for detecting an overtemperature |
DE102012200384B4 (en) | 2011-12-29 | 2018-03-15 | Continental Automotive Gmbh | On a carrier arranged circuit arrangement with temperature monitoring and method for detecting an overtemperature |
Also Published As
Publication number | Publication date |
---|---|
ES2184580B2 (en) | 2004-03-16 |
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Legal Events
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