ES2160564T1 - Componente electrico de medicion y la utilizacion del mismo. - Google Patents

Componente electrico de medicion y la utilizacion del mismo.

Info

Publication number
ES2160564T1
ES2160564T1 ES99963773T ES99963773T ES2160564T1 ES 2160564 T1 ES2160564 T1 ES 2160564T1 ES 99963773 T ES99963773 T ES 99963773T ES 99963773 T ES99963773 T ES 99963773T ES 2160564 T1 ES2160564 T1 ES 2160564T1
Authority
ES
Spain
Prior art keywords
same
electrical measurement
measurement component
winding
measuring component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES99963773T
Other languages
English (en)
Other versions
ES2160564T3 (es
Inventor
Kurt-Ake Magnusson
Laust Pedersen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Westinghouse Electric Sweden AB
Original Assignee
Westinghouse Atom AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Atom AB filed Critical Westinghouse Atom AB
Publication of ES2160564T1 publication Critical patent/ES2160564T1/es
Application granted granted Critical
Publication of ES2160564T3 publication Critical patent/ES2160564T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Electrochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

Componente eléctrico de medición apto para ser utilizado para la medición de parámetros de materiales por medio de un procedimiento de corriente de fuga inductiva, comprendiendo dicho componente de medición un arrollamiento de un material eléctricamente conductor, caracterizado porque el arrollamiento está conformado de modo que comprenda por lo menos una primera parte en forma helicoidal (20).
ES99963773T 1998-11-26 1999-11-26 Utilizacion de un componente de medicion electrico. Expired - Lifetime ES2160564T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE9804080A SE515190C2 (sv) 1998-11-26 1998-11-26 Användning av en elektrisk spole som mäter materialparametrar medelst en induktiv virvelströmsmetod
SE9804080 1998-11-26

Publications (2)

Publication Number Publication Date
ES2160564T1 true ES2160564T1 (es) 2001-11-16
ES2160564T3 ES2160564T3 (es) 2007-10-16

Family

ID=20413443

Family Applications (1)

Application Number Title Priority Date Filing Date
ES99963773T Expired - Lifetime ES2160564T3 (es) 1998-11-26 1999-11-26 Utilizacion de un componente de medicion electrico.

Country Status (6)

Country Link
EP (1) EP1137907B1 (es)
JP (1) JP2002531853A (es)
DE (2) DE69935610T2 (es)
ES (1) ES2160564T3 (es)
SE (1) SE515190C2 (es)
WO (1) WO2000034734A1 (es)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5047833B2 (ja) * 2008-02-14 2012-10-10 日本システム開発株式会社 変位センサシステム及び変位センサ
DE102011103123A1 (de) * 2011-05-25 2012-11-29 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Messsonde zur Messung der Dicke dünner Schichten sowie ein Sensorelement für die Messsonde und ein Verfahren zu deren Herstellung
DE102011103122A1 (de) * 2011-05-25 2012-11-29 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Aufsetzkalotte für eine Messsonde sowie Messsonde zur Messung der Dicke dünner Schichten
JP2014516157A (ja) 2011-05-25 2014-07-07 ヘルムート・フィッシャー・ゲーエムベーハー・インスティテュート・フューア・エレクトロニク・ウント・メステクニク 薄層の厚さを測定する測定プローブ及び測定プローブのセンサ要素の製造方法
CN103515045B (zh) * 2013-09-30 2016-02-03 东北大学 一种柔软压敏电涡流线圈的研制方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1567600A (en) * 1975-10-15 1980-05-21 British Gas Corp Lipe line inspection equipment
SU1185217A2 (ru) * 1983-11-22 1985-10-15 Kubansk Selskokhozyajst Inst Матрица токовихревых накладньк преобразователей
US4593245A (en) * 1983-12-12 1986-06-03 General Electric Company Eddy current method for detecting a flaw in semi-conductive material
US4706020A (en) * 1983-12-12 1987-11-10 General Electric Company High frequency eddy current probe with planar, spiral-like coil on flexible substrate for detecting flaws in semi-conductive material
SU1610420A1 (ru) * 1987-12-08 1990-11-30 Всесоюзный заочный машиностроительный институт Вихретоковый преобразователь дл неразрушающего контрол
US5402098A (en) * 1991-03-25 1995-03-28 Satosen Co., Ltd. Coil

Also Published As

Publication number Publication date
DE69935610T2 (de) 2007-11-29
WO2000034734A1 (en) 2000-06-15
EP1137907B1 (en) 2007-03-21
SE9804080L (sv) 2000-05-27
DE1137907T1 (de) 2002-06-13
EP1137907A1 (en) 2001-10-04
ES2160564T3 (es) 2007-10-16
SE9804080D0 (sv) 1998-11-26
JP2002531853A (ja) 2002-09-24
DE69935610D1 (de) 2007-05-03
SE515190C2 (sv) 2001-06-25

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