ES2153740B1 - SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID - Google Patents

SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID

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Publication number
ES2153740B1
ES2153740B1 ES9801475A ES9801475A ES2153740B1 ES 2153740 B1 ES2153740 B1 ES 2153740B1 ES 9801475 A ES9801475 A ES 9801475A ES 9801475 A ES9801475 A ES 9801475A ES 2153740 B1 ES2153740 B1 ES 2153740B1
Authority
ES
Spain
Prior art keywords
frequency
fluid
resonance
piezometric
compensate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES9801475A
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Spanish (es)
Other versions
ES2153740A1 (en
Inventor
Vives Antonio Arnau
Devesa Tomas Sogorb
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universidad Politecnica de Valencia
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Universidad Politecnica de Valencia
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Application filed by Universidad Politecnica de Valencia filed Critical Universidad Politecnica de Valencia
Priority to ES9801475A priority Critical patent/ES2153740B1/en
Publication of ES2153740A1 publication Critical patent/ES2153740A1/en
Application granted granted Critical
Publication of ES2153740B1 publication Critical patent/ES2153740B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)

Abstract

Sistema para compensar los efectos de rozamiento viscoso en la medida de la frecuencia de resonancia de un cristal piezométrico en un fluido. Sistema de medida para conocer los parámetros eléctricos de un cristal piezoeléctrico en estado de resonancia y sumergido en un fluido, e indirectamente, medir los cambios de masa superficial del sensor y de variaciones de las propiedades físicas del medio fluido tales como densidad y viscosidad o rozamiento viscoso. Se emplea un método de medida de tipo pasivo donde el resonador es excitado por una fuente externa de frecuencia variable, y que está basado en puentes de impedancia y en líneas de transmisión. El circuito de medida tiene, entre otros, un oscilador controlado por tensión o un sintetizador de frecuencia, un detector de fase y un integrador o convertidor analógicodigital con microprocesador. Se mide la capacidad estática del cristal piezoeléctrico y se compensa mediante un ajuste en componentes pasivos asociados, que varía la frecuencia deenganche. Pertenece al campo de los sensores microgravimétricos y microbalanzas de precisión.System to compensate for the effects of viscous friction in the measurement of the resonance frequency of a piezometric crystal in a fluid. Measuring system to know the electrical parameters of a piezoelectric crystal in a resonance state and submerged in a fluid, and indirectly, to measure the changes in surface mass of the sensor and variations in the physical properties of the fluid medium such as density and viscosity or friction viscous. A passive type measurement method is used where the resonator is excited by an external source of variable frequency, and which is based on impedance bridges and transmission lines. The measuring circuit has, among others, a voltage controlled oscillator or a frequency synthesizer, a phase detector and an analogue-digital integrator or converter with microprocessor. The static capacity of the piezoelectric crystal is measured and compensated by an adjustment in associated passive components, which varies the coupling frequency. It belongs to the field of microgravimetric sensors and precision microbalances.

ES9801475A 1998-07-08 1998-07-08 SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID Expired - Fee Related ES2153740B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES9801475A ES2153740B1 (en) 1998-07-08 1998-07-08 SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES9801475A ES2153740B1 (en) 1998-07-08 1998-07-08 SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID

Publications (2)

Publication Number Publication Date
ES2153740A1 ES2153740A1 (en) 2001-03-01
ES2153740B1 true ES2153740B1 (en) 2001-10-01

Family

ID=8304487

Family Applications (1)

Application Number Title Priority Date Filing Date
ES9801475A Expired - Fee Related ES2153740B1 (en) 1998-07-08 1998-07-08 SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID

Country Status (1)

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ES (1) ES2153740B1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2197796B1 (en) * 2002-01-31 2005-02-16 Universidad Politecnica De Valencia CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY.
ES2333088B2 (en) * 2009-06-23 2011-02-07 Universidad Politecnica De Valencia METHOD AND DEVICE OF NANOGRAVIMETRY IN FLUID MEDIA BASED ON PIEZOELECTRIC RESONATORS.

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4447782A (en) * 1982-03-17 1984-05-08 Transat Corp. Apparatus for automatic measurement of equivalent circuit parameters of piezoelectric resonators
US5117192A (en) * 1990-01-12 1992-05-26 Leybold Inficon Inc. Control circuitry for quartz crystal deposition monitor
US5112642A (en) * 1990-03-30 1992-05-12 Leybold Inficon, Inc. Measuring and controlling deposition on a piezoelectric monitor crystal
US5201215A (en) * 1991-10-17 1993-04-13 The United States Of America As Represented By The United States Department Of Energy Method for simultaneous measurement of mass loading and fluid property changes using a quartz crystal microbalance
SE504199C2 (en) * 1995-05-04 1996-12-02 Bengt Kasemo Device for measuring resonant frequency and / or dissipation factor of a piezoelectric crystal microwave
US5734098A (en) * 1996-03-25 1998-03-31 Nalco/Exxon Energy Chemicals, L.P. Method to monitor and control chemical treatment of petroleum, petrochemical and processes with on-line quartz crystal microbalance sensors
US5754437A (en) * 1996-09-10 1998-05-19 Tektronix, Inc. Phase measurement apparatus and method
JP3209935B2 (en) * 1996-12-18 2001-09-17 リオン株式会社 Piezoelectric element characteristic test equipment

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Publication number Publication date
ES2153740A1 (en) 2001-03-01

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