ES2134164A1 - Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares. - Google Patents

Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares.

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Publication number
ES2134164A1
ES2134164A1 ES09702565A ES9702565A ES2134164A1 ES 2134164 A1 ES2134164 A1 ES 2134164A1 ES 09702565 A ES09702565 A ES 09702565A ES 9702565 A ES9702565 A ES 9702565A ES 2134164 A1 ES2134164 A1 ES 2134164A1
Authority
ES
Spain
Prior art keywords
solar cells
laser
spectroscopy
analysis method
quality control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES09702565A
Other languages
English (en)
Other versions
ES2134164B1 (es
Inventor
Vazquez Jose Javier Laserna
Jimenez Francisco Martin
Sander Pots
Nunez Montserrat Hidalgo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universidad de Malaga
Original Assignee
Universidad de Malaga
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Publication date
Application filed by Universidad de Malaga filed Critical Universidad de Malaga
Priority to ES009702565A priority Critical patent/ES2134164B1/es
Publication of ES2134164A1 publication Critical patent/ES2134164A1/es
Application granted granted Critical
Publication of ES2134164B1 publication Critical patent/ES2134164B1/es
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

Método computerizado de análisis mediante espectroscopia de plasmas producidos por láser para el control de calidad de células solares. Mediante este método, un potente láser de nitrógeno es enfocado sobre el material a analizar y, como resultado de la interacción con la muestra, una pequeña cantidad es vaporizada (ablación), formándose sobre la superficie del sólido un plasma de elevada temperatura y gran densidad electrónica. La resolución espectral de la luz emitida por el plasma, utilizando como detector un dispositivo de acoplamiento de carga bidimensional, proporciona información acerca de la composición química del material ablacionado, simultáneamente en superficie (técnica de mapeo) y en profundidad (perfiles de profundidad). Esta técnica es de utilidad para el control de calidad en la industria de la tecnología fotovoltaica y es aplicable tanto al material base como a los distintos estados de elaboración de la oblea durante la fabricación de células solares fotovoltaicas.
ES009702565A 1997-12-10 1997-12-10 Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares. Expired - Fee Related ES2134164B1 (es)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES009702565A ES2134164B1 (es) 1997-12-10 1997-12-10 Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES009702565A ES2134164B1 (es) 1997-12-10 1997-12-10 Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares.

Publications (2)

Publication Number Publication Date
ES2134164A1 true ES2134164A1 (es) 1999-09-16
ES2134164B1 ES2134164B1 (es) 2000-05-16

Family

ID=8301454

Family Applications (1)

Application Number Title Priority Date Filing Date
ES009702565A Expired - Fee Related ES2134164B1 (es) 1997-12-10 1997-12-10 Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares.

Country Status (1)

Country Link
ES (1) ES2134164B1 (es)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003027649A1 (en) * 2001-09-24 2003-04-03 Pure Wafer Limited Detection of metals in semiconductor wafers
FR3087049A1 (fr) * 2018-10-08 2020-04-10 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de determination de la technologie d'une cellule photovoltaique, procede de tri, procede de recyclage et dispositif associes

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1395994A1 (ru) * 1985-08-07 1988-05-15 Московский Инженерно-Физический Институт Фотоэлектрический спектрометр микрочастиц
JPH0224535A (ja) * 1988-07-12 1990-01-26 Canon Inc 粒子解析装置
EP0520463A1 (en) * 1991-06-28 1992-12-30 CSELT Centro Studi e Laboratori Telecomunicazioni S.p.A. A high-resolution spectroscopy system
US5569916A (en) * 1992-07-09 1996-10-29 Agency Of Industrial Science & Technology, Ministry Of International Trade & Industry Electron spectroscopy apparatus
JPH09196868A (ja) * 1996-01-22 1997-07-31 Agency Of Ind Science & Technol 光電子分光装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1395994A1 (ru) * 1985-08-07 1988-05-15 Московский Инженерно-Физический Институт Фотоэлектрический спектрометр микрочастиц
JPH0224535A (ja) * 1988-07-12 1990-01-26 Canon Inc 粒子解析装置
EP0520463A1 (en) * 1991-06-28 1992-12-30 CSELT Centro Studi e Laboratori Telecomunicazioni S.p.A. A high-resolution spectroscopy system
US5569916A (en) * 1992-07-09 1996-10-29 Agency Of Industrial Science & Technology, Ministry Of International Trade & Industry Electron spectroscopy apparatus
JPH09196868A (ja) * 1996-01-22 1997-07-31 Agency Of Ind Science & Technol 光電子分光装置

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN CD-ROM MIJP 9707 PAJ / 1997 - 11[034] [09-172801/09-201100] & JP 9196868 A (AGENCY OF IND SCIENCE & TECHNOL) 31.07.1997 *
PATENT ABSTRACTS OF JAPAN CD-ROM PAJ / G01MNP 1988-1993 (2/2) / 51 & JP 2024535 A (CANON INC.) 26.01.1990 *
Publications Ltd., AN 88-329387, Class S03, & SU 1395994 A1 (MOEP, MOSC ENG PHYS INST) 15.05.1988 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003027649A1 (en) * 2001-09-24 2003-04-03 Pure Wafer Limited Detection of metals in semiconductor wafers
FR3087049A1 (fr) * 2018-10-08 2020-04-10 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de determination de la technologie d'une cellule photovoltaique, procede de tri, procede de recyclage et dispositif associes
WO2020074470A1 (fr) * 2018-10-08 2020-04-16 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de determination de la technologie d'une cellule photovoltaïque, procede de tri, procede de recyclage et dispositif associes

Also Published As

Publication number Publication date
ES2134164B1 (es) 2000-05-16

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