EP4695603A1 - Dispositif de détection d'ions fluorure en milieu nitrique - Google Patents
Dispositif de détection d'ions fluorure en milieu nitriqueInfo
- Publication number
- EP4695603A1 EP4695603A1 EP24716222.5A EP24716222A EP4695603A1 EP 4695603 A1 EP4695603 A1 EP 4695603A1 EP 24716222 A EP24716222 A EP 24716222A EP 4695603 A1 EP4695603 A1 EP 4695603A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- measuring
- measuring element
- electrically connected
- conductors
- reference element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/06—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a liquid
- G01N27/07—Construction of measuring vessels; Electrodes therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/045—Circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/06—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a liquid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/12—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluid; of a solid body in dependence upon reaction with a fluid, for detecting components in the fluid
- G01N27/122—Circuits particularly adapted therefor, e.g. linearising circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/18—Water
- G01N33/182—Specific anions in water
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Definitions
- the invention relates to the field of detection of chemical elements and more particularly relates to the detection of the chemical element fluorine (F) in free form, i.e. in the form of fluoride ions.
- these methods and devices are generally limited to the detection of the fluorine element as a whole, whether present in complex or free form, and are not able to distinguish fluoride ions from the fluorine element present in complex form (for example when it is bound to a metal cation, or when it is bound to a proton to form hydrofluoric acid).
- the invention aims to improve the detection devices of the prior art.
- the invention relates to a device for detecting fluoride ions in a nitric medium comprising:
- a detection probe comprising: a zirconium measuring element having a wall delimiting a closed internal space, this measuring element being intended to be immersed in the nitric medium to be inspected; a zirconium reference element, arranged in the internal space of the measuring element and electrically connected by a first end to the measuring element; - measuring conductors electrically connected to the measuring element and to the reference element, and adapted to measure the electrical resistance of a portion of the measuring element and a portion of the reference element;
- an electrical resistance measuring circuit connected to said measuring conductors, and adapted to measure the relative electrical resistance of said portion of the measuring element, with respect to said portion of the reference element;
- a detection circuit adapted to correlate an increase in said relative resistance with the presence of fluoride ions in the nitric medium.
- the invention allows precisely the detection only of fluoride ions within the nitric medium.
- the device according to the invention can be installed online, on a continuous process, to allow continuous monitoring and almost real-time detection of the presence of fluoride ions in the nitric medium inspected, without requiring sampling or intervention on the nitric medium.
- the device according to the invention can provide highly precise information, without necessarily resorting to expensive resources.
- the invention can be implemented for example in industries producing nitric acid, or any process using nitric acid, manufacturing structures intended to receive nitric acid (such as acid storage tanks, or for the treatment of used nuclear fuel), in the field of manufacturing chemical monitoring and control instruments, or in laboratory chemistry.
- the device according to the invention may include the following additional characteristics, alone or in combination:
- said measuring conductors comprise: a first measuring conductor electrically connected to the measuring element at a first measuring point and a second measuring conductor electrically connected to the measuring element at a second measuring point located at a predetermined distance from the first measuring point; a first reference measuring conductor electrically connected to the reference element at a first reference measuring point and a second reference measuring conductor electrically connected to the reference element at a second reference measuring point located at a predetermined distance from the first reference measuring point;
- the device further comprises a first power supply conductor electrically connected to the measuring element, and a second power supply conductor electrically connected to a second end of the reference element;
- the detection probe comprises a body to which the measuring element is hermetically attached, said conductors being connected at the output of this body to external wiring;
- said body is of the same material as the measuring element
- the measuring element has a tubular shape
- the reference element has an oblong shape extending longitudinally in the measuring element, the reference element being electrically connected to the measuring element at one end of the measuring element on one end of the measuring element;
- the measuring element is formed of a tube closed by a plug to which the reference element is electrically connected;
- the detection probe comprises an electrically insulating material in contact with the internal faces of the measuring element and in contact with the reference element, this electrically insulating material having a thermal conductivity greater than 1.15 W/m.k;
- the electrical resistance measuring circuit is suitable for a “4-wire” type resistance measurement
- the reference element comes from the same metallurgical casting as the measuring element.
- FIG. 1 schematically illustrates a device for detecting fluoride ions in a nitric medium according to the invention
- figure 2 illustrates in perspective the detection probe of the device of figure 1;
- FIG. 3 is a sectional view of the detection probe
- FIG. 4 illustrates an example of relative resistance measurement with the detection probe.
- Figure 1 schematically illustrates a device for detecting fluoride ions in a nitric medium according to the invention.
- the detection device comprises a detection probe 1 intended to come into contact with the nitric medium as well as an electronic measurement module 2 comprising the components necessary for the operation of the detection device.
- the module 2 is connected to the detection probe 1 by one or more cables 3, and comprises the interfaces adapted to the device and in particular for consulting or exporting the data and alerts produced, directly or by means of additional computer means.
- the module 2 comprises a circuit 25 for measuring electrical resistance, and a detection circuit 26.
- the circuits 25, 26 can be constituted by any known electronic and/or computer means, with the appropriate programming, and possibly by an external computer with an appropriate communication interface.
- the nitric medium 4 is here schematized inside a portion of a container (circulation conduit, tank, etc.) which is delimited by a wall 5.
- the detection probe 1 comprises a measuring element 6 which is a closed envelope adapted to come into contact with the nitric medium 4, with a wall delimiting a closed internal space, and sealed to this medium.
- the detection probe 1 is, in this exemplary embodiment, adapted to be mounted in a sealed manner on the wall 5 so that the measuring element 6 is in contact with the nitric medium 4.
- Nitric medium 4 can be any solution comprising at least part of nitric acid.
- Figure 2 is a perspective view of the detection probe 1, with the measuring element 6 seen in transparency so as to make its internal components visible.
- Figure 3 also shows the detection probe 1, here in a sectional view.
- the measuring element 6 is formed of a zirconium metal wall.
- the measuring element 6 contains a reference element 7.
- the reference element 7 is made of the same material as the measuring element 6.
- the reference element 7 has an oblong shape extending longitudinally in the measuring element (6).
- the reference element can be constituted by any oblong shape: wire, blade or strip, cylinder, etc. In the present example, this oblong shape is a blade.
- the reference element 7 is made of the same material and preferably from the same metallurgical casting as the measuring element 6, i.e. zirconium.
- the measuring element 6 consists of a tube 8 hermetically sealed at its end by a plug 9.
- the detection probe 1 comprises a body 10 and the measuring element s is hermetically sleeved onto this body 10, for example by welding.
- the reference element 7 is arranged inside the measuring element 6 and is electrically connected to the measuring element 6.
- the reference element 7 is electrically connected to the measuring element 6 at the plug 9, by one of the ends of the reference element 7.
- the reference element 7 also extends over the entire length of the measuring element 6.
- the measuring element 6 thus has a tubular shape, and the blade which constitutes in this example the reference element 7 extends longitudinally in the measuring element 6, the reference element 7 being electrically connected to the measuring element 6 at one end of said blade on one end of the tubular shape of the measuring element 6.
- the electrical connection between the reference element 7 and the measuring element 6 can be made by any means which does not affect the sealing of the assembly, such as welding, gluing, etc.
- An electrically insulating and thermally conductive material 24 is cast inside the measuring element 6 and holds the reference element 7 in place, electrically insulating it from the measuring element 6 but thermally coupling it.
- the device also includes measuring conductors 11, 12, 13, 14 suitable for measuring:
- the device here comprises a first measuring conductor 11 electrically connected to the measuring element 6 at a first measuring point 15, as well as a second measuring conductor 12 electrically connected to the measuring element 6 at a second measuring point 16. These measuring points 15, 16 are located on the internal face of the measuring element 6.
- the device here comprises a first reference measuring conductor 13 electrically connected to the reference element 7 at a first reference measuring point 17, as well as a second reference measuring conductor 14 electrically connected to the reference element 7 at a second reference measuring point 18.
- the electrical connection between the measuring conductors 11, 12, 13, 14 at the measuring points 15, 16, 17, 18 is made by any known and suitable means such as welding.
- the first and second measuring points 15, 16 of the measuring element 6, on the one hand, and the first and second reference measuring points 17, 18 of the reference element 7, on the other hand, are respectively spaced apart by a predetermined distance, defining a portion of the measuring element 6 and of the reference element 7 on which the corresponding electrical resistance will be measured.
- the measurement of the electrical resistance between each pair of measuring points 15, 16; 17, 18 can be carried out by any known means. In the present example, this measurement of electrical resistance is carried out by a so-called “4-wire” measurement.
- the device comprises a first power supply conductor 20 which is electrically connected to the base of the measuring element 6, on its internal face, at a first power supply point 22.
- the first power supply point 22 is located in this case at the contact between the first power supply conductor 20 and the internal face of the measuring element 6.
- the first power supply conductor 20 can be electrically connected to the body 10, preferably near the junction between the body 10 and the measuring element 6 (the first power supply point 22 then being located at the junction between the body 10 and the measuring element 6). This variant allows a simplification of the manufacturing method of the device.
- the device also comprises a second supply conductor 21 which is electrically connected to the reference element 7 at a second supply point 23.
- the second supply point 23 is located on an end of the reference element 7 which is opposite the end by which the reference element is electrically connected to the measuring element 6.
- the measuring conductors 11, 12, 13, 14 and the power supply conductors 20, 21 are connected to the output of the body 10 to an external wiring (shown schematically by the cable 3 in figure 1) necessary for the connection with the module 2.
- the conductors 11, 12, 13, 14, 20, 21 are sheathed for example by a suitable electrically insulating polymer.
- Figure 4 schematically illustrates the 4-wire resistance measurement applied to both the measuring element 6 and the reference element 7.
- the resistor 19 schematically represents the resistance to be measured of the portion of the measuring element 6 or the reference element 7 located between the two measuring points 15, 16 or 17, 18.
- a current source (contained in the module 2, in the resistance measurement circuit 25) causes a constant current to flow between the two supply points 22, 23. This current passes through the measurement element 6 and the reference element 7. The voltage between the two measurement points 15, 16 on the one hand, and 17, 18 on the other hand is then measured precisely (using voltage measurement means contained in the module 2, in the resistance measurement circuit 25) to deduce the value of the resistance 19 by Ohm's law. A precise measurement of the electrical resistance of the portion of the measurement element 6 and of the portion of the reference element 7 in question is thus carried out continuously, so as to detect minimal variations in resistance.
- the measuring circuit 25 determines the variation in electrical resistance of the portion of the measuring element 6 which goes beyond the variation in the electrical resistance of the portion of the reference element 7.
- This relative measurement can be carried out by an individual measurement of the resistance of said portion of the measuring element 6, and of said portion of the reference element 7, and the ratio of these voltages is determined by the module 2, possibly with computer means connected to the module 2 by a suitable interface. To obtain this relative resistance, the value of the electrical resistance relative to the reference element 7 can be continuously subtracted from the value of the electrical resistance relative to the measuring element 6.
- this relative electrical resistance makes it possible to quantify the value of the electrical resistance (of said portion of the measuring element) independently of the temperature.
- the insulating material 24 being thermally conductive, the measuring element 6 and the reference element 7 are subjected to substantially the same temperature, and the variations in the electrical resistance relating to changes in temperature will be seen both by the measuring element 6 and by the reference element 7. These variations in electrical resistance due to the temperature will therefore not be taken into account in the measurement of said relative electrical resistance, the latter therefore varying only under the influence of the interactions of the measuring element 6 with the nitric medium 4.
- the measuring element 6 When the detection device is in service, the measuring element 6 is immersed in the nitric medium 4 and the fluoride ions which would be present in the nitric medium react with the material constituting the measuring element 6. Thus, the presence of fluoride ions in the nitric medium 4 causes a reduction in the thickness of the measuring element 6, which is in contact with the nitric medium 4, and has no impact on the reference element 7, which is protected inside the measuring element 6.
- the presence of fluoride ions in the nitric medium will result in a decrease (even a small one) in the zirconium thickness of the measuring element 6, and this presence will be detected by the increase in said relative electrical resistance beyond a predetermined threshold.
- the detection circuit 26 of the module 2 is adapted (by construction or programming) to correlate an increase in the value of said relative resistance with the presence of fluoride ions in the nitric medium 4.
- the detection circuit 26 is adapted to detect the presence of fluoride ions in the nitric medium, as a function of an increase in said relative electrical resistance.
- the detection circuit 26 can be calibrated for example experimentally or by calculation.
- the measuring conductors 11, 12, 13, 14, the power supply conductors 20, 21, and the body 10 are made of the same material as the measuring element 6 (zirconium).
- the entire detection probe 1 can be produced by a welding technique such as high energy density welding processes such as the electron beam under vacuum or resistance welding, which allow both the assembly of the tube 8 and the plug 9, as well as the welding of the conductors at the measuring points 15, 16, 17, 18 and at the supply points 22, 23.
- Module 2 can be programmed according to any suitable method, for example to continuously monitor the variation of said relative resistance and thus qualify the evolution of the presence of fluoride ions in the nitric medium 4.
- Variants of embodiment of the device can be envisaged, for example the shape and arrangements of the measuring element 6, or the means of measuring the relative resistance which can be different.
Landscapes
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR2303665A FR3147868B1 (fr) | 2023-04-13 | 2023-04-13 | Dispositif de détection d’ions fluorure en milieu nitrique |
| PCT/EP2024/059758 WO2024213594A1 (fr) | 2023-04-13 | 2024-04-10 | Dispositif de détection d'ions fluorure en milieu nitrique |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP4695603A1 true EP4695603A1 (fr) | 2026-02-18 |
Family
ID=88291123
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP24716222.5A Pending EP4695603A1 (fr) | 2023-04-13 | 2024-04-10 | Dispositif de détection d'ions fluorure en milieu nitrique |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20260235541A1 (fr) |
| EP (1) | EP4695603A1 (fr) |
| JP (1) | JP2026518523A (fr) |
| KR (1) | KR20260023664A (fr) |
| CN (1) | CN121175559A (fr) |
| FR (1) | FR3147868B1 (fr) |
| WO (1) | WO2024213594A1 (fr) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1567002A (fr) * | 1964-10-23 | 1968-05-16 | ||
| US3431182A (en) * | 1966-02-04 | 1969-03-04 | Orion Research | Fluoride sensitive electrode and method of using same |
| US5932176A (en) * | 1998-07-07 | 1999-08-03 | Bacharach, Inc. | Halogen gas detector |
-
2023
- 2023-04-13 FR FR2303665A patent/FR3147868B1/fr active Active
-
2024
- 2024-04-10 KR KR1020257038040A patent/KR20260023664A/ko active Pending
- 2024-04-10 JP JP2025559901A patent/JP2026518523A/ja active Pending
- 2024-04-10 CN CN202480032882.1A patent/CN121175559A/zh active Pending
- 2024-04-10 US US19/474,789 patent/US20260235541A1/en active Pending
- 2024-04-10 WO PCT/EP2024/059758 patent/WO2024213594A1/fr not_active Ceased
- 2024-04-10 EP EP24716222.5A patent/EP4695603A1/fr active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| KR20260023664A (ko) | 2026-02-20 |
| CN121175559A (zh) | 2025-12-19 |
| FR3147868A1 (fr) | 2024-10-18 |
| FR3147868B1 (fr) | 2025-03-07 |
| JP2026518523A (ja) | 2026-06-09 |
| US20260235541A1 (en) | 2026-08-13 |
| WO2024213594A1 (fr) | 2024-10-17 |
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