EP4298398A1

EP4298398A1 - Measuring system for a manufacturing system for in-situ detection of a property, and method

Info

Publication number: EP4298398A1
Application number: EP22707609.8A
Authority: EP
Inventors: Stefan Thomas Grottker; Dennis Jutkuhn
Original assignee: Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Current assignee: Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Priority date: 2021-02-24
Filing date: 2022-02-22
Publication date: 2024-01-03
Also published as: WO2022179663A1; DE102021104440A1

Abstract

The invention relates to a measuring system (1) for a manufacturing system (100) for in-situ detection of a property, a manufacturing system (100), a method for in-situ detection of a property, a use, a system for data processing, and a computer program. In particular, the invention relates to a measuring system (1) for a manufacturing system (100) for in-situ detection of a property, in particular a surface property of a surface (82), comprising a plenoptic camera unit (2, 6, 12) having a field of view, in particular a field of view (4, 8) alignable with the surface.

Description

Measurement system for a manufacturing system for in-situ recording of a property and method

The invention relates to a measuring system for a manufacturing system for the in-situ detection of a property, a manufacturing system, a method for the in-situ detection of a property, a use, a data processing system and a computer program. Measuring systems for manufacturing systems are known in principle. As a rule, the monitoring of the process conditions and states of

Manufacturing processes, in particular additive manufacturing processes, for example additive manufacturing processes in a powder bed, are not sufficient to record and evaluate them in detail. Due to this insufficient recording, critical process parameters that have a significant influence on the process stability and thus on the resulting production quality cannot be identified, analyzed, monitored and controlled sufficiently or not at all. Critical process parameters of powder bed-based additive manufacturing processes are, for example, the powder application, in particular the homogeneity, the evenness and the layer thickness, the powder particle size distribution, thermally induced component deformations, in particular superexposures, irregularities in the joining process as well as disruptive particles and/or foreign particles. In particular, the monitoring is insufficient with regard to those process variables that are to be detected in an interaction zone between the tool, for example the laser beam, and the workpiece as well as adjacent areas before, during and after the joining process.

As described above, the currently available technical approaches are generally not sufficient. For example, it is possible to measure the topography of the surface with a line camera during a layer-by-layer construction process of the additive manufacturing of a component. A line camera mounted on a powder coater captures a two-dimensional image of the surface of the powder bed and the most recently created layer of the component located therein by moving the powder coater, whereby the depth of focus and depth resolution of this image are usually low.

Due to the low depth of field of the recording, different heights in the topography appear differently sharp. The blurrier the image, the greater the difference in elevation relative to a calibrated zero elevation where the image is sharp. Height information can be calculated based on the blurring. Such an arrangement is described, for example, in EP3159081 A1. The disadvantage of this technology is that it is usually not possible to differentiate between elevation and depression. Thus, a layer thickness measurement is not possible. Furthermore, it is an indirect measurement method that only records a few critical process variables.

Another method used relates to strip light projection. Based on a laser light projection, a stripe pattern is projected onto a building level. By stereo-optically capturing this pattern with at least two cameras in a Scheimpflug configuration, a triangulation for three-dimensional capturing of the topography is realized. EP3581884A1 describes a system for monitored additive manufacturing of a component with structured light projection. The disadvantages of strip light projection are the comparatively high time required for the measurement, since an independent process step is required for measuring the surface, the high costs, a high level of integration effort due to the optical accessibility in the build chamber, and a large amount of space.

Another way to measure a surface is to use the shadow measurement method. On the basis of a camera unit and directed lighting, shadows caused by unevenness in the surface being viewed are optically recorded. From the shape, position and area of the shadows, a calculation is made to draw conclusions about the topography of the surface. The disadvantages of this technology are the low and direction-dependent resolution, the lack of the possibility of layer thickness measurement, the lack of information about areas that are in shadowed zones and the indirect character of the information determination.

Furthermore, surfaces can be measured with laser triangulation. Laser triangulation also has several disadvantages. With laser triangulation, the height of the surface is determined by offsetting the back reflection of a laser beam onto the sensor with a fixed emitter-sensor configuration. A disadvantage of laser triangulation is possible shadowing, which can cause insufficient resolution depending on the measurement direction. Furthermore, information losses occur with complex geometries, such as with undercuts.

Interferometry relates to a punctiform determination of the height of the surface using an interferometer that is optically arranged in the beam path. A raster scan is carried out to determine the topography. The disadvantage is that raster scanning takes a lot of time, which results in poor profitability.

It is therefore an object of the present invention to provide a measuring system for a manufacturing system for in-situ detection of a property, a manufacturing system, a method for in-situ detection of a property, a use, a system for data processing and a computer program that reduce or eliminate one or more of the disadvantages mentioned. In particular, it is an object of the invention to provide a solution that allows a process-parallel recording of a time-related change

Surface properties of a surface allows. In addition, it is an object of the invention to provide a solution that enables improved detection of a surface.

This task is solved with a measuring system, a method, a use, a system for data processing and a

Computer program product according to the features of the independent patent claims. Further advantageous refinements of these aspects are specified in the respective dependent patent claims. The features listed individually in the patent claims and the description can be combined with one another in any technologically meaningful way, with further embodiment variants of the invention being shown. According to a first aspect, the invention relates to the measuring system for a manufacturing system for the in-situ detection of a property, in particular a surface property of a surface.

The surface can be a component or workpiece surface, for example. In addition, the surface can be a process surface, for example a powder bed surface. Furthermore, the process surface can be an element and/or substance surface of an element and/or substance in the field of view of the plenoptic camera. Furthermore, the surface can also be a combination of the aforementioned surfaces. The surface property can be scattered radiation, reflected radiation and/or emitted radiation. The scattered radiation can be caused, for example, by the powder of a powder bed surface. The reflected radiation is caused in particular by a reflective surface, for example by a component surface or a melt pool. The emitted radiation is caused in particular by a temperature. The temperature can be caused, for example, by the processing laser and/or by a preheating unit. The in-situ detection of the surface property of the surface relates in particular to the detection of the surface property during the use of a manufacturing process. Alternatively, this can also be referred to as process-parallel detection of the surface properties. Parallel to the process means in particular that the surface property can be detected parallel to the main time.

The measuring system is designed in particular for the in-situ detection of multispectral topographical properties of the surface. Multispectral topographic properties of the surface relate to properties that can be detected with different wavelength ranges. In particular, reflected light, scattered light and emitted light can be detected with the measuring system. For example, the microgeometric structure of the surface can be detected with visible light and/or infrared radiation. Furthermore, discolorations in the visible wavelength spectrum, in particular in the RGB spectrum, and heat radiation can also be detected with specific wavelength ranges.

The measurement system includes a plenoptic camera unit. A pie-optical camera unit is also referred to as a light field camera. In particular, the plenoptic camera unit has a field of view that can be aligned with the surface. A field of view is generally understood to mean the area in the field of view of an optical device within which events or changes can be detected and/or recorded. A pie-optical camera unit is described, for example, in EP2422525B1.

It is preferred that the measurement system has two or more camera units. The two or more pie-optical camera units are preferably movable relative to one another.

The invention is based on the finding that the measuring system essentially has no delaying influence on the production process, for example on the additive printing process, by detecting the surface property and can in particular be operated parallel to the main time. The measuring system can create three-dimensional thermal recordings and/or RGB recordings parallel to the production process. In addition, can by capturing the topography, changes in the topography over time can also be determined. Furthermore, only a single camera unit is required to create the topography, so that it is not necessary to calculate the topography based on data from multiple cameras. The use of the plenoptic camera unit for the production system results in a large number of new approaches for evaluating the recorded data. Multiple, time-staggered recordings of the thermal properties and a topography height at a predefined point make it possible to record the cooling and deformation behavior, which means that quality-critical areas can be determined in this regard, for example in the case of a large difference in the course of time.

Furthermore, the data evaluation of the in-situ acquisition enables the determination of temporal and spatial gradients, the monitoring of absolute values, for example in SPC charts, and the monitoring of a joining process as such. The latter includes in particular the joining behavior in the sequence of exposure vectors in an additive powder bed process. Every single melt line produced that contributes to the structure of the component is documented and analyzed.

Furthermore, the preconditions in the powder bed for the production of the melt paths can be recorded. These include, among other things

Particle size distribution, spatter, smoke, turbulence as well

accumulations of powder. Furthermore, the weld track as such can be measured, analyzed and interpreted spectrally, for example by means of temper colors of the joined material, and topographically, for example by means of the characteristic shape of the melt track caused by fluctuations in the melt pool, over time.

Another advantage of the measurement system is that it offers the possibility of quickly capturing the topography of the powder bed surface, especially in the case of the configuration with a plenoptic camera unit arranged on a recoater. The recoater is preferably a layer application unit, in particular a powder layer application unit, and/or a layer-applying and/or layer-generating element, in particular a powder layer applying and/or powder layer generating element. In a configuration with a plenoptic camera unit mounted off- or on-axis, there is a further advantage in capturing the topography of the surface in different wavelength ranges as well as the video character of the recordings. A preferred embodiment variant of the measuring system is characterized in that the plenoptic camera unit is designed to be arranged on a production machine. The manufacturing machine is preferably an additive manufacturing machine. Furthermore, it is preferred that the plenoptic camera unit is arranged within the production machine. In addition, it is preferred that the plenoptic camera unit can be arranged within a build chamber of the additive manufacturing machine. In order for the plenoptic camera unit to be able to be arranged on a production machine, in particular the aforementioned construction chamber, different properties adapted to the environmental conditions are generally required. The plenoptic camera unit is preferably designed to be essentially dust-tight and/or temperature-resistant for arrangement in the production machine. In addition, the plenoptic camera unit is preferably designed in such a way that it withstands low and/or high ambient pressures. In addition, it is preferred that the plenoptic camera unit enables reliable detection of the surface properties with vapor, smoke and/or particles in the field of view.

In addition, it is preferred that the plenoptic camera unit can be arranged in a movable manner. For this purpose, the plenoptic camera unit is preferably of such a robust design that the movement essentially does not or only slightly influence the functionality of the plenoptic camera unit.

A further preferred development of the measurement system is characterized in that the plenoptic camera unit is arranged on a movement unit. The moving unit can be a moving unit, for example, which can be moved relative to a workpiece to be machined. The relative movement between the traversing unit and the workpiece to be machined or the component to be produced can be achieved by a moving traversing unit and/or be realized by a moving workpiece or component in relation to a reference point of the production machine.

In addition, the movement unit can be a robot, in particular an articulated-arm robot, preferably a robot arm. Furthermore, the plenoptic camera unit can be arranged on moving parts of the production machine. In particular, the movement unit can be a layer application unit, in particular a powder layer application unit, of an additive manufacturing machine. In addition, the movement unit can be a print head unit and/or a process unit of an additive manufacturing machine. In a further preferred embodiment variant of the measuring system, it is provided that it comprises at least one optical element for controlling the field of view of the pie-optical camera unit. Controlling the field of view relates to the shape and/or size of the field of view and/or the orientation of the field of view. Controlling the field of view can also mean controlling a portion of the field of view of the pie-optical camera unit.

It is preferred that the at least one optical element is designed as mirror and/or deflection kinematics. The optical element can be, for example, a protective glass, a mirror, in particular a partially transparent mirror or a splitter mirror, a lens, a prism, a filter and/or a shutter.

It is also preferred that the at least one optical element is arranged to be movable. The movably arranged optical element is in particular rotatable and/or movable in translation.

A further preferred development of the measuring system is characterized in that the plenoptic camera unit comprises at least one lens arrangement with a large number of lenses. The lens arrangement can also include lens groups. The lens arrangement is preferably in the form of a microlens arrangement. The microlens array has a multiplicity of microlenses and/or lens groups comprising microlenses. A microlens can, for example, have a diameter of 50 μm to 500 μm, in particular from 100 μm to 200 μm.

It is preferred that the lenses and/or lens groups have the same and/or different depths of field. A depth of field is understood to mean, in particular, a measure of the extent of the sharp area in the object space and/or field of view of the plenoptic camera unit.

In addition, it is preferred that the lenses and/or lens groups have the same and/or different focal positions.

In addition, it can be preferred that the lenses and/or lens groups are arranged as lines, matrices and/or lens patterns. The lens pattern can be, for example, a checkerboard pattern, a line and/or stripe pattern, a periodic geometric pattern, one, two or more concentric circles and/or one, two or more concentric polygons.

According to a further preferred embodiment variant of the measuring system, it is provided that the plenoptic camera unit has at least one sensor unit. The sensor unit preferably interacts with the at least one lens arrangement. In a light entry direction into the plenoptic camera unit, the sensor unit is preferably arranged behind the lens arrangement in the beam direction. A beam entering the plenoptic camera unit thus first impinges on the lens arrangement and then on the sensor unit. The sensor unit and the lens arrangement are preferably arranged in such a way that the beam entering the plenoptic camera unit first impinges on the lens arrangement and then on the sensor unit.

In addition, it is preferred that the sensor unit is set up for the simultaneous detection of one, two or more way length ranges. This has the particular advantage that different surface properties can be recorded. For example, a temperature can be detected by detecting infrared light. In addition, the detection of a light visible to a human can be used to detect a geometric topography. Furthermore, can Surface properties are detected with the measuring system by detecting ultraviolet light.

In addition, it is preferred that the sensor unit has two or more sensor areas for the simultaneous detection of two or more wavelength ranges. It is preferred that a first sensor area is designed for detecting a first wavelength range and a second sensor area is designed for detecting a second wavelength range that is different from the first wavelength range,

Two or more sensor areas can be provided by providing two or more sensor surfaces on the sensor unit. In addition, two or more sensor areas can be realized by segmented areas of one, two or more of these sensor surfaces. It is preferred that the plenoptic camera unit has a higher number of sensor rods than a number of lenses. A further preferred embodiment variant of the measuring system comprises a beam splitting unit and/or a beam filter unit for the simultaneous detection of one, two or more wavelength ranges. In addition, the measuring system include a filter shutter for the simultaneous detection of one, two or more wavelength ranges. A further preferred development of the measuring system includes a screen unit with a rotating screen and translucent recesses. The recesses preferably have filters that transmit different wavelength ranges. In a further preferred embodiment variant it is provided that the measuring system comprises an illumination unit for directed and/or non-directed illumination within the field of view of the plenoptic camera, in particular the surface. The undirected illumination can in particular be diffuse.

With a directed illumination, high light intensities can be achieved in the field of view, which means that an exposure time required for recording a Image or video frame is shortened and the motion blur can be minimized. In addition, the object to be detected can be illuminated more homogeneously. The lighting unit for directional illumination is a laser unit, for example. A diffuse, undirected illumination results in a uniform illumination of the construction space with reduced shadows. Shadowing and consequently a loss of information can be avoided or reduced as a result. The lighting unit for non-directional illumination is, for example, a surface or volume light source, preferably an LED, an OLED, halogen and/or neon tubes, and/or a thermal lighting element.

A further preferred development of the measuring system comprises a control device which is arranged and designed to receive at least one camera signal from the plenoptic camera unit and to evaluate the property, in particular the surface property of the surface, for detecting it. The control device is preferably coupled in terms of signals to the pie-optical camera unit. The camera signal is in particular an output signal of the pie-optical camera unit. The camera signal can be an input signal for the control device.

The control device is preferably set up to multispectrally break down the at least one camera signal into one, two or more wavelength ranges. In addition, it is preferred that the control device is set up to determine thermal and/or spatial changes as a function of time of predetermined areas within the field of view, in particular of predetermined surface areas of the surface, based on the at least one camera signal. An analysis of the time-resolved dynamic behavior is thus possible.

A further preferred development is characterized in that the control device is set up to determine thermal, spatial and/or spectral absolute values based on the at least one camera signal. In addition, it can be preferred that the control device is set up, based on the at least one camera signal, to determine thermal, spatial and/or spectral gradients between To determine pixels and/or predefined areas within the field of view, in particular predefined surface areas of the surface.

Furthermore, it can be preferred that the control device is set up to determine isolines and/or isarithms based on the at least one camera signal. In addition, it is preferred that the control device displays the isolines and/or isarithms with a suitable display device, for example a screen.

According to a further aspect, the object mentioned at the outset is achieved by the manufacturing system with in-situ detection of a property, in particular a surface property of a surface, preferably multispectral topographical properties of the surface, comprising a manufacturing machine, in particular for additive manufacturing, for example an additive manufacturing machine based on a powder bed method, and a measuring system according to one of the embodiment variants described above, the plenoptical camera unit being arranged to record the property, in particular the surface property. The measuring system is preferably coupled to the production machine, in particular mechanically and/or coupled in terms of signals.

It is preferred that the plenoptic camera unit is arranged on the production machine. It is particularly preferred that the plenoptic camera unit is arranged within the production machine. In addition, it can be preferred that the plenoptic camera unit is arranged within a build chamber of the manufacturing machine, in particular the additive manufacturing machine. Furthermore, it can be preferred that the plenoptic camera unit is arranged on a movement unit. The movement unit can be a separate displacement unit, a separate robot, in particular a robot arm, a machine-internal layer application unit, and/or a machine-internal print head and/or process unit. According to a further preferred embodiment variant of the production system, it is provided that the plenoptical camera unit is optically equipped with at least is coupled to an optical system of a processing laser. Additive manufacturing machines in particular, for example powder bed-based additive manufacturing machines, usually have a processing laser. Such processing lasers usually have an optical system to align the laser beam in a predefined area of the surface. This optical system can be used for the plenoptic camera unit for in-situ detection of the surface property of the surface. The use of the optical system of the processing laser is particularly preferred when the exposure area of the laser on the surface and the adjacent areas are to be captured by the plenoptical camera unit.

In addition, it can be preferred that the production system comprises at least one optical element for controlling the field of view of the plenoptic camera unit. Such an optical element can be provided in addition to the optical system of the processing laser, in particular if the optical system of the processing laser is not intended to be used by the plenoptical camera unit, or not at all times. The optical element is preferably mirror and/or deflection kinematics.

With such an optical element, the field of view of the plenoptic camera unit can essentially be oriented arbitrarily on the surface, so that different surface areas can be recorded with the plenoptic camera unit.

According to a further preferred embodiment variant of the production system, it is provided that this comprises a build-up welding unit, in particular a build-up welding head, with a material feed line, with the plenoptic camera being arranged and designed in such a way as to monitor a material emerging from the material feed line and/or a trace of melting and /or to analyze. The material feed line is preferably designed for powdery and/or wirelike material. The build-up welding unit can be the moving unit. the

The build-up welding unit is or preferably includes a laser build-up welding unit with a laser unit. The plenoptic The camera unit is preferably arranged and designed in such a way that it monitors and/or analyzes a melting process of the material using a laser beam from a laser unit. In addition, it is preferred that the plenoptic camera unit is coupled to an optical system of the laser unit, a mirror being used, for example, which is translucent for a laser beam and reflective for the field of view of the plenoptic camera unit.

Furthermore, the build-up welding unit is preferably or comprises a welding unit, in particular a welding torch. Furthermore, the manufacturing system preferably includes an application unit that has a binder source.

According to a further preferred embodiment variant of the production system, it is provided that this includes a print head for a binder jetting method. The printhead is preferably the moving unit. The print head preferably has dispensing units, in particular nozzles, for dispensing a binder,

The plenoptic camera unit is preferably arranged on the print head. The plenoptical camera unit is preferably arranged in such a way that it monitors a binder application, in particular a droplet fall, an entry and/or a wetting of a powder layer and/or the delivery units, in particular a blockage of the delivery units. Furthermore, the plenoptic camera unit arranged on the print head preferably interacts with one, two or more optical elements, in particular mirrors.

According to a further aspect, the object mentioned at the outset is achieved by the method for in-situ detection of a property, in particular a surface property of a surface, preferably multispectral topographical properties of the surface, comprising the steps of: controlling a plenoptical camera unit for plenoptical detection of the property, in particular the Surface property, and/or control of a measuring system according to one of the embodiment variants described above, generation of a camera signal characterizing the property, in particular the surface property, on the basis of the plenoptical detection, and evaluation of the camera signal. The method is preferably at least in part a computer-implemented method.

The method preferably includes the step: providing a manufacturing system according to one of the embodiment variants described above.

The evaluation of the camera signal can include or be, for example, the multispectral decomposition of the camera signal into one, two or more wavelength ranges. In addition, the evaluation can be the determination of thermal and/or spatial changes as a function of time in predetermined surface areas of the surface. In addition, thermal, spatial and/or spectral absolute values can be determined. Furthermore, the evaluation can include the determination of thermal, spatial and/or spectral gradients between pixels and/or predefined surface areas of the surface. Furthermore, isolines and/or isarithms can be determined.

According to a further aspect, the object mentioned at the outset is achieved by using a plenoptic camera unit for in-situ recording of a surface property of a surface, preferably of multispectral topographical properties of the surface. According to a further aspect, the object mentioned at the outset is achieved by a system for data processing, comprising means for carrying out the steps of the method described above.

According to a further aspect, the object mentioned at the outset is achieved by a computer program product, comprising instructions which, when the computer program is executed by a computer, cause the latter to execute the method described above.

For further advantages, design variants and design details of the further aspects and their possible developments, reference is also made to the previously given description of the corresponding features and developments of the measuring system. Preferred exemplary embodiments are explained by way of example with reference to the accompanying figures. Show it:

FIG. 1: a schematic, two-dimensional view of an exemplary embodiment of a measuring system; FIG. 2: a further schematic, two-dimensional view of an exemplary embodiment of a measuring system;

FIG. 3: a further schematic, two-dimensional view of an exemplary embodiment of a measuring system;

FIG. 4: a further schematic, two-dimensional view of an exemplary embodiment of a measuring system;

FIG. 5: a further schematic, two-dimensional view of an exemplary embodiment of a measuring system;

FIG. 6: a further schematic, two-dimensional view of an exemplary embodiment of a measuring system; FIG. 1: another schematic, two-dimensional view of an exemplary embodiment of a measuring system;

FIG. 8: a schematic, two-dimensional view of an exemplary embodiment of a manufacturing system;

FIG. 9: a further schematic, two-dimensional view of an exemplary embodiment of a manufacturing system;

FIG. 10: a schematic, two-dimensional view of an exemplary embodiment of a plenoptic camera unit; and

FIG. 11: a schematic method. In the figures, identical or essentially functionally identical or similar elements are denoted by the same reference symbols. FIG. 1 shows a schematic, two-dimensional view of an exemplary embodiment of a measuring system 1 for a manufacturing system 100 for in-situ detection of a surface property of a surface 82, which is also designed for in-situ detection of multispectral topographical properties of the surface 82. The surface 82 shown in FIG. 1 is a process surface, namely a powder bed surface. A section of the powder bed surface located above the component 80 is exposed after production with a laser, so that a further component layer is produced. The state after exposure is shown in FIG. There, the surface 82 is a combination of a process surface and a component surface.

The measurement system 1 includes a pie-optical camera unit 2 with a field of view 4 that can be aligned with the surface 82 . The surface 82 is a powder surface under which a component 80 is located. The pie-optical camera unit 2 is arranged on the production machine 102 inside the construction chamber 104 .

The measuring system 1 shown in FIG. 2 comprises a camera arrangement 5 which, in addition to the plenoptic camera unit 2 described above, has a further, second pieoptic camera unit 8 with a second field of view 8 . The measuring system 1 can also have three or more pie-optical camera units 2, 8. The arrow next to the pie-optical camera units 2, 6 shows that the pie-optical camera units 2, 8 are movably arranged. The pie-optical camera units provided with the reference symbols 2a, 2b, 2c, 2d are intended in particular to represent alternative positions for pie-optical camera units. The pie-optical camera units 2, 8 can thus be arranged in the positions 2a, 2b, 2c, 2d. FIG. 3 shows two different possibilities for the movable arrangement of the pie-optical camera units 2, 6, 12. The movement can take place with the displacement unit 18 on the one hand and with the articulated-arm robot 20 on the other hand. The displacement unit 16 and the articulated robot 20 usually represent alternative solutions, but they can also be combined in one Manufacturing machine are used. The displacement unit 16 and/or the articulated-arm robot 20 can be arranged inside the construction chamber 104 and/or outside of the construction chamber 104 .

The traversing unit 18 can be a traversing unit specially provided for the plenoptic camera units 2, 6 or a print head unit and/or

Process unit of the production machine 102. The displacement unit 16 can be moved in the direction of movement 18. In addition, it can be preferred that the displacement unit 18 can also be moved orthogonally to the direction of movement 18, so that any direction of movement, for example at an angle. are realizable. It is preferred that the displacement unit 18 can be moved in all spatial directions. The articulated-arm robot 20 as a movement unit has a further plenoptic camera unit 12 at one end.

An additive manufacturing machine 102 with a build chamber 104 is shown in FIG. A layer application unit 22 is movably arranged within the build chamber 104 . The layer application unit 22 is a movement unit. The layer application unit 22 can be moved in the movement direction 24 . In addition, the layer application unit 22 can also be moved in a direction oriented perpendicularly and/or obliquely, in particular when using a round construction plane, to the direction of movement 24. The measuring system 1 shown in Figure 5 comprises the plenoptic camera unit 2 and a plurality of optical elements 26, 28 , 30, 32 for controlling the field of view 4 of the plenoptical camera unit 2. The field of view 4 of the plenoptical camera unit 2 is directed onto optical elements 26, 28 designed as mirrors. The field of view 4 is passed on by the optical elements 26, 28 in the direction of the optical elements 30, 32, so that fields of view 34, 38 directed onto the surface 82 arise. This embodiment variant has the advantage that the field of view 4 can be controlled by means of the optical elements 28, 28, 30, 32 and thus the movement of the plenoptic camera unit 2 can be reduced. In addition, the field of view 4 can be specifically adapted, as can be seen from the field of view 38, for example. FIG. 6 shows that the plenoptical camera units 2, 8 are optically coupled to an optical system 44, 48 of a processing laser 40. Of the Laser beam 42 of the processing laser 40 passes the optical deflection element 44 and is deflected by the optical deflection element 46 towards the optical elements 26 ~ 32 and then strikes the surface 82. The optical deflection elements 44, 46 are also used for the fields of view of the plenoptic camera units 2, 6 used, so that they also impinge on the component surface 82. The optical deflection elements 44, 46 are designed as splitter mirrors. The optical deflection elements 44, 46 are designed to transmit the laser beam 42 and to reflect the beams emitted by the pie-optical camera units. The optical elements 26, 28 are also arranged to be movable, in this case rotatable.

The structure shown in FIG. 6 can also be implemented without using the optical system of the processing laser 40 by providing the optical elements 48, 50 as separate optical elements for the measuring system 1 and having the functionality described above. FIG. 7 shows a further variant of the measuring system 1, two light sources 52, 56 being provided in order to illuminate the surface 82. The light source 52 has directed light beams 54 . The light source 56 has diffuse, undirected light beams 58. The measuring system 1 can have one, two or more light sources 52, 56 of the same and/or different design. The arrangement of the light sources 52, 56 inside and/or outside of the build chamber 104 is arbitrary. For example, these can have the positions 2a-d shown in FIG. The light sources 52, 56 can also be ring-shaped, with such a light source preferably being able to be arranged around a laser beam and/or a laser unit. Figure 8 shows a manufacturing system 100 with a manufacturing machine 102 and a build chamber 104. The manufacturing machine 102 includes a

Laser deposition welding head 106 with a laser source 108 and a material feed 112 for feeding material into a process area. The process area is within the field of view 4 of the plenoptic camera unit 2 of the measuring system 1, so that the process area can be monitored.

Alternatively or additionally, the plenoptic camera unit 4 can be arranged in the position 2e. The field of view of the plenoptic camera unit 4 is deflected into the process area via a splitter mirror 110, so that the area surrounding the laser beam 42 can be monitored.

FIG. 9 shows a production system 100 for carrying out a binder jetting method. The manufacturing system 100 includes a printhead 114 having binder nozzles 116 for dispensing a binder in droplet form. In this method, the component 80 is a green ring which is essentially located within the powder bed 81 . The droplet fall of the binder, the wetting of the powder particles or the powder layer and the binder nozzles 116 can be monitored with the plenoptic camera unit 4 . Alternatively or additionally, the plenoptic camera unit 4 can also be arranged at position 2f or at position 2g. A plenoptic camera unit 4 located at position 2f interacts with the optical elements 118, 120 to monitor the process.

FIG. 10 shows an exemplary embodiment of a plenoptic camera unit 2 . The plenoptic camera unit 2 has a main lens 60 . In addition, the plenoptic camera unit 2 has a virtual image plane 62 , a microlens arrangement 64 and a sensor unit 66 . The plenoptic camera unit 2 is coupled to a control device 68 .

FIG. 11 shows a schematic method for in-situ detection of a surface property of a surface, preferably multispectral topographical properties of the surface. In step 200, a plenoptical camera unit 2, 6 for the plenoptical detection of the surface 82 is controlled. A measuring system 1 described above is preferably controlled. In step 202, a camera signal characterizing the surface property is generated on the basis of the plenoptical detection, in step 204 the camera signal is evaluated. REFERENCE MARKS

1 measuring system

2 plenoptic camera unit

2a-g positions of plenoptic camera units 4 field of view

5 camera arrangement

6 plenoptic camera unit 8 field of view 10 camera arrangement 12 plenoptic camera unit 14 field of view 16 traversing unit 18 direction of movement 20 articulated arm robot 22 layer application unit

24 direction of movement 26 optical element 28 optical element 30 optical element 32 optical element

34 field of view 36 field of view

38 laser system

40 processing lasers 42 laser beam 44 optical deflection element 46 optical deflection element 48 optical element 50 optical element

52 light source 54 directed light beams 56 light source 58 diffuse, non-directed light beams 60 main lens 62 virtual image plane 64 microlens arrangement 66 sensor unit 68 control device 80 component

81 Powder bed 82 Surface 84 Weld pool 100 Manufacturing system 102 Manufacturing machine 104 Build chamber 106 Laser cladding head 108 Laser source

110 splitter mirror 112 material feed

114 print head

116 binder nozzles

118 optical element 120 optical element

Claims

EXPECTATIONS

1. Measuring system (1) for a manufacturing system (100) for in-situ detection of a property, in particular a surface property of a surface (82), comprising - a plenoptic camera unit (2, 6, 12) with a field of view, in particular one of the surface adjustable field of view (4, 8).

2. Measuring system (1) according to claim 1, wherein the plenoptic camera unit (2, 6, 12) is designed to be mounted on a production machine (102), in particular within a construction chamber

(104) and/or the plenoptic camera unit (2, 6, 12) can be arranged to be movable, and/or the plenoptic camera unit (2, 6, 12) is arranged on a movement unit (16, 20, 22). .

3. Measuring system according to one of the preceding claims, comprising at least one optical element (26, 28, 30, 32) for controlling the field of view (4, 8) of the plenoptic camera unit (2, 6, 12), - wherein preferably the at least one optical element (26, 28,

30, 32) is designed as mirror and/or deflection kinematics, and/or wherein the at least one optical element (26, 28, 30, 32) is preferably arranged to be movable, in particular rotatable and/or movable in translation.

4. Measuring system according to one of the preceding claims, wherein the plenoptic camera unit (2, 6, 12) at least one

Lens arrangement (64) with a large number of lenses and/or lens groups, and preferably the lenses and/or lens groups have the same and/or different depths of field, and/or the lenses and/or lens groups have the same and/or different focal positions, and/or the lenses and/or lens groups are arranged as lines, matrices and/or lens patterns.

5. Measuring system according to one of the preceding claims, wherein the plenoptic camera unit (2, 6, 12) at least one

sensor unit (66) which preferably interacts with the at least one lens arrangement (64), and - preferably the sensor unit (66) is set up for the simultaneous detection of one, two or more wavelength ranges, and preferably the sensor unit (66) for the simultaneous detection of two or more wavelength ranges has two or more sensor areas.

6. Measuring system according to one of the preceding claims, comprising a beam splitting unit and/or a beam filter unit for the simultaneous detection of one, two or more wavelength ranges, and/or a filter shutter for the simultaneous detection of one, two or more wavelength ranges.

7. Measuring system according to one of the preceding claims, comprising - an illumination unit (52, 56) for directed and/or non-directed, in particular diffusely non-directed, illumination within the field of view of the plenoptic camera, in particular the surface. 8. Measuring system according to one of the preceding claims, comprising a control device (68) which is arranged and designed to receive at least one camera signal of the plenoptic camera unit (2, 6, 12) and to detect the property, in particular the surface property of the surface ( 82), to evaluate wherein the control device (68) is preferably set up to o multispectrally break down the at least one camera signal into one, two or more wavelength ranges, and/or o based on the at least one camera signal, thermal and/or spatial changes as a function of time in predetermined ranges within the field of view, in particular of predetermined surface areas of the surface, and/or o to determine thermal, spatial and/or spectral absolute values based on the at least one camera signal, and/or o to determine thermal, spatial and/or spectral absolute values based on the at least one camera signal or to determine spectral gradients between pixels and/or predefined areas within the field of view, in particular of predefined surface areas of the surface, and/or to determine isolines and/or isarithms based on the at least one camera signal.

9. Manufacturing system (100) with an in-situ detection of a property, in particular a surface property of a surface (82), comprising a manufacturing machine (102), in particular for additive manufacturing, and a measuring system (1) according to any one of the preceding claims 1-8 , wherein the plenoptic camera unit (2, 6, 12) is arranged for detecting the property, in particular the surface property.

10. Manufacturing system according to the preceding claim 9, wherein the plenoptic camera unit (2, 6, 12) is arranged on, in particular inside, the production machine (102), in particular inside a build chamber (104) of the production machine, and/or the plenoptic camera unit (2, 6, 12) on a movement unit (16, 20, 22).

11. Production system according to one of the preceding claims 9-10, wherein the plenoptic camera unit (2, 6, 12) is optically coupled to at least one optical system of a processing laser (40), and/or comprising at least one optical element, in particular a mirror and/or deflection kinematics for controlling the field of view of the plenoptic camera unit (2, 6, 12). 12. A method for in-situ detection of a property, in particular one

Surface property of a surface (82), comprising the steps of:

Control of a plenoptic camera unit (2, 6, 12) for plenoptic detection of the property, in particular a surface property, preferably control of a measuring system (1) according to one of the preceding claims 1-8,

Generating a camera signal characterizing the property, in particular the surface property, on the basis of the plenoptical detection, and evaluating the camera signal.

13. Use of a plenoptic camera unit (2, 6, 12) for the in-situ detection of a property, in particular a surface property of a surface (82). 14. System for data processing, comprising means for executing the

Steps of the method of claim 12.

15. A computer program product comprising instructions which, when the computer program is executed by a computer, cause the latter to execute the method according to claim 12.