EP4118512A4 - Systems, methods, and media for manufacturing processes - Google Patents

Systems, methods, and media for manufacturing processes Download PDF

Info

Publication number
EP4118512A4
EP4118512A4 EP21767468.8A EP21767468A EP4118512A4 EP 4118512 A4 EP4118512 A4 EP 4118512A4 EP 21767468 A EP21767468 A EP 21767468A EP 4118512 A4 EP4118512 A4 EP 4118512A4
Authority
EP
European Patent Office
Prior art keywords
media
systems
methods
manufacturing processes
processes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP21767468.8A
Other languages
German (de)
French (fr)
Other versions
EP4118512A1 (en
Inventor
Matthew C. Putman
Vadim Pinskiy
Andrew Sundstrom
Aswin Raghav Nirmaleswaran
Eun-Sol Kim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanotronics Imaging Inc
Original Assignee
Nanotronics Imaging Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US17/091,393 external-priority patent/US20210132593A1/en
Application filed by Nanotronics Imaging Inc filed Critical Nanotronics Imaging Inc
Publication of EP4118512A1 publication Critical patent/EP4118512A1/en
Publication of EP4118512A4 publication Critical patent/EP4118512A4/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B13/00—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
    • G05B13/02—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
    • G05B13/04—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32193—Ann, neural base quality management
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32216—If machining not optimized, simulate new parameters and correct machining
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Quality & Reliability (AREA)
  • Manufacturing & Machinery (AREA)
  • Mathematical Physics (AREA)
  • Computing Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Health & Medical Sciences (AREA)
  • General Factory Administration (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
  • Image Analysis (AREA)
EP21767468.8A 2020-03-09 2021-03-09 Systems, methods, and media for manufacturing processes Pending EP4118512A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202062986987P 2020-03-09 2020-03-09
US17/091,393 US20210132593A1 (en) 2019-11-06 2020-11-06 Systems, Methods, and Media for Manufacturing Processes
PCT/US2021/021440 WO2021183468A1 (en) 2020-03-09 2021-03-09 Systems, methods, and media for manufacturing processes

Publications (2)

Publication Number Publication Date
EP4118512A1 EP4118512A1 (en) 2023-01-18
EP4118512A4 true EP4118512A4 (en) 2024-04-03

Family

ID=77671945

Family Applications (1)

Application Number Title Priority Date Filing Date
EP21767468.8A Pending EP4118512A4 (en) 2020-03-09 2021-03-09 Systems, methods, and media for manufacturing processes

Country Status (6)

Country Link
EP (1) EP4118512A4 (en)
JP (1) JP2023516776A (en)
KR (1) KR20220154135A (en)
CN (1) CN115210744A (en)
TW (2) TWI801820B (en)
WO (1) WO2021183468A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114580876B (en) * 2022-02-24 2023-02-10 山西省交通新技术发展有限公司 Energy data acquisition, analysis, management and control system and method based on energy conservation and environmental protection

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0671677B1 (en) * 1994-03-11 1999-03-17 Matsushita Electric Industrial Co., Ltd. Method of and apparatus for finely machining a workpiece with numerical control having a computer-aided simulation function
US20070005525A1 (en) * 2005-05-13 2007-01-04 Collette L P Iii Neural network using spatially dependent data for controlling a web-based process
US20190118300A1 (en) * 2017-08-25 2019-04-25 Massachusetts Institute Of Technology Sensing and Control of Additive Manufacturing Processes
WO2019182913A1 (en) * 2018-03-20 2019-09-26 Tokyo Electron Limited Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7130710B2 (en) * 2002-08-07 2006-10-31 Kimberly-Clark Worldwide, Inc. System and method for tracking and exploiting per station information from a multiple repeat manufacturing device
US20060013505A1 (en) * 2002-11-06 2006-01-19 Shing-Tung Yau Analysis of geometric surfaces by comformal structure
WO2007017738A2 (en) * 2005-08-05 2007-02-15 Pfizer Products Inc. Automated batch manufacturing
JP2016157357A (en) * 2015-02-26 2016-09-01 株式会社日立製作所 Operator quality control method and operator quality management device
US10176408B2 (en) * 2015-08-14 2019-01-08 Elucid Bioimaging Inc. Systems and methods for analyzing pathologies utilizing quantitative imaging
CN114972180A (en) * 2017-04-13 2022-08-30 英卓美特公司 Method for predicting defects in an assembly unit
US9977425B1 (en) * 2017-07-14 2018-05-22 General Electric Company Systems and methods for receiving sensor data for an operating manufacturing machine and producing an alert during manufacture of a part
US20190138880A1 (en) * 2017-11-03 2019-05-09 Drishti Technologies, Inc. Workspace actor selection systems and methods
US10733723B2 (en) * 2018-05-22 2020-08-04 Midea Group Co., Ltd. Methods and system for improved quality inspection
US11225039B2 (en) * 2018-06-08 2022-01-18 Aurora Flight Sciences Corporation Systems and methods to automate composite manufacturing quality checks
TWI696959B (en) * 2018-06-12 2020-06-21 蟲洞科技股份有限公司 Machine parameters acquiring device
US11132787B2 (en) * 2018-07-09 2021-09-28 Instrumental, Inc. Method for monitoring manufacture of assembly units
US10481579B1 (en) * 2019-02-28 2019-11-19 Nanotronics Imaging, Inc. Dynamic training for assembly lines

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0671677B1 (en) * 1994-03-11 1999-03-17 Matsushita Electric Industrial Co., Ltd. Method of and apparatus for finely machining a workpiece with numerical control having a computer-aided simulation function
US20070005525A1 (en) * 2005-05-13 2007-01-04 Collette L P Iii Neural network using spatially dependent data for controlling a web-based process
US20190118300A1 (en) * 2017-08-25 2019-04-25 Massachusetts Institute Of Technology Sensing and Control of Additive Manufacturing Processes
WO2019182913A1 (en) * 2018-03-20 2019-09-26 Tokyo Electron Limited Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2021183468A1 *

Also Published As

Publication number Publication date
TW202333014A (en) 2023-08-16
JP2023516776A (en) 2023-04-20
TW202147051A (en) 2021-12-16
KR20220154135A (en) 2022-11-21
TWI801820B (en) 2023-05-11
EP4118512A1 (en) 2023-01-18
WO2021183468A1 (en) 2021-09-16
CN115210744A (en) 2022-10-18

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