EP4094222A4 - Process and system for detecting cracks on back panel of an electronic device - Google Patents

Process and system for detecting cracks on back panel of an electronic device Download PDF

Info

Publication number
EP4094222A4
EP4094222A4 EP20968181.6A EP20968181A EP4094222A4 EP 4094222 A4 EP4094222 A4 EP 4094222A4 EP 20968181 A EP20968181 A EP 20968181A EP 4094222 A4 EP4094222 A4 EP 4094222A4
Authority
EP
European Patent Office
Prior art keywords
electronic device
back panel
detecting cracks
cracks
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP20968181.6A
Other languages
German (de)
French (fr)
Other versions
EP4094222A1 (en
Inventor
Satish Suggala
Anson Bastos
Abhishek Nadgeri
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Service Lee Technologies Pvt Ltd
Original Assignee
Service Lee Technologies Pvt Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Service Lee Technologies Pvt Ltd filed Critical Service Lee Technologies Pvt Ltd
Publication of EP4094222A1 publication Critical patent/EP4094222A1/en
Publication of EP4094222A4 publication Critical patent/EP4094222A4/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30121CRT, LCD or plasma display

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Image Processing (AREA)
  • Studio Devices (AREA)
EP20968181.6A 2020-01-23 2020-03-16 Process and system for detecting cracks on back panel of an electronic device Pending EP4094222A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IN202021003076 2020-01-23
PCT/IN2020/050236 WO2021149068A1 (en) 2020-01-23 2020-03-16 Process and system for detecting cracks on back panel of an electronic device

Publications (2)

Publication Number Publication Date
EP4094222A1 EP4094222A1 (en) 2022-11-30
EP4094222A4 true EP4094222A4 (en) 2024-04-03

Family

ID=76992206

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20968181.6A Pending EP4094222A4 (en) 2020-01-23 2020-03-16 Process and system for detecting cracks on back panel of an electronic device

Country Status (2)

Country Link
EP (1) EP4094222A4 (en)
WO (1) WO2021149068A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013051546A1 (en) * 2011-10-05 2013-04-11 三洋電機株式会社 Electronic camera
US20160019685A1 (en) * 2014-07-21 2016-01-21 Tu Nguyen Method for Performing a Cosmetic Evaluation of a Used Electronic Device
US20170256051A1 (en) * 2016-03-07 2017-09-07 Hyla, Inc. Screen damage detection for devices

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA3227945A1 (en) * 2014-11-06 2016-05-12 Ecoatm, Llc Methods and systems for evaluating and recycling electronic devices
US10127647B2 (en) * 2016-04-15 2018-11-13 Ecoatm, Llc Methods and systems for detecting cracks in electronic devices

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013051546A1 (en) * 2011-10-05 2013-04-11 三洋電機株式会社 Electronic camera
US20160019685A1 (en) * 2014-07-21 2016-01-21 Tu Nguyen Method for Performing a Cosmetic Evaluation of a Used Electronic Device
US20170256051A1 (en) * 2016-03-07 2017-09-07 Hyla, Inc. Screen damage detection for devices

Also Published As

Publication number Publication date
EP4094222A1 (en) 2022-11-30
WO2021149068A1 (en) 2021-07-29

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