EP4092501A4 - FAULT DIAGNOSTIC SYSTEM AND FAULT DIAGNOSTIC METHOD - Google Patents

FAULT DIAGNOSTIC SYSTEM AND FAULT DIAGNOSTIC METHOD Download PDF

Info

Publication number
EP4092501A4
EP4092501A4 EP20913851.0A EP20913851A EP4092501A4 EP 4092501 A4 EP4092501 A4 EP 4092501A4 EP 20913851 A EP20913851 A EP 20913851A EP 4092501 A4 EP4092501 A4 EP 4092501A4
Authority
EP
European Patent Office
Prior art keywords
abnormality diagnosis
diagnosis method
diagnosis system
abnormality
diagnosis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP20913851.0A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP4092501A1 (en
Inventor
Tetsushi Nagano
Takehide Hirata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
JFE Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JFE Steel Corp filed Critical JFE Steel Corp
Publication of EP4092501A1 publication Critical patent/EP4092501A1/en
Publication of EP4092501A4 publication Critical patent/EP4092501A4/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2223/00—Indexing scheme associated with group G05B23/00
    • G05B2223/02—Indirect monitoring, e.g. monitoring production to detect faults of a system

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
EP20913851.0A 2020-01-14 2020-12-21 FAULT DIAGNOSTIC SYSTEM AND FAULT DIAGNOSTIC METHOD Pending EP4092501A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020003769 2020-01-14
PCT/JP2020/047726 WO2021145156A1 (ja) 2020-01-14 2020-12-21 異常診断システム及び異常診断方法

Publications (2)

Publication Number Publication Date
EP4092501A1 EP4092501A1 (en) 2022-11-23
EP4092501A4 true EP4092501A4 (en) 2023-07-19

Family

ID=76863703

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20913851.0A Pending EP4092501A4 (en) 2020-01-14 2020-12-21 FAULT DIAGNOSTIC SYSTEM AND FAULT DIAGNOSTIC METHOD

Country Status (8)

Country Link
US (1) US20230024947A1 (ja)
EP (1) EP4092501A4 (ja)
JP (1) JP6915763B1 (ja)
KR (1) KR20220104042A (ja)
CN (1) CN114846315A (ja)
BR (1) BR112022013365A2 (ja)
TW (1) TWI760050B (ja)
WO (1) WO2021145156A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023113056A (ja) * 2022-02-02 2023-08-15 株式会社日立製作所 タクト分割データ収集システム、及び、異常検知システム

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4762088B2 (ja) * 2006-08-31 2011-08-31 株式会社東芝 プロセス異常診断装置
WO2016039088A1 (ja) * 2014-09-12 2016-03-17 株式会社神戸製鋼所 回転機械異常検出装置および該方法ならびに回転機
WO2017176401A1 (en) * 2016-04-05 2017-10-12 Siemens Energy, Inc. Shaft ground monitoring with diagnostic waveform analysis

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002181038A (ja) * 2000-12-18 2002-06-26 Mitsubishi Heavy Ind Ltd 異常診断装置
JP2008224519A (ja) * 2007-03-14 2008-09-25 Omron Corp 検査装置及びその検査装置における見直し時期の判定方法
JP5991042B2 (ja) 2011-06-29 2016-09-14 Ｊｆｅスチール株式会社 異常監視システムおよび異常監視方法
CN103191931B (zh) * 2012-01-10 2015-03-04 宝山钢铁股份有限公司 热连轧机零调后二侧偏差控制方法
JP6330864B2 (ja) 2015-08-05 2018-05-30 Ｊｆｅスチール株式会社 モータの監視装置および方法
TWI571329B (zh) * 2016-03-02 2017-02-21 中國鋼鐵股份有限公司 軋延追蹤方法
JP6791261B2 (ja) * 2016-11-28 2020-11-25 東芝三菱電機産業システム株式会社 圧延設備の異常診断の方法及び装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4762088B2 (ja) * 2006-08-31 2011-08-31 株式会社東芝 プロセス異常診断装置
WO2016039088A1 (ja) * 2014-09-12 2016-03-17 株式会社神戸製鋼所 回転機械異常検出装置および該方法ならびに回転機
WO2017176401A1 (en) * 2016-04-05 2017-10-12 Siemens Energy, Inc. Shaft ground monitoring with diagnostic waveform analysis

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2021145156A1 *

Also Published As

Publication number Publication date
BR112022013365A2 (pt) 2022-09-13
KR20220104042A (ko) 2022-07-25
JPWO2021145156A1 (ja) 2021-07-22
US20230024947A1 (en) 2023-01-26
WO2021145156A1 (ja) 2021-07-22
JP6915763B1 (ja) 2021-08-04
CN114846315A (zh) 2022-08-02
EP4092501A1 (en) 2022-11-23
TWI760050B (zh) 2022-04-01
TW202138076A (zh) 2021-10-16

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