EP4036674A4 - Individual identification system, individual identification method, and computer-readable recording medium - Google Patents

Individual identification system, individual identification method, and computer-readable recording medium Download PDF

Info

Publication number
EP4036674A4
EP4036674A4 EP20928570.9A EP20928570A EP4036674A4 EP 4036674 A4 EP4036674 A4 EP 4036674A4 EP 20928570 A EP20928570 A EP 20928570A EP 4036674 A4 EP4036674 A4 EP 4036674A4
Authority
EP
European Patent Office
Prior art keywords
individual identification
computer
recording medium
readable recording
identification method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP20928570.9A
Other languages
German (de)
French (fr)
Other versions
EP4036674A1 (en
Inventor
Kengo MAKINO
Toru Takahashi
Rui Ishiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of EP4036674A1 publication Critical patent/EP4036674A1/en
Publication of EP4036674A4 publication Critical patent/EP4036674A4/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/4183—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by data acquisition, e.g. workpiece identification
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/50—Information retrieval; Database structures therefor; File system structures therefor of still image data
    • G06F16/58—Retrieval characterised by using metadata, e.g. metadata not derived from the content or metadata generated manually
    • G06F16/583—Retrieval characterised by using metadata, e.g. metadata not derived from the content or metadata generated manually using metadata automatically derived from the content
    • G06F16/5854—Retrieval characterised by using metadata, e.g. metadata not derived from the content or metadata generated manually using metadata automatically derived from the content using shape and object relationship
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
    • G06T7/38—Registration of image sequences
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67294—Apparatus for monitoring, sorting or marking using identification means, e.g. labels on substrates or labels on containers
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/31—From computer integrated manufacturing till monitoring
    • G05B2219/31308—Capture image asynchronously with processing of analysis, identification
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/45—Nc applications
    • G05B2219/45031—Manufacturing semiconductor wafers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Library & Information Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Manufacturing & Machinery (AREA)
  • Databases & Information Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • General Factory Administration (AREA)
EP20928570.9A 2020-03-30 2020-03-30 Individual identification system, individual identification method, and computer-readable recording medium Pending EP4036674A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/014483 WO2021199123A1 (en) 2020-03-30 2020-03-30 Individual identification system, individual identification method, and computer-readable recording medium

Publications (2)

Publication Number Publication Date
EP4036674A1 EP4036674A1 (en) 2022-08-03
EP4036674A4 true EP4036674A4 (en) 2022-10-12

Family

ID=77928154

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20928570.9A Pending EP4036674A4 (en) 2020-03-30 2020-03-30 Individual identification system, individual identification method, and computer-readable recording medium

Country Status (4)

Country Link
US (1) US20220414851A1 (en)
EP (1) EP4036674A4 (en)
JP (1) JP7311033B2 (en)
WO (1) WO2021199123A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230351723A1 (en) * 2020-10-23 2023-11-02 Nec Corporation Individual identification apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017079326A (en) * 2015-10-21 2017-04-27 日本電気株式会社 Identification device, traceability system, and identification method
JP2018088107A (en) * 2016-11-29 2018-06-07 日本電気株式会社 Identification system, identification method, and identification program

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4518835B2 (en) * 2004-05-13 2010-08-04 大日本スクリーン製造株式会社 Defect detection device, wiring region extraction device, defect detection method, and wiring region extraction method
JP4622477B2 (en) 2004-11-24 2011-02-02 ソニー株式会社 Collation method, computer, and program
JP2008146136A (en) 2006-12-06 2008-06-26 Seiko Epson Corp Image recognition device, image recognition system, image recognition method, and control program
JP4832272B2 (en) * 2006-12-12 2011-12-07 アルパイン株式会社 Vehicle periphery image display device and display method thereof
JP5498111B2 (en) 2008-10-10 2014-05-21 株式会社日立ソリューションズ 1-N authentication apparatus and 1-N authentication method
EP3839803A1 (en) * 2019-12-17 2021-06-23 Wincor Nixdorf International GmbH Method, control device and registration terminal for computer-assisted recognition of empty transport containers
US20210264503A1 (en) * 2020-02-26 2021-08-26 Toshiba Tec Kabushiki Kaisha Sales management system, sales management device, and control method of sales management device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017079326A (en) * 2015-10-21 2017-04-27 日本電気株式会社 Identification device, traceability system, and identification method
JP2018088107A (en) * 2016-11-29 2018-06-07 日本電気株式会社 Identification system, identification method, and identification program

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
ANONYMOUS: "python - OpenCV feature matching for multiple images - Stack Overflow", 21 March 2017 (2017-03-21), XP055956451, Retrieved from the Internet <URL:https://stackoverflow.com/questions/22272283/opencv-feature-matching-for-multiple-images> [retrieved on 20220831] *
See also references of WO2021199123A1 *

Also Published As

Publication number Publication date
WO2021199123A1 (en) 2021-10-07
JP7311033B2 (en) 2023-07-19
JPWO2021199123A1 (en) 2021-10-07
US20220414851A1 (en) 2022-12-29
EP4036674A1 (en) 2022-08-03

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