EP3971598A1 - Magnetoresistive element for a 2d magnetic sensor having a reduced hysteresis response - Google Patents

Magnetoresistive element for a 2d magnetic sensor having a reduced hysteresis response Download PDF

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EP3971598A1
EP3971598A1 EP20315414.1A EP20315414A EP3971598A1 EP 3971598 A1 EP3971598 A1 EP 3971598A1 EP 20315414 A EP20315414 A EP 20315414A EP 3971598 A1 EP3971598 A1 EP 3971598A1
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sense
sublayer
layer
magnetoresistive element
spontaneous
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German (de)
French (fr)
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Andrey Timopheev
Nikita Strelkov
Jeffrey Childress
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Allegro Microsystems Inc
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Crocus Technology SA
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Priority to EP20315414.1A priority Critical patent/EP3971598A1/en
Priority to PCT/IB2021/058336 priority patent/WO2022058875A1/en
Priority to KR1020237009350A priority patent/KR20230069125A/en
Priority to US18/245,380 priority patent/US20230296703A1/en
Priority to JP2023515805A priority patent/JP2023545902A/en
Publication of EP3971598A1 publication Critical patent/EP3971598A1/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09Magnetoresistive devices
    • G01R33/098Magnetoresistive devices comprising tunnel junctions, e.g. tunnel magnetoresistance sensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/12Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/14Measuring or plotting hysteresis curves
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00Thin magnetic films, e.g. of one-domain structure
    • H01F10/32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3254Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/0052Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00Thin magnetic films, e.g. of one-domain structure
    • H01F10/32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3268Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
    • H01F10/3272Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn by use of anti-parallel coupled [APC] ferromagnetic layers, e.g. artificial ferrimagnets [AFI], artificial [AAF] or synthetic [SAF] anti-ferromagnets

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  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
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Abstract

A magnetoresistive element (10) for a 2D magnetic sensor, the magnetoresistive element (10) comprising a tunnel barrier layer (22) included between a reference layer (21) having a reference magnetization (210) and a sense layer (23) having a sense magnetization (230). The sense layer (23) comprises a sense synthetic antiferromagnetic (SAF) structure including a first sense sublayer (231) in contact with the tunnel barrier layer (22) and separated from a second sense sublayer (232) by a first nonmagnetic spacer layer (233) such that the first sense sublayer (231) is antiferromagnetically coupled to the second sense sublayer (232). The sense layer (23) is configured such that a sense magnetic ratio (ΔM) defined as: ΔM=MsFM2tFM2−MsFM1tFM1MsFM2tFM2+MsFM1tFM1 wherein M<sub>SFM1</sub> and M<sub>SFM2</sub> are the spontaneous magnetizations of the first and second sense sublayers (231, 232) and t<sub>FM1</sub> and t<sub>FM2</sub> are the thicknesses of the first and second sense sublayers (231, 232); and wherein the sense magnetic ratio is between 0.1 and 0.25.

Description

    Technical domain
  • The present invention concerns a magnetoresistive element adapted to sense an external magnetic field and having a reduced hysteresis in its response with varying angle of the external magnetic field. The present invention concerns further concerns a 2D magnetic sensor comprising a plurality of the magnetoresistive element.
  • Related art
  • Fig. 1 shows a conventional magnetoresistive element 10 comprising a reference layer 21 having a reference magnetization 210, comprises a tunnel barrier layer 22 and a sense layer 23 having a sense magnetization 230. In Fig. 1, the reference layer 21 comprises a synthetic antiferromagnetic (SAF) structure including a first reference sublayer 211 separated from a second reference sublayer 212 by a first non-magnetic spacer layer 213 such that the first reference sublayer 211 is antiferromagnetically coupled to the second reference sublayer 212.
  • Sensor applications of the magnetoresistive element 10 require that the reference magnetization 210 is fixed such that it is not orientable by an external magnetic field to be measured. To that end, the reference magnetization 210 is pinned by a pinning layer 24, such as an antiferromagnetic layer, by exchange coupling. In contrast, the sense magnetization 230 is free such that it can be aligned by the external magnetic field to be sensed.
  • Moreover, in order to obtain a good sensitivity to the external magnetic field to be measured, the sense magnetization 230 is saturated. However, the saturated sense magnetization 230 induces a local magnetic stray field, shown by numeral 55 in Fig. 1, coupling with the reference layer 21 in a closed magnetic flux configuration. The magnitude of the local magnetic stray field 55 can reach values up to 1000 Oe at the edges of the magnetoresistive element 10.
  • The pinning layer 24 usually contains a certain amount of thermally unstable grains which can be switched upon application of the external magnetic field. The stray field 55 can locally disturb the exchange coupling of the pinning layer 24, resulting in a hysteresis in the response of the magnetoresistive element 10 when the angle of the external magnetic field is varied. Fig. 2 reports simulated response of a 2D sensor comprising a magnetoresistive element 10 such as the one of Fig.1, when the external magnetic field is rotated clockwise (positive angles) and counterclockwise (negative angles). A hysteresis is visible between the clockwise and counterclockwise rotation.
  • A possible solution destined to minimize such hysteresis comprises enhancing the exchange coupling between the pinning layer 24 and the reference layer 21. Alternatively, the reference layer 21 can comprises ferromagnetic materials having higher exchange stiffness, for example Co-rich alloys. However, there are only very limited alloys that have high exchange stiffness and that are compatible with the tunnel magnetoresistive technology. Another possible solution can include decreasing the thickness of the sense layer 23 such as to reduce the stray field 55. However, this is detrimental to the signal-to-noise ratio of the magnetoresistive element 10. Other solutions can include optimizing the growth of the pinning layer 24 and using a larger magnetoresistive element 10 such that the relative contribution of the edges of the magnetoresistive element 10 to reduce the response signal. The two latter solutions are not satisfactory.
  • Summary
  • The present disclosure concerns a magnetoresistive element comprising a tunnel barrier layer included between a reference layer having a reference magnetization and a sense layer having a sense magnetization. The sense layer comprises a SAF structure including a ferromagnetic first sense sublayer in contact with the tunnel barrier layer and separated from a ferromagnetic second sense sublayer by a first non-magnetic spacer layer such that the first sense sublayer is antiferromagnetically coupled to the second sense sublayer. The sense layer is configured such that a sense magnetic ratio defined as: Δ M = Ms FM 2 t FM 2 Ms FM 1 t FM 1 Ms FM 2 t FM 2 + Ms FM 1 t FM 1
    Figure imgb0001
    wherein MSFM1 and MSFM2 are the spontaneous magnetizations of, respectively, the first and second sense sublayers and tFM1 and tFM2 are the thicknesses of, respectively, the first and second sense sublayers. The sense magnetic ratio is between 0.1 and 0.25.
  • The present disclosure further concerns a 2D magnetic sensor comprising a plurality of the magnetoresistive element disclosed herein.
  • The ratio of the magnetic moment results in a non-null magnetic moment of the sense layer and a net stray field on the level of pinned layer will that is significantly suppressed.
  • The magnetoresistive element disclosed herein has a reduced hysteresis response when measuring an external magnetic field varying angularly. The magnetoresistive element has improved sensitivity, signal to noise ratio and has better sensor lifetime.
  • The present invention further concerns a 2D magnetic sensor comprising a plurality of the magnetoresistive element.
  • Short description of the drawings
  • Exemplar embodiments of the invention are disclosed in the description and illustrated by the drawings in which:
    • Fig. 1 illustrates schematically a conventional magnetoresistive element;
    • Fig. 2 reports simulated response of a 2D sensor comprising the magnetoresistive element of Fig.1;
    • Fig. 3 illustrates schematically a magnetoresistive element comprising a reference layer a sense layer and a tunnel barrier layer, wherein the sense layer comprises a sense SAF structure including a first sense sublayer separated from a second sense sublayer by a non-magnetic sense spacer layer, according to an embodiment;
    • Fig. 4 reports the ratio of the SAF stray field for a magnetoresistive element of the invention to the FM stray field for a conventional magnetoresistive element, as a function of the ratio of the magnetic moment of the first sense sublayer to the magnetic moment of the second sense sublayer;
    • Fig. 5 reports the ratio of the SAF stray field to the FM stray field as a function of the thickness of the second sense sublayer for a magnetoresistive element of the invention;
    • Fig. 6 shows the variation of a signal measured by the magnetoresistive element of the invention as a function of the angle of an external magnetic field;
    • Fig. 7 shows the magnetoresistive element, according to another embodiment;
    • Fig. 8 shows a detail of the second sense sublayer according to another embodiment;
    • Fig. 9 shows the magnetoresistive element, according to yet another embodiment;
    • Fig. 10 illustrates the magnetoresistive element, according to yet another embodiment; and
    • Fig. 11 shows a detail of the sense layer, according to an embodiment.
    Examples of embodiments
  • With reference to Fig. 3 , a magnetoresistive element 10 is shown comprising a reference layer 21 having a reference magnetization 210 and a sense layer 23 having a sense magnetization 230. A tunnel barrier layer 22 is included between the reference layer 21 and the sense layer 23. The reference layer 21 comprises a reference SAF structure including a first reference sublayer 211, a second reference sublayer 212 in contact with the tunnel barrier layer 22 and a non-magnetic reference spacer layer 213 between the first and second reference sublayers 211, 212 such that the first reference sublayer 211 is antiferromagnetically coupled to the second reference sublayer 212. The sense layer 23 comprises a sense SAF structure including a first sense sublayer 231 in contact with the tunnel barrier layer 22 and separated from a second sense sublayer 232 by a non-magnetic first sense spacer layer 233 such that the first sense sublayer 231 is antiferromagnetically coupled to the second sense sublayer 232.
  • Preferably, the sense magnetization 230 is saturated.
  • In an embodiment, the magnetic moment of the first sense sublayer 231 is smaller than the magnetic moment of the second sense sublayer 232. More particularly, a sense magnetic ratio ΔM, i.e., the ratio of the magnetic moment of the first sense sublayer 231 to the magnetic moment of the second sense sublayer 232, can be defined by Equation (1): Δ M = Ms FM 2 t FM 2 Ms FM 1 t FM 1 Ms FM 2 t FM 2 + Ms FM 1 t FM 1
    Figure imgb0002
    where MSFM1 corresponds to the spontaneous magnetization of the first sense sublayer 231, tFM1 corresponds to the thickness of the first sense sublayer 231, MSFM2 corresponds to the spontaneous magnetization of the second sense sublayer 232 and tFM2 corresponds to the thickness of the second sense sublayer 232.
  • In a preferred embodiment, the sense magnetic ratio ΔM is between 0.1 and 0.25.
  • Fig. 4 reports the ratio of the SAF stray field HAFM to the FM stray field HFM as a function of the sense magnetic ratio ΔM. Here, the SAF stray field HAFM corresponds to the net stray field 55 generated by the sense SAF structure 23, i.e., the stray field resulting from the different sense sublayers 231, 232. The FM stray field HFM corresponds to the stray field generated by the sense layer 23 comprising a single ferromagnetic layer or several ferromagnetically coupled ferromagnetic layers. The SAF stray field HAFM was calculated for the first sense sublayer 231 having a thickness of 2 nm and for the second sense sublayer 232 having a thickness between 2 nm and 6 nm. The FM stray field HFM was calculated for a ferromagnetic layer having a thickness of between 0 nm and 4 nm. Fig. 4 shows that a sense magnetic ratio ΔM of 0.2 yields a ratio of the SAF stray field HAFM to the FM stray field HFM of 14%.
  • Fig. 5 reports the ratio of the SAF stray field HAFM to the FM stray field HFM as a function of the thickness of the second sense sublayer 232. The first sense sublayer 231 has a thickness of 2 nm. When the ratio of the SAF stray field HAFM to the FM stray field HFM is null, and when the sense magnetic ratio ΔM is null, the sense layer 23 loses its capability to sense the external magnetic field. This corresponds to the second sense sublayer 232 having a thickness of 3 nm in the example of Fig. 5.
  • A sense magnetic ratio ΔM between 0.1 and 0.25 provides a good sensitivity of the magnetoresistive element 10 to the external magnetic field. Moreover, it reduces the net stray field 55 on the reference layer 21 such that the response of the magnetoresistive element 10 to an angularly varying external magnetic field shows substantially no hysteresis. Fig. 6 shows the variation of a signal measured by the magnetoresistive element 10 (such as a resistance value) as a function of the angle of the external magnetic field being measured. Here, the net stray field 55 generated by the sense layer 23 has a magnitude of 400 Oe. Almost no hysteresis is observed.
  • The magnetoresistive element 10 described herein can have lower magnetic noise and higher tunnel magnetoresistance (TMR) by using thick magnetic layers in the sensing layer 23. The reduction of the net stray field 55 generated by the sense layer 23 and acting on the pinned reference layer 21 can further have enhanced stability to high temperature, improved life-time stability and improved overall performance.
  • As shown in Figs. 4 and 5, the ratio of the magnetic moments in the first and second sense sublayers 231, 232 can be varied in order to optimize the net stray field 55 by selecting the thickness of the first and second sense sublayers 231, 232, by selecting the composition of the first and second sense sublayers 231, 232 and/or by other parameters of the sense layer 23.
  • In one aspect, the first and second sense sublayers 231, 232 can comprise a ferromagnetic material such as a ferromagnetic alloy based on any one of Fe, Co, Ni, for example CoFe or NiFe. At least one of the first and second sense sublayers 231, 232 can further comprise a non-magnetic element such as B, Ta, Ru or W or a combination of these elements. More particularly, the first sense sublayer 231 comprises nonmagnetic elements in order to dilute the ferromagnetic material constituting the first sense sublayer 231 and decrease its spontaneous magnetization 230.
  • In another aspect, the second sense sublayer 232 has a greater thickness than the first sense sublayer 231.
  • In one aspect, the first sense spacer layer 233 can comprise a non-magnetic material such as, but not limited to, Ru, W, Mo or Ir or a combination of these elements.
  • With reference to Fig. 7 , the magnetoresistive element 10 is shown according to another embodiment, wherein the first sense sublayer 231 is antiferromagnetically coupled to the second sense sublayer 232, and wherein the second sense sublayer 232 comprises a gradient of the sense spontaneous magnetization 230. More particularly the sense spontaneous magnetization 230 in the second sense sublayer 232 increases with increasing distance from the first sense spacer layer 233.
  • The net spontaneous magnetization 230 of the second sense sublayer 232 can be adjusted to compensate the spontaneous magnetization 230 of the first sense sublayer 231 such as to adjust the sense magnetic ratio ΔM, for example between 0.1 and 0.25. Here, MSFM2 corresponds to the net spontaneous magnetization of the second sense sublayer 232.
  • Since the magnitude of the stray field 55 decreases as the cube of the distance, the larger sense magnetization 230 in the portion of the second sense sublayer 232 farthest from the reference layer 21 does not contribute significantly to the net stray field 55 at the level of the reference layer 21. On the other hand, the larger sense magnetization 230 allows for increasing the TMR of the magnetoresistive element 10.
  • has a sense spontaneous magnetization 230 that is smaller, for example at least two times, than the sense spontaneous magnetization 230 of the first sense sublayer 231 and, thus, generate a smaller net stray field 55 on the reference layer 21. On the level of the reference layer 21, the net stray field 55 produced by the second sense sublayer 232 is smaller than the one produced by the first sense sublayer 231.
  • In one aspect, the second sense sublayer 232 comprises a gradient of nonmagnetic impurities. More particularly, the second sense sublayer 232 comprises nonmagnetic impurities in a concentration that decreases with increasing distance from the first sense spacer layer 233. The increasing content of nonmagnetic impurities dilutes the ferromagnetic material of the second sense sublayer 232 towards the first sense spacer layer 233.
  • Fig. 8 shows a detail of the second sense sublayer 232 according to another aspect. Here, the second sense sublayer 232 comprises a plurality of ferromagnetic sense bi-layers 232bl, wherein each sense bi-layer 232bl includes a low spontaneous sense layer 237 and a high spontaneous sense layer 238. The high spontaneous sense layer 238 has a sense spontaneous magnetization 230 higher than the one of the low spontaneous sense layer 237. The thicknesses of the low spontaneous sense layer 237 relative to the thicknesses of the high spontaneous sense layer 238 decreases with increasing distance from the first sense spacer layer 233.
  • Any one of, alone or in combination, the thickness of the second sense sublayer 232, the gradient of the sense spontaneous magnetization 230 or the arrangement of the sense bi-layers 232bl, can be adjusted in order to obtain the ratio of the magnetic moment of the first sense sublayer 231 to the magnetic moment of the second sense sublayer 232 between 0.1 and 0.25, and to decrease the net stray field 55 applied on the reference layer 21.
  • The configuration of the magnetoresistive element 10 shown in Figs. 7 and 8 allows for obtaining a low stray field 55 and have a sense magnetic ratio ΔM between 0.1 and 0.25 using only a single sense spacer layer 233. In the case the second sense sublayer 232 comprises a plurality of ferromagnetic sense bi-layers 232bl, the term MSFM2 corresponds to the net spontaneous magnetization of the plurality of ferromagnetic sense bi-layers 232bl and tFM2 corresponds to the thickness of the second sense sublayer 232 comprising the plurality of ferromagnetic sense bi-layers 232bl. Fig. 9 illustrates the magnetoresistive element 10 according to yet another embodiment, wherein the second sense sublayer 232 comprises a proximal second sense sublayer 232a and a distal second sense sublayer 232b. The distal second sense sublayer 232b has a sense spontaneous magnetization 230 that is at least two times higher than the sense spontaneous magnetization 230 of the proximal second sense sublayer 232a. The proximal second sense sublayer 232a is ferromagnetically coupled to the distal second sense sublayer 232b.
  • Here, the sense magnetic ratio ΔM does not depend on a specific arrangement of the first and second sense layers 231, 232a, 232b but rather on the net magnetic moment of these layers. More particularly, the term MSFM2 tFM2 in Equation (1) corresponds to MSFM2a tFM2a + MSFM2b tFM2b, where MSFM2a and tFM2a respectively correspond to the spontaneous magnetization and thickness of the proximal second sense sublayer 232a and where MSFM2b and tFM2b, respectively correspond to the spontaneous magnetization and thickness of the distal second sense sublayer 232b.
  • In one aspect, the lower sense spontaneous magnetization 230 of the proximal second sense sublayer 232a relative to the distal second sense sublayer 232b can be obtained by including nonmagnetic impurities in the ferromagnetic proximal second sense sublayer 232a such as to dilute the spontaneous magnetization of the ferromagnetic material. Alternatively or in combination, the relative lower sense spontaneous magnetization 230 of the proximal second sense sublayer 232a can be obtained by the distal second sense sublayer 232b having a greater thickness that the thickness of the proximal second sense sublayer 232a.
  • The sense spontaneous magnetization 230 of the proximal second sense sublayer 232a can be adjusted to compensate the stray field generated by the first sense sublayer 231 and decrease the net stray field 55 at the reference layer 21. Since the magnitude of the stray field 55 decreases as the cube of the distance, the stray field generated by the thicker distal second sense sublayer 232b has a negligible contribution in the net stray field 55 at the reference layer 21. The larger sense magnetization 230 of the distal second sense sublayer 232b allows for increasing the TMR of the magnetoresistive element 10.
  • Fig. 10 illustrates a variant of the magnetoresistive element 10 shown in Fig. 9, wherein the second sense sublayer 232 comprises a proximal second sense sublayer 232a separated from a distal second sense sublayer 232b by a non-magnetic second sense spacer layer 235. The second sense spacer layer 235 can comprise a non-magnetic material such as, but not limited to, Ru, W, Mo or Ir or a combination of these elements. In this configuration, the distal second sense sublayer 232b is antiferromagnetically coupled to the proximal second sense sublayer 232a.
  • Similarly to the configuration of the magnetoresistive element 10 shown in Fig. 9, the thickness of the proximal second sense sublayer 232a can be adjusted to compensate the stray field generated by the first sense sublayer 231 and decrease the net stray field 55 at the reference layer 21. The stray field generated by the thicker distal second sense sublayer 232b has a negligible contribution in the net stray field 55 at the reference layer 21. The larger sense magnetization 230 of the distal second sense sublayer 232b allows for increasing the TMR of the magnetoresistive element 10.
  • In a variant not illustrated, the sequence: "first sense layer 231 / first sense spacer layer 233 / second sense layer 232" can be repeated a plurality of times forming a multi-layered structure. Such multi-layered structure can have a spontaneous magnetization that is lower than the spontaneous magnetization of the distal second sense layer 232b. The multi-layered structure can be strongly coupled to the distal second sense layer 232b.
  • The thickness of the first sense layer 231 and/or the second sense layer 232, as well as the thickness of the proximal and distal second sense layers 232a, 232b in the magnetoresistive element 10 according to the configuration of Figs. 9 and 10, can be adjusted in order to decrease the stray field 55.
  • Fig. 11 shows a detail of the sense layer 23 according to an embodiment, wherein the sense layer 23 further comprises an intermediate ferromagnetic sense layer 236 on each side of the first sense spacer layer 233 and in contact with the first sense spacer layer 233. The intermediate ferromagnetic sense layer 236 can be a nanolayer, for example have a thickness of about 1 nm. The intermediate ferromagnetic sense layer 236 can comprises any one of a Co or CoFe -based alloy. Preferably, the intermediate ferromagnetic sense layer 236 has a high spontaneous magnetization. For example, the intermediate ferromagnetic sense layer 236 can comprises a CoFe alloy containing 25 to 50% wt Fe.
  • Improved sensing layer structure with two or more antiferromagnetically coupled sublayers. Proper choice of sense layer materials and sense layer thickness provides significant reduction of hysteresis in sensor angular response, improves sensitivity, signal to noise ratio and longevity of sensor lifetime.
  • In an embodiment, a 2D magnetic sensor comprises a plurality of the magnetoresistive element 10 disclosed herein.
  • Reference numbers and symbols
  • 10
    magnetoresistive element
    21
    reference layer, reference SAF structure
    210
    reference magnetization
    211
    first reference sublayer
    212
    second reference sublayer
    213
    reference spacer layer
    22
    tunnel barrier layer
    23
    sense layer, sense SAF structure
    230
    sense magnetization
    231
    first sense sublayer
    232
    second sense sublayer
    232a
    proximal second sense sublayer
    232b
    distal second sense sublayer
    232bl
    sense bi-layer
    233
    first sense spacer layer
    234
    third sense sublayer
    235
    second sense spacer layer
    236
    intermediate ferromagnetic sense layer
    237
    low spontaneous sense layer
    238
    high spontaneous sense layer
    24
    pinning layer, antiferromagnetic layer
    55
    local magnetic stray field, net stray field
    ΔM
    sense magnetic ratio
    HAFM
    SAF stray field
    HFM
    FM stray field

Claims (15)

  1. A magnetoresistive element (10) for a 2D magnetic sensor, the magnetoresistive element (10) comprising a tunnel barrier layer (22) included between a reference layer (21) having a reference magnetization (210) and a sense layer (23) having a sense magnetization (230);
    wherein the sense layer (23) comprises a synthetic antiferromagnetic (SAF) structure including a ferromagnetic first sense sublayer (231) in contact with the tunnel barrier layer (22) and separated from a ferromagnetic second sense sublayer (232) by a first non-magnetic spacer layer (233) such that the first sense sublayer (231) is antiferromagnetically coupled to the second sense sublayer (232); and
    wherein the sense layer (23) is configured such that a sense magnetic ratio (ΔM) defined as: Δ M = Ms FM 2 t FM 2 Ms FM 1 t FM 1 Ms FM 2 t FM 2 + Ms FM 1 t FM 1
    Figure imgb0003

    wherein MSFM1 and MSFM2 are the spontaneous magnetizations of, respectively, the first and second sense sublayers (231, 232) and tFM1 and tFM2 are the thicknesses of, respectively, the first and second sense sublayers (231, 232); and
    wherein the sense magnetic ratio (ΔM) is between 0.1 and 0.25.
  2. The magnetoresistive element according to claim 1,
    wherein the first sense sublayer (231)has a thickness between 1 nm and 3 nm and the second sense sublayer (232) has a thickness between 2 nm and 6 nm.
  3. The magnetoresistive element according to claim 2,
    wherein the second sense sublayer (232) has a greater thickness than the first sense sublayer (231).
  4. The magnetoresistive element according to claim 3,
    wherein the first sense sublayer (231) comprises nonmagnetic elements in order to decrease its spontaneous magnetization (230).
  5. The magnetoresistive element according to any one of claims 1 to 4,
    wherein the sense spacer layer (233) comprises Ru, W, Mo or Ir or a combination of these elements.
  6. The magnetoresistive element according to any one of claims 1 to 5,
    wherein the second sense sublayer (232) comprises a spontaneous magnetization (230) that increases with increasing distance from the sense spacer layer (233).
  7. The magnetoresistive element according to claim 6,
    wherein the second sense sublayer (232) comprises a ferromagnetic material containing nonmagnetic impurities in a concentration that decreases with increasing distance from the sense spacer layer (233).
  8. The magnetoresistive element according to claim 6,
    wherein the second sense sublayer (232) comprises a plurality of ferromagnetic sense bi-layers (232bl), each sense bi-layer (232bl) including a low spontaneous sense layer (237) and a high spontaneous sense layer (238) having a spontaneous magnetization (230) higher than the one of the low spontaneous sense layer (237); and
    wherein the thicknesses of the low spontaneous sense layer (237) relative to the thicknesses of the high spontaneous sense layer (238) decreases with increasing distance from the sense spacer layer (233).
  9. The magnetoresistive element (10) according to any one of claims 1 to 5,
    wherein the second sense sublayer (232) comprises a proximal second sense sublayer 232a and a distal second sense sublayer 232bferromagnetically coupled to the proximal second sense sublayer (232a); and
    wherein the a distal second sense sublayer (232b) has a spontaneous magnetization (230) that is at least two times greater than the proximal second sense sublayer (232a).
  10. The magnetoresistive element (10) according to claim 9,
    wherein the proximal second sense sublayer (232a) comprises a ferromagnetic material containing nonmagnetic impurities decreasing the spontaneous magnetization (230) of the ferromagnetic material.
  11. The magnetoresistive element (10) according to any one of claims 1 to 5,
    wherein the second sense sublayer (232) comprises a proximal second sense sublayer (232a) separated from a distal second sense sublayer (232b) by a non-magnetic second sense spacer layer (235) and antiferromagnetically coupled to the distal second sense sublayer (232b).
  12. The magnetoresistive element (10) according to claim 11,
    wherein the spontaneous magnetization (230) of the distal second sense sublayer (232b) is higher than the spontaneous magnetization (230) of the first sense layer (231) and the proximal second sense sublayer (232a).
  13. The magnetoresistive element (10) according to claim 11 or 12, comprising a plurality of the sense SAF structure (231, 232, 233).
  14. The magnetoresistive element (10) according to any one of claims 1 to 13,
    wherein the sense layer (23) further comprises an intermediate ferromagnetic sense layer (236) on each side of the sense spacer layer (233) and in contact with the sense spacer layer(233).
  15. 2D magnetic sensor comprising a plurality of the magnetoresistive element (10) according to any one of claims 1 to 14.
EP20315414.1A 2020-09-18 2020-09-18 Magnetoresistive element for a 2d magnetic sensor having a reduced hysteresis response Pending EP3971598A1 (en)

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Application Number Priority Date Filing Date Title
EP20315414.1A EP3971598A1 (en) 2020-09-18 2020-09-18 Magnetoresistive element for a 2d magnetic sensor having a reduced hysteresis response
PCT/IB2021/058336 WO2022058875A1 (en) 2020-09-18 2021-09-14 Magnetoresistive element for a 2d magnetic sensor having a reduced hysteresis response
KR1020237009350A KR20230069125A (en) 2020-09-18 2021-09-14 Magnetoresistive element for two-dimensional magnetic sensor with reduced hysteresis response
US18/245,380 US20230296703A1 (en) 2020-09-18 2021-09-14 Magnetoresistive element for a 2d magnetic sensor having a reduced hysteresis response
JP2023515805A JP2023545902A (en) 2020-09-18 2021-09-14 Magnetoresistive element for two-dimensional magnetic sensor with reduced hysteresis response

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EP1727149A1 (en) * 2005-05-19 2006-11-29 NEC Corporation Magnetoresistive device and magnetic memory using the same
US20090121710A1 (en) * 2007-11-09 2009-05-14 Headway Technologies, Inc. Novel free layer design for TMR/CPP device
US20100316890A1 (en) * 2007-10-26 2010-12-16 Canon Anelva Corporation Magnetic tunnel junction device with magnetic free layer having sandwich structure
US20170140781A1 (en) * 2015-11-12 2017-05-18 Seagate Technology Llc Reader with free layer experiencing opposite phase-shifted media torques

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1727149A1 (en) * 2005-05-19 2006-11-29 NEC Corporation Magnetoresistive device and magnetic memory using the same
US20100316890A1 (en) * 2007-10-26 2010-12-16 Canon Anelva Corporation Magnetic tunnel junction device with magnetic free layer having sandwich structure
US20090121710A1 (en) * 2007-11-09 2009-05-14 Headway Technologies, Inc. Novel free layer design for TMR/CPP device
US20170140781A1 (en) * 2015-11-12 2017-05-18 Seagate Technology Llc Reader with free layer experiencing opposite phase-shifted media torques

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WO2022058875A1 (en) 2022-03-24
KR20230069125A (en) 2023-05-18
US20230296703A1 (en) 2023-09-21

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