EP3895018A4 - Vérification de synchronisme de matériel dans un intervalle de détection de défaillance dans un système sur puce - Google Patents
Vérification de synchronisme de matériel dans un intervalle de détection de défaillance dans un système sur puce Download PDFInfo
- Publication number
- EP3895018A4 EP3895018A4 EP19894625.3A EP19894625A EP3895018A4 EP 3895018 A4 EP3895018 A4 EP 3895018A4 EP 19894625 A EP19894625 A EP 19894625A EP 3895018 A4 EP3895018 A4 EP 3895018A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- hardware
- chip
- fault detection
- detection interval
- lockstep checking
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/16—Error detection or correction of the data by redundancy in hardware
- G06F11/1675—Temporal synchronisation or re-synchronisation of redundant processing components
- G06F11/1683—Temporal synchronisation or re-synchronisation of redundant processing components at instruction level
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/16—Error detection or correction of the data by redundancy in hardware
- G06F11/1629—Error detection by comparing the output of redundant processing systems
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/16—Error detection or correction of the data by redundancy in hardware
- G06F11/1629—Error detection by comparing the output of redundant processing systems
- G06F11/1633—Error detection by comparing the output of redundant processing systems using mutual exchange of the output between the redundant processing components
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/16—Error detection or correction of the data by redundancy in hardware
- G06F11/1629—Error detection by comparing the output of redundant processing systems
- G06F11/1641—Error detection by comparing the output of redundant processing systems where the comparison is not performed by the redundant processing components
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/16—Error detection or correction of the data by redundancy in hardware
- G06F11/1695—Error detection or correction of the data by redundancy in hardware which are operating with time diversity
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16/218,078 US10831628B2 (en) | 2018-12-12 | 2018-12-12 | Hardware lockstep checking within a fault detection interval in a system on chip |
PCT/US2019/063607 WO2020123159A1 (fr) | 2018-12-12 | 2019-11-27 | Vérification de synchronisme de matériel dans un intervalle de détection de défaillance dans un système sur puce |
Publications (2)
Publication Number | Publication Date |
---|---|
EP3895018A1 EP3895018A1 (fr) | 2021-10-20 |
EP3895018A4 true EP3895018A4 (fr) | 2022-09-14 |
Family
ID=66095804
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP19894625.3A Pending EP3895018A4 (fr) | 2018-12-12 | 2019-11-27 | Vérification de synchronisme de matériel dans un intervalle de détection de défaillance dans un système sur puce |
Country Status (4)
Country | Link |
---|---|
US (1) | US10831628B2 (fr) |
EP (1) | EP3895018A4 (fr) |
CN (1) | CN113168366A (fr) |
WO (1) | WO2020123159A1 (fr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10831628B2 (en) | 2018-12-12 | 2020-11-10 | Intel Corporation | Hardware lockstep checking within a fault detection interval in a system on chip |
KR20210044364A (ko) | 2019-10-14 | 2021-04-23 | 삼성전자주식회사 | 이미지 센서 |
US11221901B2 (en) | 2019-11-26 | 2022-01-11 | Siemens Industry Software Inc. | Monitoring processors operating in lockstep |
KR20210084871A (ko) | 2019-12-30 | 2021-07-08 | 삼성전자주식회사 | 안전 민감 데이터의 무결성 점검 장치 및 이를 포함하는 전자 기기 |
JP7312141B2 (ja) * | 2020-05-25 | 2023-07-20 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US11513883B2 (en) * | 2021-01-29 | 2022-11-29 | Stmicroelectronics International N.V. | Glitch absorption apparatus and method |
US11550684B2 (en) * | 2021-04-19 | 2023-01-10 | Nxp B.V. | Testing of lockstep architecture in system-on-chips |
US11892505B1 (en) * | 2022-09-15 | 2024-02-06 | Stmicroelectronics International N.V. | Debug and trace circuit in lockstep architectures, associated method, processing system, and apparatus |
CN116821038B (zh) * | 2023-08-28 | 2023-12-26 | 英特尔(中国)研究中心有限公司 | 用于处理器的锁步控制装置和方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007005818A2 (fr) * | 2005-06-30 | 2007-01-11 | Intel Corporation | Reduction du taux d'erreurs incorrigibles dans un systeme de redondance a double module en mode perpetuel |
EP2722760A1 (fr) * | 2012-10-18 | 2014-04-23 | Renesas Electronics Corporation | Dispositif semi-conducteur |
US20180059180A1 (en) * | 2016-09-01 | 2018-03-01 | Texas Instruments Incorporated | Self Test for Safety Logic |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6055660A (en) * | 1997-10-02 | 2000-04-25 | International Business Machines Corporation | Method for identifying SMP bus transfer errors |
US7502958B2 (en) * | 2004-10-25 | 2009-03-10 | Hewlett-Packard Development Company, L.P. | System and method for providing firmware recoverable lockstep protection |
JP3897046B2 (ja) | 2005-01-28 | 2007-03-22 | 横河電機株式会社 | 情報処理装置および情報処理方法 |
US7412353B2 (en) * | 2005-09-28 | 2008-08-12 | Intel Corporation | Reliable computing with a many-core processor |
US8117512B2 (en) | 2008-02-06 | 2012-02-14 | Westinghouse Electric Company Llc | Failure detection and mitigation in logic circuits |
US7890831B2 (en) * | 2008-06-10 | 2011-02-15 | Globalfoundries Inc. | Processor test system utilizing functional redundancy |
DE102011086530A1 (de) | 2010-11-19 | 2012-05-24 | Continental Teves Ag & Co. Ohg | Mikroprozessorsystem mit fehlertoleranter Architektur |
KR101560497B1 (ko) | 2014-09-26 | 2015-10-15 | 성균관대학교산학협력단 | 락스텝으로 이중화된 프로세서 코어들의 리셋 제어 방법 및 이를 이용하는 락스텝 시스템 |
US10169240B2 (en) * | 2016-04-08 | 2019-01-01 | Qualcomm Incorporated | Reducing memory access bandwidth based on prediction of memory request size |
US10482024B2 (en) * | 2017-07-20 | 2019-11-19 | Alibaba Group Holding Limited | Private caching for thread local storage data access |
US10831628B2 (en) | 2018-12-12 | 2020-11-10 | Intel Corporation | Hardware lockstep checking within a fault detection interval in a system on chip |
-
2018
- 2018-12-12 US US16/218,078 patent/US10831628B2/en active Active
-
2019
- 2019-11-27 EP EP19894625.3A patent/EP3895018A4/fr active Pending
- 2019-11-27 CN CN201980043425.1A patent/CN113168366A/zh active Pending
- 2019-11-27 WO PCT/US2019/063607 patent/WO2020123159A1/fr unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007005818A2 (fr) * | 2005-06-30 | 2007-01-11 | Intel Corporation | Reduction du taux d'erreurs incorrigibles dans un systeme de redondance a double module en mode perpetuel |
EP2722760A1 (fr) * | 2012-10-18 | 2014-04-23 | Renesas Electronics Corporation | Dispositif semi-conducteur |
US20180059180A1 (en) * | 2016-09-01 | 2018-03-01 | Texas Instruments Incorporated | Self Test for Safety Logic |
Also Published As
Publication number | Publication date |
---|---|
US10831628B2 (en) | 2020-11-10 |
CN113168366A (zh) | 2021-07-23 |
US20190114243A1 (en) | 2019-04-18 |
WO2020123159A1 (fr) | 2020-06-18 |
EP3895018A1 (fr) | 2021-10-20 |
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