EP3418754B1 - Leakage current sensor, and apparatus for monitoring leakage current - Google Patents
Leakage current sensor, and apparatus for monitoring leakage current Download PDFInfo
- Publication number
- EP3418754B1 EP3418754B1 EP17900278.7A EP17900278A EP3418754B1 EP 3418754 B1 EP3418754 B1 EP 3418754B1 EP 17900278 A EP17900278 A EP 17900278A EP 3418754 B1 EP3418754 B1 EP 3418754B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- leakage current
- asic chip
- current sensor
- signals
- module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012544 monitoring process Methods 0.000 title description 3
- 238000004891 communication Methods 0.000 claims description 24
- 238000012545 processing Methods 0.000 claims description 22
- 238000005070 sampling Methods 0.000 claims description 19
- 238000012806 monitoring device Methods 0.000 claims description 11
- 230000002093 peripheral effect Effects 0.000 claims description 6
- 230000002457 bidirectional effect Effects 0.000 claims description 5
- 238000013507 mapping Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 5
- 230000003321 amplification Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/257—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/44—Modifications of instruments for temperature compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Current Or Voltage (AREA)
Description
- The present invention relates to the technical field of current sensing, and more particularly, to a leakage current sensor and a leakage current monitoring device.
- In particular the invention relates to a leakage current sensor, comprising: an input end, an output end, and an ASIC chip, wherein the ASIC chip is electrically connected with the input end for reading analog quantity signals of the input end, wherein the ASIC chip is further electrically connected to a digital signal processing module, wherein the digital signal processing module is configured to output digital quantity signals to the output end, wherein the input end comprises a current sampling unit, wherein the current sampling unit is used for sampling and acquiring an analog quantity of a reference current or a leakage current.
- Document
US 2016/0124030 A1 discloses a leakage current sensor of the generic type as defined above. In particular the document discloses a method for measuring current, comprising shorting first and second inputs of an amplifying circuit to generate a first output signal, and converting the first output signal into an offset cancelation value. The method also comprises passing a current through a power switch, wherein the current generates a voltage drop across the power switch, applying the voltage drop across the first and second inputs of the amplifying circuit to generate a second output signal, and converting the second output signal into a current value. The method further comprises subtracting the offset cancelation value from the current value to generate an offset-compensated current value. - Leakage current sensors are widely applied in various industries such as photovoltaic inverters, charging piles, rail signal monitoring, special power supply and fireproof monitoring. For instance, a leakage current sensor serves as a core protection component of a non-isolated photovoltaic inverter. However, traditional closed-loop flux gate sensors are no longer applicable due to their low power density degree, cumbersome structure and high cost.
- Moreover, a leakage current sensor occupies too much space, as compared to other components in a photovoltaic inverter. Thus, it's difficult to achieve miniaturization and portability of an overall structural design.
- To adapt to various current levels, leakage current sensors usually amplify a part of the sampling current. In a traditional technical solution, an amplification circuit is installed in the sensor, and the input and output of the circuit are both analog quantities. Due to the inherent characteristics of the amplifying circuit, the amplifying process has low precision. Even worse, noises are inevitably introduced into the aforesaid process, leading to a distorted output quantity.
- Leakage current sensors are also an important safety component. In order to enhance their safety and reliability, functions such as self-checking and over-temperature protection are necessary during the electrifying and operating processes.
- The purpose of the present invention is to solve the shortcomings in the prior art by providing a leakage current sensor, which is portable, intelligent and has a high power density degree.
- To achieve the above purpose, the present invention adopts the following technical solution:
A leakage current sensor, comprising: an input end, an output end, and an ASIC chip,
wherein the ASIC chip is electrically connected with the input end for reading analog quantity signals of the input end, wherein the ASIC chip is further electrically connected to a digital signal processing module, wherein the digital signal processing module is configured to output digital quantity signals to the output end, wherein the input end comprises a current sampling unit, wherein the current sampling unit is used for sampling and acquiring an analog quantity of a reference current or a leakage current. In addition the digital signal processing module is configured to simultaneously feedback the output digital quantity signals to the ASIC chip, thereby forming a closed-loop feedback circuit, and a reference unit is arranged between the current sampling unit and the ASIC chip, wherein the ASIC chip is configured to control the reference unit to generate reference currents with different grades; wherein the ASIC chip is configured to repeatedly set a same reference current value for calibration, and to read digital quantity signals fed back by the digital signal processing module, thereby forming a corresponding mapping between the analog quantity and the digital quantity of the reference current; the ASIC chip is configured to compensate the errors of the analog quantity signals of the leakage current according to aforesaid corresponding mapping, thereby outputting digital quantity signals; and the ASIC chip has a preset programmable circuit which is programmed to achieve an accurate gain output of the digital quantity signals. - In another embodiment of the present invention, the leakage current sensor further comprises a communication module, and the ASIC chip is electrically connected with the communication module. The communication module is connected with an external device for acquiring external control signals. The ASIC chip is configured to read the aforesaid external control signals.
- In another embodiment of the present invention, the leakage current sensor further comprises a communication module, and the ASIC chip is electrically connected with the communication module. The communication module is connected with an external device for acquiring external control signals. The ASIC chip is configured to read the aforesaid external control signals and adjusts the programmable circuit.
- In another embodiment of the present invention, the communication module is configured to read the state signals sent by the ASIC chip and and to further forward the signals to an external device, thereby achieving a bidirectional signal communication.
- In another embodiment of the present invention, the leakage current sensor further comprises a safety self-checking module and an over-temperature protection module, wherein the safety self-checking module and the over-temperature protection module are respectively electrically connected with the
ASIC chip 120. The over-temperature protection module has a preset temperature upper limit. - In another aspect of the present invention, a leakage current monitoring device comprises the aforesaid leakage current sensor. The leakage current monitoring device comprises a base plate and an annular magnetic core that is fixedly connected with the base plate. The base plate is embedded in an outer shell, and the leakage current sensor is embedded in the base plate. A peripheral circuit and a plurality of lead feet are arranged on the periphery of the leakage current sensor. The lead feet are led from the peripheral circuit, and are further connected with an external device. The leakage current monitoring device comprises at least one bus bar, which is led from a monitored leakage current component, and penetrates through the annular magnetic core.
- In another embodiment of the present invention, the annular magnetic core is made from an amorphous strip material.
- Compared with the prior art, the present invention has the following advantages:
The leakage current sensor of the present invention possesses functions such as programmable gain output, adjustable leakage current grade, digital quantity calibration, bidirectional signal communication, safety self-checking and over-temperature protection. Moreover, the adjustment of the current output can range from a milliampere level to an ampere level. - To clearly expound the technical solution of the present invention, the drawings and embodiments are hereinafter combined to illustrate the present invention. Obviously, the drawings are merely some embodiments of the present invention and those skilled in the art can associate themselves with other drawings without paying creative labor.
-
Figure 1 is a structural diagram of the modules of the preferred embodiment of the present invention; -
Figure 2 is an explosive view of the preferred embodiment of the present invention; -
Figure 3 is a partial structural diagram of the preferred embodiment of the present invention. -
Reference Unit 111,Current Sampling Unit 112, ASICChip 120, Digital SignalProcessing Module 130,Communication Module 140, Safety Self-checking Module 150, Over-temperatureProtection Module 160,Input End 101,Output End 102, AnnularMagnetic Core 210,Base Plate 220,Bus Bar 230,Lead Foot 240,Outer Shell 250 - Drawings and detailed embodiments are combined hereinafter to elaborate the technical principles of the present invention.
- The present invention discloses a leakage current sensor and a leakage current monitoring device.
Figure 1 is a structural diagram of the modules of the leakage current sensor. As shown inFigure 1 , the leakage current sensor of the present invention comprises aninput end 101, anoutput end 102 and anASIC chip 120. TheASIC chip 120 is electrically connected with theinput end 101 for reading analog quantity signals of theinput end 101. The ASICchip 120 is further electrically connected to a digitalsignal processing module 130. The digitalsignal processing module 130 can output digital quantity signals to theoutput end 102. The digitalsignal processing module 130 can simultaneously feedback the output digital quantity signals to theASIC chip 120. Thus, a closed-loop feedback circuit can be formed, enabling theASIC chip 120 to accurately calibrate the output gain. - A breakdown structure of the leakage current monitoring device matched with the leakage current sensor is shown in
Figures 2-3 . The leakage current monitoring device comprises abase plate 220 and an annularmagnetic core 210 that is fixedly connected with thebase plate 220. Thebase plate 220 is embedded in anouter shell 250, and the leakage current sensor is embedded in thebase plate 220. A peripheral circuit and a plurality oflead feet 240 are arranged on the periphery of the leakage current sensor. Thelead feet 240 are led from the peripheral circuit, and are further connected with an external device. The leakage current monitoring device further comprises abus bar 230 that is led from a monitored leakage current component. Thebus bar 230 penetrates through the annularmagnetic core 210. - Preferably, the input end 100 of the leakage current sensor comprises a
current sampling unit 112. Areference unit 111 is arranged between thecurrent sampling unit 112 and theASIC chip 120. Thereference unit 111 serves as a built-in excitation source, and high-precision currents with different grades such as 30mA, 60mA and 100mA can be generated under the control of the ASIC chip 20. Thecurrent sampling unit 112 is used for sampling and acquiring the current analog quantity of thereference unit 111 or thebus bar 230. - Furthermore, the leakage current sensor is capable of calibrating the current digital quantity, outputting the programmable gain, and adjusting the leakage current grade. Preferably, the
ASIC chip 120 presets a certain current value (e.g., 10mA) for calibrating the digital quantity, and controls thereference unit 111 to generate a 10mA reference current. Thecurrent sampling unit 112 samples the reference current, thereby obtaining a corresponding analog quantity. TheASIC chip 120 outputs the analog quantity of the reference current to the digitalsignal processing module 130. Subsequently, the digitalsignal processing module 130 reads the analog quantity of the reference current and converts the analog quantity into the digital quantity through a built-in circuit. The digitalsignal processing module 130 feeds back the obtained digital quantity of the reference current to theASIC chip 120 through a feedback path. TheASIC chip 120 reads the aforesaid digital quantity of the reference current, and compares it with a reference current value used for calibration. TheASIC chip 120 repeatedly sets a same reference current value for calibration, and reads the digital quantity signals fed back by the digitalsignal processing module 130. Based on this, multiple sets of different reference current values can be set. Thus, the corresponding mapping between the analog quantity and the digital quantity of the reference current can be drawn, and a corresponding relation between the reference current value and the actual output value can be determined. Meanwhile, due to the inherent characteristics of the circuit, the current preset value and the actual output value cannot be completely consistent. Therefore, a small error cannot be avoided. When thecurrent sampling unit 112 obtains the current analog quantity of thebus bar 230, according to the corresponding relation between the reference current value and the actual output value, the digitalsignal processing module 130 compensates the small error, and forcibly outputs an accurate digital quantity of the leakage current. Therefore, the calibration of the current digital quantity can be achieved. - According to above formula 1, when the digital
signal processing module 130 outputs an accurate leakage current digital quantity for compensating the error, the digitalsignal processing module 130 directly outputs the leakage current digital quantity (Vout) to theoutput end 102 through an output path. Alternatively, the leakage current digital quantity (Vout) can be non-destructively amplified through a preset programmable circuit, thereby achieving an accurate gain output. Thus, the shortcoming of the traditional amplifying circuit that the error is synchronously amplified along the amplification of the analog quantity can be overcome. Meanwhile, the programmable gain output of the digital quantity can be achieved, and the leakage current grade can be adjusted. - Moreover, the leakage current sensor achieves a bidirectional signal communication. The programmable gain output and the adjustable leakage current grade can be automatically or controllably realized. Preferably, the leakage current sensor further comprises a
communication module 140, and theASIC chip 120 is electrically connected with thecommunication module 140. Thecommunication module 140 is connected with an external device for acquiring external control signals. After the aforesaid external control signals are read by theASIC chip 120, the programmable circuit can be controlled and adjusted to adapt to different gain outputs and leakage current grades. Alternatively, the state signals sent by theASIC chip 120 can be read by thecommunication module 140, and further forwarded to an external device, thereby achieving a bidirectional signal communication. - The leakage current sensor possesses a safety protection function during the electrifying and operating processes. Thus, the failure rate can be reduced, and the functional life can be prolonged. Preferably, the leakage current sensor further comprises a safety self-checking module 150 and an
over-temperature protection module 160, wherein the safety self-checking module 150 and theover-temperature protection module 160 are respectively electrically connected with theASIC chip 120. - When the leakage current sensor is electrified and initiated, the safety self-checking module 150 is preferentially awakened to check each module such as the digital
signal processing module 130. After the checking process is completed, other modules are sequentially awakened according to a preset workflow. Theover-temperature protection module 160 has a preset temperature upper limit. During the operation of the leakage current sensor, when the temperature monitored by theover-temperature protection module 160 is higher than the temperature upper limit value due to other reasons such as a short circuit of the bus bar, theover-temperature protection module 160 sends out an alarm signal according to the preset workflow. As a result, other protection measures (e.g., a forced outage) can be adopted, thereby effectively preventing the leakage current sensor from operating abnormally. - Preferably, the annular
magnetic core 210 is made from an amorphous strip material, which is capable of significantly reducing the volume of the magnetic core and improving the power density. - In this embodiment, the leakage current sensor adopts a chip-level open-loop magnetic flux gate solution. Preferably, a current sensing chip is arranged in the leakage current sensor. The current sensing chip comprises a sensing unit that is connected with an IGBT output bridge arm. The current sensing chip further comprises a programmable gain unit, a temperature compensation unit, a zero correction unit and a control unit that is connected with the aforesaid three units. The sensing unit is sealed in the IGBT output bridge arm. The sensing unit comprises a detection lead wire and an even number of magnetic sensing subunits. The magnetic sensing subunits are arranged on the same plane in an array. The distances between the detection lead foot and each magnetic sensing subunit are equal. The output of each magnetic sensing subunit is sent out after a differential amplification. Through a magnetic-electrical coupling, the sensing unit of the leakage current sensor detects a magnetic field generated when the current flows through the chip, thereby forming a current signal. The magnetic field and the primary side current are in a linear proportion. After being adjusted by the programmable gain unit, corrected by the temperature compensation unit and rectified by the zero correction unit, an high-precision output of the current signal can be achieved under the control of the control unit.
- The description of above embodiments allows those skilled in the art to realize or use the present invention. Although some special terms are used in the description of the present invention, the scope of the invention should not necessarily be limited by this description. The scope of the present invention is defined by the claims.
Claims (7)
- A leakage current sensor, comprising:an input end (101),an output end (102), andan ASIC chip (120), wherein the ASIC chip is electrically connected with the input end for reading analog quantity signals of the input end, wherein the ASIC chip is further electrically connected to a digital signal processing module (130), wherein the digital signal processing module is configured to output digital quantity signals to the output end,wherein the input end comprises a current sampling unit (112), wherein the current sampling unit is used for sampling and acquiring an analog quantity of a reference current or a leakage current, characterized in that:the digital signal processing module is configured to simultaneously feedback the output digital quantity signals to the ASIC chip, thereby forming a closed-loop feedback circuit, and a reference unit (111) is arranged between the current sampling unit and the ASIC chip, wherein the ASIC chip is configured to control the reference unit to generate reference currents with different grades; whereinthe ASIC chip is configured to repeatedly set a same reference current value for calibration, andto read digital quantity signals fed back by the digital signal processing module, thereby forming a corresponding mapping between the analog quantity and the digital quantity of the reference current;the ASIC chip is configured to compensate the errors of the analog quantity signals of the leakage current according to aforesaid corresponding mapping, thereby outputting digital quantity signals; andthe ASIC chip has a preset programmable circuit which is programmed to achieve an accurate gain output of the digital quantity signals.
- The leakage current sensor of claim 1, wherein the leakage current sensor further comprises a communication module (140), and the ASIC chip is electrically connected with the communication module, wherein the communication module is connected with an external device for acquiring external control signals, wherein the ASIC chip is configured to read the aforesaid external control signals.
- The leakage current sensor of claim 1, wherein the leakage current sensor further comprises a communication module (140), and the ASIC chip is electrically connected with the communication module, wherein the communication module is connected with an external device for acquiring external control signals, wherein the ASIC chip is configured to read the aforesaid external control signals and adjusts the programmable circuit.
- The leakage current sensor of claim 2, wherein the communication module is configured to read the state signals sent by the ASIC chip and to further forward the signals to an external device, thereby achieving a bidirectional signal communication.
- The leakage current sensor of claim 1, wherein the leakage current sensor further comprises a safety self-checking module (150) and an over-temperature protection module (160), wherein the safety self-checking module and the over-temperature protection module are respectively electrically connected with the ASIC chip, wherein the over-temperature protection module has a preset temperature upper limit.
- A leakage current monitoring device, comprising:the leakage current sensor of claim 1,a base plate (220), andan annular magnetic core (210) that is fixedly connected with the base plate, wherein the base plate is embedded in an outer shell (250), and the leakage current sensor is embedded in the base plate, wherein a peripheral circuit and a plurality of lead feet (240) are arranged on the periphery of the leakage current sensor, wherein the lead feet are led from the peripheral circuit, and are further connected with an external device, wherein the leakage current monitoring device comprises at least one bus bar (230), which is led from a monitored leakage current component, and penetrates through the annular magnetic core.
- The leakage current monitoring device of claim 6, wherein the annular magnetic core is made from an amorphous strip material.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2017/077033 WO2018165970A1 (en) | 2017-03-17 | 2017-03-17 | Leakage current sensor, and apparatus for monitoring leakage current |
Publications (3)
Publication Number | Publication Date |
---|---|
EP3418754A1 EP3418754A1 (en) | 2018-12-26 |
EP3418754A4 EP3418754A4 (en) | 2019-04-24 |
EP3418754B1 true EP3418754B1 (en) | 2020-09-23 |
Family
ID=63522788
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP17900278.7A Active EP3418754B1 (en) | 2017-03-17 | 2017-03-17 | Leakage current sensor, and apparatus for monitoring leakage current |
Country Status (3)
Country | Link |
---|---|
US (1) | US11163016B2 (en) |
EP (1) | EP3418754B1 (en) |
WO (1) | WO2018165970A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109917318A (en) * | 2019-04-03 | 2019-06-21 | 北京碧思特科技有限公司 | The self checking sensor and its method of for partial discharge of switchgear electric wave detection |
CN110632366A (en) * | 2019-09-29 | 2019-12-31 | 浙江巨磁智能技术有限公司 | Leakage current sensor for low-power three-phase inverter |
CN110988565B (en) * | 2019-12-24 | 2021-12-07 | 重庆国翰能源发展有限公司 | Self-checking method for one-machine four-pile charging pile system |
CN111289919B (en) * | 2020-04-03 | 2022-05-24 | 广州市扬新技术研究有限责任公司 | Multi-range contact net leakage current detection device |
CN112651498B (en) * | 2020-09-22 | 2021-08-31 | 杭州杭越传感科技有限公司 | Method and device for improving temperature stability of self-learning current sensor |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6917203B1 (en) * | 2001-09-07 | 2005-07-12 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Current signature sensor |
US8112240B2 (en) * | 2005-04-29 | 2012-02-07 | Abbott Diabetes Care Inc. | Method and apparatus for providing leak detection in data monitoring and management systems |
CN101246206A (en) * | 2008-03-13 | 2008-08-20 | 谭国强 | Bleeder current measurer checking device |
CN201364383Y (en) * | 2009-01-12 | 2009-12-16 | 上海市质量监督检验技术研究院 | Automatic metering calibrating device for leakage current instrument |
US9523730B2 (en) * | 2009-04-08 | 2016-12-20 | Analog Devices, Inc. | Architecture and method to determine leakage impedance and leakage voltage node |
CN201622316U (en) * | 2010-03-26 | 2010-11-03 | 哈尔滨国力电气有限公司 | Capacitive equipment current-leaking measuring device |
US8907678B2 (en) * | 2010-12-10 | 2014-12-09 | Raritan Americas, Inc. | Methods and apparatus for sensing ground leakage and automated self testing thereof |
CN103209379B (en) * | 2012-01-16 | 2015-09-02 | 上海耐普微电子有限公司 | A kind of programmable MEMS microphone of single line and programmed method thereof and system |
CN202522611U (en) * | 2012-02-29 | 2012-11-07 | 深圳市三电测控技术有限公司 | Direct-current leakage current sensor |
US8806085B2 (en) * | 2012-08-09 | 2014-08-12 | Ge Intelligent Platforms, Inc. | Application specific integrated circuit (ASIC) disposed in input/output module connectable to programmable logic controller (PLC) based systems having plurality of connection paths |
CN104237599A (en) * | 2013-06-07 | 2014-12-24 | 恒能华工监测技术(北京)有限公司 | Width dynamic capacitive equipment leakage current sensor monitoring system |
US9671438B2 (en) * | 2014-11-05 | 2017-06-06 | Qualcomm Incorporated | High-current sensing scheme using drain-source voltage |
CN204422634U (en) * | 2015-02-27 | 2015-06-24 | 北京柏艾斯科技有限公司 | A kind of DC/AC leakage current sensor with self-checking function |
CN204595054U (en) * | 2015-04-01 | 2015-08-26 | 华南理工大学 | A kind of leak current detector for photovoltaic inverter |
CN106093543B (en) * | 2016-06-07 | 2018-09-14 | 国网电力科学研究院武汉南瑞有限责任公司 | Direct current cables leakage current electrification detection system |
US9899953B2 (en) * | 2016-06-27 | 2018-02-20 | Rockwell Automation Technologies, Inc. | Method and apparatus for detecting ground faults in inverter outputs on a shared DC bus |
-
2017
- 2017-03-17 WO PCT/CN2017/077033 patent/WO2018165970A1/en active Application Filing
- 2017-03-17 EP EP17900278.7A patent/EP3418754B1/en active Active
- 2017-03-17 US US16/076,118 patent/US11163016B2/en active Active
Non-Patent Citations (1)
Title |
---|
None * |
Also Published As
Publication number | Publication date |
---|---|
EP3418754A4 (en) | 2019-04-24 |
WO2018165970A1 (en) | 2018-09-20 |
EP3418754A1 (en) | 2018-12-26 |
US11163016B2 (en) | 2021-11-02 |
US20210080512A1 (en) | 2021-03-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP3418754B1 (en) | Leakage current sensor, and apparatus for monitoring leakage current | |
US8222886B2 (en) | Voltage detecting apparatus and line voltage detecting apparatus having a detection electrode disposed facing a detected object | |
US8912786B2 (en) | Method and device for determining a direct current and resistance welding device | |
CN101754506B (en) | Electromagnetic oven power automatic calibration method and circuit | |
CN102472670A (en) | Body temperature measureing system and data reading device as well as relevant drive and control method | |
CN101658969A (en) | Tin soldering machine | |
CN104793100A (en) | Detection device for circuit breakage and short circuit of secondary coil of electric leakage mutual inductor | |
CN103364108A (en) | Welding temperature detection device, welding machine and welding temperature calibration method | |
CN106298408A (en) | A kind of control method improving magnetron output power stability and system | |
US20120217984A1 (en) | Resistance-measuring circuit and electronic device using the same | |
EP4280457A3 (en) | Protection circuit in electronic device and method therefor | |
CN109470913B (en) | Method for reversely deducing power supply voltage through reference voltage | |
CN201355876Y (en) | Power automatic calibration circuit of electromagnetic oven | |
CN111561960A (en) | Sensor device and method for operating a sensor device | |
TWI461703B (en) | Motor monitoring system and current detecting device thereof | |
CN213661446U (en) | Power supply circuit and clamping circuit thereof | |
CN103364606B (en) | Simultaneously Measurement accuracy voltage and current system and adopt the instrument of this system | |
JP4249081B2 (en) | Measuring device and temperature compensation method of measuring device | |
CN202548186U (en) | System capable of accurately measuring voltage and current simultaneously and instrument adopting system | |
US20220042855A1 (en) | Temperature input unit, temperature measuring device, and recording medium | |
CN105388959B (en) | One kind is based on pwm signal control laser tube power circuit and method | |
CN216209826U (en) | Fault finding device of mutual inductor | |
CN114963901B (en) | System and method for measuring ignition resistance of electronic detonator | |
US11041931B2 (en) | Voltage measurement device with self-diagnosis function, and self-diagnosis method of voltage measurement device | |
KR20120067567A (en) | Power amplifying apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: UNKNOWN |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
|
17P | Request for examination filed |
Effective date: 20180918 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
AX | Request for extension of the european patent |
Extension state: BA ME |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20190322 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: G01R 35/00 20060101ALI20190318BHEP Ipc: G01R 19/25 20060101ALI20190318BHEP Ipc: G01R 19/257 20060101AFI20190318BHEP |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: EXAMINATION IS IN PROGRESS |
|
17Q | First examination report despatched |
Effective date: 20191016 |
|
GRAP | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOSNIGR1 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: GRANT OF PATENT IS INTENDED |
|
INTG | Intention to grant announced |
Effective date: 20200428 |
|
DAV | Request for validation of the european patent (deleted) | ||
DAX | Request for extension of the european patent (deleted) | ||
GRAS | Grant fee paid |
Free format text: ORIGINAL CODE: EPIDOSNIGR3 |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE PATENT HAS BEEN GRANTED |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: FG4D |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: EP |
|
REG | Reference to a national code |
Ref country code: IE Ref legal event code: FG4D |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R096 Ref document number: 602017024391 Country of ref document: DE Ref country code: AT Ref legal event code: REF Ref document number: 1316932 Country of ref document: AT Kind code of ref document: T Effective date: 20201015 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FI Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: GR Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20201224 Ref country code: NO Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20201223 Ref country code: BG Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20201223 Ref country code: SE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: HR Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 |
|
REG | Reference to a national code |
Ref country code: AT Ref legal event code: MK05 Ref document number: 1316932 Country of ref document: AT Kind code of ref document: T Effective date: 20200923 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: RS Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: LV Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 |
|
REG | Reference to a national code |
Ref country code: NL Ref legal event code: MP Effective date: 20200923 |
|
REG | Reference to a national code |
Ref country code: LT Ref legal event code: MG4D |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: CZ Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: RO Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: PT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20210125 Ref country code: EE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: LT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: SM Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: AL Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: AT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: ES Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: PL Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: IS Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20210123 |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R097 Ref document number: 602017024391 Country of ref document: DE |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: SK Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 |
|
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: SI Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 Ref country code: DK Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 |
|
26N | No opposition filed |
Effective date: 20210624 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: MC Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 20210317 |
|
REG | Reference to a national code |
Ref country code: BE Ref legal event code: MM Effective date: 20210331 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: IE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20210317 Ref country code: GB Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20210317 Ref country code: CH Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20210331 Ref country code: LI Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20210331 Ref country code: LU Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20210317 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: BE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20210331 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: NL Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20200923 Ref country code: CY Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: HU Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT; INVALID AB INITIO Effective date: 20170317 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 20230630 Year of fee payment: 7 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: IT Payment date: 20230712 Year of fee payment: 7 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 20230705 Year of fee payment: 8 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: MK Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20200923 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 20240315 Year of fee payment: 8 |