EP3248227A1

EP3248227A1 - Optoelectronic device and method for manufacturing same

Info

Publication number: EP3248227A1
Application number: EP16703590.6A
Authority: EP
Inventors: Benoît AMSTATT; Sylvia SCARINGELLA; Jesus ZUNIGA-PEREZ
Original assignee: Centre National de la Recherche Scientifique CNRS; Aledia
Current assignee: Centre National de la Recherche Scientifique CNRS; Aledia
Priority date: 2015-01-22
Filing date: 2016-01-20
Publication date: 2017-11-29
Anticipated expiration: 2036-01-20
Also published as: WO2016116703A1; US20190363219A1; EP3514841A1; FR3032064A1; FR3032064B1; EP3248227B1; US10424692B2; US10651341B2; US20180277717A1; EP3514841B1

Abstract

The invention relates to an optoelectronic device (40) including first and second active regions (56A, 56B) suitable for emitting or detecting electromagnetic radiation and containing a first semiconductor material that predominantly contains a first compound selected from Compounds III-V, Compounds II-VI, and mixtures of same. The first active regions (56A) have a first polarity, and the second active regions (56B) have a second polarity different from the first polarity.

Description

OPTOELECTRONIC DEVICE AND METHOD FOR MANUFACTURING THE SAME

The present patent application claims the priority of the French patent application FR15 / 50511 which will be considered as an integral part of the present description.

Field

The present invention relates generally to optoelectronic devices based on semiconductor materials and their manufacturing processes.

By optoelectronic devices are meant devices adapted to perform the conversion of an electrical signal into an electromagnetic radiation or vice versa, and in particular devices dedicated to the detection, measurement or emission of electromagnetic radiation or devices dedicated to photovoltaic applications.

Presentation of the prior art

Called active region of a device optoélec ^¬ tronique the region from which is emitted a majority of the electromagnetic radiation provided by the device or opto ^¬ e is captured the majority of the electromagnetic radiation received by the optoelectronic device.

The optoelectronic device is said to have two-dimensional structure when the active region is formed on a flat semiconductor layer and the optoelectronic device is said to have a three-dimensional structure when the active region or the active regions are formed on three-dimensional semiconductor elements, for example microwires or nanowires.

It is known to produce an active region comprising a single quantum well or multiple quantum wells. A single quantum well is produced by interposing, between two layers of a first semiconductor material, for example a compound III-V, in particular GaN, respectively doped with P and N type, a layer of a second semiconductor material, for example an alloy of the compound III-V or II-VI and a third element whose forbidden band is different from the first doped material. The third element is, for example, indium (In) and the second semiconductor material may be InGaN. A multiple quantum well structure comprises a stack of semiconductor layers forming an alternation of quantum wells and barrier layers.

An optoelectronic device with a two-dimensional or three-dimensional structure generally emits a substantially monochromatic radiation whose wavelength depends on the properties of the active region, and in particular on the first and second semiconductor materials.

It may be desirable to provide an optoelectronic device having a broad spectrum of transmit or receive wavelengths. In the case of an optoelectronic device emitting electromagnetic radiation, it is known to cover the optoelectronic device with a layer of photoluminescent materials in order to convert at least a portion of the radiation emitted by the active region of the optoelectronic device into one radiation to another. wave length. However, the use of photoluminescent materials increases the cost of the optoelectronic device and does not always make it possible to obtain the desired emission spectrum.

It would, however, be desirable to have an optoelectronic device comprising at least two regions distinct active elements adapted to emit or pick up radiation at at least two different wavelengths.

summary

Thus, an object of an embodiment is to overcome at least in part the disadvantages of optoelectronic devices and their manufacturing processes described above.

Another object of an embodiment is to broaden the emission or absorption spectrum of the optoelectronic device.

Another object of an embodiment is that the optoelectronic device can be formed on an industrial scale and at low cost.

Thus, an embodiment provides an optoelectronic device comprising first and second active regions adapted to emit or pick up electromagnetic radiation and comprising at least one first semiconductor material comprising predominantly a first compound selected from the compounds III-V, the compounds II- VI and mixtures thereof, the first active regions having a first polarity and the second active regions having a second polarity different from the first polarity.

According to one embodiment, the first active regions are adapted to emit or pick up a first electromagnetic radiation at a first wavelength and the second active regions are adapted to emit or pick up a second electromagnetic radiation at a second different wavelength. of the first wavelength.

According to one embodiment, the first polarity corresponds to the polarity of the element of group III or II and the second polarity corresponds to the polarity of the element of group V or VI.

According to one embodiment, the device comprises: a substrate; first semiconductor portions resting on the substrate, a second semiconductor material preferably comprising the first compound, and having the first polarity, the first active regions being in contact with the first semiconductor portions; and

second semiconductor portions resting on the substrate, in the second semiconductor material, and having the second polarity, the second active regions being in contact with the second semiconductor portions.

According to one embodiment, the first semiconductor material comprises an additional element in addition to the first compound.

According to one embodiment, the device further comprises:

third portions of a third semiconductor material, having a third polarity and located between the substrate and the first semiconductor portions, the third material being a transition metal nitride, carbide or boride of column IV, V or VI or a combination of these compounds; and

fourth portions of the third semiconductor material, having a fourth polarity different from the third polarity, and located between the substrate and the second semiconductor portions.

According to one embodiment, the first semiconductor portions have the shape of pyramids and the second semiconductor portions comprise microwires or nanowires.

One embodiment also relates to a method of manufacturing an optoelectronic device comprising the formation of first and second active regions adapted to emit or pick up electromagnetic radiation in at least one first semiconductor material comprising, orally, a first compound selected from compounds III -V, compounds II-VI and mixtures thereof, the first active regions having a first polarity and the second active regions having a second polarity different from the first polarity.

According to one embodiment, the method comprises the following steps:

forming on a substrate first semiconductor portions of a second semiconductor material comprising, orally, the first compound and having the first polarity and second semiconductor portions of the second semiconductor material and having the second polarity; and

epitaxially growing the first active regions in contact with the first semiconductor portions and the second active regions in contact with the second semiconductor portions.

According to one embodiment, the method further comprises the following steps:

forming, on the substrate, third portions of a third semiconductor material and having a third polarity and fourth portions of the third semiconductor material and having a fourth polarity different from the third polarity, the third material being a nitride, a carbide or a boride of a transition metal of column IV, V or VI or a combination thereof; and

epitaxially growing the first semiconductor portions on the third portions and the second semiconductor portions on the fourth portions simultaneously.

According to one embodiment, the method further comprises the following steps:

forming on the substrate a layer of the third material and having the fourth polarity; and

epitaxially growing a portion of the third portions having the third polarity in contact with the layer.

According to one embodiment, the third portions are formed by MOCVD at a temperature below 1150 ° C.

According to one embodiment, the method further comprises the following step: epitaxially growing the fourth portions having the fourth polarity in contact with the layer and the remainder of the third portions having the third polarity.

According to one embodiment, the fourth portions are formed by MOCVD at a temperature above 1200 ° C.

According to one embodiment, the method further comprises the following steps:

forming on the substrate a layer of the third material and having the fourth polarity;

etching the layer to the substrate to delimit the fourth portions; and

epitaxially grow the third portions in contact with the substrate.

Brief description of the drawings

These and other features and advantages will be set forth in detail in the following description of particular embodiments in a non-limiting manner with reference to the accompanying drawings in which:

FIG. 1 is a partial and diagrammatic section of an embodiment of an optoelectronic device with a two-dimensional structure with an enlarged emission spectrum;

FIG. 2 is a partial and schematic cross section of an embodiment of an optoelectronic device with a three-dimensional structure with an enlarged emission spectrum;

Figure 3 is a top view, partial and schematic, of the optoelectronic device shown in Figure 1 or 2;

FIGS. 4A to 4E are partial and schematic sections of structures obtained at successive stages of an embodiment of a method of manufacturing the optoelectronic device of FIG. 1;

FIGS. 5A to 5F are partial and schematic sections of structures obtained at successive stages of an embodiment of a method of manufacturing the optoelectronic device of FIG. 2; FIGS. 6A to 6D are partial and schematic sections of structures obtained at successive stages of another embodiment of a method of manufacturing the optoelectronic device of FIG. 2;

FIG. 7 is a partial and diagrammatic section of the structure obtained at a step of another embodiment of a method of manufacturing the optoelectronic device of FIG. 2;

FIGS. 8A to 8D are partial and schematic sections of structures obtained at successive stages of an embodiment of a method of manufacturing the optoelectronic device of FIG. 1 or 2; and

FIGS. 9A and 9B are partial and schematic sections of structures obtained at successive stages of an embodiment of a method for manufacturing the optoelectronic device of FIG. 1 or 2.

detailed description

For the sake of clarity, the same elements have been designated by the same references in the various figures and, moreover, as is customary in the representation of the electronic circuits, the various figures are not drawn to scale. In addition, only the elements useful for understanding the present description have been shown and are described.

In particular, the polarization and control means of the optoelectronic device are well known and are not described. In the remainder of the description, unless otherwise indicated, the terms "substantially", "about" and "of the order of" mean "within 10%", preferably within 5%.

In the rest of the description, the fact of saying that a compound based on at least a first element and a second element has a polarity of the first element or a polarity of the second element means that the material increases in one direction. favored and that when the material is cut in a plane perpendicular to the preferred growth direction, the exposed face essentially comprises atoms of the first element in the case of the polarity of the first element or atoms of the second element in the case of the polarity of the second element.

The present application relates in particular to optoelectronic devices with a three-dimensional structure comprising three-dimensional elements, for example microwires, nanowires, conical elements or frustoconical elements. In particular, a conical or frustoconical element may be a conical or frustoconical element of revolution or a conical or frustoconical pyramidal element. In the remainder of the description, embodiments are described in particular for optoelectronic devices with a three-dimensional structure with microfilts or nanowires. However, these embodiments may be implemented for three-dimensional elements other than microfilms or nanowires, for example three-dimensional conical or frustoconical elements.

The term "microfil", "nanowire", "conical element" or "frustoconical element" denotes a three-dimensional structure of elongated shape in a preferred direction, of which at least two dimensions, called minor dimensions, are between 5 nm and 2.5 μm. , preferably between 50 nm and 2.5 μm, the third dimension, called the major dimension, being greater than or equal to 1 time, preferably greater than or equal to 5 times and even more preferably greater than or equal to 10 times, the greater minor dimensions. In some embodiments, the minor dimensions may be less than or equal to about 1 μm, preferably from 100 nm to 1 μm, more preferably from 100 nm to 800 nm. In some embodiments, the height of each microfil or nanowire may be greater than or equal to 500 nm, preferably from 1 μm to 50 μm.

In the remainder of the description, the term "wire" is used to mean "microfil or nanowire". Preferably, the mean line of the wire which passes through the centroids of the straight sections, in planes perpendicular to the direction preferred wire, is substantially rectilinear and is called thereafter "axis" of the wire.

In the remainder of the description, embodiments will be described in the case of an optoelectronic device with light-emitting diodes. However, it is clear that these embodiments may relate to other applications, including devices dedicated to the detection or measurement of electromagnetic radiation or devices dedicated to photovoltaic applications.

According to one embodiment, the two-dimensional or three-dimensional optoelec ^¬ tronic device comprises active regions which are formed by epitaxy on semiconductor portions of the same material and which have different polarities. The inventors have demonstrated that the active regions formed simultaneously under the same growth conditions have different emission or reception properties depending on the polarity of the semiconductor portions on which they are formed. In particular, active regions adapted to emit or absorb electromagnetic radiation at different wavelengths can be obtained.

FIG. 1 is a partial and schematic cross section of an embodiment of an optoelectronic device 10 with a two-dimensional structure and adapted to the emission of electromagnetic radiation.

The device 10 comprises, from the bottom to the top in FIG.

a first polarization electrode 12, for example metallic;

a substrate 14 comprising a first face 16 in contact with the electrode 12 and a second face 18 opposite the first face 16;

a seed layer 20 of a first semiconductor material with a first polarity, in contact with the face 18; first seed portions 22A, in contact with the layer 20, of the first semiconductor material with a second polarity different from the first polarity;

second seed portions 22B, in contact with the layer 20, of the first material with the first polarity, contiguous with the first portions 22A, the seed portions 22A and 22B having, in the present embodiment, substantially coplanar upper surfaces;

a semiconductor layer 24 of a second doped semiconductor material of a first conductivity type covering the first and second portions 22A, 22B and dividing into first semiconducting regions 24A, in contact with the first portions 22A and having a first polarity, and second semiconductor regions 24B, in contact with the second portions 22B and contiguous with the first semiconductor regions 24A and having a second polarity different from the first polarity, the upper surfaces of the conductive portions 22A, 24B also being substantially coplanar;

an active layer 26 covering the semiconductor layer 24 and dividing into first active regions 26A in contact with the first semiconductor regions 24A and in second active regions 26B, contiguous with the first active regions 26A and in contact with the second regions 24B;

a semiconductor layer 28 of the second doped semiconductor material of a second conductivity type opposite to the first conductivity type, covering the active layer 26 and dividing into third semiconductor regions 28A, in contact with the first active regions 26A and having a first polarity, and in fourth semiconductor regions 28B, in contact with the second active regions 26B, contiguous with the third semiconductor regions 28A and having a second polarity; and

a second electrode layer 30 covering the semiconductor layer 28.

In another embodiment, the upper surfaces of the seed portions 22A and 22B are not coplanar and only the upper surfaces of the conductive portions 22A, 24B are substantially coplanar.

Each stack comprising a first active region 26A sandwiched between a first semiconductor region 24A and a third semiconductor region 28A constitutes a first LED light emitting diode. Each stack comprising a second active region 26B sandwiched between a second semiconductor region 24B and a fourth semiconductor region 28B constitutes a second LED emitting diode.

In the present embodiment, the LEDs LED1, DEL1 are connected in parallel. The optoelectronic device 10 may comprise from a LED light emitting diode to a thousand light emitting diodes LED and a LED light emitting diode to a thousand LEDs.

FIG. 2 is a partial and schematic sectional view of an embodiment of an optoelectronic device 40 with a three-dimensional wire structure as described above and adapted to the emission of electromagnetic radiation.

The device 40 comprises, like the optoelectronic device 10 represented in FIG. 1, the first electrode 12, the substrate 14, the layer 20, the first portions 22A and the second portions 22B, with the difference that the second portions 22B may not have the same size. same thickness as the first portions 22A.

The device 40 furthermore comprises from bottom to top in FIG.

an insulating region 42 covering the first seed portions 22A and the second seed portions 22B and including openings 44A, 44B, each opening 44A exposing a portion of one of the first seed portions 22A and each opening 44B exposing a portion of one of the second seed portions 22B; first seeds 46A located in the openings 44A in contact with the first seed portions 22A;

second seeds 46B located in the openings 44B in contact with the second seed portions 22B;

first portions 48A semiconductor ^¬ corres ponding to the first three-dimensional semiconductor elements 48A, which in the present embodiment, correspond to the pyramids, the pyramids being represented three 48A, 48A each pyramid comprising an inner portion 50A, doped with a first type of conductivity, for example N type, in contact with one of the first seeds 46A, and an outer portion 52A, doped with the first type of conductivity or unintentionally doped, covering the inner portion 50A, each pyramid 48A being able to this is shown in Figure 2, based on the insulating region 42, or may extend only on the first seed 46A subacient;

second semiconductor portions 48B ^¬ corres ponding to the second three-dimensional semiconductor elements 48B, which in the present embodiment, correspond to son axis D, two son 48B being shown, each wire 48B having a lower portion 50B, doped a first type of conductivity, for example of N type, in contact with one of the second seeds 46B, and an upper portion 52B, doped with the first type of conductivity or unintentionally doped, the insulating region 42 being able, moreover, covering the side walls of the lower portion 50B of each wire 48B;

a first shell 54A covering the outer portion 52A of each pyramid 48A, each first shell 54A comprising at least one stack of a region or active layer 56A covering the outer portion 52A of the pyramid 48A and a semiconductor layer 58A of a second conductivity type opposite to the first conductivity type, covering the active layer 56A;

a second shell 54B covering the upper portion 52B of each wire 48B, each second shell 54B comprising at least one stack of an active layer 56B covering the portion upper 52B of the wire 48B and a semiconductor layer 58B of a second conductivity type opposite to the first conductivity type, covering the active layer 56B;

a second electrode layer 60 covering the semiconductor layers 58A, 58B of the first and second shells 54A, 54B and the insulating region 42.

For the optoelectronic device 10, 40, a conductive layer, not shown, can cover the electrode layer 60 between the son 48B and the pyramids 48A. An insulating and transparent encapsulation layer, not shown, can cover the electrode layer 60.

The assembly formed by each pyramid 48A and the associated shell 54A constitutes a first light-emitting diode DELΆ. The assembly formed by each wire 48B and the associated shell 54B constitutes a second light-emitting diode DEL'B. The optoelectronic device 40 may comprise of a light emitting diode DELΆ with a thousand LEDs DELΆ and a light emitting diode DEL'B with a thousand light emitting diodes DEL'B. The light-emitting diodes DEL1, OE- _Q , DEL1, DEL'B of the optoelectronic device 10 or 40 may be arranged in the form of a matrix of light-emitting diodes.

Figure 3 schematically shows an array of N rows and M columns of display pixels Pix-j, where N and M are integers, which are each equal to 2 in Figure 3, where i is a integer which varies from 1 to N and j is an integer which varies from 1 to M. In FIG. 3, the rows and the columns are rectilinear. However, the display pixels of a row may be staggered relative to the pixels of the adjacent rows. In the case of the optoelectronic device 10 shown in FIG. 1, the display pixels Pix] _ _. and Pix2,2 may correspond to LEDs LED ^ and display pixels Pix] _, 2 and Ρι ^Χ 2.1 may correspond to light emitting diodes DELB. In the case of the optoelectronic device 40 represented in 2, the display pixels Pix] _, i and Pix2,2 may correspond to light emitting diodes and DELΆ Pix display pixels] _, 2 ^e t ^Ρί χ 2.1 may correspond to light-emitting diodes LED ' B.

According to another embodiment, the optoelectronic device may comprise both light-emitting diodes of a two-dimensional optoelectronic device and light-emitting diodes of an optoelectronic device with a three-dimensional structure. According to another embodiment, the display pixel _Pix] _, i may correspond to a light emitting diode LED ^ of the optoelectronic device 10, the display pixel Pix] _, 2 may correspond to a light emitting diode device DELΆ of optoélec ^¬ tronic 40, the display pixel Pix2 i may correspond to a light emitting diode DEL 'B of the optoelectronic device 40 and the display pixel Pix2 ^ 2 may correspond to an electroluminescent diode OE- _Q of the optoelectronic device 10.

Alternatively, instead of display pixels, the first and second seed portions 22A, 22B may be banded. The optoelectronic device may include both light-emitting diodes of a two-dimensional structure optoelectronic device formed on first strips and light-emitting diodes of a three-dimensional structure optoelectronic device formed on second strips.

The substrate 14 may be a one-piece structure or comprise a stack of a layer, two layers or more layers. The substrate 14 may be a semiconductor substrate, for example a substrate made of silicon, germanium, silicon carbide, a III-V compound, such as GaN or GaAs, or a ZnO substrate. Preferably, the substrate 14 is a monocrystalline silicon substrate. Preferably, it is a semiconductor substrate compatible with the manufacturing processes implemented in microelectronics. The substrate 14 may correspond to a multilayer structure of silicon type on insulator, also called SOI (acronym for Silicon On Insulator). The substrate 14 may be of an insulating material, for example sapphire, silicon dioxide (SiO 2) or glass. When the structure of the substrate 14 does not allow the flow of current between the faces 16 and 18, the electrode 12 may be made on the side of the face 18 of the substrate 14. The substrate 14 may be heavily doped, weakly doped or undoped .

The seed layer 20 and the seed portions 22A, 22B are of a material promoting growth of the semiconductor portions 24A, 24B and seeds 46A, 46B. By way of example, the material constituting the seed layer 20 and the seed portions 22A, 22B may be a nitride, a carbide or a boride of a transition metal of column IV, V or VI of the periodic table of elements or a combination of these compounds. By way of example, the seed layer 20 and the seed portions 22A, 22B may be made of aluminum nitride (AlN), aluminum oxide (Al 2 O 3), boron (B), boron nitride ( BN), of titanium (Ti), of titanium nitride (TiN), of tantalum (Ta), of tantalum nitride (TaN), of hafnium (Hf), of hafnium nitride (HfN), of niobium (Nb ), of niobium nitride (NbN), of zirconium (Zr), of zirconium borate (ZrB2), of zirconium nitride (ZrN), of silicon carbide (SiC), of nitride and of tantalum carbide (TaCN), or in magnesium nitride in the form Mg _x Ny, where x is approximately equal to 3 and y is approximately equal to 2, for example magnesium nitride according to the form

Mg3N2. The seed layer 20 has, for example, a thickness of between 1 and 300 nanometers, preferably between 10 and 50 nanometers. Each seed portion 22A, 22B, for example, has a thickness of between 1 and 500 nanometers, preferably between 10 and 100 nanometers. The seed portions 22A, 22B may have a generally cylindrical shape, the base of which has, for example, a polygonal shape, in particular triangular, rectangular, square or hexagonal.

The material composing the seed layer 20 and the seed portions 22A, 22B may have a first polarity or a second polarity. According to one embodiment, the seed layer 20 and the seed portions 22B have the first polarity and the seed portions 22A have the second polarity. By way of example, when the seed layer 20 and the seed portions 22A, 22B are of AIN, the seed layer 20 and the seed portions 22B may have an N polarity and the seed portions 22A may have a polarity Al.

The semiconductor portions 24A, 24B, the seeds 46A, 46B, the semiconductor elements 48A, 48B and the semiconductor layers 28, 58A, 58B can be formed in majority from at least one semiconductor material selected from the group comprising the compounds III And compounds II-VI.

The semiconductor portions 24A, 24B, the seeds 46A, 46B, the semiconductor elements 48A, 48B and the semiconductor layers 28, 58A, 58B may be, at least in part, formed from semiconductor materials having a compound III-V for example a compound III-N. Examples of group III elements include gallium (Ga), indium (In) or aluminum (Al). Examples of III-N compounds are GaN, AlN, InN, InGaN, AlGaN or AlInGaN. Other group V elements may also be used, for example, phosphorus or arsenic. In general, the elements in compound III-V can be combined with different mole fractions.

The semiconductor portions 24A, 24B, the seeds 46A, 46B, the semiconductor elements 48A, 48B and the semiconductor layers 28, 58A, 58B may be at least partially formed from semiconductor materials predominantly comprising a compound II-VI. Examples of Group II elements include Group IIA elements, including beryllium (Be) and magnesium (Mg) and Group IIB elements, including zinc (Zn), cadmium (Cd) and mercury ( Hg). Examples of Group VI elements include elements of the VIA group, including oxygen (O) and tellurium (Te). of the Examples of compounds II-VI are ZnO, ZnMgO, CdZnO, CdZnMgO, CdHgTe, CdTe or HgTe. In general, the elements in II-VI can be combined with different mole fractions.

The semiconductor portions 24A, 24B, the semiconductor elements 48A, 48B and the semiconductor layers 28, 58A, 58B may further comprise a dopant. By way of example, for compounds III-V, the dopant may be chosen from the group comprising a group II P dopant, for example magnesium (Mg), zinc (Zn), cadmium (Cd ) or mercury (Hg), a group IV P-type dopant, for example carbon (C) or a group IV N-type dopant, for example silicon (Si), germanium (Ge), selenium (Se), sulfur (S), terbium (Tb) or tin (Sn).

The semiconductor layer 24 of the opto ^¬ electronic device 10 may have a thickness ranging from 10 nm to 10 um, preferably from 100 nm to 2.5 microns.

When the three-dimensional semiconductor elements 48A of the optoelectronic device 40 correspond to pyramids, the height of each pyramid may be between 100 nm and a hundred micrometers, preferably between 200 nm and 25 μm. Each pyramid 48A may have an elongated semiconductor structure along an axis substantially perpendicular to the face 18. The base of each pyramid may have a general shape of oval, circular or polygonal type, including triangular, rectangular, square or hexagonal. The centers of two adjacent pyramids can be from 0.25 μm to 10 μm, and preferably from 1 μm to 5 μm.

When the three-dimensional semiconductor elements 48B of the optoelectronic device 40 correspond to wires, the height of the wire 48B may be between 250 nm and 50 μm. Each wire 48B may have an elongate semiconductor structure along an axis D. The axes D of the wires 48B may be substantially parallel. Each wire 48B may have a generally cylindrical shape, whose base has, for example, an oval shape, circular or polygonal, in particular triangular, rectangular, square or hexagonal. The axes of two adjacent wires 48B may be 0.5 μm to 10 μm apart, and preferably 1.5 μm to 5 μm. By way of example, the wires 48B can be regularly distributed, in particular along a hexagonal network.

According to one embodiment, the lower portion 50B of each wire 48B consists mainly of a III-N compound, for example gallium nitride, doped with a first type of conductivity, for example of N type. The dopant of N type can be silicon. The height of the lower portion 50B may be between 500 nm and 25 μm.

According to one embodiment, the upper portion 52B of each wire 48B is, for example, at least partially made in a compound III-N, for example gallium nitride. The upper portion 52B may be doped with the first type of conductivity, for example of the N type, or may not be intentionally doped. The height of the upper portion 52B may be between 500 nm and 25 μm.

In the case of a wire 48B composed mainly of GaN, the crystalline structure of the wire may be of the wurtzite type, the wire extending in the crystallographic direction c.

The active layer 26, 56A, 56B is the layer from which the majority of the radiation supplied by the optoelectronic device 10, 40 is emitted. The active layer 26, 56A, 56B may comprise confinement means. By way of example, the active layer 26, 56A, 56B may comprise a single quantum well. It can then comprise a semiconductor material having a lower bandgap than the material forming the semiconductor layers 24, 28, the three-dimensional semiconductor elements 48A, 48B and the semiconductor layers 58A,

58B. The active layer 26, 56A, 56B may comprise multiple quantum wells. It then comprises a stack of semiconductor layers forming an alternation of quantum wells and barrier layers. The semiconductor layer 28, 58A, 58B may comprise a multilayer stack comprising in particular:

an electron blocking layer covering the active layer 26, 56A, 56B;

an intermediate layer of conductivity type opposite to the semiconductor layer 24 or to the semiconductor portions 50A, 50B and covering the electron-blocking layer; and

a bonding layer covering the intermediate layer and covered by the electrode 30, 60.

The electron blocking layer may be formed of a ternary alloy, for example gallium aluminum nitride (AlGaN) or indium aluminum nitride (AlInN) in contact with the active layer and the intermediate layer, to ensure a good distribution of the electric carriers in the active layer.

The intermediate layer, for example doped P-type, may correspond to a semiconductor layer or a stack of semiconductor layers and allows the formation of a PN or PIN junction, the active layer 26, 56A, 56B being between the intermediate layer P-type and semiconductor portion 24A, 50A, 50B N-type PN junction or PIN.

The bonding layer may correspond to a semiconductor layer or to a stack of semiconductor layers and allows the formation of an ohmic contact between the intermediate layer and the electrode 30, 60. By way of example, the bonding layer may be doped very strongly of the type opposite to the semiconductor portion 24A, 24B, 50A, 50B, until degenerate the semiconductor layer or layers, for example doped P type at a concentration greater than or equal to 10 ^ 0 atoms / cm- ^.

The intermediate layer and / or the tie layer may be formed, for the most part, from at least one semiconductor material selected from the group consisting of compounds III-V and compounds II-VI. The insulating region 42 of the optoelectronic device 40 may be made of a dielectric material, for example silicon oxide (SiO 2), silicon nitride (Si _x Ny, where x is approximately equal to 3 and y is approximately equal to 4, example of S 13N4), silicon oxynitride (in particular of general formula SiO _x Ny, for example S 12ON2), hafnium oxide (HfO2) or diamond. By way of example, the thickness of the insulating region 42 is between 10 nm and 25 μm. The insulating region 42 may have a monolayer structure or correspond to a stack of two layers or more than two layers.

The electrode 30, 60 is adapted to polarize the active layer 26, 56A, 56B and to allow the electromagnetic radiation emitted by the LEDs DEL1, DELB, DEL1, DEL 'B to pass. The material forming the electrode 30, 60 may be a transparent and conductive material such as tin-doped indium oxide (or ITO, acronym for Indium Tin Oxide), zinc oxide doped or not with aluminum or gallium , or graphene. By way of example, the electrode layer 30, 60 has a thickness of between 5 nm and 200 nm, preferably between 20 nm and 50 nm.

When a voltage is applied between the electrodes 12 and 30, 60, light radiation is emitted by the active layer 26, 56A, 56B.

The growth method of the seed layer 20, the semiconductor layer 24, the seeds 46A, the three-dimensional semiconductor elements 48A, 48B, the active layers 26, 56A, 56B and / or the semiconductor layers 28, 58A, 58B can be a chemical vapor deposition (CVD) method or an organometallic chemical vapor deposition (MOCVD), also known as organometallic epitaxy in vapor phase (or MOVPE, acronym for Metal-Organic Vapor Phase Epitaxy). However, methods such as Molecular Beam Epitaxy (MBE), Gas Source (GSMBE), Organometallic MBE (MOMBE), Plasma Assisted MBE (PAMBE), Atomic Layer Epitaxy (ALE), Hydride Vapor Epitaxy (HVPE) , Acronym for Hydride Vapor Phase Epitaxy) or an Atomic Layer Deposition (ALD) process may be used. In addition, methods of physical vapor deposition (PVD) or chemical vapor deposition can be used, for example chemical bath deposition (CBD), hydrothermal processes, liquid aerosol pyrolysis, electrodeposition or cathodic sputtering.

The growth method of the seed portions 22A, 22B may be a method of the CVD, MOCVD, MBE, GSMBE, MOMBE, PAMBE, ALE, HVPE, PVD or ALD type.

By way of example, in the case of the semiconductor layer 24, seeds 46A, 46B and / or three-dimensional semiconductor elements 48A, 48B, the method can comprise the in ection in a reactor of a precursor of an element. Group III and a precursor of a group element

Examples of group III precursors are trimethylgallium (TMGa), triethylgallium (TEGa), trimethylindium (TMIn) or trimethylaluminum (TMA1). Examples of group V precursors are ammonia (NH ₃ ), tertiarybutylphoshine (TBT), arsine (AsH ₃ ), or asymmetric dimethylhydrazine (UDMH). The ratio V / III of the gas flow of the precursor of the group V element to the gas flow of the precursor of the group III element is referred to as the V / III ratio.

According to one embodiment of the invention, in a phase of growth of the semiconductor layer 24 and / or three-dimensional semiconductor elements 48A, 48B of the compound III-V, in particular for the growth of the portion 50A, 50B, a precursor of an additional element is added in addition to the precursors of III-V. The presence of the precursor of the additional element leads to the incorporation of the element compound III-V to dope this compound III-V. In the case of the lower portion 50B of the wire 48B, this leads, in addition, to the formation of a layer of a dielectric material consisting mainly of the additional element and the element of the group V on the lateral flanks of the growing crystals of III-V compound. The additional element may be silicon (Si). An example of a precursor of silicon is silane (S1H4). This enables the N-type wires to be doped. This can also lead to the formation of a SiN silicon nitride dielectric layer, possibly in S13N4 stoichiometric form, on the sidewalls of the wire. The thickness of the dielectric layer of S13N4 obtained is then generally less than 10 nm.

The optoelectronic device 10, 40 is formed such that the polarity of the semiconductor portions 24A, 52A is different from the polarity of the semiconductor portions 24B, 52B. As a result, the polarity of the active regions 26A, 56A is different from the polarity of the active regions 26B, 56B. The wavelength of the electromagnetic radiation emitted or picked up by the optoelectronic device depends in particular on the forbidden band of the material forming the quantum well or the quantum wells. When the material is an alloy of compound III-V or II-VI and a third element, the wavelength of the radiation emitted or captured depends in particular on the atomic percentage of the third element, for example indium. In particular, the higher the atomic percentage of indium, the higher the wavelength.

In the case where the active layers are formed by epitaxy and comprise a third element, the incorporation of the third element depends in particular on the polarity of the active layer. As a result, the proportion of the third element is different between the active regions 26A, 56A and the active regions 26B, 56B. As a result, the emission wavelengths related to the active regions 26A, 56A are different from those of the active regions 26B, 56B. The optoelectronic device 10 shown in FIG. 1 and the device Optoelectronics 40 shown in FIG. 2 are adapted to emit light radiation having at least two different wavelengths. It is thus possible to obtain a device having broadband transmission or reception properties. In particular, the emission or reception spectrum obtained may be characteristic of a white light. With respect to an optoelectronic device comprising blue light emitting microwires or nanowires and a layer comprising luminophores absorbing part of the blue light and emitting yellow light, so that the overall emission spectrum of the optoelectronic device is close to that of white light, the optoelectronic device according to the present embodiments does not require a phosphor layer to provide white light.

In addition, for the optoelectronic device 40 shown in FIG. 2, the active layers 56A, 56B comprise a succession of regions having different thicknesses or proportions of materials. In particular, in the case where the active layer 56A, 56B comprises at least one layer of InGaN, the proportion of indium is modified when the deposition is carried out on structures with straight sides or on structures with inclined sides. In addition, the thicknesses of the InGaN and GaN layers are different when these layers are formed on straightwall structures or sloping flank structures. Indeed, the growth rate, on sloping flank structures, of the layers forming the quantum wells as well as the incorporation of indium in these same wells is different according to the different diameters of the regions with constant cross section and the different inclinations of the inclined flank areas.

In addition, when the optoelectronic device comprises both light-emitting diodes of a two-dimensional optoelectronic device and light-emitting diodes of an optoelectronic device with a three-dimensional structure, light radiation having more than two different wavelengths can be obtained. . We can obtain a device having broadband transmission or reception properties. In particular, the emission or reception spectrum obtained may be characteristic of a white light.

The deposition method of the seed layer 20 is adapted to grow the seed layer 20 at a first polarity. The seed portions 22A are at least partly formed by epitaxy on the seed layer 20 by a method adapted to change the polarity of the seed portions 22A with respect to the seed layer 20. According to one embodiment, the process is a low temperature MOCVD process. The seed portions 22B are at least partly formed by epitaxy on the seed layer 20 by a method adapted to not change the polarity of the seed portions 22B with respect to the seed layer 20. According to one embodiment the process is a high temperature MOCVD process.

FIGS. 4A to 4E are partial and schematic sections of structures obtained at successive stages of an embodiment of a method of manufacturing the optoelectronic device 10 shown in FIG.

FIG. 4A represents the structure obtained after having deposited the seed layer 20 on the face 18 of the substrate 14. By way of example, the seed layer 20 is of AIN of N polarity. The seed layer 20 can be deposited by Reactive PVD.

FIG. 4B represents the structure obtained after having deposited by epitaxy a seed layer 70 of the same material as the seed layer 20 and having a polarity different from the polarity of the seed layer 20. A method of the MOCVD type can be set up by injection into a spray-type MOCVD reactor, aluminum precursor gases and a nitrogen precursor gas. By way of example, it is possible to use a 3x2 "MOCVD reactor, of spray type, marketed by the company AIXTRON When the seed layer 20 is in AIN of N polarity, the seed layer 70 may be formed by MOCVD at a temperature below 1150 ° C. The layer 70 is then of polarity Al.

Figure 4C shows the structure obtained after etching the layer 70 to form portions 72 of Al polarity at the desired locations for the seed portions 22A. A chemical or physical etching, wet or dry, can be implemented.

FIG. 4D shows the structure obtained after simultaneously epitaxially forming a portion 74 on each portion 72 and the germination portions 22B on the portions of the seed layer 20 not covered by the portions 72. The portions 74 are of the same material and have the same polarity as the portions 72. The seed portions 22B are of the same material and have the same polarity as the seed layer 20. The stacking of the seed portions 72, 74 forms the seed portion 22A described above. The seed portions 74 and 22B may be formed by MOCVD at a temperature above 1200 ° C. In the present embodiment, the upper surfaces of the portions 74 are substantially coplanar with the upper surfaces of the seed portions 22B. This is made possible because the growth rate of AIN of polarity N and the growth rate of AIN of polarity Al are different under these growing conditions. According to another embodiment, the upper surfaces of portions 74 and portions 22B may not be coplanar. The thicknesses of the semiconductor portions 24A and 24B resting respectively on the portions 74 and 22B can then be adjusted, in particular by different growth rates for the GaN of Ga-polarity and GaN of N-polarity, so that the upper surfaces of the semiconductor portions 24A and 24B are substantially coplanar. This allows the formation of an active layer 26 with a two-dimensional structure. FIG. 4E represents the structure obtained after having formed the semiconductor layer 24, the active layer 26 and the semiconductor layer 28, for example by MOCVD under growth conditions such that the polarity of the semiconductor portions 24A, 24B follows that of the germination portions 22A, 22B sub acents. In the embodiment according to which the semiconductor layer 24 is made of GaN, the portions 24A of the layer 24 are of Ga polarity and the portions 24B of the layer 24 are of polarity N. In the embodiment according to which the active layer 26 comprises at least one InGaN layer, an indium precursor may be provided in the reactor in addition to gallium precursors and nitrogen. Under the same growth conditions, the indium incorporation rate in the InGaN layer varies depending on the Ga or N polarity of this layer. The emission wavelength of the region 26A of the active layer 26 is therefore different from the emission wavelength of the region 26B of the active layer 26.

The following process steps include the formation of the electrodes 30 and 12.

FIGS. 5A to 5F are partial and schematic sections of structures obtained at successive stages of an embodiment of a method of manufacturing the optoelectronic device 40 shown in FIG.

The method comprises the steps previously described in connection with Figures 4A to 4D except that the thickness of the seed portion 22B may be different from the thickness of the seed portion 22A as shown in Figure 5A.

FIG. 5B represents the structure obtained after having formed an insulating layer 76 on the seed portions 22A,

22B and after etching the openings 44A, 44B in the insulating layer 76 to expose portions of the seed portions 22A, 22B at the desired locations of seed formation 46A, 46B. FIG. 5C shows the structure obtained after the formation of the seeds 46A, 46B in the openings 44A, 44B. By way of example, in the case where the seeds 46A, 46B are GaN, a process of the MOCVD type can be carried out by injection into a MOCVD reactor of a gallium precursor gas, for example trimethylgallium (TMGa). and a nitrogen precursor gas, for example ammonia (NH3). A V / III ratio in the range of 10 to 10,000, makes it possible to promote the growth of seeds 46A, 46B. The pressure in the reactor is, for example, between 100 hPa and 800 hPa. The temperature in the reactor is, for example, between 800 ° C and 1100 ° C. The seeds 46A, formed on portions 22A of Al polarity, have a Ga polarity. The seeds 46B, formed on portions 22B of N polarity, have a polarity N.

FIG. 5D represents the structure obtained after having grown the internal portions 50A of pyramids 48A on the seeds 46A and the lower portions 50B of the wires 48B on the seeds 46B. According to one embodiment, the ratio V / III is, for example, in the range of 10 to 200. The pressure in the reactor is, for example, between 100 hPa and 800 hPa. The temperature in the reactor is, for example, between

900 ° C and 1100 ° C. Under these conditions, son 48B of polarity N grow on seeds 46B of polarity N and pyramids 48A of polarity Ga grow on seeds 46A of polarity Ga.

In addition, a precursor of silicon, for example silane (S1H4), is added to the other precursor gases. The presence of silane among the precursor gases results in the incorporation of silicon into the GaN compound. In this way, internal portions 50A and N-doped lower portions 50B are obtained. In addition, this may result in the formation of a layer of silicon nitride, not shown, which covers the periphery of each lower portion 50B. except for the top as the lower portion 50B grows. In the present embodiment, the growth conditions are chosen such that the silicon nitride layer is not formed on the inner portions 50A of the pyramids 48A. FIG. 5E shows the structure obtained after having grown the outer portions 52A of the pyramids and the upper portions 52B of the wires 48B. According to one embodiment, the operating conditions of the MOCVD reactor described above are, by way of example, maintained except that the stream of silane in the reactor is reduced, for example by a factor greater than or equal to at 10, or stopped. Even when the silane stream is stopped, the outer portion 52A and the upper portion 52B may be N-type doped due to the diffusion in these portions of dopants from the portions 50A, 50B or due to the residual doping of GaN.

FIG. 5F represents the structure obtained after having simultaneously grown the shells 54A covering the outer portions 52A of the pyramids 48A and the shells 54B covering the upper portions 52B of the wires 48B. The shell component layers 54A, 54B may be formed by MOCVD epitaxy. Given the possible presence of the silicon nitride layer covering the periphery of the lower portion 50B of each wire 48B, the deposition of the shell component layers 54B occurs only on the upper portion 52B of each wire 48B. Other methods can be used to allow growth of the wells throughout the yarns by depositing a low temperature layer.

In the embodiment in which each active layer 56A, 56B comprises one or more InGaN layers, an indium precursor may be provided in the reactor in addition to the gallium and nitrogen precursors. Under the same growth conditions, the indium incorporation rate in the InGaN layer varies as a function of the Ga or N polarity of this layer and according to the crystallographic orientation of the surface on which the active layer 56A is formed. , 56B.

The following process steps include the formation of electrodes 60 and 12.

FIGS. 6A to 6D are partial and schematic sections of structures obtained at successive stages of another embodiment of a method of manufacturing an optoelectronic device having the same structure as the optoelectronic device 40 shown in FIG. 2 except that the seeds 46A, 46B are not formed in openings of a insulating layer.

The method comprises the steps previously described in connection with Figures 4A to 4D except that the thickness of the seed portion 22B may be different from the thickness of the seed portion 22A.

Figure 6A shows the structure obtained after formation of seeds 46A, 46B on the seed portions 22A and 22B. The number of seeds 46A, 46B that can be formed on the seed portions 22A and 22B depends on the dimensions of the seed portions 22A and 22B. Preferably, the dimensions of the seed portions 22A and 22B may be sufficiently small to promote the growth of a single seed 46A, 46B on each seed portion 22A and 22B. By way of example, in the case where the seeds 46A, 46B are made of GaN, a method of the MOCVD type can be implemented by injection into a MOCVD reactor, of the shower type, of a gallium precursor gas, for example trimethylgallium (TMGa) and a nitrogen precursor gas, for example ammonia (NH3). By way of example, it is possible to use a 3x2 "MOCVD reactor, of spray type, marketed by the company AIXTRON A V / III ratio in the range of 10 to 10,000, makes it possible to promote the growth of seeds 46A, 46B. The pressure in the reactor is, for example, between 100 hPa and 800 hPa The temperature in the reactor is, for example, between 800 ° C and 1100 ° C.

FIG. 6B shows the structure obtained after having grown the internal portions 50A of the pyramids 48A and the lower portions 50B of the wires 48B on the seeds 46A as described previously in relation with FIG. 5D.

FIG. 6C represents the structure obtained after having grown the external portions 52A of the pyramids 48A and the upper portions 52B of the son 48B as previously described in connection with Figure 5E.

FIG. 6D represents the structure obtained after having deposited an insulating layer 78 on the whole of the structure represented in FIG. 6C and after having etched the insulating layer 78 to keep the layer 78 only around the base of the pyramids 48A and feet of the wires 48B.

The following process steps include growth of the shells 54A, 54B as previously described in connection with Fig. 5F and formation of the electrodes 60 and 12.

FIG. 7 is a partial and schematic sectional view of the structure obtained at a step of another embodiment of a method of manufacturing an optoelectronic device having the same structure as the optoelectronic device 40 shown in FIG. The method according to the present embodiment is identical to the embodiment described previously with reference to FIGS. 5A to 5F, except that the step of growth of the portions 74 and 22B by epitaxy, previously described in connection with FIG. 5A, is not present and the insulating layer 76 is formed directly on the portions 72 and the layer 20. In this embodiment, the seed portions 22B then correspond to the portions of the layer 20 not covered by the portions 72 and the seed portions 22A correspond to the portions 72. Advantageously, the present embodiment comprises an epitaxial growth step of less than the embodiment described above in connection with FIGS. 5A to 5F. Similarly, the manufacturing method according to the embodiment previously described in relation with FIGS. 6A to 6B can be implemented by directly forming the seeds 46A on the portions 72 and the seeds 46B on the seed layer 20.

FIGS. 8A to 8D are partial and schematic sections of structures obtained at successive stages of another embodiment of a method for manufacturing the Optoelectronic device 10 shown in FIG. 1 or the optoelectronic device 40 shown in FIG. 2. The method comprises the step described above in relation to FIG. 4A.

FIG. 8A represents the structure obtained after the following steps:

deposition of an insulating layer 80 on the layer 20; and etching apertures 82 in the insulating layer 80 to expose portions of the seed layer 20 to the desired areas of formation of the seed portions 22B.

FIG. 8B shows the structure obtained after the etching of the layer 20 through the openings 82 to the substrate 14 to delimit germination portions 84 in the layer 20.

FIG. 8C represents the structure obtained after an epitaxial growth step which has resulted in the formation of germination portions 22A on the portions of substrate 14 not covered by portions 84. The growth conditions can be the same as those described previously in FIG. relationship with Figure 4D. The inventors have demonstrated that the polarity of the portions 22A which grow on the substrate 14 is opposite to that of the portions 84. In the case of the production of an optoelectronic device 10 with a two-dimensional structure, the growth of the portions 22A is continued until the upper surfaces of the portions 22A are substantially coplanar with the upper surfaces of the seed portions 84. Preferably, the material constituting the insulating layer 80 does not promote the growth of the material constituting the seed portions 22A. However, some seeds 86 may nevertheless form on the layer 80.

FIG. 8D represents the structure obtained after a step of etching the insulating layer 80 so as to expose the germination portions 84. The seed portions 84 then correspond to the seed portions 22B previously described. The following steps of the method may comprise the steps described above in connection with FIG. 4E in the case of the formation of a two-dimensional optoelectronic device, or the steps described above in connection with FIGS. 5B to 5F or in connection with FIGS. FIGS. 6A to 6D in the case of the formation of an optoelectronic device with a three-dimensional structure.

FIGS. 9A and 9B are partial and schematic sections, structures obtained at successive stages of another embodiment of a method for manufacturing the optoelectronic device 10 shown in FIG. 1 or optoelectronic device 40 represented in FIG. 2 The method comprises the steps previously described in connection with Figures 8A and 8B.

FIG. 9A shows the structure obtained after removal of the insulating layer 80 to expose the seed portions 84.

FIG. 9B shows the structure obtained after an epitaxial growth step which resulted in the formation of seed portions 22A on the portions of substrate 14 not covered by portions 22B and the formation of seed portions 88 on portions 84. Growth conditions may be the same as those previously described in connection with Figure 4D. The inventors have demonstrated that the polarity of the portions 22A that grow on the substrate 14 is opposite to that of the portions 84 while the polarity of the portions 88 which grow on the portions 84 have the same polarity as the portions 84. The set formed by the portion 88 and the underlying portion 84 then constitutes the germination portion 22B. This is made possible due to the fact that the growth rate of AIN of polarity N and the growth rate of AIN of polarity Al can be made different according to the growth conditions. An embodiment of a manufacturing method of an optoelectronic device comprising électrolumi diodes LED ^ ^¬ nescentes, DEL¾ and DELΆ emitting diodes, LED 'B may comprise the steps of forming the three-dimensional semiconductor elements 48A, 48B before or after the steps of forming the semiconductor portions 24A, 24B. The method further comprises a step of depositing an insulating layer on the lateral flanks of the semiconductor portions 24A, 24B which then correspond to distinct blocks. The active layers 56A, 56B, 26A, 26B can then be formed simultaneously and the semiconductor layers 58A, 58B, 28A, 28B can be formed simultaneously.

Particular embodiments have been described. Various variations and modifications will be apparent to those skilled in the art. In particular, the ratio between the number of light-emitting diodes DEL 1, DEL 1 and the number of light-emitting diodes OE- _Q , DEL 'B is chosen as a function of the desired emission spectrum of the optoelectronic device 10, 40. Likewise, the density pyramids or wires may be chosen and modified so as to obtain different In concentrations of the active layers and thus obtain additional wavelengths, which make it possible, among other things, to produce white.

Claims

An optoelectronic device (10; 40) comprising first and second active regions (26A, 26B; 56A, 56B) adapted to emit or pick up electromagnetic radiation and comprising at least a first semiconductor material comprising orally a first compound selected from the group consisting of III-V compounds, II-VI compounds and mixtures thereof, the first active regions (26A; 56A) having a first polarity and the second active regions (26B; 56B) having a second polarity different from the first polarity.

2. Device according to claim 1, wherein the first active regions (26A, 56A) are adapted to emit or pick up a first electromagnetic radiation at a first wavelength and in which the second active regions (26B; 56B) are adapted. emitting or sensing a second electromagnetic radiation at a second wavelength different from the first wavelength.

3. Device according to claim 1 or 2, wherein the first polarity corresponds to the polarity of the group III or II element and wherein the second polarity corresponds to the polarity of the group V or VI element.

4. Device according to any one of claims 1 to 3, comprising:

a substrate (14);

first semiconductor portions (24A; 48A) resting on the substrate, a second semiconductor material suitably comprising the first compound, and having the first polarity, the first active regions (26A; 56A) being in contact with the first semiconductor portions; and

second semiconductor portions (24B; 48B) resting on the substrate, the second semiconductor material, and having the second polarity, the second active regions (26B; 56B) being in contact with the second semiconductor portions.

5. Device according to claim 4, wherein the first semiconductor material comprises an additional element ^¬ mentary in addition to the first compound.

6. Device according to any one of claims 2 to 5, further comprising:

third portions (22A) of a third semiconductor material, having a third polarity and located between the substrate (14) and the first semiconductor portions (24A; 48A), the third material being a nitride, a carbide or a boride of a transition metal of column IV, V or VI or a combination of these compounds; and

fourth portions (22B) of the third semiconductor material, having a fourth polarity different from the third polarity, and located between the substrate (14) and the second semiconductor portions (24B; 48B).

7. Device according to any one of claims 2 to 6, wherein the first semiconductor portions (48A) are in the form of pyramids and wherein the second semiconductor portions (48B) comprise microwires or nanowires.

8. A method of manufacturing an optoelec ^¬ tronic device comprising the formation of first and second active regions (26A, 26B, 56A, 56B) adapted to emit or pick up electromagnetic radiation in at least one first semiconductor material comprising orally a first compound selected from compounds III-V, compounds II-VI and mixtures thereof, the first active regions (26A; 56A) having a first polarity and the second active regions (26B; 56B) having a second polarity different from the first polarity .

The method of claim 8, comprising the steps of:

forming on a substrate (14) first semiconductor portions (24A; 48A) of a second semiconductor material comprising orally the first compound and having the first polarity and second portions semiconductors (24B; 48B) of the second semiconductor material and having the second polarity; and

epitaxially growing the first active regions (26A, 56A) in contact with the first semiconductor portions and the second active regions (26B, 56B) in contact with the second semiconductor portions.

The method of claim 9, further comprising the steps of:

forming, on the substrate (14), third portions (22A) of a third semiconductor material and having a third polarity and fourth portions (22B) of the third semiconductor material and having a fourth polarity different from the third polarity, the third material being a nitride, carbide or boride of a transition metal of column IV, V or VI or a combination thereof; and

epitaxially growing the first semiconductor portions (24A, 48A) on the third portions (22A) and the second semiconductor portions (24B; 48B) on the fourth portions.

The method of claim 10, further comprising the steps of:

forming, on the substrate (14), a layer (70) of the third material and having the fourth polarity; and

epitaxially growing a portion of the third portions (22A) having the third polarity in contact with the layer.

The method of claim 11, wherein the third portions (22A) are formed by MOCVD at a temperature below 1150 ° C.

The method of claim 11 or 12, further comprising the step of:

epitaxially growing the fourth portions (22B) having the fourth polarity in contact with the layer (70) and the remainder of the third portions (22A) having the third polarity.

The method of claim 13, wherein the fourth portions (22A) are formed by MOCVD at a temperature above 1200 ° C.

The method of claim 10, further comprising the steps of:

forming, on the substrate (14), a layer (70) of the third material and having the fourth polarity;

etching the layer to the substrate to delineate the fourth portions (22B); and

epitaxially growing the third portions (22A) in contact with the substrate (14).