EP3051292A4 - Aufnahmemechanismus für teststücke, bewegungsvorrichtung für teststücke, analysevorrichtung für flüssige proben und aufnahmeverfahren für teststücke - Google Patents

Aufnahmemechanismus für teststücke, bewegungsvorrichtung für teststücke, analysevorrichtung für flüssige proben und aufnahmeverfahren für teststücke Download PDF

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Publication number
EP3051292A4
EP3051292A4 EP14847074.3A EP14847074A EP3051292A4 EP 3051292 A4 EP3051292 A4 EP 3051292A4 EP 14847074 A EP14847074 A EP 14847074A EP 3051292 A4 EP3051292 A4 EP 3051292A4
Authority
EP
European Patent Office
Prior art keywords
test piece
liquid sample
sample analytical
piece pickup
moving apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP14847074.3A
Other languages
English (en)
French (fr)
Other versions
EP3051292A1 (de
Inventor
Satoshi Takai
Hanako YURA
Shingo HATADA
Yasuhiro Miyake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Publication of EP3051292A1 publication Critical patent/EP3051292A1/de
Publication of EP3051292A4 publication Critical patent/EP3051292A4/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
    • G01N2035/00059—Transport arrangements specific to flat sample substrates, e.g. pusher blade vacuum chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper
    • G01N2035/00118—Test strips, e.g. paper for multiple tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/0099—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor comprising robots or similar manipulators

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
EP14847074.3A 2013-09-26 2014-09-26 Aufnahmemechanismus für teststücke, bewegungsvorrichtung für teststücke, analysevorrichtung für flüssige proben und aufnahmeverfahren für teststücke Pending EP3051292A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013199301A JP6255198B2 (ja) 2013-09-26 2013-09-26 試験片ピックアップ機構及び試験片移動装置
PCT/JP2014/075625 WO2015046425A1 (ja) 2013-09-26 2014-09-26 試験片ピックアップ機構、試験片移動装置、液体試料分析装置及び試験片ピックアップ方法

Publications (2)

Publication Number Publication Date
EP3051292A1 EP3051292A1 (de) 2016-08-03
EP3051292A4 true EP3051292A4 (de) 2017-04-26

Family

ID=52743551

Family Applications (1)

Application Number Title Priority Date Filing Date
EP14847074.3A Pending EP3051292A4 (de) 2013-09-26 2014-09-26 Aufnahmemechanismus für teststücke, bewegungsvorrichtung für teststücke, analysevorrichtung für flüssige proben und aufnahmeverfahren für teststücke

Country Status (5)

Country Link
US (1) US10101345B2 (de)
EP (1) EP3051292A4 (de)
JP (1) JP6255198B2 (de)
CN (1) CN105556315B (de)
WO (1) WO2015046425A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9990560B2 (en) 2015-02-09 2018-06-05 Digital Concepts Of Missouri, Inc. Test strip mobile APP system and method
US11040892B2 (en) 2015-02-09 2021-06-22 Digital Concepts Of Missouri, Inc. Spa/pool water treatment system and method
USD865992S1 (en) * 2015-11-02 2019-11-05 Jon A. Petty Fluid test strip
USD878624S1 (en) * 2018-06-05 2020-03-17 Digital Concepts Of Missouri, Inc. Test strip
USD888981S1 (en) * 2018-11-01 2020-06-30 Bionime Corporation Sensing strip
CN114624065B (zh) 2022-05-16 2022-08-12 成都理工大学 用于地质流体检测的取样装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5540887A (en) * 1994-05-10 1996-07-30 Bayer Corporation Test strip overturning mechanism in automated analyzer
JP3697535B2 (ja) * 1996-06-05 2005-09-21 栄研化学株式会社 試験片ピックアップ機構及び試験片供給装置
JP2006167864A (ja) * 2004-12-16 2006-06-29 Seiko Epson Corp 水平多関節型ロボット

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4876204A (en) * 1984-10-11 1989-10-24 Kabushiki Kaisha Kyoto Daiichi Kagaku Method and apparatus of automatic continuous analysis using analytical implement
JP2686202B2 (ja) * 1992-02-14 1997-12-08 三洋電機株式会社 部品装着装置
JP3331257B2 (ja) * 1994-05-10 2002-10-07 バイエルコーポレーション 試験片の真空吸引方法およびその真空吸引回路装置
JP3331253B2 (ja) * 1994-05-10 2002-10-07 バイエルコーポレーション 自動分析装置の試験片取出装置
JPH10329012A (ja) * 1997-03-21 1998-12-15 Canon Inc 研磨装置および研磨方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5540887A (en) * 1994-05-10 1996-07-30 Bayer Corporation Test strip overturning mechanism in automated analyzer
JP3697535B2 (ja) * 1996-06-05 2005-09-21 栄研化学株式会社 試験片ピックアップ機構及び試験片供給装置
JP2006167864A (ja) * 2004-12-16 2006-06-29 Seiko Epson Corp 水平多関節型ロボット

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2015046425A1 *

Also Published As

Publication number Publication date
US10101345B2 (en) 2018-10-16
EP3051292A1 (de) 2016-08-03
US20160216285A1 (en) 2016-07-28
CN105556315A (zh) 2016-05-04
JP2015064313A (ja) 2015-04-09
JP6255198B2 (ja) 2017-12-27
WO2015046425A1 (ja) 2015-04-02
CN105556315B (zh) 2018-03-20

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