Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
  • G01J3/28—Investigating the spectrum
  • G01J3/45—Interferometric spectrometry
  • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
  • G01J3/28—Investigating the spectrum
  • G01J3/45—Interferometric spectrometry
  • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
  • G01J3/4532—Devices of compact or symmetric construction
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N21/55—Specular reflectivity
  • G01N21/552—Attenuated total reflection
  • G01N21/553—Attenuated total reflection and using surface plasmons
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
  • G01J3/28—Investigating the spectrum
  • G01J3/45—Interferometric spectrometry
  • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
  • G01J2003/4538—Special processing

Definitions

• the present invention relates to the field of spectrometry, in particular coupled to plasmon resonance.
• the invention relates, according to a first of its objects, to an interferometric device comprising:
• a separator (20) configured to separate an incident light beam (F0) collimated into a first incident beam (F1) and a second incident beam (F2);
• At least one transducer (13) configured to perform a transduction based on the surface plasmon resonance and in contact with the first face (D1).
• the second face (D2) carries a network of nanostructures at which the first incident beam (F1) and the second incident beam (F2) are capable of interfering and then forming an interferogram whose central fringe is at a point of defined convergence (ZOPD);
• the optical block (10) and the separator (20) being configured so that the first incident beam (F1) undergoes at least one total internal reflection on the first face (D1) and the second incident beam (F2) undergoes at least one total internal reflection on the third face (D3) before they interfere on the second face (D2) in total internal reflection;
• the interferometric device further comprising a calculator (50), configured to simultaneously calculate the spectral distribution of the amplitude and the relative phase of the incident light beam (F0) having interacted with at least one transducer (13, 14) through the first incident beam
• the invention it is thus possible to have access to a phase measurement.
• the invention makes it possible to solve a large number of technical problems related to a phase measurement in surface plasmon resonance (SPR) systems.
• the invention comprises a static and compact SPR device allowing direct access to the phase.
• a second transducer 14
• said second transducer (14) being in contact with the second face (D2).
• the first face supports a plurality of transduction zones (131, 132, 133, 134), each transduction zone (131, 132, 133, 134) comprising an individual transducer.
• the second face (D2) comprises a plurality of interference zones (ZI, Z2, Z3, Z4), each interference zone (ZI, Z2, Z3, Z4) comprising a set of nanostructures, the optical block (10) being configured so that a given transduction zone (131, 132, 133, 134) is arranged in correspondence with a given interference zone (ZI, Z2, Z3, Z4), so that the total internal reflection of the first incident beam (F1) on a given transduction zone (131, 132, 133, 134) interferes with the second incident beam (F2) on a given interference zone (ZI, Z2, Z3, Z4).
• the optical block (10) is an assembly or molding equivalent to the assembly of a first right isosceles prism (11) with a second right isosceles prism (12), wherein the length of a side of the second isosceles right prism (12) is equal to half the length of the hypotenuse of the first right isosceles prism (11), the second prism (12) being assembled by one of its sides on one half of the hypotenuse of the first prism (11) so that the hypotenuse of the second prism (12) is parallel to one side of the first prism (11), and so that a cross-section of the optical block (10) thus produced is inscribed in a square.
• the separator is a separator cube (20) made by assembling or molding equivalent to assembling a first right isosceles prism (21) and a second identical isosceles right prism (22). at the first isosceles right prism (21), the first right isosceles prism (21) and the second right isosceles prism (22) being assembled by their hypotenuse, one of which is metallized.
• the position of the central fringe of the interferogram at the point of convergence is determined by constructing the optical block (10) according to the dimensions of the first right isosceles prism (11) and the second isosceles prism right (12) of said optical block (10).
• the invention relates to a spectrometer comprising a device according to the invention, a light source (1) configured to emit said incident light beam (F0), and comprising an optical sensor (30) disposed vis-à-vis the nanostructures of the second face (D2) and configured to capture the diffusion of 1 interferogram resulting from the interference of the first incident beam (Fl) and the second incident beam (F2).
• the spectrometer further comprises
• the computer (50) is configured to
• R_spr (X) 2 * P_mes (X) / P_F0 ( ⁇ ), with P_F0 ( ⁇ ) the power of the incident beam (F0) emitted by the light source ( 1) which is known or measured by the first power meter (40a).
• the light source (1) is monochromatic, and
• the computer (50) is configured to calculate the phase shift ( ⁇ ( ⁇ )) of the first beam (F1) by comparing I (t1) and I (t0) two values recorded in a memory and corresponding to the intensity distribution on the plane (xoy) of the interferogram obtained by interfering on the second face (D2) the first incident beam (F1) and the second incident beam (F2) at a time t1 and a time respectively.
• the light source (1) is broadband
• the computer (50) is configured to calculate the spectrum of the source filtered by the reflection coefficient (R_spr ( ⁇ )) of the transducer (13).
• FIG. 1 illustrates, for a given wavelength, two truncated interferograms, measured between two instants, and produced with a device according to one embodiment of the invention
• FIG. 2a illustrates the comparison of the variation of the reflection coefficient as a function of the wavelength between a simulation and an experiment with a device according to one embodiment of the invention
• FIG. 2b illustrates the comparison of the variation of the phase shift introduced by the reflection of the first beam F1 on the transducer in polarization TM, taking as phase of reference the phase in polarization TE, as a function of the wavelength between a simulation and an experiment with a device according to an embodiment of the invention
• FIG. 3 illustrates an embodiment of an interferometric device according to the invention
• FIG. 4 illustrates an embodiment of an interferometric device according to an embodiment with a microfluidic cell
• FIG. 5 illustrates another embodiment of an interferometric device according to an embodiment with a microfluidic cell
• FIG. 6 illustrates a function of the surface of the diopter D1 comprising a plurality of transducers.
• the invention aims to analyze the properties or nature of biological or chemical compounds included in a fluid, ie a liquid or a gas, based on spectrometry.
• a light source 1 when active, generates an incident light beam FO, said "incident beam” concisely.
• the incident beam FO is monochromatic. In another embodiment, the incident beam FO is poly chromatic, and in this case, white light.
• a collimator 2 for obtaining a beam of parallel rays from the incident beam.
• the collimator is a lens system known to those skilled in the art.
• the collimator 2 further comprises a separator which takes a few percent of the power of the incident beam FO.
• This sampling makes it possible to control the power of the light source, in the laser case, using a first power meter 40a, in this case a photodiode calibrated, and normalize the power measurement by the second power meter 40b described later.
• An optical fiber (not shown) can be provided between the light source and the collimator 2.
• a polarizer 3 configured to polarize the incident beam F0, in the case where the source is not polarized, in TM polarization (electric field in the incidence plane xoz) or TE (magnetic field in the plane xoz incidence), particularly when the transducer 13 described later is configured to perform plasmon resonance based (SPR) transduction.
• the polarizer is located before the element that takes a portion of the beam F0 to the power meter 40a, to account for intensity fluctuations related to polarization effects of the source, in this case laser.
• a separator is provided, preferably downstream of the collimator, configured to separate the incident beam F0 into a first incident beam F1 and a second incident beam F2.
• the ratio of the separator is chosen so as to maintain the highest possible fringe contrast by balancing the powers of the beams F1 and F2 at the diopter D2.
• a 10/90 separator can be selected so as to increase the power of the beam F1 relative to the beam F 2 to compensate for the strong absorption of the photons which excite the resonance surface plasmons.
• a 50/50 separator can be provided.
• the separator may be a splitter plate, the metallization of a diopter (for example a semi-reflective mirror), or a splitter cube 20, in particular as described below.
• the separator is a separator cube 20, made for example by assembling a first right isosceles prism 21 and a second identical isosceles right prism 22, assembled by their hypotenuse whose one serves as a separator, for example by metallization thereof.
• the assembly of the separator cube 20 is easy and inexpensive to manufacture because the right isosceles prisms are the most common prisms and very affordable price.
• An optical block 10 is also provided, making it possible to interfere with the two incident beams F1 and F2 coming from the separator.
• Optical block means a solid and transparent element with preferably isotropic optical properties and comprising an assembly of at least three plane surfaces, each flat surface having a plane diopter function as soon as said plane surface of said optical block is placed in a plane. a refractive index medium different from that of said block.
• the optical unit 10 comprises a first diopter D1, a second diopter D2 and a third diopter D3.
• the first diopter D1 is parallel to the third diopter D3 and perpendicular to the second diopter D2.
• the realization of an optical unit is not limited to this configuration alone.
• diopter means a surface separating two unevenly transparent refractive media.
• a surface separating a first medium, in this case said optical block a second medium whose refractive index is different from that of said first medium, in this case a fluid.
• the fluid may be a gas, for example air, any other gas or mixture of gases; or a liquid, placed in contact with a transducer 13 for example by means of a microfluidic cell 15.
• the second medium must have a refractive index lower than that of the optical block.
• the optical unit 10 may be made of glass or of synthetic material whose refractive index is close to that of glass.
• the optical block can be molded or assembled for example by means of a glue (molecular, UV ...) and a gel index.
• the first diopter D1 of the optical block 10 supports a transducer 13 configured to perform transduction based on plasmon resonance, ie the resonant absorption of photons by the electrons of a thin metal layer.
• the photons of a light source ie the beam F1
• This excitation in particular the resonance frequency of this excitation, is very sensitive to the variation of the index of refraction of the fluid medium in contact with the metal layer.
• a measurement of the properties of the light that interacts with the transducer 13 then makes it possible to trace the variation of the refractive index in the vicinity of the metal layer.
• This index variation is essentially related to the adsorption of specific molecules (chemical or biological compounds) that one seeks to detect.
• SPR Surface Plasmon Resonance Anglicism
• the transducer is a thin metallic layer, in this case gold, evaporated on the surface of a diopter D1 of the optical unit 10.
• the transducer 13 may comprise, in addition to the thin metal layer, elements capable of combining with complementary biological or chemical compounds that are to be detected and contained in a fluid in contact with said thin metallic layer.
• This functionalization ⁇ organic chemical surface allows for so-called selective measures.
• the second diopter D2 of the optical unit 10 supports a network of nanostructures centered around the convergence point ZOPD, which enables the interferogram to be detected by an optical sensor 30, for example a CCD camera, disposed opposite -vis nanostructures. It is expected that the third diopter D3 of the optical unit 10 is left in the open air.
• the third diopter D3 of the optical unit 10 supports a transducer 14, different from the transducer 13 supported by the first diopter D1.
• the effects of interactions between biological or chemical compounds that the aim is to detect and the transducer 14 are known, in order to allow a differential analysis of the effects of the interactions of the biological or chemical compounds that one seeks to detect with between on the one hand the first diopter D1 carrying the transducer 13 and on the other hand the third diopter D3 possibly carrying the transducer 14.
• the optical block 10 is provided to be an assembly of a first isosceles right prism 11 with a second right isosceles prism 12, in which the length of one side of the second right isosceles prism 12 is equal to the half of the length of the hypotenuse of the first right isosceles prism 11, ie the length of the hypotenuse of the second right isosceles prism 12 is equal to the length of one side of the first right isosceles prism 11.
• the second prism 12 is assembled by one of its sides on one half of the hypotenuse of the first prism 11 so that the hypotenuse of the second prism 12 is parallel to one side of the first prism 11, and so that a cross section of the optical block 10 thus produced is inscribed in a square.
• the separator cube 20 is assembled by one of its faces between the free half of the hypotenuse of the first prism 11 of the optical block and the free side of the second prism 12 of the optical block.
• the plane 23 of the separator which is an extension of the diagonal of the separator cube, passes through the center of the hypotenuse of the first prism 11 (which is also the apex of the second prism 12 of the optical block) and the center of the second diopter D2.
• the first right isosceles prism 11 of the optical block can be predicted to be identical to one of the prisms 21, 22 of the separator cube 20.
• the optical block 10 obtained by assembly, possibly combined with the separator cube 20 can also be obtained by molding.
• the optical block, possibly combined with the separator cube advantageously has a plane of symmetry passing through the plane 23 of the separator, illustrated by dotted lines in FIG.
• One of the optical block dioptres in this case the second diopter D2, carries nanostructures which make it possible to sample spatially (in the xoy plane) an interferogram produced by the interference of the first beam Fl in total internal reflection on this dioptre with the second beam F2 in total internal reflection on the same diopter, as described in the patent FR2929402 of the applicant.
• the central fringe of the interferogram which corresponds to the ZOPD convergence point, is ideally centered on the network of nanostructures.
• the optical block 10 is configured so that the first beam Fl undergoes total internal reflection on the diopter carrying the transducer before reaching the ZOPD convergence point.
• the angle between the first diopter D1 and the second diopter D2 may be a right angle as shown in Figure 3, or different, as shown in Figure 4 or Figure 5.
• the ZOPD convergence point is also called the zero-path difference point and corresponds to the position of the central fringe of the interferogram forming on the diopter carrying the D2 nanostructures.
• a beam consists of rays.
• the geometric structure of a collimated FO beam is cylindrically symmetrical with an axis of symmetry.
• the beams of the beams F1 and F2 coincide with the axes of symmetry of said beams F1 and F2.
• Rays that are not confused with the axis of symmetry interfere with phase shifts that depend on their distance from the axis of symmetry of the beam. This gives the figure of interference with maxima and minima of intensity on both sides of the central fringe.
• the position of the central fringe of the ZOPD interferogram can be controlled and adjusted by construction, as a function of the dimensions of the first right isosceles prism 11, of the second right isosceles prism 12 of the optical block 10. It can also be provided according to the point input of the incident beam FO in the separator cube 20, that is to say of the position of the point S along the plane 23. It is possible to define:
• the plane 23 of the separator does not pass through the middle of the diopter D2.
• the incident beam FO is always parallel to the hypotenuse of the prism 11.
• the optical paths of the two beams F1 and F2 are equal to the convergence point ZOPD.
• the ZOPD convergence point belongs to the plane containing the second diopter D2.
• the length of one side of the second right isosceles prism 12 ie B
• the length of one side of the second right isosceles prism 12 ie B
• the length of one side of the second right isosceles prism 12 ie B) is equal to half the length of the hypotenuse of the first right isosceles prism.
• we then have a plane of symmetry which contains the diagonal separator of the cube. Consequently, the ZOPD convergence point must belong to this plane of symmetry, that is to say ⁇ 0.
• the refractive index of the first prism 11 and the second prism 12 of the optical block is the same as that of the separator cube 20. This makes it possible to control the optical paths by geometrical construction and to avoid retro-reflections. reflections (see multiple reflections) related to the passage of light through two media of different indices.
• any separator can be used in combination with the optical block 10.
• the use of a separator having a refractive index different from the refractive index of the optical block 10 can influence the optical path of at least one of the first beam Fl and second beam F2.
• the light source 1 emitting the incident beam F0 may be monochromatic, possibly tunable, or a broadband source.
• the incident beam F0 preferably arrives at normal incidence on the surface of the separator cube 20.
• the separator separates the incident beam F0 at a separation point S (FIG. 3) into a first incident beam F1 and a second incident beam F2. Between the point of separation S and the point of convergence
• the angle of incidence of the incident beam FO on the separator is such that the incident beam F1 and the incident beam F2 undergo a total internal reflection on each diopter of the optical block.
• a plurality of total internal reflections of the incident beams F1 and F2 can be provided in the optical unit 10, as illustrated in FIG. 4 and FIG. 5, provided that the optical paths of the first incident beam F1 and the second incident beam F2 are controlled from so as to position the ZOPD convergence point in the center of the interferogram detection zone. But the number of reflections influences the risk of loss of quality or power of the optical signal carried by the incident beams Fl and F2.
• the number of total internal reflections between the separation point S and the convergence point ZOPD is as small as possible for each incident beam F1 and F2.
• FIG. 3 provides for the first incident beam F1 a single total internal reflection on the diopter D1 of the optical unit 10, then a total internal reflection at the ZOPD convergence point on the diopter D2 of the optical unit 10 carrying the nanostructures.
• the second incident beam F2 a single total internal reflection on the diopter D3 of the optical block 10, and a total internal reflection at the ZOPD convergence point on the diopter D2 of the optical block 10 carrying the nanostructures.
• the first incident beam F1 undergoes total internal reflection on the diopter D3 of the optical unit 10, then a reflection on the separator, identical to that undergone by the beam FO to give the beam F1 and which is not an internal total reflection, before being recombined at the second incident beam F2 into an output beam FO 'on the second power meter 40b; and the second incident beam F2 undergoes a total internal reflection on the diopter Dl of the optical block 10, then a transmission and a reflection (loss in reflection towards the source 1) on the separator.
• the transmitted portion of the second incident beam F2 is recombined at S to the reflected portion of the first incident beam F1 to constitute the output beam FO 'on the power meter 40b.
• the total power of the output beam F0 ' is then equal to half of the incident power F0 in the case where the losses in the optical elements are negligible.
• the other half of the power goes back to source 1.
• the transducer 13 disturbs the evanescent wave generated by the first incident beam F1, which introduces a change in amplitude and in phase of said first incident beam F1, according to a function of the reflection coefficient R (X ) and the phase shift ⁇ ( ⁇ ) related to the transducer and the incident wavelength.
• the peculiarity of the transducer is that the coefficients R and ⁇ are very sensitive to the refractive index of the surrounding medium, which is the very principle of the operation of a transducer.
• a small variation of the environment results in a modification of its refractive index which modifies in turn the coefficients R and ⁇ .
• Information on the state of the environment is thus obtained by measuring the optical magnitudes R and ⁇ .
• the amplitude of the incident beam F1 after total internal reflection on the diopter D1 carrying the transducer 13 is equal to A_F1 ( ⁇ ) * R ( ⁇ ) exp [ ⁇ * ⁇ ( ⁇ )], with A_F1 ( ⁇ ) the amplitude of the incident beam before total internal reflection on said diopter Dl carrying the transducer 13; the power or intensity of a light beam expressing itself as the standard squared amplitude.
• This modification in amplitude and in phase of the beam Fl makes it possible to detect the biological or chemical compounds contained in a fluid in contact with the transducer 13, by measuring the variations of the reflection coefficient R (X) and of the phase shift ⁇ ( ⁇ ) of said first beam Fl incident when it interferes with the F2 beam.
• the interferogram generated at the level of the diopter D2 bearing the nanostructures of the optical block 10 is picked up by an optical sensor 30, in this case a CCD camera, which transmits its information to the computer 50, in this case a computer equipped with a calculation software and a memory.
• ⁇ II is possible thanks to the calculator 50 to determine the incident spectrum F0 by Fourier transform of 1 interferogram sensed by the optical sensor 30 and thus access to the wavelength or wavelength F0 which is (are) recorded (s) in a memory.
• the wavelength is obtained by considering the norm of the fourrier transform of the interferogram sampled spatially according to the method described in patent FR2929402. R calculation
• a power meter 40b for example a calibrated photodiode, makes it possible to measure the power of the beam (or indifferently signal) F0 'at the output of the optical unit 10 and of the separator, by recombination of the beams F 1 and F 2 which have interfered with each other.
• the measured power P_mes (X) is a function of the power P_F0 ( ⁇ ) of the incident beam emitted by the light source 1, which is known or measured, and of the reflectivity R_spr ( ⁇ ).
• R_spr (X) we mean indistinctly reflectivity R_spr (X) or reflection coefficient R (X).
• R_spr (X) the index "_spr” applied to the reflection coefficient R (X) simply means a particular transducer 13, in this case SPR type.
• the calculator 50 can then calculate the reflectivity R_spr (X), typically according to the equation
• the advantage is that the measurement can be in a single acquisition of the interferogram.
• the second power meter 40b is not necessary.
• the measured spectrum ( ⁇ ) is equal to the spectrum of the source (1) multiplied (filtered) by the reflectivity R_spr ( ⁇ ).
• phase calculation ⁇ we mean the relative phase with respect to a reference phase.
• phase ⁇ ( ⁇ ) can be deduced directly by exploiting one measured interferogram and which is expressed according to the following formula:
• I (x,, t0) A0 + B0 x Cos (2 ⁇ / ⁇ + ⁇ 0)
• A0 and A1 are offsets
• B0 and B1 are the amplitudes or contrasts of the interference fringes. These coefficients are obtained, in a first step of the digital processing, by applying an adjustment curve to the recorded interferograms. This adjustment can be done conventionally using a least squares method.
• n is the refractive index of the prism 11 and ⁇ the angle of incidence of the beams Fl and F2 at the diopter D2.
• ⁇ - ⁇ 2XArcCos (Amp01 / 2)
• the present solution allows access to the reflectivity and the relative phase by experimentally determining the amplitude and phase transfer functions of a SPR type transducer. constituted in this case a thin layer of gold deposited on the face of the prism corresponding to the diopter Dl.
• the reference phase for each wavelength ⁇ was measured by considering a TE polarization (electric field perpendicular to the plane of incidence is E // 0Y).
• E // 0Y electric field perpendicular to the plane of incidence
• the spectral response of a SPR layer is flat (no excitation plasmon in TE).
• the transfer function of an SPR layer is given by exciting the electrons with a TM polarization (electric field in the plane of incidence). Taking the TE signal as a reference is commonly used in this type of SPR sensor.
• the experimental curve of Figure 2b was obtained by considering the interferograms I (x,, TE) and ⁇ ( ⁇ , ⁇ , ⁇ ) independently of time (considering that the interferogram are stable over time when nothing disturbs the transducer, in this case in contact with air and at a controlled temperature of 22 ° C). For each wavelength (between 500 and 700nm) two interferograms I (x,, TE) and ⁇ ( ⁇ , ⁇ , ⁇ ) are recorded and the signal processing described above is applied to determine ⁇ - ⁇ .
• a first measurement of I is made at a time t0 whose value I (t0) is stored in a memory, then a second measurement at a time t1 whose value I (tl) is stored in a memory.
• the difference between these two values I (tl) -I (t0) makes it possible to calculate the value of the phase ⁇ ( ⁇ ) which corresponds to the phase variation undergone by the beam Fl (and F2 in the case where one considers transducer 14) between times t0 and t1.
• Figure 1 shows two truncated interferograms for a given wavelength (in this case 630nm), measured between two instants, in this case 10 minutes apart.
• the curves of FIG. 1 illustrate the spatial distribution along the axis (ox) of the intensity received by the optical sensor 30 around the convergence point ZOPD, in this case according to a method described in patent FR2929402.
• FIG. 2a illustrates the variation of the reflection coefficient R (X) as a function of the wavelength for a simulation compared to an experiment, in which the minimum of the curve corresponds to the maximum absorption of the photons by the electrons of the SPR layer and defines the plasmon resonance wavelength.
• the intensity transfer function (reflectivity) of the SPR transducer has been measured using the device proposed here, with a very good agreement with the simulations. It is therefore entirely possible to use the proposed device as a SPR sensor with intensity interrogation.
• the first diopter D1 comprises a plurality of transduction zones, each zone comprising a specific surface chemical treatment, so that each zone can be considered as an individual transducer.
• the position of each zone or each transducer is known.
• FIG. 6 diagrammatically shows a view from above of the first diopter D1 comprising for this example four transduction zones.
• Each zone 131, 132, 133, 134 comprises a specific surface chemical treatment, preferably different from one zone to another, which allows multi-species chemical or biological detection.
• each interference zone ZI, Z2, Z3, Z4 comprises a network of nanostructures.
• the position of each interference zone or network of nanostructures is known.
• the optical block 10 is configured such that a given transduction zone is disposed in correspondence with a given interference zone, so that the total internal reflection of the first incident beam F1 on a given transduction zone can not interfere with the second incident beam F2 only on a given interference zone.
• the transduction zone 132 is arranged in correspondence with the interference zone Z2 so that the beam F1, shown in dotted lines, undergoes a total internal reflection on the transduction zone 132 and then interferes with the second beam F2 (not shown) on the Z2 interference zone.
• each transduction zone is configured to detect a given chemical or biological species.
• the incident beam FO is monochromatic.
• the invention it is possible to obtain a compact system making it possible to have simultaneous access to the spectral distribution of the amplitude and the relative phase of the beam FO incident having interacted with at least one transducer 13, 14 through the Fl or F2 beams.
• the two incident beams Fl and F2 interfere in extremely stable conditions (in this case encapsulated in the glass); that is to say that the interferogram obtained at the diopter D2 carrying the nanostructures depends only on R (X) and ⁇ ( ⁇ ); and that the two interference beams F1 and F2 have extremely stable relative phases.

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