EP2956064A4 - Large field of view grating interferometers for x-ray phase contrast imaging and ct at high energy - Google Patents

Large field of view grating interferometers for x-ray phase contrast imaging and ct at high energy

Info

Publication number
EP2956064A4
EP2956064A4 EP14757381.0A EP14757381A EP2956064A4 EP 2956064 A4 EP2956064 A4 EP 2956064A4 EP 14757381 A EP14757381 A EP 14757381A EP 2956064 A4 EP2956064 A4 EP 2956064A4
Authority
EP
European Patent Office
Prior art keywords
high energy
phase contrast
large field
contrast imaging
ray phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP14757381.0A
Other languages
German (de)
French (fr)
Other versions
EP2956064A2 (en
Inventor
Dan Stutman
Michael Finkenthal
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Johns Hopkins University
Original Assignee
Johns Hopkins University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johns Hopkins University filed Critical Johns Hopkins University
Publication of EP2956064A2 publication Critical patent/EP2956064A2/en
Publication of EP2956064A4 publication Critical patent/EP2956064A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/40Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment with arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4035Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment with arrangements for generating radiation specially adapted for radiation diagnosis the source being combined with a filter or grating
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/48Diagnostic techniques
    • A61B6/484Diagnostic techniques involving phase contrast X-ray imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/18Diffraction gratings
    • G02B5/1814Diffraction gratings structurally combined with one or more further optical elements, e.g. lenses, mirrors, prisms or other diffraction gratings
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/18Diffraction gratings
    • G02B5/1814Diffraction gratings structurally combined with one or more further optical elements, e.g. lenses, mirrors, prisms or other diffraction gratings
    • G02B5/1819Plural gratings positioned on the same surface, e.g. array of gratings
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/18Diffraction gratings
    • G02B5/1866Transmission gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
    • G02B5/1871Transmissive phase gratings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/14Electro-optical investigation, e.g. flow cytometers
    • G01N15/1434Electro-optical investigation, e.g. flow cytometers using an analyser being characterised by its optical arrangement
    • G01N2015/1454Electro-optical investigation, e.g. flow cytometers using an analyser being characterised by its optical arrangement using phase shift or interference, e.g. for improving contrast
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N2021/4173Phase distribution
    • G01N2021/4186Phase modulation imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/18Diffraction gratings
    • G02B5/1838Diffraction gratings for use with ultraviolet radiation or X-rays
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/18Diffraction gratings
    • G02B5/1842Gratings for image generation
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/02Optical fibres with cladding with or without a coating
    • G02B6/02057Optical fibres with cladding with or without a coating comprising gratings
    • G02B6/02076Refractive index modulation gratings, e.g. Bragg gratings
    • G02B6/0208Refractive index modulation gratings, e.g. Bragg gratings characterised by their structure, wavelength response
    • G02B6/02085Refractive index modulation gratings, e.g. Bragg gratings characterised by their structure, wavelength response characterised by the grating profile, e.g. chirped, apodised, tilted, helical
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Medical Informatics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
EP14757381.0A 2013-02-12 2014-04-09 Large field of view grating interferometers for x-ray phase contrast imaging and ct at high energy Withdrawn EP2956064A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361763683P 2013-02-12 2013-02-12
US14/176,655 US9329141B2 (en) 2013-02-12 2014-02-10 Large field of view grating interferometers for X-ray phase contrast imaging and CT at high energy
PCT/US2014/033561 WO2014134634A2 (en) 2013-02-12 2014-04-09 Large field of view grating interferometers for x-ray phase contrast imaging and ct at high energy

Publications (2)

Publication Number Publication Date
EP2956064A2 EP2956064A2 (en) 2015-12-23
EP2956064A4 true EP2956064A4 (en) 2016-11-09

Family

ID=51297425

Family Applications (1)

Application Number Title Priority Date Filing Date
EP14757381.0A Withdrawn EP2956064A4 (en) 2013-02-12 2014-04-09 Large field of view grating interferometers for x-ray phase contrast imaging and ct at high energy

Country Status (4)

Country Link
US (2) US9439613B2 (en)
EP (1) EP2956064A4 (en)
KR (1) KR20160014576A (en)
WO (2) WO2014134634A2 (en)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9805834B2 (en) * 2009-05-19 2017-10-31 Koninklijke Philips N.V. Grating for phase-contrast imaging
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
WO2014137325A1 (en) * 2012-03-05 2014-09-12 University Of Rochester Methods and apparatus for differential phase-contrast cone-beam ct and hybrid cone-beam ct
CN104244828B (en) * 2012-04-24 2017-06-30 西门子公司 X-ray equipment
US9494534B2 (en) 2012-12-21 2016-11-15 Carestream Health, Inc. Material differentiation with phase contrast imaging
US9001967B2 (en) * 2012-12-28 2015-04-07 Carestream Health, Inc. Spectral grating-based differential phase contrast system for medical radiographic imaging
US9357975B2 (en) * 2013-12-30 2016-06-07 Carestream Health, Inc. Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
US9724063B2 (en) 2012-12-21 2017-08-08 Carestream Health, Inc. Surrogate phantom for differential phase contrast imaging
US10578563B2 (en) 2012-12-21 2020-03-03 Carestream Health, Inc. Phase contrast imaging computed tomography scanner
US9907524B2 (en) 2012-12-21 2018-03-06 Carestream Health, Inc. Material decomposition technique using x-ray phase contrast imaging system
US9700267B2 (en) 2012-12-21 2017-07-11 Carestream Health, Inc. Method and apparatus for fabrication and tuning of grating-based differential phase contrast imaging system
US10096098B2 (en) 2013-12-30 2018-10-09 Carestream Health, Inc. Phase retrieval from differential phase contrast imaging
AU2012268876A1 (en) * 2012-12-24 2014-07-10 Canon Kabushiki Kaisha Non-linear solution for 2D phase shifting
US9439613B2 (en) * 2013-02-12 2016-09-13 The Johns Hopkins University System and method for phase-contrast X-ray imaging
US10085701B2 (en) * 2013-07-30 2018-10-02 Konica Minolta, Inc. Medical image system and joint cartilage state score determination method
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US9936935B1 (en) * 2014-02-14 2018-04-10 Nosil DSC Innovations, Inc. Phantom systems and methods for diagnostic radiographic and fluoroscopic X-ray equipment
KR20170015886A (en) * 2014-05-09 2017-02-10 더 존스 홉킨스 유니버시티 System and method for phase-contrast x-ray imaging
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
JP6451400B2 (en) * 2015-02-26 2019-01-16 コニカミノルタ株式会社 Image processing system and image processing apparatus
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
EP3314576B1 (en) 2015-06-26 2019-11-27 Koninklijke Philips N.V. Robust reconstruction for dark-field and phase contrast ct
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
CN109690627A (en) 2016-09-08 2019-04-26 皇家飞利浦有限公司 Improved phase contrast and dark field CT algorithm for reconstructing
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
US11026643B2 (en) 2016-12-06 2021-06-08 Koninklijke Philips N.V. Interferometer grating support for grating-based x-ray imaging and/or a support bracket therefor
WO2018175570A1 (en) 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
WO2019236384A1 (en) 2018-06-04 2019-12-12 Sigray, Inc. Wavelength dispersive x-ray spectrometer
US10658145B2 (en) 2018-07-26 2020-05-19 Sigray, Inc. High brightness x-ray reflection source
EP3603515A1 (en) 2018-08-01 2020-02-05 Koninklijke Philips N.V. Apparatus for generating x-ray imaging data
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
WO2020051061A1 (en) 2018-09-04 2020-03-12 Sigray, Inc. System and method for x-ray fluorescence with filtering
DE112019004478T5 (en) 2018-09-07 2021-07-08 Sigray, Inc. SYSTEM AND PROCEDURE FOR X-RAY ANALYSIS WITH SELECTABLE DEPTH
CN113597285A (en) * 2018-12-03 2021-11-02 北卡罗来纳大学教堂山分校 Compact x-ray apparatus, system and method for tomosynthesis, fluoroscopy and stereotactic imaging
US11639903B2 (en) 2019-03-25 2023-05-02 Battelle Memorial Institute Serial Moire scanning phase contrast x-ray imaging
US11006912B2 (en) 2019-03-25 2021-05-18 Battelle Memorial Institute Methods, systems, and computer-readable storage media for enhanced phase-contrast x-ray imaging
DE112020004169T5 (en) 2019-09-03 2022-05-25 Sigray, Inc. SYSTEM AND METHODS FOR COMPUTER-ASSISTED LAMINOGRAM X-RAY FLUORESCENCE IMAGING
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11215572B2 (en) 2020-05-18 2022-01-04 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
US11686692B2 (en) 2020-12-07 2023-06-27 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
WO2023215204A1 (en) 2022-05-02 2023-11-09 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090092227A1 (en) * 2005-06-06 2009-04-09 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
US20130028378A1 (en) * 2011-07-29 2013-01-31 The Johns Hopkins University Differential phase contrast x-ray imaging system and components

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4798446A (en) 1987-09-14 1989-01-17 The United States Of America As Represented By The United States Department Of Energy Aplanatic and quasi-aplanatic diffraction gratings
US5812629A (en) 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
US6804324B2 (en) 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
US7315611B2 (en) 2003-06-03 2008-01-01 Monochromatic X-Ray Technologies, Inc. X-ray reflector exhibiting taper, method of making same, narrow band x-ray filters including same, devices including such filters, multispectral x-ray production via unispectral filter, and multispectral x-ray production via multispectral filter
DE102006037281A1 (en) 2006-02-01 2007-08-09 Siemens Ag X-ray radiographic grating of a focus-detector arrangement of an X-ray apparatus for generating projective or tomographic phase-contrast images of an examination subject
US7659529B2 (en) * 2007-04-13 2010-02-09 Cymer, Inc. Method and apparatus for vibration reduction in laser system line narrowing unit wavelength selection optical element
US7949095B2 (en) * 2009-03-02 2011-05-24 University Of Rochester Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
JP2010253194A (en) 2009-04-28 2010-11-11 Fujifilm Corp Radiation phase imaging apparatus
US8855265B2 (en) 2009-06-16 2014-10-07 Koninklijke Philips N.V. Correction method for differential phase contrast imaging
JP5238786B2 (en) 2010-10-26 2013-07-17 富士フイルム株式会社 Radiography apparatus and radiation imaging system
WO2013096974A1 (en) * 2011-12-21 2013-06-27 THE UNITED STATES OF AMERICA, as represented by THE SECRETARY DEPT. OF HEALTH AND HUMAN SERVICES Multilayer-coated micro grating array for x-ray phase sensitive and scattering sensitive imaging
US9439613B2 (en) * 2013-02-12 2016-09-13 The Johns Hopkins University System and method for phase-contrast X-ray imaging

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090092227A1 (en) * 2005-06-06 2009-04-09 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
US20130028378A1 (en) * 2011-07-29 2013-01-31 The Johns Hopkins University Differential phase contrast x-ray imaging system and components

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
See also references of WO2014134634A2 *
STUTMAN D ET AL: "Glancing angle Talbot-Lau grating interferometers for phase contrast imaging at high x-ray energy", APPLIED PHYSICS LETTERS, A I P PUBLISHING LLC, US, vol. 101, no. 9, 27 August 2012 (2012-08-27), pages 91108 - 91108, XP012164901, ISSN: 0003-6951, [retrieved on 20120828], DOI: 10.1063/1.4748882 *

Also Published As

Publication number Publication date
US20140226785A1 (en) 2014-08-14
WO2015119747A1 (en) 2015-08-13
EP2956064A2 (en) 2015-12-23
US9439613B2 (en) 2016-09-13
WO2014134634A2 (en) 2014-09-04
US20140226782A1 (en) 2014-08-14
US9329141B2 (en) 2016-05-03
KR20160014576A (en) 2016-02-11
WO2014134634A3 (en) 2014-12-04

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