EP2912512A4 - Quantitative phase microscopy for label-free high-contrast cell imaging - Google Patents

Quantitative phase microscopy for label-free high-contrast cell imaging

Info

Publication number
EP2912512A4
EP2912512A4 EP13851247.0A EP13851247A EP2912512A4 EP 2912512 A4 EP2912512 A4 EP 2912512A4 EP 13851247 A EP13851247 A EP 13851247A EP 2912512 A4 EP2912512 A4 EP 2912512A4
Authority
EP
European Patent Office
Prior art keywords
label
cell imaging
free high
quantitative phase
phase microscopy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP13851247.0A
Other languages
German (de)
French (fr)
Other versions
EP2912512A1 (en
Inventor
Evgenia Mikhailovna Kim
Siavash Yazdanfar
Dmitry Vladimirovich Dylov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US13/663,069 external-priority patent/US8934103B2/en
Application filed by General Electric Co filed Critical General Electric Co
Publication of EP2912512A1 publication Critical patent/EP2912512A1/en
Publication of EP2912512A4 publication Critical patent/EP2912512A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP13851247.0A 2012-10-29 2013-10-29 Quantitative phase microscopy for label-free high-contrast cell imaging Withdrawn EP2912512A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/663,069 US8934103B2 (en) 2011-12-22 2012-10-29 Quantitative phase microscopy for label-free high-contrast cell imaging
PCT/SE2013/051257 WO2014070082A1 (en) 2012-10-29 2013-10-29 Quantitative phase microscopy for label-free high-contrast cell imaging

Publications (2)

Publication Number Publication Date
EP2912512A1 EP2912512A1 (en) 2015-09-02
EP2912512A4 true EP2912512A4 (en) 2016-07-13

Family

ID=50627810

Family Applications (1)

Application Number Title Priority Date Filing Date
EP13851247.0A Withdrawn EP2912512A4 (en) 2012-10-29 2013-10-29 Quantitative phase microscopy for label-free high-contrast cell imaging

Country Status (3)

Country Link
EP (1) EP2912512A4 (en)
JP (1) JP2015534134A (en)
WO (1) WO2014070082A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3050038B1 (en) * 2016-04-06 2018-05-18 Lltech Management METHOD AND DEVICE FOR FULL-FIELD INTERFERENTIAL MICROSCOPY IN INCOHERENT LIGHT
JP2018139532A (en) * 2017-02-28 2018-09-13 株式会社島津製作所 Cell observation device
EP3610313B1 (en) * 2017-04-11 2022-03-02 Calico Life Sciences LLC Fluorescence microscopy system and methods based on stimulated emission
JP7080718B2 (en) * 2018-05-08 2022-06-06 株式会社ミツトヨ Optical device and shape measurement method
CN109375358B (en) * 2018-11-28 2020-07-24 南京理工大学 Differential phase contrast quantitative phase microscopic imaging method based on optimal illumination mode design

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001025721A1 (en) * 1999-10-06 2001-04-12 Metrolaser, Inc. Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
WO2003002972A2 (en) * 2001-06-29 2003-01-09 Universite Libre De Bruxelles Method and device for obtaining a sample with three-dimensional microscopy
US20080285048A1 (en) * 2007-05-18 2008-11-20 National Taipei University Of Technology Method and apparatus for simultaneously acquiring interferograms and method for solving the phase information
US20100231896A1 (en) * 2009-03-16 2010-09-16 Mann Christopher J Quantitative phase-contrast and excitation-emission systems
WO2012103233A1 (en) * 2011-01-25 2012-08-02 Massachusetts Institute Of Technology Single-shot full-field reflection phase microscopy

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5241364A (en) * 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
JPH1123372A (en) * 1997-07-02 1999-01-29 Res Dev Corp Of Japan Light wave coherence imaging method and apparatus
EP1232377B1 (en) * 1999-11-24 2004-03-31 Haag-Streit Ag Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object
JP4409331B2 (en) * 2004-03-30 2010-02-03 株式会社トプコン Optical image measuring device
US20070242133A1 (en) * 2004-06-30 2007-10-18 Nikon Corporation Microscope Observation Method, Microscope, Differentiation Interference Microscope, Phase Difference Microscope, Interference Microscope, Image Processing Method, and Image Processing Device
CN101147052B (en) * 2005-03-25 2012-01-11 麻省理工学院 System and method for Hilbert phase imaging
US8537461B2 (en) * 2007-11-26 2013-09-17 Carl Zeiss Microimaging Gmbh Method and configuration for the optical detection of an illuminated specimen
US7884997B2 (en) * 2007-11-27 2011-02-08 Northrop Grumman Systems Corporation System and method for coherent beam combination
US8693000B2 (en) * 2011-12-22 2014-04-08 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
US9097900B2 (en) * 2012-06-14 2015-08-04 General Electric Company Quantitative phase microscopy for high-contrast cell imaging using frequency domain phase shift

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001025721A1 (en) * 1999-10-06 2001-04-12 Metrolaser, Inc. Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
WO2003002972A2 (en) * 2001-06-29 2003-01-09 Universite Libre De Bruxelles Method and device for obtaining a sample with three-dimensional microscopy
US20080285048A1 (en) * 2007-05-18 2008-11-20 National Taipei University Of Technology Method and apparatus for simultaneously acquiring interferograms and method for solving the phase information
US20100231896A1 (en) * 2009-03-16 2010-09-16 Mann Christopher J Quantitative phase-contrast and excitation-emission systems
WO2012103233A1 (en) * 2011-01-25 2012-08-02 Massachusetts Institute Of Technology Single-shot full-field reflection phase microscopy

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
DUBOIS F ET AL: "Improved three-dimensional imaging with a digital holography microscope with a source of partial spatial coherence", APPLIED OPTICS, OPTICAL SOCIETY OF AMERICA, WASHINGTON, DC; US, vol. 38, no. 34, 1 December 1999 (1999-12-01), pages 7085 - 7094, XP002232391, ISSN: 0003-6935, DOI: 10.1364/AO.38.007085 *
See also references of WO2014070082A1 *
ZHUO WANG ET AL: "Spatial light interference microscopy (SLIM)", OPTICS EXPRESS, vol. 19, no. 2, 17 January 2011 (2011-01-17), pages 1016, XP055145500, ISSN: 1094-4087, DOI: 10.1364/OE.19.001016 *

Also Published As

Publication number Publication date
JP2015534134A (en) 2015-11-26
EP2912512A1 (en) 2015-09-02
WO2014070082A1 (en) 2014-05-08

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