EP2791617A4 - Material thickness measuring device - Google Patents

Material thickness measuring device

Info

Publication number
EP2791617A4
EP2791617A4 EP12858673.2A EP12858673A EP2791617A4 EP 2791617 A4 EP2791617 A4 EP 2791617A4 EP 12858673 A EP12858673 A EP 12858673A EP 2791617 A4 EP2791617 A4 EP 2791617A4
Authority
EP
European Patent Office
Prior art keywords
measuring device
material thickness
thickness measuring
thickness
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP12858673.2A
Other languages
German (de)
French (fr)
Other versions
EP2791617A1 (en
Inventor
Bengt Åkerblom
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daprox AB
Original Assignee
Daprox AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daprox AB filed Critical Daprox AB
Publication of EP2791617A1 publication Critical patent/EP2791617A1/en
Publication of EP2791617A4 publication Critical patent/EP2791617A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/40—Caliper-like sensors
    • G01B2210/42—Caliper-like sensors with one or more detectors on a single side of the object to be measured and with a backing surface of support or reference on the other side

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
EP12858673.2A 2011-12-14 2012-12-13 Material thickness measuring device Withdrawn EP2791617A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE1151195 2011-12-14
PCT/SE2012/051384 WO2013089627A1 (en) 2011-12-14 2012-12-13 Material thickness measuring device

Publications (2)

Publication Number Publication Date
EP2791617A1 EP2791617A1 (en) 2014-10-22
EP2791617A4 true EP2791617A4 (en) 2014-12-10

Family

ID=48612941

Family Applications (1)

Application Number Title Priority Date Filing Date
EP12858673.2A Withdrawn EP2791617A4 (en) 2011-12-14 2012-12-13 Material thickness measuring device

Country Status (2)

Country Link
EP (1) EP2791617A4 (en)
WO (1) WO2013089627A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113375550B (en) * 2021-04-25 2022-09-20 山西迪迈沃科光电工业有限公司 Non-contact internal thread detection device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3753096A (en) * 1971-02-04 1973-08-14 Automation Ind Inc Eddy current flaw detection system with left off compensation
US4977853A (en) * 1989-06-01 1990-12-18 E. I. Du Pont De Nemours And Company Non-contact wet or dry film thickness measuring device
EP0801288A1 (en) * 1996-04-12 1997-10-15 Beta Instrument Company Limited Thickness measuring device
US20050104585A1 (en) * 2003-11-13 2005-05-19 Yuli Bilik Methods and devices for eddy current PCB inspection

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5644803A (en) * 1979-09-21 1981-04-24 Bridgestone Corp System measuring for thickness of nonmetallic sheet like object
US5355083A (en) * 1988-11-16 1994-10-11 Measurex Corporation Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate
DE3919131A1 (en) * 1989-06-12 1990-12-13 Tzn Forschung & Entwicklung DEVICE AND METHOD FOR CONTACTLESS MEASUREMENT OF THE LAYER THICKNESS OF A NON-CONDUCTIVE MATERIAL, AND USE OF THE DEVICE FOR MEASURING PLASTIC-COVERED METAL PARTS
DE4221031C2 (en) * 1992-06-26 1995-08-24 Voith Gmbh J M Device for measuring the thickness of thin moving substrates
FR2707109B1 (en) * 1993-06-30 1995-09-01 Pont A Mousson Device and method for non-contact measurement of internal coatings of cast iron pipes.
JP2002148012A (en) * 2000-11-08 2002-05-22 Ulvac Japan Ltd Apparatus and method for measurement of film thickness
US6608495B2 (en) * 2001-03-19 2003-08-19 Applied Materials, Inc. Eddy-optic sensor for object inspection
US7173417B1 (en) * 2003-03-28 2007-02-06 Nanometrics Incorporated Eddy current sensor with concentric confocal distance sensor
EP2406579A4 (en) * 2009-03-12 2017-02-15 Daprox Ab Method and means for non-contact measuring thickness of non-metal coating on surface of metal matrix

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3753096A (en) * 1971-02-04 1973-08-14 Automation Ind Inc Eddy current flaw detection system with left off compensation
US4977853A (en) * 1989-06-01 1990-12-18 E. I. Du Pont De Nemours And Company Non-contact wet or dry film thickness measuring device
EP0801288A1 (en) * 1996-04-12 1997-10-15 Beta Instrument Company Limited Thickness measuring device
US20050104585A1 (en) * 2003-11-13 2005-05-19 Yuli Bilik Methods and devices for eddy current PCB inspection

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2013089627A1 *

Also Published As

Publication number Publication date
EP2791617A1 (en) 2014-10-22
WO2013089627A1 (en) 2013-06-20

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Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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17P Request for examination filed

Effective date: 20140603

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

A4 Supplementary search report drawn up and despatched

Effective date: 20141106

RIC1 Information provided on ipc code assigned before grant

Ipc: G01B 7/06 20060101AFI20141031BHEP

Ipc: G01B 21/08 20060101ALI20141031BHEP

Ipc: G01B 11/06 20060101ALI20141031BHEP

DAX Request for extension of the european patent (deleted)
STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN

18D Application deemed to be withdrawn

Effective date: 20150606