EP2715278A1 - 3d scanner using structured lighting - Google Patents
3d scanner using structured lightingInfo
- Publication number
- EP2715278A1 EP2715278A1 EP12724736.9A EP12724736A EP2715278A1 EP 2715278 A1 EP2715278 A1 EP 2715278A1 EP 12724736 A EP12724736 A EP 12724736A EP 2715278 A1 EP2715278 A1 EP 2715278A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- image
- intensity features
- subset
- lighting pattern
- intensity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2536—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
- G06T7/586—Depth or shape recovery from multiple images from multiple light sources, e.g. photometric stereo
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
- G06T2207/10012—Stereo images
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10028—Range image; Depth image; 3D point clouds
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10141—Special mode during image acquisition
- G06T2207/10152—Varying illumination
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP12724736.9A EP2715278B1 (en) | 2011-05-24 | 2012-05-11 | 3d scanner using structured lighting |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP11167285 | 2011-05-24 | ||
EP12724736.9A EP2715278B1 (en) | 2011-05-24 | 2012-05-11 | 3d scanner using structured lighting |
PCT/IB2012/052347 WO2012160470A1 (en) | 2011-05-24 | 2012-05-11 | 3d scanner using structured lighting |
Publications (2)
Publication Number | Publication Date |
---|---|
EP2715278A1 true EP2715278A1 (en) | 2014-04-09 |
EP2715278B1 EP2715278B1 (en) | 2019-10-16 |
Family
ID=46197637
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP12724736.9A Active EP2715278B1 (en) | 2011-05-24 | 2012-05-11 | 3d scanner using structured lighting |
Country Status (7)
Country | Link |
---|---|
US (1) | US9982995B2 (en) |
EP (1) | EP2715278B1 (en) |
JP (1) | JP6097282B2 (en) |
CN (1) | CN103562676B (en) |
AU (1) | AU2012260548B2 (en) |
BR (1) | BR112013029691B1 (en) |
WO (1) | WO2012160470A1 (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9947112B2 (en) | 2012-12-18 | 2018-04-17 | Koninklijke Philips N.V. | Scanning device and method for positioning a scanning device |
DE102013201650A1 (en) * | 2013-01-31 | 2014-07-31 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | METHOD AND SYSTEM FOR DETECTING A POSITION OR FORM OF AN ILLUMINATING ELEMENT |
CN105378802B (en) | 2013-05-10 | 2019-02-05 | 皇家飞利浦有限公司 | 3D patient interface device selects system and method |
EP2887009A1 (en) | 2013-12-23 | 2015-06-24 | Universität Zürich | Method for reconstructing a surface using spatially structured light and a dynamic vision sensor |
US9958758B2 (en) | 2015-01-21 | 2018-05-01 | Microsoft Technology Licensing, Llc | Multiple exposure structured light pattern |
JP6512912B2 (en) * | 2015-04-10 | 2019-05-15 | キヤノン株式会社 | Measuring device for measuring the shape of the object to be measured |
DE102016003512A1 (en) * | 2016-03-22 | 2017-09-28 | Rodenstock Gmbh | Method and device for determining 3D coordinates of at least one predetermined point of an object |
WO2017214735A1 (en) * | 2016-06-17 | 2017-12-21 | 7D Surgical Inc. | Systems and methods for obtaining a structured light reconstruction of a 3d surface |
US10122877B2 (en) | 2016-12-20 | 2018-11-06 | Kabushiki Kaisha Toshiba | Image forming apparatus |
US10542245B2 (en) * | 2017-05-24 | 2020-01-21 | Lg Electronics Inc. | Mobile terminal and method for controlling the same |
DE102018205191A1 (en) | 2018-04-06 | 2019-10-10 | Carl Zeiss Industrielle Messtechnik Gmbh | Method and device for detecting coordinates of an object surface by means of triangulation |
US20210196384A1 (en) * | 2019-12-30 | 2021-07-01 | Ethicon Llc | Dynamic surgical visualization systems |
Family Cites Families (32)
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WO1997047942A1 (en) * | 1996-06-13 | 1997-12-18 | K.U. Leuven Research & Development | Method and system for acquiring a three-dimensional shape description |
AU3991799A (en) * | 1998-05-14 | 1999-11-29 | Metacreations Corporation | Structured-light, triangulation-based three-dimensional digitizer |
US6754370B1 (en) * | 2000-08-14 | 2004-06-22 | The Board Of Trustees Of The Leland Stanford Junior University | Real-time structured light range scanning of moving scenes |
JP2002164066A (en) * | 2000-11-22 | 2002-06-07 | Mitsubishi Heavy Ind Ltd | Stacked heat exchanger |
DE10194962T1 (en) | 2000-11-24 | 2003-12-04 | Nihon University Tokio Tokyo | Image processing method |
JP2004520660A (en) | 2001-05-23 | 2004-07-08 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | Depth map calculation |
US7440590B1 (en) * | 2002-05-21 | 2008-10-21 | University Of Kentucky Research Foundation | System and technique for retrieving depth information about a surface by projecting a composite image of modulated light patterns |
EP1649423B1 (en) * | 2003-07-24 | 2008-08-13 | Cognitens Ltd. | Method and sytem for the three-dimensional surface reconstruction of an object |
JP2006010576A (en) * | 2004-06-28 | 2006-01-12 | Chugoku Electric Power Co Inc:The | Width measurement method and volume measurement method on measuring-object recessed part or projecting part on body surface |
JP4433907B2 (en) * | 2004-07-06 | 2010-03-17 | 富士ゼロックス株式会社 | Three-dimensional shape measuring apparatus and method |
EP1794703A4 (en) | 2004-09-17 | 2012-02-29 | Cyberextruder Com Inc | System, method, and apparatus for generating a three-dimensional representation from one or more two-dimensional images |
US7315241B1 (en) | 2004-12-01 | 2008-01-01 | Hrl Laboratories, Llc | Enhanced perception lighting |
WO2006074310A2 (en) * | 2005-01-07 | 2006-07-13 | Gesturetek, Inc. | Creating 3d images of objects by illuminating with infrared patterns |
US7916932B2 (en) * | 2005-02-16 | 2011-03-29 | In-G Co., Ltd. | Method and system of structural light-based 3D depth imaging using signal separation coding and error correction thereof |
CN1285882C (en) * | 2005-02-28 | 2006-11-22 | 天津大学 | System and method for testing three-dimensional motion of microstructure by image matching and phase shift interference |
US7724379B2 (en) * | 2005-05-12 | 2010-05-25 | Technodream21, Inc. | 3-Dimensional shape measuring method and device thereof |
JP4730836B2 (en) * | 2005-09-15 | 2011-07-20 | Jfeスチール株式会社 | Apparatus and method for measuring surface distortion |
US7929751B2 (en) * | 2005-11-09 | 2011-04-19 | Gi, Llc | Method and apparatus for absolute-coordinate three-dimensional surface imaging |
GB0718629D0 (en) | 2007-05-16 | 2007-11-07 | Seereal Technologies Sa | Holograms |
JP4931728B2 (en) * | 2007-08-08 | 2012-05-16 | シーケーディ株式会社 | 3D measuring device and board inspection machine |
JP5094663B2 (en) | 2008-09-24 | 2012-12-12 | キヤノン株式会社 | Position / orientation estimation model generation apparatus, position / orientation calculation apparatus, image processing apparatus, and methods thereof |
JP4638550B2 (en) | 2008-09-29 | 2011-02-23 | 東京エレクトロン株式会社 | Mask pattern forming method, fine pattern forming method, and film forming apparatus |
US8717416B2 (en) | 2008-09-30 | 2014-05-06 | Texas Instruments Incorporated | 3D camera using flash with structured light |
WO2010081094A2 (en) | 2009-01-09 | 2010-07-15 | The Johns Hopkins University | A system for registration and information overlay on deformable surfaces from video data |
KR20100084718A (en) | 2009-01-19 | 2010-07-28 | 삼성전자주식회사 | Mobile terminal for generating 3 dimensional image |
CN201440274U (en) * | 2009-07-22 | 2010-04-21 | 深圳泰山在线科技有限公司 | Target detection equipment and image acquisition device used by same |
WO2011013373A1 (en) * | 2009-07-29 | 2011-02-03 | Canon Kabushiki Kaisha | Measuring apparatus, measuring method, and program |
CN102042814B (en) | 2010-06-24 | 2012-03-07 | 中国人民解放军国防科学技术大学 | Projection auxiliary photographing measurement method for three-dimensional topography of large storage yard |
US20120176478A1 (en) * | 2011-01-11 | 2012-07-12 | Sen Wang | Forming range maps using periodic illumination patterns |
US8811767B2 (en) * | 2011-03-15 | 2014-08-19 | Mitsubishi Electric Research Laboratories, Inc. | Structured light for 3D shape reconstruction subject to global illumination |
KR101974651B1 (en) * | 2011-06-22 | 2019-05-02 | 성균관대학교산학협력단 | Measuring method of 3d image depth and a system for measuring 3d image depth using boundary inheritance based hierarchical orthogonal coding |
US8970693B1 (en) * | 2011-12-15 | 2015-03-03 | Rawles Llc | Surface modeling with structured light |
-
2012
- 2012-05-11 WO PCT/IB2012/052347 patent/WO2012160470A1/en active Application Filing
- 2012-05-11 AU AU2012260548A patent/AU2012260548B2/en active Active
- 2012-05-11 US US14/117,446 patent/US9982995B2/en active Active
- 2012-05-11 JP JP2014511981A patent/JP6097282B2/en active Active
- 2012-05-11 BR BR112013029691-7A patent/BR112013029691B1/en not_active IP Right Cessation
- 2012-05-11 CN CN201280025159.8A patent/CN103562676B/en active Active
- 2012-05-11 EP EP12724736.9A patent/EP2715278B1/en active Active
Non-Patent Citations (1)
Title |
---|
See references of WO2012160470A1 * |
Also Published As
Publication number | Publication date |
---|---|
BR112013029691A2 (en) | 2017-01-17 |
CN103562676A (en) | 2014-02-05 |
BR112013029691B1 (en) | 2020-10-06 |
JP6097282B2 (en) | 2017-03-15 |
AU2012260548A1 (en) | 2014-01-23 |
US9982995B2 (en) | 2018-05-29 |
US20150204663A1 (en) | 2015-07-23 |
EP2715278B1 (en) | 2019-10-16 |
WO2012160470A1 (en) | 2012-11-29 |
JP2014515485A (en) | 2014-06-30 |
CN103562676B (en) | 2017-03-22 |
AU2012260548B2 (en) | 2015-07-09 |
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