EP2195640A4 - Verfahren und systeme zur identifizierung des materialtyps einer oberfläche - Google Patents

Verfahren und systeme zur identifizierung des materialtyps einer oberfläche

Info

Publication number
EP2195640A4
EP2195640A4 EP08799991.8A EP08799991A EP2195640A4 EP 2195640 A4 EP2195640 A4 EP 2195640A4 EP 08799991 A EP08799991 A EP 08799991A EP 2195640 A4 EP2195640 A4 EP 2195640A4
Authority
EP
European Patent Office
Prior art keywords
material type
identiying
systems
methods
intensity data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP08799991.8A
Other languages
English (en)
French (fr)
Other versions
EP2195640A1 (de
Inventor
Nathan Kirchner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Technology Sydney
Original Assignee
University of Technology Sydney
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2007904898A external-priority patent/AU2007904898A0/en
Application filed by University of Technology Sydney filed Critical University of Technology Sydney
Publication of EP2195640A1 publication Critical patent/EP2195640A1/de
Publication of EP2195640A4 publication Critical patent/EP2195640A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/4802—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00 using analysis of echo signal for target characterisation; Target signature; Target cross-section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4733—Discriminating different types of scatterers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N2021/4776—Miscellaneous in diffuse reflection devices
    • G01N2021/4783—Examining under varying incidence; Angularly adjustable head
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4785—Standardising light scatter apparatus; Standards therefor

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP08799991.8A 2007-09-10 2008-09-10 Verfahren und systeme zur identifizierung des materialtyps einer oberfläche Withdrawn EP2195640A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AU2007904898A AU2007904898A0 (en) 2007-09-10 Methods and systems for identifying the material type of a surface
PCT/AU2008/001346 WO2009033220A1 (en) 2007-09-10 2008-09-10 Methods and systems for identiying the material type of a surface

Publications (2)

Publication Number Publication Date
EP2195640A1 EP2195640A1 (de) 2010-06-16
EP2195640A4 true EP2195640A4 (de) 2013-10-09

Family

ID=40451478

Family Applications (1)

Application Number Title Priority Date Filing Date
EP08799991.8A Withdrawn EP2195640A4 (de) 2007-09-10 2008-09-10 Verfahren und systeme zur identifizierung des materialtyps einer oberfläche

Country Status (2)

Country Link
EP (1) EP2195640A4 (de)
WO (1) WO2009033220A1 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108027319A (zh) * 2015-08-28 2018-05-11 于尔根·马克斯 用于检测试样的表面结构和特性的方法和设备

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5252836A (en) * 1991-03-07 1993-10-12 U.S. Natural Resources, Inc. Reflective grain defect scanning
EP0612996A2 (de) * 1993-02-25 1994-08-31 Black & Decker Inc. Vorrichtung und Verfahren zur Identifizierung von Textilien
EP1790972A1 (de) * 2005-11-24 2007-05-30 Schreder Vorrichtung und Verfahren zur Bestimmung der Reflexionseigenschaften einer Oberfläche

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH663473A5 (de) * 1983-04-26 1987-12-15 Volpi Ag Verfahren zum optischen bestimmen der oberflaechenbeschaffenheit von festkoerpern.
US7742168B2 (en) * 2003-04-29 2010-06-22 Surfoptic Limited Measuring a surface characteristic

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5252836A (en) * 1991-03-07 1993-10-12 U.S. Natural Resources, Inc. Reflective grain defect scanning
EP0612996A2 (de) * 1993-02-25 1994-08-31 Black & Decker Inc. Vorrichtung und Verfahren zur Identifizierung von Textilien
EP1790972A1 (de) * 2005-11-24 2007-05-30 Schreder Vorrichtung und Verfahren zur Bestimmung der Reflexionseigenschaften einer Oberfläche

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
See also references of WO2009033220A1 *
WOLFF L B: "POLARIZATION-BASED MATERIAL CLASSIFICATION FROM SPECULAR REFLECTION", TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, IEEE, PISCATAWAY, USA, vol. 12, no. 11, 1 November 1990 (1990-11-01), pages 1059 - 1071, XP000168469, ISSN: 0162-8828, DOI: 10.1109/34.61705 *

Also Published As

Publication number Publication date
EP2195640A1 (de) 2010-06-16
WO2009033220A1 (en) 2009-03-19

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