EP2184614A3 - Systems and methods for charged device model electrostatic discharge testing - Google Patents

Systems and methods for charged device model electrostatic discharge testing Download PDF

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Publication number
EP2184614A3
EP2184614A3 EP09175552A EP09175552A EP2184614A3 EP 2184614 A3 EP2184614 A3 EP 2184614A3 EP 09175552 A EP09175552 A EP 09175552A EP 09175552 A EP09175552 A EP 09175552A EP 2184614 A3 EP2184614 A3 EP 2184614A3
Authority
EP
European Patent Office
Prior art keywords
electrostatic discharge
charged
device model
systems
methods
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP09175552A
Other languages
German (de)
French (fr)
Other versions
EP2184614A2 (en
Inventor
Marcos Hernandez
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Fisher Scientific Inc
Original Assignee
Thermo Fisher Scientific Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Fisher Scientific Inc filed Critical Thermo Fisher Scientific Inc
Publication of EP2184614A2 publication Critical patent/EP2184614A2/en
Publication of EP2184614A3 publication Critical patent/EP2184614A3/en
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Systems and methods for testing an integrated circuit device using transmission path and charged device model electrostatic discharge testing. The method includes measuring a electrostatic discharge signal (152) from a charged transmission path (56) of the system (10), measuring a electrostatic discharge signal (162) from the charged transmission path (56) of the system (10) and a charged integrated circuit device (12) coupled with the charged transmission path (56), and determining a charged device model waveform (182) based upon distinctions between these electrostatic discharge signals (152, 162).
EP09175552A 2008-11-11 2009-11-10 Systems and methods for charged device model electrostatic discharge testing Withdrawn EP2184614A3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11330808P 2008-11-11 2008-11-11
US12/465,099 US20100117674A1 (en) 2008-11-11 2009-05-13 Systems and methods for charged device model electrostatic discharge testing

Publications (2)

Publication Number Publication Date
EP2184614A2 EP2184614A2 (en) 2010-05-12
EP2184614A3 true EP2184614A3 (en) 2012-03-28

Family

ID=42045303

Family Applications (1)

Application Number Title Priority Date Filing Date
EP09175552A Withdrawn EP2184614A3 (en) 2008-11-11 2009-11-10 Systems and methods for charged device model electrostatic discharge testing

Country Status (3)

Country Link
US (1) US20100117674A1 (en)
EP (1) EP2184614A3 (en)
JP (1) JP2010117352A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8760185B2 (en) * 2009-12-22 2014-06-24 Anthony J. Suto Low capacitance probe for testing circuit assembly
US8970239B2 (en) 2010-09-27 2015-03-03 International Business Machines Corporation Methods and systems for detecting ESD events in cabled devices
US9671448B2 (en) * 2012-12-28 2017-06-06 Illinois Tool Works Inc. In-tool ESD events monitoring method and apparatus
US11307235B2 (en) 2012-12-28 2022-04-19 Illinois Tool Works Inc. In-tool ESD events selective monitoring method and apparatus
CN109001610B (en) * 2017-06-06 2020-11-27 中芯国际集成电路制造(上海)有限公司 ESD (electro-static discharge) channel detection method and system
CN111209182B (en) * 2018-11-22 2022-06-14 长鑫存储技术有限公司 Integrated circuit power-on test method and device, storage medium and electronic equipment
CN114966368A (en) * 2022-05-12 2022-08-30 苏州泰思特电子科技有限公司 Static automatic test system based on vision hybrid positioning

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5523699A (en) * 1992-06-03 1996-06-04 Seiko Epson Corporation Method and apparatus for testing semiconductor device
US20050030043A1 (en) * 2003-08-08 2005-02-10 Ming-Dou Ker Automatic transmission line pulse system
US20070018670A1 (en) * 2005-07-21 2007-01-25 Choshu Ito Electrostatic discharge testing

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5519327A (en) * 1994-06-10 1996-05-21 Vlsi Technology, Inc. Pulse circuit using a transmission line
US6429674B1 (en) * 1999-04-28 2002-08-06 Jon E. Barth Pulse circuit
US20010056340A1 (en) * 2000-06-26 2001-12-27 Gorin Igor Anatoly CDM simulator for testing electrical devices
US6933741B2 (en) * 2003-11-13 2005-08-23 Texas Instruments Incorporated Electrostatic discharge testers for undistorted human-body-model and machine-model characteristics
JP2006317432A (en) * 2005-04-12 2006-11-24 Nec Electronics Corp Charge plate, cdm simulator and testing method
US7560948B2 (en) * 2006-01-11 2009-07-14 Thermo Keytek LLC Circuit for minimizing or eliminating pulse anomalies in human body model electrostatic discharge tests
FR2911996A1 (en) * 2007-01-31 2008-08-01 St Microelectronics Sa Electronic integrated circuit, has protection elements discharging nodes, respectively, where element does not allow circulation of electric current towards or from nodes when circuit is subjected to voltage, respectively
US8278936B2 (en) * 2007-11-23 2012-10-02 Evan Grund Test circuits and current pulse generator for simulating an electrostatic discharge

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5523699A (en) * 1992-06-03 1996-06-04 Seiko Epson Corporation Method and apparatus for testing semiconductor device
US20050030043A1 (en) * 2003-08-08 2005-02-10 Ming-Dou Ker Automatic transmission line pulse system
US20070018670A1 (en) * 2005-07-21 2007-01-25 Choshu Ito Electrostatic discharge testing

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
HORST GIESER ET AL: "Very Fast Transmission Line Pulsing of Integrated Structures and the Charged Device Model", IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURINGTECHNOLOGY. PART C: MANUFACTURING, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, vol. 21, no. 4, 1 October 1998 (1998-10-01), XP011019955, ISSN: 1083-4400 *

Also Published As

Publication number Publication date
US20100117674A1 (en) 2010-05-13
JP2010117352A (en) 2010-05-27
EP2184614A2 (en) 2010-05-12

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