EP2016494A4 - Beschreiben und einstellen von flash-speichern - Google Patents

Beschreiben und einstellen von flash-speichern

Info

Publication number
EP2016494A4
EP2016494A4 EP07756993A EP07756993A EP2016494A4 EP 2016494 A4 EP2016494 A4 EP 2016494A4 EP 07756993 A EP07756993 A EP 07756993A EP 07756993 A EP07756993 A EP 07756993A EP 2016494 A4 EP2016494 A4 EP 2016494A4
Authority
EP
European Patent Office
Prior art keywords
writing
flash memory
configuring flash
configuring
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP07756993A
Other languages
English (en)
French (fr)
Other versions
EP2016494A2 (de
Inventor
Frode Milch Pedersen
Marc Laurent
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Atmel Corp
Original Assignee
Atmel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/353,873 external-priority patent/US7610528B2/en
Priority claimed from US11/353,874 external-priority patent/US7428610B2/en
Application filed by Atmel Corp filed Critical Atmel Corp
Publication of EP2016494A2 publication Critical patent/EP2016494A2/de
Publication of EP2016494A4 publication Critical patent/EP2016494A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0401—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals in embedded memories
EP07756993A 2006-02-14 2007-02-14 Beschreiben und einstellen von flash-speichern Withdrawn EP2016494A4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/353,873 US7610528B2 (en) 2006-02-14 2006-02-14 Configuring flash memory
US11/353,874 US7428610B2 (en) 2006-02-14 2006-02-14 Writing to flash memory
PCT/US2007/062143 WO2007095579A2 (en) 2006-02-14 2007-02-14 Writing to and configuring flash memory

Publications (2)

Publication Number Publication Date
EP2016494A2 EP2016494A2 (de) 2009-01-21
EP2016494A4 true EP2016494A4 (de) 2010-02-03

Family

ID=38372239

Family Applications (1)

Application Number Title Priority Date Filing Date
EP07756993A Withdrawn EP2016494A4 (de) 2006-02-14 2007-02-14 Beschreiben und einstellen von flash-speichern

Country Status (2)

Country Link
EP (1) EP2016494A4 (de)
WO (1) WO2007095579A2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2539445A (en) 2015-06-16 2016-12-21 Nordic Semiconductor Asa Data processing
CN116259347B (zh) * 2023-05-16 2023-07-21 上海灵动微电子股份有限公司 基于spi协议的嵌入式闪存的编程装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050195635A1 (en) * 2004-03-08 2005-09-08 Conley Kevin M. Flash controller cache architecture
US20050268025A1 (en) * 2004-05-27 2005-12-01 Peter Smith Configurable ready/busy control
WO2006068916A1 (en) * 2004-12-21 2006-06-29 Sandisk Corporation System and method for use of on-chip non-volatile memory write cache

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0618535B1 (de) * 1989-04-13 1999-08-25 SanDisk Corporation EEPROM-Karte mit Austauch von fehlerhaften Speicherzellen und Zwischenspeicher
US6076177A (en) * 1997-09-23 2000-06-13 Motorola, Inc. Method and apparatus for testing a circuit module concurrently with a non-volatile memory operation in a multi-module data processing system
TW368626B (en) * 1998-04-17 1999-09-01 Winbond Electronics Corp Microprocessor with self-programmed embedded flash memory and programming method
US6421757B1 (en) * 1998-09-30 2002-07-16 Conexant Systems, Inc Method and apparatus for controlling the programming and erasing of flash memory
US6851013B1 (en) * 1999-12-15 2005-02-01 Intel Corporation Fast program mode
FR2803080A1 (fr) * 1999-12-22 2001-06-29 St Microelectronics Sa Memoire flash programmable page par page
US6510488B2 (en) * 2001-02-05 2003-01-21 M-Systems Flash Disk Pioneers Ltd. Method for fast wake-up of a flash memory system
EP1388150B1 (de) * 2001-04-25 2009-01-14 Nxp B.V. Integrierte schaltung mit einer selbsttesteinrichtung für einen eingebetteten nichtflüchtigen speicher und verwandte testverfahren

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050195635A1 (en) * 2004-03-08 2005-09-08 Conley Kevin M. Flash controller cache architecture
US20050268025A1 (en) * 2004-05-27 2005-12-01 Peter Smith Configurable ready/busy control
WO2006068916A1 (en) * 2004-12-21 2006-06-29 Sandisk Corporation System and method for use of on-chip non-volatile memory write cache

Also Published As

Publication number Publication date
EP2016494A2 (de) 2009-01-21
WO2007095579A3 (en) 2008-12-04
WO2007095579A2 (en) 2007-08-23

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