EP1997162A1 - Dispositif de detection/memorisation de rayonnements electromagnetiques, procede de fabrication, utilisation de ce dispositif et imageur l'incorporant - Google Patents
Dispositif de detection/memorisation de rayonnements electromagnetiques, procede de fabrication, utilisation de ce dispositif et imageur l'incorporantInfo
- Publication number
- EP1997162A1 EP1997162A1 EP07731128A EP07731128A EP1997162A1 EP 1997162 A1 EP1997162 A1 EP 1997162A1 EP 07731128 A EP07731128 A EP 07731128A EP 07731128 A EP07731128 A EP 07731128A EP 1997162 A1 EP1997162 A1 EP 1997162A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- nanotube
- radiation
- nanowire
- pixels
- contact electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/60—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation in which radiation controls flow of current through the devices, e.g. photoresistors
- H10K30/65—Light-sensitive field-effect devices, e.g. phototransistors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/466—Lateral bottom-gate IGFETs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/484—Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
- H10K10/486—Insulated gate field-effect transistors [IGFETs] characterised by the channel regions the channel region comprising two or more active layers, e.g. forming pn heterojunctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
- H10K85/113—Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/20—Carbon compounds, e.g. carbon nanotubes or fullerenes
- H10K85/221—Carbon nanotubes
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/832—Nanostructure having specified property, e.g. lattice-constant, thermal expansion coefficient
- Y10S977/834—Optical properties of nanomaterial, e.g. specified transparency, opacity, or index of refraction
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/936—Specified use of nanostructure for electronic or optoelectronic application in a transistor or 3-terminal device
- Y10S977/938—Field effect transistors, FETS, with nanowire- or nanotube-channel region
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/953—Detector using nanostructure
- Y10S977/954—Of radiant energy
Definitions
- the present invention relates to a device for detecting and storing electromagnetic radiation, an imager incorporating it, a method for manufacturing said device and using it.
- the invention applies to a device comprising a field effect phototransistor and adapted to form at least one imaging pixel.
- Electromagnetic radiation sensors for imaging are a growing area of research.
- a light radiation sensor associated with a transducer to provide an electrical signal proportional to the quantity of photons received for a period of time. given exposure, and, secondly, a resetting device for resetting this pixel to its state prior to this light radiation.
- CCD matrix of charge coupled devices
- CMOS complementary metal oxide semiconductor
- Each pixel of a CMOS pixel active matrix image sensor typically contains a photodetector element (photodiode or phototransistor), as well as a transistor circuit for reading the pixel signal).
- the electrical signal obtained may be proportional to the dose or flow of photons received.
- CMOS sensors have many advantages over “CCD” sensors, including lower power consumption, as well as easier manufacturing and lower cost.
- One of the main challenges of the current development of imagers is to maintain good sensitivity to radiation while further reducing the size of the pixels used.
- a known solution for significantly reducing pixel size is to maximize the fill factor defined as the ratio of the pixel's sensitive area to its total area.
- a known solution for this is to reduce the size of the "drawing rules" for producing the addressing, amplifying and reading transistors of the signal, coming from the photodetector, and their interconnections.
- Another known solution is to reduce the number of transistors used for addressing, amplifying and reading the signal generated by the photodetector. For example, sharing the amplification circuit between several neighboring pixels allows such a reduction.
- Star et al. have shown in the Nanotube Optoelectronic Memory Devices article, Alexander Star, Lu Yu, Keith Bradley, George Grenner - American Chemical Society, published on the Internet on 16/06/2004, that if one drops a drop of one photoconductive polymer on a nanotube packet or "carpet" which is formed of an undifferentiated mixture of metallic and semiconductor nanotubes and which is disposed between two contact electrodes and above a gate electrode from which it is isolated by a dielectric, so we get a field effect phototransistor. More specifically, Star et al. have shown that the conductivity of this nanotube packet increased under illumination at a wavelength at which this polymer absorbs the photons, and that this increase in conductivity was maintained partially after stopping this illumination.
- Star et al. have also shown in this article that the application of an alternating voltage on the gate electrode of this phototransistor allowed to reduce the conductivity of the "carpet" to bring it back to its initial value after several minutes, the application of high gate voltages for faster resetting of conductivity.
- a major disadvantage of this light detection / storage device obtained by Star et al. lies in particular in the use of this composite package of metallic nanotubes and semiconductors, which does not actually obtain an "off" state (ie non-conduction) of the phototransistor and, therefore, a high sensitivity of the conductivity from phototransistor to illuminance.
- the present invention aims at overcoming the drawbacks of the preceding devices and at significantly increasing the filling factor obtained by means of smaller and juxtaposed pixels.
- the main object of the present invention is to provide a device for detecting and storing electromagnetic radiation, comprising a field effect phototransistor which comprises:
- a nanostructured electrical conduction unit which is connected to said contact electrodes and which is covered with at least one photosensitive polymer layer able to absorb said radiation to be detected, to generate in response electric charges detected by said conduction unit and to be stored these charges, and
- a gate electrode adapted to control the electric current in the unit as well as the spatial distribution of the charges in said photosensitive layer and which is separated from said unit by a gate dielectric, which overcomes all the aforementioned drawbacks by being adapted to form at least one imaging pixel.
- this device is such that said conduction unit comprises at least one nanotube or nanowire semiconductor type capable of providing an electrical signal representative of a change in the conductivity of said phototransistor having been exposed to a radiation, and that said gate dielectric has a thickness e between said contact electrodes and a relative permittivity ⁇ r that satisfy the condition ⁇ r / e> 0.2 nm "1 , such that said conductivity after exposure to radiation can be reset electrically in a minimized time by recovering its value prior to this exposure.
- this use of a gate dielectric satisfying the condition ⁇ r / e> 0.2 nm "1 and, preferably, the condition ⁇ r / e> 0.4 nm " 1 allows a very efficient electrostatic control of the electric charge in the nanotube (s) or nanowire (s) and in the photosensitive layer, this results in a reinitialization of the device forming the pixel of the invention which is extremely efficient and possible for any instant, regardless of the intensity of the radiation received, by applying a negative voltage pulse applied to the gate electrode.
- this thickness e of said dielectric is less than or equal to 20 nm and, even more preferably, it is between 2 nm and 12 nm.
- said conduction unit according to the invention may thus comprise: a single nanotube or nanowire which is connected to said contact electrodes by its respective ends, or
- each nanotube or nanowire is connected "in parallel" by its ends to said source and drain electrodes.
- said or each nanotube or nanowire that includes said unit is specifically selected semiconductor type, which allows to obtain a "off" satisfactory state for the phototransistor and therefore maximize the conductivity difference of said phototransistor in response to the radiation.
- the device according to the invention thus makes it possible to obtain conductivity changes of up to a factor of about 10,000, in comparison with the factors obtained with the field effect phototransistors of the prior art, such as that described in the aforementioned article by Star et al. which are only of the order of 5.
- said or each nanotube is a carbon nanotube that can be of single-wall or multi-wall type ("SWNT” or “MWNT” for short, respectively) and, even more preferably, uses for said or each nanotube a single-walled carbon nanotube.
- SWNT single-wall or multi-wall type
- MWNT multi-wall type
- the reduced diameter of the latter makes it possible to minimize the distance between the electrical charges located in the or each nanotube and the interface between said gate dielectric and said photosensitive layer.
- the or each single-wall carbon nanotube may have a diameter advantageously less than or equal to 3.5 nm, while this diameter may be up to 50 nm in the case of a multiwall nanotube.
- nanowire (s) usable (s) in said conduction unit can be advantageously used or silicon nanowire (s), preferably less than or equal to 15 nm in diameter.
- said conduction unit is adapted to detect the radiations from their effects on the electrical charge of said photosensitive layer (ie from the photoinduced charges therein) while producing, during the duration of each exposure to radiation and following it, an electrical signal whose intensity is representative of this exposure.
- the photoelectric effect inherent in the operation of the device according to the invention results in a dynamic based on photo-induced charge transfers within said layer. photosensitive, and that the aforementioned electrical signal that is provided by said conduction unit continues for at least as long as the exposure to illumination.
- the intensity of this electrical signal obtained with the device of the invention increases with time as long as this exposure lasts.
- said photosensitive layer is advantageously formed of a film of average thickness between 3 nm and 10 nm, which covers both said contact electrodes, said gate dielectric and said conduction unit. functionalizing the wall of said or each nanotube or nanowire.
- this reduced thickness for said photosensitive layer allows optimal control of the location of the effect of the electrical charges trapped in this layer and also contributes to the significantly improved sensitivity of the device of the invention, which sensitivity can be characterized by a conductivity modification factor of about 10,000, as indicated above.
- said photosensitive layer is based on at least one photoconductive polymer, in particular in the visible and near ultraviolet domains, which is capable of generating and separating said charges at each exposure to said radiation in its absorption bands, without being altered by this exposure.
- said polymer is chosen from the group consisting of polythiophenes, polythiophene derivatives such as polyalkylthiophenes, poly (N-vinylcarbazole), polyvinylpyrenes and polyparaphenylenevinylene or derivatives and, more advantageously, it is chosen from poly (3-octylthiophene-2,5-diyl), poly ⁇ (m-phenylene-vinylene) -co- [(2,5-dioctyloxy-p-phenylene) vinylene] ⁇ and poly- (3-hexylthiophene).
- each polymer used in said photosensitive layer is provided to absorb radiation in a region of its own spectrum.
- each device according to the invention each incorporating a photosensitive layer based on a polymer specifically sensitive to a specific region of the spectrum, particularly in the visible and near ultraviolet.
- the photoconductive polymer used in the or each photosensitive layer may be doped with a compound that shifts the wavelengths of the absorption band of this layer.
- the device of the invention may further comprise at least one positioning pad which is adapted to position said conduction unit on said gate dielectric, and which is formed of a monolayer covering locally said gate dielectric, said or each nanotube or nanowire adhering to said or each corresponding pellet.
- said or each pellet may be based on an aminosilane.
- said contact electrodes each have a width of less than 0.5 ⁇ m, even more advantageously less than or equal to 0.3 ⁇ m, and are separated from each other by a distance of less than 1 ⁇ m. more preferably less than or equal to 0.4 ⁇ m.
- these two dimensions characterizing said contact electrodes are much smaller than the corresponding dimensions of 1 ⁇ m and 50 ⁇ m used for the phototransistor described in the aforementioned article by Star et al., And that the miniaturization obtained for the pixels delimited by these electrodes. of extremely small size makes it possible to use several devices according to the invention to form dense matrices of pixels.
- any metallic material such as, without limitation, a metal selected from the group consisting of Au, Pd, Ti, Al, Cr, Cu, Pt and Co, and alloys of these metals.
- said gate electrode may be formed of a metallic or semiconductor material, such as silicon, without limitation.
- said gate dielectric may be based on any electrically insulating material that can be used in a gate of a field effect transistor comprising one or more carbon nanotubes.
- this dielectric is based on at least one metal oxide whose relative permittivity ⁇ r is equal to or greater than 4, such as, in a nonlimiting manner, Al 2 O 3 , ZrO 2 or HfO 2 .
- An imager according to the invention is such that it comprises at least two devices according to the invention as defined above, respectively forming adjacent imaging pixels which are each based on said phototransistor, so that the photosensitive layers phototransistors corresponding to said pixels are respectively able to absorb bands of different wavelengths of the electromagnetic spectrum.
- each of said pixels has an area less than 1 ⁇ m 2 , for example substantially equal to 0.5 ⁇ m 2 or 0.1 ⁇ m 2 , this miniaturization allowing the formation of dense matrices pixels.
- the arrangement according to the invention of the nanotubes or nanotubes all semiconductors in a reduced number in the case of a plurality of nanotubes, preferably less than or equal to 10) combined with the particular geometry of the or each photosensitive layer (of reduced thickness and covering one or a small number of nanotube (s)) make it possible to obtain areas of controlled pixels, ie consistent with those desired.
- the combination of these two essential features of the invention thus makes it possible to obtain pixels which all have substantially the same dimensions and which are therefore able to be assembled into a matrix of pixels.
- said gate electrode provided with said dielectric is common to all of said pixels.
- said gate electrode is relative to each of said pixels, with as many corresponding gate electrodes as pixels.
- a method of manufacturing a radiation detection and storage device essentially comprises: a) a localized deposit, on said gate dielectric of a substrate, of at least one pellet positioning device formed of a monolayer for example based on an aminosilane, b) a selective deposition, on said or each pellet, of said or each nanotube or nanowire in solution, c) the formation of said contact electrodes on the (s) nanotube (s) by masking the area of said or each nanotube capable of being functionalized according to step d) below, followed by a metal deposit and a "lift-off" (ie a cleaning of the mask and metal residues not forming these contact electrodes), then d) a deposit of said photosensitive polymer layer, for example made by spinning, both on the said nanotube (s) or nanowire (s) ) for the functionalization (s), on said dielectric of gr ille and on said contact electrodes which are connected to said nanotube (s) or nanowire (s).
- the positioning on the substrate of one or more nanotube (s) or nanowire (s) functionalized conduction units according to the invention By way of examples, mention may be made of "CVD" techniques and growth methods directly implemented on this substrate, before deposition of the photosensitive layer.
- the device according to the invention may comprise catalyst particles which are adapted in size, position and composition to allow the growth of said or each nanotube on said gate dielectric, so as to form said unit of conduction.
- step c) of the above process it is possible to form the contact electrodes (step c) of the above process) prior to the deposition of the conduction units (step b) of the above process).
- the formation of the contact electrodes takes place not on the ends of the nanotube (s), but in the precise places they must occupy.
- the method of manufacturing a radiation detection and storage device 1 essentially comprises: a) the formation of contact electrodes by a conventional nanofabrication method; advantageously, these electrodes are included in the gate dielectric, so that their surface is flush with the surface of the latter; b) a localized deposit, on the contact electrodes or on said gate dielectric of a substrate, of at least one positioning pad formed of a monolayer, for example based on an aminosilane deposited on said dielectric or else based on aminoalkylthiol deposited on the electrodes; c) selectively depositing, on said or each pellet, said or each nanotube or nanowire in solution; then d) a deposit of said photosensitive polymer layer, for example made by spinning, both on said nanotube (s) or nanowire (s) to function (s) it on said gate dielectric and on said contact electrodes which are connected to said nanotube (s) or nanowire (s).
- each pixel formed by the device according to the invention can be manufactured on a pre-existing electronic circuit, for example on a pixel addressing circuit, provided that it has a dielectric surface capable of constituting the gate dielectric. .
- This is particularly the case of the selective positioning method according to the invention described above, which makes it possible to relate nanotubes or nanowires to desired locations on a dielectric surface (eg based on silicon oxide) and without altering the existing surface or electronic circuit (high temperature annealing, in particular) is not practiced.
- the entire device according to the invention can be manufactured on a flexible film and / or transparent to visible radiation, for example.
- this flexible film it first produces a grid and then deposited (s) nanotube (s) or nanowire (s), the contact electrodes and finally the photosensitive polymer layer.
- the resulting flexible and / or transparent substrate then simply replaces the silicon substrate usually used.
- a use according to the invention of a device as defined above relates to the formation of at least one imaging pixel detecting and storing electromagnetic control radiation, such as radiation in the near ultraviolet visible range, X-rays and gamma rays, such that said or each pixel can be electrically reset in a minimized time, via a voltage pulse applied to said gate electrode.
- electromagnetic control radiation such as radiation in the near ultraviolet visible range, X-rays and gamma rays
- this use of said device relates to the formation of a matrix of pixels of a imager, in which only the pixel containing the photosensitive layer which is specifically capable of absorbing the wavelength band of the control radiation detects and stores this radiation, and generates in response said electric charges for obtaining electrical signals representative of said radiation.
- FIG. 1 is a schematic perspective view in transparency of a radiation detection / storage device according to an exemplary embodiment of the invention with a single nanotube
- FIG. 2 (a) is a diagram illustrating the connection of the single nanotube according to Figure 1 to two contact electrodes of said device
- Figure 2 (b) is a diagram illustrating the connection of several nanotubes in parallel to these contact electrodes according to a variant of Figure 2 (a)
- FIG. 1 is a schematic perspective view in transparency of a radiation detection / storage device according to an exemplary embodiment of the invention with a single nanotube
- FIG. 2 (a) is a diagram illustrating the connection of the single nanotube according to Figure 1 to two contact electrodes of said device
- Figure 2 (b) is a diagram illustrating the connection of several nanotubes in parallel to these contact electrodes according to a variant of Figure 2 (a)
- FIG. 1 is a schematic perspective view in transparency of a radiation detection / storage device according to an exemplary embodiment of the invention with a single nanotube
- FIG. 2 (c) is a diagram illustrating the connection of several nanotubes to these contact electrodes according to a variant of FIG. 2 (b), FIG. a current / voltage graph illustrating the measured effect of a visible laser radiation on the device of FIG. 1, before and after the deposition of a photosensitive polymer layer on said nanotube, FIG. 4 is a current / voltage graph illustrating the effect of the power of this same radiation on the same device of FIG. 1, FIG. 5 is a current / voltage graph illustrating the effect of the location of the impact of this radiation on the device of FIG. 1, FIG. 6 is a current / time graph illustrating the integration effect of this radiation by the device of FIG. 1, on the one hand, for continuous form illumination and, secondly, for pulsed illumination, and Fig. 7 is a current / time graph illustrating the electrical reset of the device of Fig. 1 via a gate voltage pulse, following continuous illumination via the aforementioned radiation.
- the device 1 according to an exemplary embodiment of the invention which is illustrated in FIGS. 1 and 2 (a) is of the field-effect phototransistor type, and it essentially comprises: two contact electrodes S and D respectively of source and of drain, which are for example made of palladium,
- a nanostructured electrical conduction unit constituted in this example by a single-walled carbon nanotube 2 which is connected to the electrodes S and D via its ends and which is functionalized by a photoresponsive polymeric layer 3 Ie covering, and
- a gate electrode G for example made of silicon, which is adapted to control the electric current in the nanotube 2 and which is separated therefrom by a gate dielectric 4 (for example made of silicon dioxide) on which the nanotube 2 is arranged.
- FIG. 1 also shows an optional positioning pad 5 which makes it possible to position the nanotube 2 at a determined location of the gate dielectric 4, and which is formed of a monolayer made in this example of aminopropyltriethoxysilane ("APTS"). and adapted to adhere the nanotube 2.
- APTS aminopropyltriethoxysilane
- the nanotube 2 has a diameter of less than 3.5 nm and a length that can range from 100 nm to 1 ⁇ m;
- the photosensitive layer 3 has a thickness of between 3 nm and 10 nm; the dielectric 4 has a thickness of 10 nm; and
- the contact electrodes S and D have a thickness of approximately 30 nm and a width (defining the lateral dimension of the pixel obtained) of approximately 100 nm.
- the device 101 according to the invention illustrated in FIG. 2 (b) differs only from that of FIGS. 1 and 2 (a), in that the conduction unit consists of several nanotubes 102 connected "in parallel" with the electrodes. S and D, ie each having their respective ends connected to these electrodes S and D.
- the device 201 according to the invention illustrated in Figure 2 (c) differs only from that of Figure 2 (b), in that that the nanotubes 202 constituting the conduction unit are arranged in an entangled manner, so as to form conduction channels between the two electrodes S and D which exclusively consist of these nanotubes 202.
- the detection / storage devices 1, 101, 201 according to Figures 2 (a) to 2 (c) are for example manufactured as follows. a) First of all, a highly doped silicon substrate is prepared which is provided with a two-part SiO 2 layer: a 200 nm thick SiO 2 sub-layer situated below macroscopic connection pads and intended to limit the leakage and capacitive currents, and
- the carbon nanotube (s) 2 is placed on the dielectric 4, preferably using a technique of selective positioning of the nanotube (s) 2 on the dielectric 4 which is implemented as follows:
- one or more regions are defined for this positioning via an electron beam lithography technique, by means of a PMMA (polymethyl methacrylate) mask on the dielectric 4, and an aminosilane monolayer is formed in these regions, treating the sample with ethylene diamine (EDA) and subsequently with aminopropyltriethoxysilane (APTS) from the vapor phase;
- EDA ethylene diamine
- APTS aminopropyltriethoxysilane
- the aforementioned monolayer with amino terminal group acts as an adhesive patch to which the nanotube (s) selectively binds (s) in the predefined region (s); and this region or regions are then connected by the contact electrodes S and D.
- the polymeric film 3 is deposited by
- P3OT about 5 nm thick and 0.1% solution in toluene, on the substrate thus obtained: ie on the dielectric 4, partially on the electrodes S and D and on the nanotube (s) (s) 2, 102, 202, as illustrated in FIG.
- this film 3 was for example measured by the technique "AFM” (i.e. atomic force microscopy) and absorption spectroscopy on glass (other methods of measurement are usable).
- FAM atomic force microscopy
- absorption spectroscopy on glass other methods of measurement are usable.
- the device 1, 101, 201 of the field effect phototransistor type according to the invention is thus obtained. Tests carried out on the device 1 of FIG. 1:
- Another very important parameter for evaluating the quality of an imager pixel is the local character of the effect, ie a luminous impact does not excite not the neighboring pixels.
- a luminous impact does not excite not the neighboring pixels.
- FIG. 5 it has been verified that the detection of photons does not take place when the laser spot is positioned at 10 ⁇ m of the pixel, even though the polymer film covers the whole device (1 cm 2 ).
- the charge effects of the polymer are very localized at the level of the photon absorption zone. It is probable that this distance of 10 ⁇ m is an overestimation of the minimum distance between two pixels, the effect being undoubtedly even more local.
- Another important criterion for evaluating an imager pixel is the dynamics of the electrical response to photon arrival. Indeed, it is important that the pixel accumulates (i.e. integrates) the dose of light (i.e. the number of photons) over time. In a camera, for example, all the light collected during the opening time of the diaphragm must be taken into account, which makes it possible to take pictures in very dark conditions by increasing the exposure time.
- FIG. 6 compares the conductivity change dynamics of the device during the continuous arrival of light (curve I) and during a 100 ms light pulse (curve II).
- Curve I shows that during the first second of continuous illumination, the device 1 has a quasi-linear response as a function of time and that, subsequently, the conductivity evolves more slowly towards a saturation.
- the pixel acts well in integrator.
- Curve II has verified that if the device 1 is illuminated for only 100 ms, the conductivity of the device 1 is set at intermediate value corresponding exactly to that which the curve I indicates after 100 ms of illumination.
- Another essential parameter for the proper functioning of the pixel is to have a certain retention time. Indeed, after exposure to light, the value of the pixel (i.e. of its conductivity) must be read by the signal processing electronics associated with the imager. It can be seen on the curve II of FIG. 6 and in FIG. 7 that the value of the conductivity is maintained when the light is off, and for very long times, i.e. much higher than the minimum time necessary for reading the pixel. x 6) Resetting the conductivity of the device 1 and therefore the corresponding pixel:
- a critical parameter for using the device 1 as an imager pixel is the possibility of resetting the pixel to its initial value (in the dark). Indeed, after having integrated the number of photons for a certain time, the value of the conductivity is read and must be able to be initialized to allow a new detection. This reset must be effective (i.e. by a complete return to the initial value) and also fast. The reset time is, with the sensitivity already mentioned, which fixes the overall speed of the device 1.
- FIG. 7 shows that after exposure to light, a voltage pulse on the gate electrode of -4 V for a duration of 100 ms is sufficient to reinitialize device 1 very efficiently.
- this Figure 7 clearly shows the significant gain in quality and speed of the reset of the pixel that is obtained by the device according to the present invention, in comparison with the state of the art.
- This quality and speed of reinforcement significantly increased are notably due to the efficiency of the electrostatic grid, obtained thanks to the small thickness used for the gate dielectric (less than 20 nm).
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- Nanotechnology (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Electromagnetism (AREA)
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0602233A FR2898730B1 (fr) | 2006-03-14 | 2006-03-14 | Dispositif de detection/memorisation de rayonnements electromagnetiques, procede de fabrication, utilisation de ce dispositif et imageur l'incorporant. |
| PCT/FR2007/000432 WO2007104858A1 (fr) | 2006-03-14 | 2007-03-13 | Dispositif de detection/memorisation de rayonnements electromagnetiques, procede de fabrication, utilisation de ce dispositif et imageur l'incorporant |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP1997162A1 true EP1997162A1 (fr) | 2008-12-03 |
Family
ID=37596256
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP07731128A Withdrawn EP1997162A1 (fr) | 2006-03-14 | 2007-03-13 | Dispositif de detection/memorisation de rayonnements electromagnetiques, procede de fabrication, utilisation de ce dispositif et imageur l'incorporant |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7982251B2 (fr) |
| EP (1) | EP1997162A1 (fr) |
| FR (1) | FR2898730B1 (fr) |
| WO (1) | WO2007104858A1 (fr) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12140550B2 (en) * | 2022-01-27 | 2024-11-12 | Kla Corporation | Selective marking of a substrate with fluorescent conjugated polymer probes having a small form factor |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6992322B2 (en) * | 2001-01-02 | 2006-01-31 | Kavassery Sureswaran Narayan | Photo-responsive organic field effect transistor |
| US20070158642A1 (en) * | 2003-12-19 | 2007-07-12 | Regents Of The University Of California | Active electronic devices with nanowire composite components |
| FR2873493B1 (fr) * | 2004-07-20 | 2007-04-20 | Commissariat Energie Atomique | Dispositif semiconducteur a nanotube ou nanofil, configurable optiquement |
| US7825582B2 (en) * | 2004-11-08 | 2010-11-02 | Kyodo Printing Co., Ltd. | Flexible display and manufacturing method thereof |
-
2006
- 2006-03-14 FR FR0602233A patent/FR2898730B1/fr not_active Expired - Fee Related
-
2007
- 2007-03-13 WO PCT/FR2007/000432 patent/WO2007104858A1/fr not_active Ceased
- 2007-03-13 US US12/282,584 patent/US7982251B2/en not_active Expired - Fee Related
- 2007-03-13 EP EP07731128A patent/EP1997162A1/fr not_active Withdrawn
Non-Patent Citations (2)
| Title |
|---|
| None * |
| See also references of WO2007104858A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2898730A1 (fr) | 2007-09-21 |
| FR2898730B1 (fr) | 2008-06-06 |
| US20090179240A1 (en) | 2009-07-16 |
| US7982251B2 (en) | 2011-07-19 |
| WO2007104858A1 (fr) | 2007-09-20 |
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