EP1846854A4 - Method of analyzing a product - Google Patents

Method of analyzing a product

Info

Publication number
EP1846854A4
EP1846854A4 EP05732934A EP05732934A EP1846854A4 EP 1846854 A4 EP1846854 A4 EP 1846854A4 EP 05732934 A EP05732934 A EP 05732934A EP 05732934 A EP05732934 A EP 05732934A EP 1846854 A4 EP1846854 A4 EP 1846854A4
Authority
EP
European Patent Office
Prior art keywords
analyzing
product
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP05732934A
Other languages
German (de)
French (fr)
Other versions
EP1846854A1 (en
Inventor
Burton R Clarke
Jr Kermit H Dove
Anthony J Grichnik
Michael Seskin
Danny L Weis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Caterpillar Inc
Original Assignee
Caterpillar Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Caterpillar Inc filed Critical Caterpillar Inc
Publication of EP1846854A1 publication Critical patent/EP1846854A1/en
Publication of EP1846854A4 publication Critical patent/EP1846854A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32187—Correlation between controlling parameters for influence on quality parameters
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32193—Ann, neural base quality management
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32194—Quality prediction
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
EP05732934A 2005-02-09 2005-02-09 Method of analyzing a product Withdrawn EP1846854A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2005/004142 WO2006085877A1 (en) 2005-02-09 2005-02-09 Method of analyzing a product

Publications (2)

Publication Number Publication Date
EP1846854A1 EP1846854A1 (en) 2007-10-24
EP1846854A4 true EP1846854A4 (en) 2010-06-16

Family

ID=36793342

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05732934A Withdrawn EP1846854A4 (en) 2005-02-09 2005-02-09 Method of analyzing a product

Country Status (4)

Country Link
EP (1) EP1846854A4 (en)
JP (1) JP2008530686A (en)
AU (1) AU2005327270A1 (en)
WO (1) WO2006085877A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2721453A1 (en) * 2011-09-29 2014-04-23 Siemens Aktiengesellschaft Method for verifying process parameters of a manufacturing process
US11556867B2 (en) * 2019-10-16 2023-01-17 Caterpillar Inc. System and method for worksite project tracking

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5555406A (en) * 1993-08-30 1996-09-10 Toyota Jidosha Kabushiki Kaisha Method and apparatus for assisting the design of parts of a product
WO2001098849A2 (en) * 2000-06-19 2001-12-27 Dow Global Technologies Inc. Rotating equipment diagnostic system and adaptive controller

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5465221A (en) * 1993-12-30 1995-11-07 The United States Of America As Represented By The Secretary Of The Air Force Automated process planning for quality control inspection
JP2003209035A (en) * 2002-01-17 2003-07-25 Toshiba Corp Setting method, setting program and setting device for parameter control value in semiconductor manufacturing process
JP2004185142A (en) * 2002-11-29 2004-07-02 Toyota Motor Corp System and method for supporting uniform product quality
JP2004186445A (en) * 2002-12-03 2004-07-02 Omron Corp Modeling device and model analysis method, system and method for process abnormality detection/classification, modeling system, and modeling method, and failure predicting system and method of updating modeling apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5555406A (en) * 1993-08-30 1996-09-10 Toyota Jidosha Kabushiki Kaisha Method and apparatus for assisting the design of parts of a product
WO2001098849A2 (en) * 2000-06-19 2001-12-27 Dow Global Technologies Inc. Rotating equipment diagnostic system and adaptive controller

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2006085877A1 *

Also Published As

Publication number Publication date
AU2005327270A1 (en) 2006-08-17
EP1846854A1 (en) 2007-10-24
JP2008530686A (en) 2008-08-07
WO2006085877A1 (en) 2006-08-17

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Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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17P Request for examination filed

Effective date: 20070716

AK Designated contracting states

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Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR

DAX Request for extension of the european patent (deleted)
A4 Supplementary search report drawn up and despatched

Effective date: 20100517

RIC1 Information provided on ipc code assigned before grant

Ipc: G06F 19/00 20060101ALI20100507BHEP

Ipc: G05B 19/418 20060101AFI20100507BHEP

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN

18D Application deemed to be withdrawn

Effective date: 20100817