EP1738186A4 - Detector of differential threshold voltage - Google Patents

Detector of differential threshold voltage

Info

Publication number
EP1738186A4
EP1738186A4 EP05735087A EP05735087A EP1738186A4 EP 1738186 A4 EP1738186 A4 EP 1738186A4 EP 05735087 A EP05735087 A EP 05735087A EP 05735087 A EP05735087 A EP 05735087A EP 1738186 A4 EP1738186 A4 EP 1738186A4
Authority
EP
European Patent Office
Prior art keywords
detector
threshold voltage
differential threshold
differential
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP05735087A
Other languages
German (de)
French (fr)
Other versions
EP1738186A1 (en
Inventor
Sami Ajram
Franck Strazzieri
Florent Garcia
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Atmel Corp
Original Assignee
Atmel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR0403551A external-priority patent/FR2868629B1/en
Application filed by Atmel Corp filed Critical Atmel Corp
Publication of EP1738186A1 publication Critical patent/EP1738186A1/en
Publication of EP1738186A4 publication Critical patent/EP1738186A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16585—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 for individual pulses, ripple or noise and other applications where timing or duration is of importance
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/01—Shaping pulses
    • H03K5/08—Shaping pulses by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding
    • H03K5/082—Shaping pulses by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding with an adaptive threshold
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/125—Discriminating pulses
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/153—Arrangements in which a pulse is delivered at the instant when a predetermined characteristic of an input signal is present or at a fixed time interval after this instant
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/2481—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors with at least one differential stage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)
EP05735087A 2004-04-05 2005-04-04 Detector of differential threshold voltage Withdrawn EP1738186A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0403551A FR2868629B1 (en) 2004-04-05 2004-04-05 DIFFERENTIAL THRESHOLD VOLTAGE DETECTOR
US10/917,080 US7227399B2 (en) 2004-04-05 2004-08-11 Detector of differential threshold voltage
PCT/US2005/011341 WO2005098459A1 (en) 2004-04-05 2005-04-04 Detector of differential threshold voltage

Publications (2)

Publication Number Publication Date
EP1738186A1 EP1738186A1 (en) 2007-01-03
EP1738186A4 true EP1738186A4 (en) 2007-08-29

Family

ID=35125203

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05735087A Withdrawn EP1738186A4 (en) 2004-04-05 2005-04-04 Detector of differential threshold voltage

Country Status (2)

Country Link
EP (1) EP1738186A4 (en)
WO (1) WO2005098459A1 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5764086A (en) * 1995-09-04 1998-06-09 Kabushiki Kaisha Toshiba Comparator circuit with wide dynamic range

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5331210A (en) * 1993-03-16 1994-07-19 Tektronix, Inc. Differential CMOS peak detection circuit
US6172535B1 (en) * 1999-11-04 2001-01-09 Analog Devices, Inc. High-speed analog comparator structures and methods

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5764086A (en) * 1995-09-04 1998-06-09 Kabushiki Kaisha Toshiba Comparator circuit with wide dynamic range

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
DOWLATABADI A B ET AL: "A generic voltage comparator analog cell produced in standard digital CMOS technologies", CIRCUITS AND SYSTEMS, 1996., IEEE 39TH MIDWEST SYMPOSIUM ON AMES, IA, USA 18-21 AUG. 1996, NEW YORK, NY, USA,IEEE, US, 18 August 1996 (1996-08-18), pages 35 - 38, XP010222977, ISBN: 0-7803-3636-4 *
EDWARDS C F ET AL: "A high speed offset-compensated differential comparator in floating body CMOS SOS technology for radiation hard switched-capacitor systems", SOI CONFERENCE, 1997. PROCEEDINGS., 1997 IEEE INTERNATIONAL FISH CAMP, CA, USA 6-9 OCT. 1997, NEW YORK, NY, USA,IEEE, US, 6 October 1997 (1997-10-06), pages 160 - 161, XP010256254, ISBN: 0-7803-3938-X *
See also references of WO2005098459A1 *

Also Published As

Publication number Publication date
WO2005098459A1 (en) 2005-10-20
EP1738186A1 (en) 2007-01-03

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Legal Events

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