EP1654778A2 - Kalibrierbare mikrowellen-schaltung mit beleuchtbaren gaas-fet sowie kalibriervorrichtung und verfahren zur kalibrierung - Google Patents
Kalibrierbare mikrowellen-schaltung mit beleuchtbaren gaas-fet sowie kalibriervorrichtung und verfahren zur kalibrierungInfo
- Publication number
- EP1654778A2 EP1654778A2 EP05733713A EP05733713A EP1654778A2 EP 1654778 A2 EP1654778 A2 EP 1654778A2 EP 05733713 A EP05733713 A EP 05733713A EP 05733713 A EP05733713 A EP 05733713A EP 1654778 A2 EP1654778 A2 EP 1654778A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- microwave circuit
- light source
- effect transistors
- light
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P1/00—Auxiliary devices
- H01P1/10—Auxiliary devices for switching or interrupting
- H01P1/15—Auxiliary devices for switching or interrupting by semiconductor devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P1/00—Auxiliary devices
- H01P1/22—Attenuating devices
Definitions
- the invention relates to a microwave circuit with electronic switching components with field-effect transistors on a substrate base made of galium arsenide.
- the microwave circuit can, in particular but not exclusively, be designed as a step-by-step damping circuit for quickly switching high-frequency signals.
- the switching components or the GaAs-FET can be illuminated by a light source, the light striking the field-effect transistors in particular significantly reducing the switching times of the field-effect transistors and the electronic switching components.
- field effect transistors can be very easily implemented on a semiconductor chip. In addition, they require very little tax.
- An exposure of field effect transistors based on galium arsenide, in particular MESFET, has the consequence that impurities which occur at the semiconductor interfaces, in particular below the gate electrode and have a negative influence on the switching times of the field effect transistors, are recharged more quickly .
- the negative influence of the defects is known as a gate-lag effect in MESFET components and can be measured as an extremely slow change in the sheet resistance. The cause is the slow charging and discharging of the surface defects of the source-gate section and the gate-drain section.
- By illuminating the field effect transistors electron-hole pairs are generated which neutralize the charges trapped in the impurities. The lighting can suppress the gate lag effect and shorten the switching time by a factor of 10 - 100.
- High-frequency circuits for example microwave circuits, which are designed as damping circuits, are used, for example, in high-frequency technology for measuring purposes and for level control in signal generators and network analyzers.
- the damping circuits or the field effect transistors used in them must be able to switch very quickly and have a large dynamic range.
- circuits with field effect transistors based on galium arsenide are used, which can also be illuminated in newer circuit arrangements, in particular to further shorten switching times.
- Such a generic microwave circuit is known from DE 102 28 810 AI.
- the digitally controllable attenuator disclosed there is constructed with field-effect transistors as switching elements which can be illuminated by a light source, for example an LED.
- the light sources are operated in an uncontrolled manner and are controlled independently of other variables influencing the switching time of the field effect transistors, so that in particular the light intensity and the light color or the radiation energy cannot be changed during operation of the attenuator.
- the present invention has for its object a microwave circuit with a short, constant and reproducible switching time and a corresponding To create calibration device and a corresponding calibration process.
- the object is achieved with respect to the microwave circuit by the features of claim 1, with respect to the calibration device by the features of claim 12 and with respect to the calibration method by the features of claim 14.
- the present invention has the advantage that the microwave circuit with illuminable field-effect transistors can keep the switching times of the field-effect transistors particularly short and constant with little effort, and so the switching times can be predicted as a function of operating parameters. In addition, the power requirements of the light sources and the thermal effect of the light source on the field effect transistors are minimized.
- the microwave circuit is designed so that the light source can alternately or simultaneously shine in different colors and so color combinations can be generated, the light source z. B. shine or shine in red, yellow, green, white, blue, ultraviolet and infrared.
- the microwave circuit has a control device which controls or regulates the light intensity and / or the light color of the light source.
- control device controls or regulates the light intensity and / or the light color as a function of at least one measured variable or a combination of measured variables.
- the control device controls or regulates the light intensity and / or the light color as a function of at least one measured variable or a combination of measured variables.
- control device controls the light source in such a way that the switching times of the field-effect transistors remain constant over the entire range of the values of the measured variables used during operation, the switching times being minimized.
- the control device advantageously has a memory in which the optimum light intensity and / or light color of the light source for a plurality of values of the measured variables is stored, depending on the values of the measured variables used, the control device storing the light intensity and / or the light color of the respective light source adjusts or controls based on the values of the measured variables used stored in the memory.
- the electronic microwave circuit according to the invention has at least one sensor in the area of the respective field effect transistor or the respective semiconductor substrate, which detects the light intensity and / or the temperature.
- the calibration device is able to calibrate the light color and / or light intensity of the light source of the microwave circuit via adjustable value ranges of the measured variables in order to make the light intensity and / or light color optimally adjustable.
- the calibration device advantageously has a control connection for controlling a cooling / heating for cooling or heating the field effect transistors. The temperature of the field effect transistors can thus be controlled and changed arbitrarily.
- Fig. 1 shows a schematically illustrated embodiment of a microwave circuit and a calibration device according to the invention.
- FIG. 1 shows a microwave circuit 1 according to the invention, which is connected to a calibration device 20 according to the invention.
- the microwave circuit 1 is designed as a damping circuit.
- input high-frequency signals 16 present at an input 9 are fed to a circuit arrangement with GaAs field-effect switching transistors 15 and damping elements and thereby subjected to quickly switchable dampings.
- the input high-frequency signals 16 are output at an output 10 more or less damped than output high-frequency signals 17.
- the schematically shown field-effect transistors 15 are integrated on a semiconductor chip 5 and are designed as field-effect transistors 15 on a substrate base made of galium arsenide (GaAs).
- the GaAs-FET can be illuminated by a light source 2, which in the exemplary embodiment is designed as a light-emitting diode.
- the light source 2 illuminates the GaAs FET, which are formed on semiconductor chip 5 provided with a transparent, separate housing (not shown separately).
- the light source 2 is shown close to the semiconductor chip 5, but can also be arranged above the semiconductor chip 5 ' .
- GaAs MESFET can also be used.
- the microwave circuit 1 is constructed on a carrier 14, which can be a printed circuit board, for example.
- a carrier 14 which can be a printed circuit board, for example.
- the control device 6 also has a memory 7 and a digital / analog converter 13.
- the desired damping values are selected and set by the control device 6 via the digital control connection 11.
- the switching times of the field-effect transistors 15 which can be illuminated by the light source 2 are dependent on a number of influencing variables.
- the switching times depend on the light intensity or illuminance with which the light source 2 acts on the field-effect transistors 15, on the light color that the light source 2 emits, on the temperature of the field-effect transistors 15, on the level of the field-effect transistors 15 Transistor 15 to be switched signal voltage compared to the control voltage with which the field-effect transistor 15 is controlled, the signal voltage being dependent on the input high-frequency signal 16, on the level of the signal frequency, which in the exemplary embodiment is the frequency of the input high-frequency signal 16 corresponds, and the polarity of the signal voltage compared to the control voltage.
- the switching times of the field-effect transistors 15 and thus of the microwave circuit 1 remain constant over a wide range of values of the influencing variables.
- the control voltage of the field-effect transistors 15 can only be freely selected in a very narrow range and the temperature of the field-effect transistors can only be adapted or adjusted very slowly and with great technical effort can be controlled or regulated
- the light intensity and / or the light color of the light source 2 is set or controlled or regulated as a function of an influencing variable or a combination of the remaining influencing variables, hereinafter referred to as measured variables.
- the light source 2 which can be changed in light color and / or light intensity during operation, is controlled with a digital signal via the digital / analog converter 13 of the control device 6.
- the digital signal controls the light intensity and / or light color of the light source 2.
- the light source 2 can be designed, for example, as a two-color LED which can shine in one of two colors or in both at the same time.
- a light source 2 and / or a laser diode that radiates strongly in the ultraviolet or infrared range can also be used.
- control device 6 sets the light intensity and / or light color of the light source 2 via the D / A converter 13 as a function of one or more of the influencing variables, eg. B. Polarity of the signal voltage compared to the
- the D / A converter adjusts the voltage supply of the light source 2 in question and thus the current through the light source 2.
- the light intensity and / or light color of the light source 2 is regulated by the control device 6.
- a sensor 8 arranged close to the relevant field effect transistor 15 is provided.
- the sensor 8 measures the illuminance of the light source 2 in question and passes it on to the control device 6.
- the sensor 8 also measures the temperature in the region of the field-effect transistor 15 in question.
- the sensor 8 can be integrated, for example, on the semiconductor chip 5.
- the sensor 8 can, for example, only measure the temperature, in which case the light intensity of the light source 2 in question can only be controlled by the control device 6.
- the control device 6 which, in the exemplary embodiment shown, the light intensity and / or light color of the light source 2 in question as a function of the measured variables, for. B. - Polarity of the signal voltage compared to the control voltage with which the field-effect transistors 15 are driven,
- the level of the signal frequency regulates so that the switching times of the field-effect transistor 15 in question about the expected or permissible value ranges of the influencing variables is constant, the light intensity is just as large as necessary and / or the wavelength of the light color is optimal. The heat development and the temperature influence of the light source 2 on the field-effect transistor 15 is reduced.
- the light intensity and / or light color is selected by the control device 6 so that the switching times of the field-effect transistor 15 in question are as short as possible.
- the optimum light intensity and / or light color is stored in the memory 7 of the control device 6 for each combination of the occurring values of the measured variables used, whereby only one measured variable can be used.
- the light intensity and / or light color is selected so optimally that the shortest possible switching time is achieved, the light intensity and / or light color being able to be adjusted so that even with the most unfavorable values of the measured variables, a constant switching time can be achieved by regulating the Light color and / or light intensity can be set that is constant over all expected or permissible values of the measured variables.
- the microwave circuit 1 or the light intensity and / or the light color of the light source 2 is calibrated before use in, for example, a measuring arrangement by means of a calibration device 20 according to the invention.
- the connected to the microwave circuit 1 is calibrated before use in, for example, a measuring arrangement by means of a calibration device 20 according to the invention.
- Calibration device 20 is operated using the method according to the invention.
- the calibration device 20 essentially has a signal generator 21 and a controller (control unit) 22 with a memory 25.
- the signal generator 21 generates the input high-frequency signal 16 and passes it on via a calibration output 29 to the input 9 of the microwave circuit 1.
- the controller 22 controls Via a calibration connection 24, which is connected to the control connection 11, the microwave circuit 1 or the control device 6, wherein it switches between the desired attenuation values by means of digital control signals and adjusts the light intensity and / or light color.
- the output high-frequency signal 17 is fed to the controller 22 via a calibration input 30 connected to the output 10.
- the controller 22 controls the signal generator 21, the signal generator 21 generating the respective output high-frequency signals 16 desired by the controller 22, and optionally via a control connection 23, a cooling / heating 31 for changing the temperature of the microwave circuit 1 or Field effect transistors 15.
- the calibration device 20 which is operated using the method according to the invention, now varies by means of the controller 22 the influencing variables which influence the switching time of the field effect transistors 15.
- the signal generator 21 varies and sets by changing the input high-frequency signal 16: polarity of the signal voltage compared to the control voltage with which the field-effect transistors 15 are driven,
- the temperature of the field effect transistors 15 can optionally be varied and set by the controller 22 through the heating / cooling 31.
- the light intensity or light color of the light source 2 is varied and set by the controller 22 via the control connection 11 and the control device 6.
- the controller 22 is able to regulate or regulate the temperature of the field-effect transistors 15 via the temperature transmitted by the sensor 8 via the control device 6 and the control connection 11 Control heating / cooling to keep constant or change.
- the values of the influencing variables are varied or changed step by step and for each change the switching time of the relevant field effect transistor 15 is determined by comparing the time of the switching command from the controller 22 with the occurrence of the damping received by the controller 22 in the output high-frequency signal 17 the step sizes are selectable and the value ranges of the influencing variables lie in predictable or permissible ranges or are selected in this way.
- one influencing variable is changed step by step and at the same time the other influencing variables are kept constant.
- the values of the influencing variables that occur are stored in the memory 25 and then evaluated by setting values for the optimum light intensity and / or light color of the light source 2 for each combination of the values of the measured variables, in which a minimized switching time is kept constant over all possible combinations of values can be.
- the evaluation is either stored in the form of an n-dimensional table first in the memory 25 and then transferred to the memory 7 or written directly to the memory 7.
- the controller 22 can be programmed via a programming connection 33, for example from a computer (PC) 32.
- the controller 22 can also be controlled via the programming connection 32 or data can be read from the memory 25.
- the invention is not restricted to the exemplary embodiment.
- the features of the exemplary embodiment can be combined with one another in any way.
Landscapes
- Junction Field-Effect Transistors (AREA)
- Led Devices (AREA)
- Electronic Switches (AREA)
Abstract
Description
Claims
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP06012897A EP1715543B1 (de) | 2004-05-17 | 2005-04-22 | Kalibrierbare Mikrowellen-Schaltung mit beleuchtbaren GaAs-FET sowie Kalibriervorrichtung und Verfahren zur Kalibrierung |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102004024367A DE102004024367A1 (de) | 2004-05-17 | 2004-05-17 | Kalibrierbare Mikrowellen-Schaltung mit beleuchtbaren GaAs-FET sowie Kalibriervorrichtung und Verfahren zur Kalibrierung |
| PCT/EP2005/004330 WO2005114774A2 (de) | 2004-05-17 | 2005-04-22 | KALIBRIERBARE MIKROWELLEN-SCHALTUNG MIT BELEUCHTBAREN GaAs-FET SOWIE KALIBRIERVORRICHTUNG UND VERFAHREN ZUR KALIBRIERUNG |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP06012897A Division EP1715543B1 (de) | 2004-05-17 | 2005-04-22 | Kalibrierbare Mikrowellen-Schaltung mit beleuchtbaren GaAs-FET sowie Kalibriervorrichtung und Verfahren zur Kalibrierung |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP1654778A2 true EP1654778A2 (de) | 2006-05-10 |
| EP1654778B1 EP1654778B1 (de) | 2007-01-31 |
Family
ID=34965156
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP06012897A Expired - Lifetime EP1715543B1 (de) | 2004-05-17 | 2005-04-22 | Kalibrierbare Mikrowellen-Schaltung mit beleuchtbaren GaAs-FET sowie Kalibriervorrichtung und Verfahren zur Kalibrierung |
| EP05733713A Expired - Lifetime EP1654778B1 (de) | 2004-05-17 | 2005-04-22 | Kalibrierbare mikrowellen-schaltung mit beleuchtbaren gaas-fet |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP06012897A Expired - Lifetime EP1715543B1 (de) | 2004-05-17 | 2005-04-22 | Kalibrierbare Mikrowellen-Schaltung mit beleuchtbaren GaAs-FET sowie Kalibriervorrichtung und Verfahren zur Kalibrierung |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7498552B2 (de) |
| EP (2) | EP1715543B1 (de) |
| DE (3) | DE102004024367A1 (de) |
| WO (1) | WO2005114774A2 (de) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4935373B2 (ja) * | 2007-01-23 | 2012-05-23 | 横河電機株式会社 | スイッチ回路およびこのスイッチ回路を用いたステップアッテネータ |
| WO2016198100A1 (en) | 2015-06-10 | 2016-12-15 | Advantest Corporation | High frequency integrated circuit and emitting device for irradiating the integrated circuit |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3662289A (en) * | 1970-07-30 | 1972-05-09 | Rca Corp | Frequency modulation by light impingement on a solid state oscillator |
| JPS6355978A (ja) * | 1986-08-26 | 1988-03-10 | Yokogawa Electric Corp | 半導体装置 |
| US4832433A (en) | 1986-12-31 | 1989-05-23 | Hughes Aircraft Company | Fiber-optic feed network using series/parallel connected light emitting opto-electronic components |
| US4859965A (en) * | 1989-02-27 | 1989-08-22 | The United States Of America As Represented By The Secretary Of The Army | Optical gain control of GaAs microwave monolithic integrated circuit distributed amplifier |
| JP2629428B2 (ja) * | 1990-10-01 | 1997-07-09 | 日本電気株式会社 | 砒化ガリウムfet集積回路 |
| US5073717A (en) * | 1990-10-15 | 1991-12-17 | The United States Of America As Represented By The Secretary Of The Army | Optical control of a microwave switch |
| US5073718A (en) * | 1990-10-15 | 1991-12-17 | The United States Of America As Represented By The Secretary Of The Army | Optical control of a microwave switch |
| FR2669145B1 (fr) | 1990-11-09 | 1994-02-11 | Thomson Tubes Electroniques | Canon a electrons module par commutation optoelectronique. |
| US5086281A (en) * | 1991-03-04 | 1992-02-04 | The United States Of America As Represented By The Secretary Of The Army | Optical control circuit for a microwave monolithic integrated circuit |
| US5214275A (en) * | 1991-09-30 | 1993-05-25 | The Boeing Company | Optically controlled microwave switch and signal switching system |
| US5162657A (en) * | 1991-11-06 | 1992-11-10 | The United States Of America As Represented By The Secretary Of The Army | Optical control of a microwave switch |
| US5347235A (en) * | 1992-11-02 | 1994-09-13 | The United States Of America As Represented By The Secretary Of The Army | Optically controlled oscillator |
| US5623233A (en) | 1993-11-10 | 1997-04-22 | The United States Of America As Represented By The Secretary Of The Army | Pulsed optically injection locked MESFET oscillator |
| US5808322A (en) | 1997-04-01 | 1998-09-15 | Hewlett-Packard Company | Faster switching GaAs FET switches by illumination with high intensity light |
| DE10228810B4 (de) | 2002-06-27 | 2010-09-30 | Rohde & Schwarz Gmbh & Co. Kg | Mikrowellen-Schaltung mit beleuchteten Feldeffekt-Transistoren |
| FR2848375B1 (fr) * | 2002-12-05 | 2005-01-14 | Schneider Electric Ind Sas | Dispositif d'eclairage a diodes electroluminescentes comportant un dispositif de communication et installation comportant un tel dispositif |
-
2004
- 2004-05-17 DE DE102004024367A patent/DE102004024367A1/de not_active Withdrawn
-
2005
- 2005-04-22 WO PCT/EP2005/004330 patent/WO2005114774A2/de not_active Ceased
- 2005-04-22 EP EP06012897A patent/EP1715543B1/de not_active Expired - Lifetime
- 2005-04-22 DE DE502005000980T patent/DE502005000980D1/de not_active Expired - Lifetime
- 2005-04-22 EP EP05733713A patent/EP1654778B1/de not_active Expired - Lifetime
- 2005-04-22 DE DE502005000357T patent/DE502005000357D1/de not_active Expired - Lifetime
- 2005-04-22 US US10/575,741 patent/US7498552B2/en not_active Expired - Lifetime
Non-Patent Citations (1)
| Title |
|---|
| See references of WO2005114774A2 * |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2005114774A2 (de) | 2005-12-01 |
| EP1715543A1 (de) | 2006-10-25 |
| DE502005000980D1 (de) | 2007-08-16 |
| US20070176129A1 (en) | 2007-08-02 |
| EP1715543B1 (de) | 2007-07-04 |
| DE102004024367A1 (de) | 2005-12-22 |
| WO2005114774A3 (de) | 2006-01-05 |
| EP1654778B1 (de) | 2007-01-31 |
| DE502005000357D1 (de) | 2007-03-22 |
| US7498552B2 (en) | 2009-03-03 |
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