EP1353234A1 - Procédé de fabrication d'un dispositif semi-conducteur, ledit dispositif et logiciel - Google Patents

Procédé de fabrication d'un dispositif semi-conducteur, ledit dispositif et logiciel Download PDF

Info

Publication number
EP1353234A1
EP1353234A1 EP03252285A EP03252285A EP1353234A1 EP 1353234 A1 EP1353234 A1 EP 1353234A1 EP 03252285 A EP03252285 A EP 03252285A EP 03252285 A EP03252285 A EP 03252285A EP 1353234 A1 EP1353234 A1 EP 1353234A1
Authority
EP
European Patent Office
Prior art keywords
field
radiation
projection
target portions
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP03252285A
Other languages
German (de)
English (en)
Inventor
Michael Josephus Evert Van De Moosdijk
Klaus Simon
Enno Van Den Brink
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ASML Netherlands BV
Original Assignee
ASML Netherlands BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP02252625A external-priority patent/EP1353230A1/fr
Application filed by ASML Netherlands BV filed Critical ASML Netherlands BV
Priority to EP03252285A priority Critical patent/EP1353234A1/fr
Publication of EP1353234A1 publication Critical patent/EP1353234A1/fr
Withdrawn legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
    • G03F7/70466—Multiple exposures, e.g. combination of fine and coarse exposures, double patterning or multiple exposures for printing a single feature
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
    • G03F7/70475—Stitching, i.e. connecting image fields to produce a device field, the field occupied by a device such as a memory chip, processor chip, CCD, flat panel display

Definitions

  • the present invention relates to a device manufacturing method comprising the steps of:
  • patterning means as here employed should be broadly interpreted as referring to means that can be used to endow an incoming radiation beam with a patterned cross-section, corresponding to a pattern that is to be created in a target portion of the substrate; the term “light valve” can also be used in this context.
  • the said pattern will correspond to a particular functional layer in a device being created in the target portion, such as an integrated circuit or other device (see below). Examples of such patterning means include:
  • Lithographic projection apparatus can be used, for example, in the manufacture of integrated circuits (ICs).
  • the patterning means may generate a circuit pattern corresponding to an individual layer of the IC, and this pattern can be imaged onto a target portion (e.g. comprising one or more dies) on a substrate (e.g. an Si, GaAs, InP, AlTiC or SiGe wafer) that has been coated with a layer of radiation-sensitive material (resist).
  • a single wafer will contain a whole network of adjacent target portions that are successively irradiated via the projection system, one at a time.
  • each target portion is irradiated by exposing the entire mask pattern onto the target portion in one go; such an apparatus is commonly referred to as a wafer stepper.
  • each target portion is irradiated by progressively scanning the mask pattern under the projection beam in a given reference direction (the "scanning" direction) while synchronously scanning the substrate table parallel or anti-parallel to this direction; since, in general, the projection system will have a magnification factor M (generally ⁇ 1), the speed V at which the substrate table is scanned will be a factor M times that at which the mask table is scanned. More information with regard to lithographic devices as here described can be gleaned, for example, from US 6,046,792, incorporated herein by reference.
  • a pattern (e.g. in a mask) is imaged onto a substrate that is at least partially covered by a layer of radiation-sensitive material (resist).
  • the substrate Prior to this imaging step, the substrate may undergo various procedures, such as priming, resist coating and a soft bake. After exposure, the substrate may be subjected to other procedures, such as a post-exposure bake (PEB), development, a hard bake and measurement/inspection of the imaged features.
  • PEB post-exposure bake
  • This array of procedures is used as a basis to pattern an individual layer of a device, e.g. an IC.
  • Such a patterned layer may then undergo various processes such as etching, ion-implantation (doping), metallization, oxidation, chemo-mechanical polishing, etc., all intended to finish off an individual layer. If several layers are required, then the whole procedure, or a variant thereof, will have to be repeated for each new layer. Eventually, an array of devices will be present on the substrate (wafer). These devices are then separated from one another by a technique such as dicing or sawing, whence the individual devices can be mounted on a carrier, connected to pins, etc.
  • the projection system may hereinafter be referred to as the "lens"; however, this term should be broadly interpreted as encompassing various types of projection system, including refractive optics, reflective optics, and catadioptric systems, for example.
  • the radiation system may also include components operating according to any of these design types for directing, shaping or controlling the projection beam of radiation, and such components may also be referred to below, collectively or singularly, as a "lens".
  • the lithographic apparatus may be of a type having two or more substrate tables (and/or two or more mask tables). In such "multiple stage” devices the additional tables may be used in parallel, or preparatory steps may be carried out on one or more tables while one or more other tables are being used for exposures. Dual stage lithographic apparatus are described, for example, in US 5,969,441 and WO 98/40791, incorporated herein by reference.
  • stage position repeatability which may be affected by X, Y and ⁇ resolution in the servo systems, the resolution of the interferometer systems measuring stage position and errors in mirror maps; stage leveling; stage dynamics; wafer and mask holder flatness; and projection lens distortion.
  • stage position repeatability which may be affected by X, Y and ⁇ resolution in the servo systems, the resolution of the interferometer systems measuring stage position and errors in mirror maps; stage leveling; stage dynamics; wafer and mask holder flatness; and projection lens distortion.
  • stitching errors are minimized.
  • the selection of the size and location of the projected field is driven by throughput considerations and the requirements of the mask pattern.
  • the projected field will be as large as possible so that a device can be printed in as small a number of exposures as possible.
  • positional distortions in the projected image are generally greatest at the edge of the projectable field and so selecting a maximum size projection field leads to the potential for large stitching errors.
  • the present invention by appropriately selecting a reduced field for projection reduces the number of stitching errors.
  • the number, size and orientation of parts into which a device is broken down for imaging may be selected according to the contents of the pattern to be imaged as well as positional distortions in the projected field. Not all the parts need be the same size and shape.
  • the edge along which the target portions overlap may be referred to as a stitch boundary and the images at this boundary may overlap slightly or abut without overlap.
  • the selection of the reduced projection field is based on data characterizing positional distortions in the projection lens to be used and the projected field can be selected by finding a field in which the difference between positional errors on opposite sides of the field are minimized. This determination may be carried out in advance of a given exposure series.
  • the invention also provides a computer program for selecting an optimum size and location for a projection field within the total field of a projection system for a device manufacturing method using a lithographic projection apparatus in which images are projected onto first and second target portions of a radiation-sensitive layer provided on a substrate using said projection system, said first and second target portions adjoining along an edge, said computer program comprising program code means that, when executed on a computer system, instruct the computer system to perform the steps of:
  • the terms "radiation” and “beam” are used to encompass all types of electromagnetic radiation, including ultraviolet radiation (e.g. with a wavelength of 431, 410, 365, 248, 193, 157 or 126 nm) and EUV (extreme ultra-violet radiation, e.g. having a wavelength in the range 5-20 nm), as well as particle beams, such as ion beams or electron beams.
  • ultraviolet radiation e.g. with a wavelength of 431, 410, 365, 248, 193, 157 or 126 nm
  • EUV extreme ultra-violet radiation
  • Figure 1 schematically depicts a lithographic projection apparatus that may be used in a device manufacturing method according to a particular embodiment of the invention.
  • the apparatus comprises:
  • the source LA (e.g. an excimer laser) produces a beam of radiation.
  • This beam is fed into an illumination system (illuminator) IL, either directly or after having traversed conditioning means, such as a beam expander Ex, for example.
  • the illuminator IL may comprise adjusting means AM for setting the outer and/or inner radial extent (commonly referred to as ⁇ -outer and ⁇ -inner, respectively) of the intensity distribution in the beam.
  • ⁇ -outer and ⁇ -inner commonly referred to as ⁇ -outer and ⁇ -inner, respectively
  • it will generally comprise various other components, such as an integrator IN and a condenser CO.
  • the beam PB impinging on the mask MA has a desired uniformity and intensity distribution in its cross-section.
  • the source LA may be within the housing of the lithographic projection apparatus (as is often the case when the source LA is a mercury lamp, for example), but that it may also be remote from the lithographic projection apparatus, the radiation beam which it produces being led into the apparatus (e.g. with the aid of suitable directing mirrors); this latter scenario is often the case when the source LA is an excimer laser.
  • the current invention and Claims encompass both of these scenarios.
  • the beam PB subsequently intercepts the mask MA, which is held on a mask table MT. Having traversed the mask MA, the beam PB passes through the lens PL, which focuses the beam PB onto a target portion C of the substrate W. With the aid of the second positioning means (and interferometric measuring means IF), the substrate table WT can be moved accurately, e.g. so as to position different target portions C in the path of the beam PB. Similarly, the first positioning means can be used to accurately position the mask MA with respect to the path of the beam PB, e.g. after mechanical retrieval of the mask MA from a mask library, or during a scan.
  • the mask table MT may just be connected to a short stroke actuator, or may be fixed.
  • the depicted apparatus can be used in two different modes:
  • Figure 2 is an example of a vector plot characterizing the distortions introduced by the projection lens when projecting a mask pattern onto a substrate.
  • the direction and magnitude of each arrow indicates the positional error of a point in the image nominally positioned at the tail of the arrow. Note though that the size of distortions is substantially exaggerated in this Figure.
  • the lens signature represented by this plot is different for each projection system PL but can be measured and recorded by well-known techniques. It should be noted that in the process of measuring distortions introduced by the projection lens, distortions caused by the clamping of the measurement reticle and distortions of the measurement reticle itself will be measured too. Distortions of the measurement reticle can be subtracted from the measured plot before it is used in the method of the invention. Distortions due to clamping should also be subtracted, at least to the extent that they will differ from distortions of production reticle due to their clamping.
  • Figure 3 is a higher-order plot of the same lens signature. It is calculated from the vector data and represents how an ideal line would be distorted in the projected image. From the higher-order fitted data, it is possible to determine an optimum field within the total available field such that the difference between the positional errors between points on opposite boundaries of the optimum field are minimized. In this determination, 2 nd and optionally higher order distortions in the projected image are taken into account. When adjacent fields are printed using the optimum field for each exposure, the stitching errors will be correspondingly minimized. Figure 3 illustrates an example of such an optimum field OF for the example lens signature.
  • the optimum field OF can be determined by calculating and comparing left and right and/or top and bottom distortion vectors for different field sizes and locations. The optimum field size and location can then readily be selected. It should be noted however that the optimization may include additional constraints than minimizing stitching errors since in many cases the minimum stitching error would be achieved with a zero field size. Thus, the optimization may be constrained to find the field of a given minimum size and/or aspect ratio that provides minimum stitching errors. If the pattern that is to be printed is such that stitching accuracy is more critical in some parts than others, the differences between positional errors may be weighted according to the criticality of stitching errors in different parts of the boundary, before selection of the optimum field size and location.
  • Figure 6 shows a device D made up of images C1 to C6 which are of two different sizes and two different orientations. The sizes and orientations of the image fields for the different exposures are selected according to the details of the pattern of the whole device as well as the distortions of the projection lens.
  • a stitching offset provides the greatest advantage where the difference in positional errors on opposite sides of the image field is in the same direction along all or most of the edge. If the difference in positional errors in different parts of the edge is in different directions, a stitching offset may provide less or no improvement. Thus, in selected of an optimum field size and location, the improvement obtainable by a stitching offset should also be taken into account.
  • the substrate table positioning repeatability may be characterized by performing a series of test exposures or other measurements to obtain data characterizing X and Y stepping errors of the wafer table server system. Errors in table positioning will, in general, include random and systematic components. The tests are repeated to identify the systematic errors which are to be taken account of in determination of the optimum exposure sequence. Such errors may derive from the wafer table positioning and control system as well as the interferometric displacement measuring system IF. Preferably, the test exposures are arranged to take account of all possible sources of errors. The test exposures can be used to derive a table positioning fingerprint comparable to the lens signature for a given apparatus.
  • an optimization routine can readily determine the appropriate order to carry out the exposures necessary to build up a device whilst minimizing stitching errors caused by stage positioning errors.
  • exposure orders have been optimized for throughput only.
  • Figure 5 shows a substrate W on which devices D1 to D4 are to be printed. Each device is made up of target areas C1 to C4. Possible paths P1 to P4 to be followed to print the different target areas are also shown. It will be appreciated that the optimum orders for printing different devices on a substrate may be different if the X and Y stepping errors are different in different areas of the substrate. According to the invention, it is preferable that the step pattern is arranged so that the exposures necessary to complete an extended device are all done before the next device is begun and that the total distance traveled to complete an extended device is minimized.
  • the leveling process may be carried out on-the-fly, that is during an exposure, using a level sensor that provides a real-time measurement of the position of the surface of the substrate.
  • the surface contour of the wafer may be measured in advance and optimum height (Z) positions and tilts (Rx, Ry) of the substrate during a scan calculated.
  • the leveling process may be seen as determining an optimum plane, representing an average of the substrate contour, that is to be positioned in the focal plane of the projection system PL. Conventionally such a plane has been determined separately for each exposure. According to the invention, the optimum plane is determined for the whole of an extended device.
  • optimization procedures of the invention may be carried out in real-time, during the course of a series of exposures, or in advance based an previously determined characteristics of the lithography apparatus and, where relevant, data of the patterns to be imaged and the substrate to be exposed.
  • the optimization procedures may be effected by a computer system forming part of the control system of the lithographic apparatus or by a separate computer system.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
EP03252285A 2002-04-12 2003-04-10 Procédé de fabrication d'un dispositif semi-conducteur, ledit dispositif et logiciel Withdrawn EP1353234A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP03252285A EP1353234A1 (fr) 2002-04-12 2003-04-10 Procédé de fabrication d'un dispositif semi-conducteur, ledit dispositif et logiciel

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP02252625 2002-04-12
EP02252625A EP1353230A1 (fr) 2002-04-12 2002-04-12 Procédé de fabrication d'un dispositif semi-conducteur et logiciels
EP03252285A EP1353234A1 (fr) 2002-04-12 2003-04-10 Procédé de fabrication d'un dispositif semi-conducteur, ledit dispositif et logiciel

Publications (1)

Publication Number Publication Date
EP1353234A1 true EP1353234A1 (fr) 2003-10-15

Family

ID=28455921

Family Applications (1)

Application Number Title Priority Date Filing Date
EP03252285A Withdrawn EP1353234A1 (fr) 2002-04-12 2003-04-10 Procédé de fabrication d'un dispositif semi-conducteur, ledit dispositif et logiciel

Country Status (1)

Country Link
EP (1) EP1353234A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021155991A1 (fr) * 2020-02-06 2021-08-12 Asml Netherlands B.V. Procédé d'utilisation d'un appareil lithographique à deux platines et appareil lithographique

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05197158A (ja) * 1991-06-17 1993-08-06 Nikon Corp 露光方法および装置
US5281996A (en) * 1992-09-04 1994-01-25 General Signal Corporation Photolithographic reduction imaging of extended field
US5298761A (en) * 1991-06-17 1994-03-29 Nikon Corporation Method and apparatus for exposure process
US5773836A (en) * 1996-10-28 1998-06-30 International Business Machines Corporation Method for correcting placement errors in a lithography system
US6204912B1 (en) * 1996-05-08 2001-03-20 Nikon Corporation Exposure method, exposure apparatus, and mask
US20020024714A1 (en) * 1998-03-02 2002-02-28 Torbjorn Sandstrom Pattern generator

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05197158A (ja) * 1991-06-17 1993-08-06 Nikon Corp 露光方法および装置
US5298761A (en) * 1991-06-17 1994-03-29 Nikon Corporation Method and apparatus for exposure process
US5281996A (en) * 1992-09-04 1994-01-25 General Signal Corporation Photolithographic reduction imaging of extended field
US6204912B1 (en) * 1996-05-08 2001-03-20 Nikon Corporation Exposure method, exposure apparatus, and mask
US5773836A (en) * 1996-10-28 1998-06-30 International Business Machines Corporation Method for correcting placement errors in a lithography system
US20020024714A1 (en) * 1998-03-02 2002-02-28 Torbjorn Sandstrom Pattern generator

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 017, no. 621 (P - 1645) 16 November 1993 (1993-11-16) *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021155991A1 (fr) * 2020-02-06 2021-08-12 Asml Netherlands B.V. Procédé d'utilisation d'un appareil lithographique à deux platines et appareil lithographique

Similar Documents

Publication Publication Date Title
US7466413B2 (en) Marker structure, mask pattern, alignment method and lithographic method and apparatus
US20040174511A1 (en) Lithographic apparatus
US20030020184A1 (en) Substrate provided with an alignment mark, method of designing a mask, computer program, mask for exposing said mark, device manufacturing method, and device manufactured thereby
EP1496397A1 (fr) Procédé et système de correction anticipé de type overlay de distortion et décalage induits par un motif, et appareil de projection lithographique utilisant ces procédé et système
EP1477851A1 (fr) Méthode de fabrication d'un dispositif et appareil lithographique
US7492443B2 (en) Device manufacturing method, device manufactured thereby and a mask for use in the method
US7133117B2 (en) Dual sided lithographic substrate imaging
JP4058405B2 (ja) デバイス製造方法およびこの方法により製造したデバイス
EP1353229A1 (fr) Appareil lithographique, procédé pour la fabrication d un dispositif et dispositif fabriqué par ce procédé
EP1406126A1 (fr) Méthode de fabrication d'un dispositif
US6906785B2 (en) Lithographic apparatus, device manufacturing method, and device manufactured thereby
EP1477861A1 (fr) Méthode de calibration d'un appareil lithographique, méthode d'alignement, programme d'ordinateur, appareil lithographique et procédé de fabrication d'un dispositif
US6937318B2 (en) Lithographic apparatus, computer program, device manufacturing method, and device manufactured thereby
EP1469347A1 (fr) Appareil de projection lithographique et méthode de fabrication d'un dispositif
US6955074B2 (en) Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby
EP1353230A1 (fr) Procédé de fabrication d'un dispositif semi-conducteur et logiciels
EP1271247A1 (fr) Méthode et masque pour exposition par projection
EP1260870A1 (fr) Repère d'alignement
EP1353234A1 (fr) Procédé de fabrication d'un dispositif semi-conducteur, ledit dispositif et logiciel
EP1357435A1 (fr) Appareil lithographique et méthode de fabrication d'un dispositif
EP1431834B1 (fr) Méthode de fabrication d'un dispositif utilisant un masque de projection lithographique
US7041996B2 (en) Method of aligning a substrate, a computer program, a device manufacturing method and a device manufactured thereby
EP1335248A1 (fr) Appareil lithographique et méthode de fabrication d'un dispositif
EP1480084A1 (fr) Appareil de projection lithographique et méthode de fabrication d'un dispositif
EP1398670A2 (fr) Procédé d'alignement d'un substrat, programme informatique et procédé pour la production d'un dispositif

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL LT LV MK

17P Request for examination filed

Effective date: 20040323

AKX Designation fees paid

Designated state(s): DE FR GB IT NL

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: ASML NETHERLANDS B.V.

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN

18W Application withdrawn

Effective date: 20080918