EP1184682A3 - Image correcting method for an X-ray detector - Google Patents

Image correcting method for an X-ray detector Download PDF

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Publication number
EP1184682A3
EP1184682A3 EP01000355A EP01000355A EP1184682A3 EP 1184682 A3 EP1184682 A3 EP 1184682A3 EP 01000355 A EP01000355 A EP 01000355A EP 01000355 A EP01000355 A EP 01000355A EP 1184682 A3 EP1184682 A3 EP 1184682A3
Authority
EP
European Patent Office
Prior art keywords
gain
effects
light source
ray detector
pixel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP01000355A
Other languages
German (de)
French (fr)
Other versions
EP1184682A2 (en
Inventor
Michael Dr. Overdick
Walter Dr. Rütten
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Intellectual Property and Standards GmbH
Koninklijke Philips NV
Original Assignee
Philips Intellectual Property and Standards GmbH
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property and Standards GmbH, Koninklijke Philips Electronics NV filed Critical Philips Intellectual Property and Standards GmbH
Publication of EP1184682A2 publication Critical patent/EP1184682A2/en
Publication of EP1184682A3 publication Critical patent/EP1184682A3/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01T1/40Stabilisation of spectrometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/30Transforming light or analogous information into electric information
    • H04N5/32Transforming X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
  • Image Input (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Closed-Circuit Television Systems (AREA)

Abstract

Die Erfindung betrifft ein Bildkorrekturverfahren für einen Röntgendetektor mit einer rückwärtigen Lichtquelle mit verbesserter Korrektur der Nachbildeffekte.The invention relates to an image correction method for an X-ray detector with a rear light source with improved correction of afterimage effects.

Die Erfindung beruht auf der Erkenntnis, dass die sogenannten "Gain-Effekte" mit bekannten Verfahren nicht zu eliminieren sind. Die "Gain-Effekte" bewirken jedoch bereits bei üblichen diagnostischen Röntgendosen eine Erhöhung der Verstärkung um einige Prozent und damit eine fehlerhafte Hellbildaufnahme.The invention is based on the finding that the so-called "gain effects" can not be eliminated with known methods. However, the "gain effects" already cause an increase in the gain by a few percent and thus a faulty image acquisition in the case of conventional diagnostic X-ray doses.

Erfindungsgemäß werden die Gain-Effekte durch Aufnahme von Lichtquellenbildern mit Hilfe der eingebauten Lichtquelle erfasst und damit die Stärke des Gain-Effektes sowie ein Korrekturfaktor pixelweise bestimmt. Mit Hilfe des Korrekturfaktors werden die Pixelwerte der Hellbildaufnahme korrigiert.

Figure imgaf001
According to the invention, the gain effects are recorded by taking light source images with the aid of the built-in light source and thus determining the strength of the gain effect and a correction factor on a pixel-by-pixel basis. With the aid of the correction factor, the pixel values of the bright image recording are corrected.
Figure imgaf001

EP01000355A 2000-08-10 2001-08-08 Image correcting method for an X-ray detector Withdrawn EP1184682A3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10039002 2000-08-10
DE10039002A DE10039002A1 (en) 2000-08-10 2000-08-10 Image correction method for an X-ray detector

Publications (2)

Publication Number Publication Date
EP1184682A2 EP1184682A2 (en) 2002-03-06
EP1184682A3 true EP1184682A3 (en) 2006-07-12

Family

ID=7651938

Family Applications (1)

Application Number Title Priority Date Filing Date
EP01000355A Withdrawn EP1184682A3 (en) 2000-08-10 2001-08-08 Image correcting method for an X-ray detector

Country Status (4)

Country Link
US (1) US6600159B2 (en)
EP (1) EP1184682A3 (en)
JP (1) JP2002162473A (en)
DE (1) DE10039002A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2412703C (en) * 2001-11-23 2008-02-05 Imaging Dynamics Company Ltd. Balancing areas of varying density in a digital image
DE10220293A1 (en) * 2002-05-07 2003-11-27 Philips Intellectual Property Device and method for reducing image artifacts
US8049691B2 (en) * 2003-09-30 2011-11-01 Sharp Laboratories Of America, Inc. System for displaying images on a display
US7272208B2 (en) * 2004-09-21 2007-09-18 Ge Medical Systems Global Technology Company, Llc System and method for an adaptive morphology x-ray beam in an x-ray system
EP1828810B1 (en) * 2004-12-17 2012-06-06 Koninklijke Philips Electronics N.V. Pulsed x-ray for continuous detector correction
JP4462349B2 (en) * 2005-08-31 2010-05-12 株式会社島津製作所 Radiation imaging apparatus and radiation detection signal processing method
JP4989197B2 (en) * 2005-12-13 2012-08-01 キヤノン株式会社 Radiation imaging apparatus, radiation imaging system, and correction method
US7485850B2 (en) * 2006-07-27 2009-02-03 Varian Medical Systems, Inc. Gain/lag artifact correction algorithm and software
CN105717532B (en) * 2007-04-12 2019-07-26 皇家飞利浦电子股份有限公司 The determination of the spatial gain distribution of scintillator

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0397229A1 (en) * 1989-04-26 1990-11-14 Koninklijke Philips Electronics N.V. X-ray measurement apparatus
US5530238A (en) * 1993-09-03 1996-06-25 U.S. Philips Corporation Image detection device having correction circuit for removing artifacts due to delayed charge transfer
US6028314A (en) * 1996-08-01 2000-02-22 Siemens Aktiengesellschaft Method for correcting image errors in an x-ray image, and x-ray diagnostic apparatus and solid-state radiation detector operating in accordance with the method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2415365A1 (en) 1978-01-24 1979-08-17 Radiologie Cie Gle DEVICE FOR REDUCING THE DIVERGENCE OF THE USEFUL BEAM OF AN X-RAY TUBE, AND THUS EQUIPPED TUBE
DE4002431A1 (en) 1990-01-27 1991-08-01 Philips Patentverwaltung SENSOR MATRIX
WO1998001992A2 (en) * 1996-07-08 1998-01-15 Philips Electronics N.V. X-ray examination apparatus with a semiconductor x-ray detector

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0397229A1 (en) * 1989-04-26 1990-11-14 Koninklijke Philips Electronics N.V. X-ray measurement apparatus
US5530238A (en) * 1993-09-03 1996-06-25 U.S. Philips Corporation Image detection device having correction circuit for removing artifacts due to delayed charge transfer
US6028314A (en) * 1996-08-01 2000-02-22 Siemens Aktiengesellschaft Method for correcting image errors in an x-ray image, and x-ray diagnostic apparatus and solid-state radiation detector operating in accordance with the method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
FRITZ S L ET AL: "HIGH-RESOLUTION DIGITAL X-RAY DETECTOR UTILIZING A DISCRETE ARRAY OF CDWO4 SCINTILLATORS AND A SELF-SCANNED PHOTODIODE ARRAY", MEDICAL PHYSICS, AIP, MELVILLE, NY, US, vol. 14, no. 2, 1 March 1987 (1987-03-01), pages 244 - 248, XP000001289, ISSN: 0094-2405 *

Also Published As

Publication number Publication date
US6600159B2 (en) 2003-07-29
EP1184682A2 (en) 2002-03-06
DE10039002A1 (en) 2002-02-21
US20020024017A1 (en) 2002-02-28
JP2002162473A (en) 2002-06-07

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