EP1146489A2 - Dispositif palpeur et méthode de balayage sans contact de la surface d'un objet - Google Patents

Dispositif palpeur et méthode de balayage sans contact de la surface d'un objet Download PDF

Info

Publication number
EP1146489A2
EP1146489A2 EP01108145A EP01108145A EP1146489A2 EP 1146489 A2 EP1146489 A2 EP 1146489A2 EP 01108145 A EP01108145 A EP 01108145A EP 01108145 A EP01108145 A EP 01108145A EP 1146489 A2 EP1146489 A2 EP 1146489A2
Authority
EP
European Patent Office
Prior art keywords
sensor
sensor elements
elements
coin
individual
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP01108145A
Other languages
German (de)
English (en)
Other versions
EP1146489A3 (fr
EP1146489B1 (fr
Inventor
Udo Laube
Jürgen Radzewitz
Gerd Weisse
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Phoenix Mecano Digital Elektronik GmbH
Original Assignee
ACT GES fur SOFTWARE und HARD
Act Gesellschaft fur Software- und Hardware Mbh
Phoenix Mecano Digital Elektronik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ACT GES fur SOFTWARE und HARD, Act Gesellschaft fur Software- und Hardware Mbh, Phoenix Mecano Digital Elektronik GmbH filed Critical ACT GES fur SOFTWARE und HARD
Publication of EP1146489A2 publication Critical patent/EP1146489A2/fr
Publication of EP1146489A3 publication Critical patent/EP1146489A3/fr
Application granted granted Critical
Publication of EP1146489B1 publication Critical patent/EP1146489B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07DHANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/005Testing the surface pattern, e.g. relief

Definitions

  • the invention is in the field of contactless scanning of surfaces of objects especially of coins, coin-like tokens or similar items.
  • Methods for contactless checking of coins are made more inductive, for example and / or opto-electronic means performed.
  • a method is known from the document EP 0508560 and a device for contactless checking of coins is known.
  • the authenticity of the coin is checked using sampled physical signals. During the test, the coin is rotated by at least 360 ° within a test cycle, the coin initially with the aid of radially adjustable clamping elements compared to a sensor centered and then rotated.
  • coin verification is that accurate and exact detection and centering of the coin to be checked takes place since even the smallest inaccuracies and deviations during centering and subsequent scanning for misinterpretations and operational disturbances being able to lead. This is a relatively large mechanical in the known method Effort necessary.
  • the invention is therefore based on the object of a sensor device and a method for contactless scanning of a surface of objects, in particular a coin, one to create coin-like token or similar items that allow the mechanical effort to achieve sufficient accuracy in coin validation reduce, the sensor device and the method should be designed so that surfaces various objects can be scanned.
  • a sensor device solved in that the sensor has several sensor elements with a respective individual Has sensor surface, the individual sensor surfaces of the plurality of sensor elements a sensor matrix is formed, and the plurality of sensor elements for non-contact Scanning can be addressed individually in such a way that a number is formed from the plurality of sensor elements selected sensor elements can be electronically selected and addressed.
  • the main advantage which the invention achieves over the prior art is is that a way is created, a coin or some other object that is arranged opposite the sensor device in different surface areas to scan by selecting sensor elements individually. This allows for any trained coins or objects are scanned signals in different surface areas are processed and used to identify the coin or item.
  • the Sensor device is fundamentally for every kind of coins, coin-like tokens or objects suitable without having to make any design changes to the Adapt sensor device for scanning certain objects. The adjustment to Different coins or objects are scanned in particular by certain ones Sensor elements for scanning can be individually addressed. This is one for the most varied Applications suitable sensor device created.
  • the test accuracy of the scanning process can be optimized in that the one to be tested Coin and the scanning device (sensor device) during the scanning process relative to one another are in a rest position. However, it can also be provided that the coin to be checked or the object to be tested moves relative to the scanning device during the scanning process when the test accuracy achieved in such a scanning process for the particular Use case is sufficient.
  • An expedient development of the invention provides that the multiple sensor elements are so are arranged so that the number of selected sensor elements can be selected so that the essentially along the respective individual sensor surfaces of the selected sensor elements a circular path are arranged. As a result, the selected sensor elements are along a simple, closed, geometric curve arranged.
  • the distances between adjacent ones of the several sensor elements are expediently small Dimensions of the respective individual sensor surface of the neighboring sensor elements, which enables a fine scanning grid for coin validation.
  • part of the plurality Sensor elements is arranged along at least two lines. With the help of along the Signals detected on both lines can advantageously have dimensions of the object to be tested determined or used for further calculations.
  • Calculations on the relative location of the surface of the object to be scanned with respect to the Sensor devices can advantageously be implemented when using the at least two Lines an axis cross is formed.
  • a development of the invention provides that sensor elements that run along the at least two lines are arranged, each designed as a lens sensor element.
  • the time for scanning along a curve running on the coin to be tested can be minimized be, if it is provided according to an advantageous embodiment of the invention that the Several sensor elements Sensor elements with an individual, at least partially revolving Include sensor surface, the at least partially circumferential, individual sensor surface each at least partially surrounds an inner opening.
  • the comparison of the sampled signals with existing standard signals can then be carried out if the at least partially circumferential, individual sensor surface essentially is formed along a circular path, the radii of the respective circular paths differentiate.
  • the at least partially encircling, individual sensor surface of one of the sensor elements, the at least partially encircling, individual sensor surface of another of the sensor elements at least partially includes.
  • An unaffected by electromagnetic interference and the scanning of surface features the coin to be checked or the item to be checked is then a comprehensive check expediently executable if the plurality of sensor elements comprise optical sensor elements.
  • a light source for illuminating the surface of the object is arranged.
  • a further development of the invention provides that the multiple sensor elements are inductive and / or include magneto-optical sensor elements, which additionally material properties of the checking coin can be detected.
  • an electrical coil can expediently be located in the area of the sensor matrix be arranged.
  • One with regard to optimizing the density of individual sensor areas per partial area of the Sensor matrix and a convenient electronic circuit of the sensor device provides that one or all of the multiple sensor elements are integrated on one Electronic component are formed, which is included in the sensor.
  • a preferred development of the invention provides that one or all of the plurality of sensor elements are formed as bonded components, which makes it simple, with little effort Realizable construction of the sensor device is made possible.
  • a coin 1 for checking a sensor device 2 is arranged opposite one another.
  • the coin 1 is scanned with the aid of several sensor elements of the sensor device 2. This is shown schematically in FIG. 1 with the aid of arrows A.
  • To scan the coin 1 includes the sensor device 2 a plurality of sensor elements (not shown in FIG. 1), each one have individual sensor surface. The individual sensor areas form a sensor matrix 3, facing the coin 1.
  • the multiple sensor elements are used to scan the coin 1 the sensor device 2 with the aid of a control device 4, which is electrical with the sensor device is individually addressed so that for selected sensor elements of the plurality Sensor elements of the sensor device 2 each trigger a scanning process and the scanning signals detected here by means of the control device 4 from the selected sensor elements can be read out.
  • the multiple sensor elements individually or in Groups can be addressed simultaneously or in succession.
  • the read scanning signals or characteristic values derived from this are then compared with previously stored standard signals, to decide whether the coin 1 is of a certain coin type.
  • the standard signals are stored in memory means of the control device 4.
  • the control facility 4 it can be any electronic device that is suitable for the plurality To address and control sensor elements of sensor device 2 individually and separately and / or read out. It can be provided that the control device 4 also the voltage supply controls the sensor device 2.
  • control device can perform 4 further control functions in a coin checking device (not shown) in which the sensor device 2 and the control device 4 are arranged are take over.
  • a coin checking device (not shown) in which the sensor device 2 and the control device 4 are arranged are take over.
  • the control device 4 depending on Result of the coin check a process for sorting coins that are controlled as falsely recognized.
  • the control device 4 can be fully or partially integrated into the sensor device 2.
  • the object to be checked with the aid of the sensor device 2 was used in connection with FIG. 1 referred to as a coin 1.
  • the item to be checked can also be coin-like tokens, tokens or any, especially flat objects, for example Act buttons, their dimensions to the sensor matrix 3 of the sensor device 2 in one are such a size ratio that scanning signals are detected with the aid of the sensor device that can be used to identify the item.
  • a sensor device 20 is shown in front view in FIG.
  • a sensor matrix 22 is formed from individual sensor surfaces 21 of the sensor elements.
  • the individual Sensor surfaces 21 are arranged in rows and columns.
  • the sensor elements of the sensor device 20 can be selected such that the individual sensor surfaces 21 of the selected sensor elements along any curve shape are arranged. In FIG. 2 this is an example of those lying on a circular path 23 individual sensor surfaces 21 shown.
  • the sensor device 20 can be implemented any curve shape due to the grid-like Arrangement of the individual sensor surfaces 21 is possible.
  • the along the desired curve arranged and selected sensor elements preferably simultaneously addressed so that the scanning process for checking the coin is carried out in the shortest possible time can be. How many sensor elements can be addressed or read out simultaneously depends essentially on the capacity or performance of the sensor device 20 connected control device.
  • a further sensor device 30 is shown schematically in front view. Compared 2 are arranged in adjacent rows 31, 32 to the sensor device 20 according to FIG individual sensor surfaces 33 offset from one another. With the help of such an arrangement of the individual sensor surfaces 33 it is possible, for example, to select sensor elements in such a way that their individual sensor surfaces 34 lie along a square curve 35.
  • FIG. 4 schematically shows a sensor device 40 in which the multiple sensors, whose individual sensor surfaces 41 form a sensor matrix 42, of a different type are.
  • the multiple sensors whose individual sensor surfaces 41 form a sensor matrix 42, of a different type are.
  • one part 43 of the several sensor elements, as shown in FIG. 4 is arranged such that an axis cross 45 is formed.
  • a center can then be created with the aid of one part 43 of the plurality of sensor elements of the coin to be checked can then be determined depending on the determined
  • the center of the coin to be tested selected sensor elements for scanning the one to be tested To select a coin. This can ensure, for example, that when scanning the coin to be tested along a circular path the circular path with regard to the coin to be tested is centered. But also any relative positioning with the help of the selected sensor elements realized scan curve with regard to the center of the coin is possible.
  • an axis cross 51 can be made using several Sensor elements can be realized that have individual line sensor surfaces 52.
  • a sensor device 60 can comprise sensor elements that have a have at least partially circumferential, individual sensor surface 61.
  • the at least partially circumferential, individual sensor surfaces 61 can differ with respect to a respective radius distinguish so that the coin to be checked is scanned along several tracks may differ in their respective scope.
  • the sensor device 60 can have the at least one partially encircling, individual sensor surfaces include 61 further sensor elements, the closed, have individual sensor surfaces 62. Any combination of sensor elements with line sensor surfaces 52 (see FIG. 5) and / or sensor elements with at least partially circumferential, individual sensor surfaces 61 (see FIG. 6) and / or sensor elements closed, essentially punctiform sensor surfaces 62 are possible.
  • This can a sensor device can be individually designed so that it can be used to scan certain coins or flat objects is adapted. It is essential here that the combined Sensor elements can be addressed or read out individually at the same time or one after the other are in order to determine the specific nature of the object to be examined and the the time required to carry out the testing process optimized scanning process.
  • a sensor matrix is formed in each case, which is essentially rectangular a sensor matrix can also be provided, which is circular or diamond-shaped or one corresponds to any other geometric shape.
  • the sensor device has so far been independent of the individual characteristics of the several Sensor elements described.
  • the multiple sensor elements can be optically sensitive, for example Have sensor surfaces (CCD elements, photodiodes).
  • CCD elements CCD elements, photodiodes
  • the light source for illuminating the coin to be checked can even in the sensor device may be integrated, preferably in the area of the sensor matrix 22 or 42, or are on the edge of the sensor device or the sensor matrix 22 or 42, so that lighting the surface to be scanned is made possible.
  • the light source and the optically sensitive Sensor areas are matched to each other with regard to the spectral range used.
  • Inductive sensor elements can also be provided.
  • the scanning of the Passive coin to be tested using an external magnetic field of a suitable one Frequency or active by the sensor elements of the sensor device for generating Eddy currents create a magnetic field inside or on the surface of the coin to be tested.
  • the resulting and sampled signals are then used to obtain features evaluated.
  • Means for generating the external magnetic field e.g. coils
  • Light source already described can be integrated into the sensor device, preferably in the area of the sensor or the sensor matrix 22 or 42.
  • magneto-optical sensor elements can be provided.
  • the coin or the flat object relative to the sensor device is moved. For example, between two scans, each of which Sensor elements are individually addressed or read out, that the position the coin or the flat object is changed relative to the sensor device. While of the scanning processes, the coin or the flat object is then at rest relative to the sensor device.
  • the accuracy of the surface scanning is fundamentally determined using the sensor device 2 then be executable with the highest accuracy if the coin to be checked or the one to be checked Object during the scanning process in relative calm with respect to the sensor device 2 located.
  • the object to be tested is on the sensor device during the scanning process 2 moved over.
  • a possibly reduced scanning accuracy can however, certain applications may be sufficient.
  • Advantage of one on the sensor device 2 an object moving past during the scanning process would be that a larger one Number of objects can be scanned in a certain time interval since stopping of the object to be checked compared to the sensor device 2 is omitted.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Coins (AREA)
  • Image Input (AREA)
EP01108145.2A 2000-04-12 2001-03-30 Dispositif palpeur et méthode de balayage sans contact de la surface d'un objet Expired - Lifetime EP1146489B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10018198 2000-04-12
DE10018198.8A DE10018198B4 (de) 2000-04-12 2000-04-12 Sensoreinrichtung und Verfahren zum berührungslosen Abtasten einer Oberfläche eines Gegenstandes

Publications (3)

Publication Number Publication Date
EP1146489A2 true EP1146489A2 (fr) 2001-10-17
EP1146489A3 EP1146489A3 (fr) 2004-01-07
EP1146489B1 EP1146489B1 (fr) 2016-03-23

Family

ID=7638518

Family Applications (1)

Application Number Title Priority Date Filing Date
EP01108145.2A Expired - Lifetime EP1146489B1 (fr) 2000-04-12 2001-03-30 Dispositif palpeur et méthode de balayage sans contact de la surface d'un objet

Country Status (3)

Country Link
EP (1) EP1146489B1 (fr)
DE (1) DE10018198B4 (fr)
ES (1) ES2571777T3 (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004075124A1 (fr) * 2003-02-19 2004-09-02 Walter Hanke Mechanische Werkstätten GmbH & Co. KG Procede et dispositif pour controler des pieces de monnaie
EP2071525A1 (fr) 2007-12-07 2009-06-17 ACS Solutions Switzerland AG Vérificateur de pièces
WO2012038670A1 (fr) 2010-09-23 2012-03-29 Parkeon Dispositif sélecteur de pièces de monnaie
WO2012116981A1 (fr) * 2011-02-28 2012-09-07 Ezio Panzeri Appareil formant capteur

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0508560A2 (fr) 1991-04-11 1992-10-14 ACT GESELLSCHAFT FÜR SOFT UND HARDWARESYSTEME mbH Méthode et dispositif pour l'examen de pièces de monnaie

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3797628A (en) * 1972-03-17 1974-03-19 Little Inc A Device and method for testing coins employing velocity determining means
DE2716740A1 (de) * 1977-04-14 1978-10-26 Walter Hanke Mechanische Werks Vorrichtung zur automatischen, beruehrungsfreien pruefung von muenzen auf echtheit und/oder nennwert und/oder zur rechnergefuehrten parameterauswertung
US4267916A (en) * 1979-01-30 1981-05-19 Keene Corporation Coin identification system
JP3031525B2 (ja) * 1995-01-27 2000-04-10 旭精工株式会社 電子式の硬貨選別装置
GB9610603D0 (en) * 1996-05-21 1996-07-31 Panzeri Ezio Coin recognition apparatus
GB2341709A (en) * 1998-09-18 2000-03-22 Mars Inc Coin sensing device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0508560A2 (fr) 1991-04-11 1992-10-14 ACT GESELLSCHAFT FÜR SOFT UND HARDWARESYSTEME mbH Méthode et dispositif pour l'examen de pièces de monnaie

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004075124A1 (fr) * 2003-02-19 2004-09-02 Walter Hanke Mechanische Werkstätten GmbH & Co. KG Procede et dispositif pour controler des pieces de monnaie
JP2006518067A (ja) * 2003-02-19 2006-08-03 ヴァルター ハンケ メカニシュ ヴェルクシュタッテン ゲーエムベーハー ウント コー カーゲー コインのテスト方法及びテスト装置
US7552811B2 (en) 2003-02-19 2009-06-30 Walter Hanke Mechanische Werkstatten Gmbh & Co. Kg Method and device for testing coins
EP2071525A1 (fr) 2007-12-07 2009-06-17 ACS Solutions Switzerland AG Vérificateur de pièces
WO2012038670A1 (fr) 2010-09-23 2012-03-29 Parkeon Dispositif sélecteur de pièces de monnaie
WO2012116981A1 (fr) * 2011-02-28 2012-09-07 Ezio Panzeri Appareil formant capteur

Also Published As

Publication number Publication date
DE10018198B4 (de) 2015-07-23
EP1146489A3 (fr) 2004-01-07
ES2571777T3 (es) 2016-05-26
EP1146489B1 (fr) 2016-03-23
DE10018198A1 (de) 2001-10-25

Similar Documents

Publication Publication Date Title
DE3123703C2 (fr)
EP1393116B1 (fr) Dispositif de mise au point automatique pour un appareil optique
EP0898783B1 (fr) Microscope a balayage dans lequel un echantillon est excite optiquement simultanement en plusieurs points
DE19781532B4 (de) Münzhandhabungsmaschine mit kreisförmiger Sortierplatte und Münzerkennung
DE68902600T2 (de) Kruemmungsmessung eines transparenten oder durchscheinenden materials.
DE2818060C2 (de) Vorrichtung zum optischen Prüfen von Werkstücken auf Maßhaltigkeit
WO2014072049A1 (fr) Microscope optique et procédé de microscopie
EP2619525B1 (fr) Procédé de palpage optique d'un bord dans ou sur une zone superficielle
DE10103177A1 (de) Gratprüfungs-Sensorvorrichtung
DE202018006876U1 (de) Konfokale dreidimensionale Messvorrichtung und zugehörige Nipkow-Scheibe mit mehreren Lochdurchmessern
EP2773928B1 (fr) Capteur permettant de verifier des documents de valeur
DE102004010566A1 (de) Tastkopf für ein Koordinatenmessgerät
EP1146489B1 (fr) Dispositif palpeur et méthode de balayage sans contact de la surface d'un objet
WO2006076893A1 (fr) Procede et dispositif de detection de defauts de photopiles
DE69705532T2 (de) Verfahren zur überprüfung von textilspulen und vorrichtung für seine durchführung
EP2040227B1 (fr) Procédé de vérification de pièces de monnaie
DE102010014912A1 (de) Sensor zur Prüfung von Wertdokumenten
WO1989001147A1 (fr) Procede pour le controle qualite d'un objet plat, notamment pour la detection de defauts dans des matieres textiles, et dispositif a cet effet
DE102016102971A1 (de) Linseneinrichtung für variablen Arbeitsabstand, Beleuchtungsbaugruppe, Koordinatenmessgerät und Verfahren
WO2004029691A1 (fr) Procede et dispositif pour determiner une distance, module de mise au point automatique, microscope et procede pour la mise au point automatique d'un microscope
DE102013102477A1 (de) Positioniervorrichtung für mehrachsige Verstelltische
DE19904487C2 (de) Verfahren zur Messung achssymmetrischer magnetischer Felder
DE2253946A1 (de) Verfahren und vorrichtung zur automatischen auswahl von bildern von chromosomen waehrend der metaphase
DE3439578A1 (de) Vorrichtung zur messung der muef
EP2199765A1 (fr) Procédé et appareil de mesure de couleur manuelle destinés à la mesure d'une échelle de mesure de couleur

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

AX Request for extension of the european patent

Free format text: AL;LT;LV;MK;RO;SI

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: PHOENIX MECANO DIGITAL ELEKTRONIK GMBH

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

RIC1 Information provided on ipc code assigned before grant

Ipc: 7G 07F 3/02 B

Ipc: 7G 07D 5/00 A

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

AX Request for extension of the european patent

Extension state: AL LT LV MK RO SI

17P Request for examination filed

Effective date: 20040707

AKX Designation fees paid

Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

17Q First examination report despatched

Effective date: 20041130

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

RIC1 Information provided on ipc code assigned before grant

Ipc: G07D 5/00 20060101AFI20150522BHEP

INTG Intention to grant announced

Effective date: 20150616

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

INTG Intention to grant announced

Effective date: 20151009

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

Free format text: NOT ENGLISH

REG Reference to a national code

Ref country code: CH

Ref legal event code: EP

REG Reference to a national code

Ref country code: FR

Ref legal event code: PLFP

Year of fee payment: 16

Ref country code: FR

Ref legal event code: PLFP

Year of fee payment: 17

REG Reference to a national code

Ref country code: AT

Ref legal event code: REF

Ref document number: 783803

Country of ref document: AT

Kind code of ref document: T

Effective date: 20160415

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

Free format text: LANGUAGE OF EP DOCUMENT: GERMAN

REG Reference to a national code

Ref country code: DE

Ref legal event code: R096

Ref document number: 50116537

Country of ref document: DE

REG Reference to a national code

Ref country code: ES

Ref legal event code: FG2A

Ref document number: 2571777

Country of ref document: ES

Kind code of ref document: T3

Effective date: 20160526

REG Reference to a national code

Ref country code: NL

Ref legal event code: MP

Effective date: 20160323

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20160624

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20160323

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20160323

Ref country code: BE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160331

Ref country code: SE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20160323

REG Reference to a national code

Ref country code: IE

Ref legal event code: MM4A

REG Reference to a national code

Ref country code: DE

Ref legal event code: R097

Ref document number: 50116537

Country of ref document: DE

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20160323

Ref country code: IE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160330

REG Reference to a national code

Ref country code: FR

Ref legal event code: PLFP

Year of fee payment: 17

26N No opposition filed

Effective date: 20170102

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: CH

Payment date: 20170131

Year of fee payment: 17

Ref country code: FR

Payment date: 20170131

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20170329

Year of fee payment: 17

Ref country code: AT

Payment date: 20170307

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: IT

Payment date: 20170328

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: ES

Payment date: 20170403

Year of fee payment: 17

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CY

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20160323

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160330

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20160323

Ref country code: TR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20160323

Ref country code: MC

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20160323

REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

REG Reference to a national code

Ref country code: AT

Ref legal event code: MM01

Ref document number: 783803

Country of ref document: AT

Kind code of ref document: T

Effective date: 20180330

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20180330

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: AT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20180330

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20180331

Ref country code: IT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20180330

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20180331

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20180330

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20180331

REG Reference to a national code

Ref country code: ES

Ref legal event code: FD2A

Effective date: 20190911

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: ES

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20180331

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20200310

Year of fee payment: 20

REG Reference to a national code

Ref country code: DE

Ref legal event code: R071

Ref document number: 50116537

Country of ref document: DE