EP1046093A4 - An improved power contact for testing a power delivery system - Google Patents

An improved power contact for testing a power delivery system

Info

Publication number
EP1046093A4
EP1046093A4 EP99902992A EP99902992A EP1046093A4 EP 1046093 A4 EP1046093 A4 EP 1046093A4 EP 99902992 A EP99902992 A EP 99902992A EP 99902992 A EP99902992 A EP 99902992A EP 1046093 A4 EP1046093 A4 EP 1046093A4
Authority
EP
European Patent Office
Prior art keywords
testing
delivery system
power
improved
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP99902992A
Other languages
German (de)
French (fr)
Other versions
EP1046093A2 (en
Inventor
David J Ayers
Michael Brownell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of EP1046093A2 publication Critical patent/EP1046093A2/en
Publication of EP1046093A4 publication Critical patent/EP1046093A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
EP99902992A 1998-01-12 1999-01-05 An improved power contact for testing a power delivery system Withdrawn EP1046093A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US560998A 1998-01-12 1998-01-12
PCT/US1999/000204 WO1999035547A2 (en) 1998-01-12 1999-01-05 Power contact for testing a power source
US5609 2001-11-07

Publications (2)

Publication Number Publication Date
EP1046093A2 EP1046093A2 (en) 2000-10-25
EP1046093A4 true EP1046093A4 (en) 2001-01-31

Family

ID=21716741

Family Applications (1)

Application Number Title Priority Date Filing Date
EP99902992A Withdrawn EP1046093A4 (en) 1998-01-12 1999-01-05 An improved power contact for testing a power delivery system

Country Status (5)

Country Link
EP (1) EP1046093A4 (en)
JP (1) JP2002501280A (en)
CN (1) CN1296568A (en)
AU (1) AU2311699A (en)
WO (1) WO1999035547A2 (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3996516A (en) * 1973-08-23 1976-12-07 Lm-Electronic Luther & Maelzer Apparatus and process for testing printed circuits
US4164704A (en) * 1976-11-01 1979-08-14 Metropolitan Circuits, Inc. Plural probe circuit card fixture using a vacuum collapsed membrane to hold the card against the probes
US4636723A (en) * 1986-03-21 1987-01-13 Coffin Harry S Testing device for printed circuit boards
EP0305951A1 (en) * 1987-08-31 1989-03-08 Everett/Charles Contact Products Inc. Testing of integrated circuit devices on loaded printed circuit boards
EP0510910A2 (en) * 1991-04-23 1992-10-28 International Business Machines Corporation Apparatus for testing printed circuits
FR2741953A1 (en) * 1995-12-05 1997-06-06 Vaucher Christophe Contacting method for testing printed circuit tracks
US5686833A (en) * 1995-07-31 1997-11-11 Spinner; Howard D. Load board enhanced for differential pressure retention in an IC test head

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4099120A (en) * 1976-04-19 1978-07-04 Akin Aksu Probe head for testing printed circuit boards
US4160207A (en) * 1977-06-27 1979-07-03 Haines Fred E Printed circuit board tester with removable head
US4352061A (en) * 1979-05-24 1982-09-28 Fairchild Camera & Instrument Corp. Universal test fixture employing interchangeable wired personalizers

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3996516A (en) * 1973-08-23 1976-12-07 Lm-Electronic Luther & Maelzer Apparatus and process for testing printed circuits
US4164704A (en) * 1976-11-01 1979-08-14 Metropolitan Circuits, Inc. Plural probe circuit card fixture using a vacuum collapsed membrane to hold the card against the probes
US4636723A (en) * 1986-03-21 1987-01-13 Coffin Harry S Testing device for printed circuit boards
EP0305951A1 (en) * 1987-08-31 1989-03-08 Everett/Charles Contact Products Inc. Testing of integrated circuit devices on loaded printed circuit boards
EP0510910A2 (en) * 1991-04-23 1992-10-28 International Business Machines Corporation Apparatus for testing printed circuits
US5686833A (en) * 1995-07-31 1997-11-11 Spinner; Howard D. Load board enhanced for differential pressure retention in an IC test head
FR2741953A1 (en) * 1995-12-05 1997-06-06 Vaucher Christophe Contacting method for testing printed circuit tracks

Also Published As

Publication number Publication date
EP1046093A2 (en) 2000-10-25
AU2311699A (en) 1999-07-26
JP2002501280A (en) 2002-01-15
CN1296568A (en) 2001-05-23
WO1999035547A2 (en) 1999-07-15
WO1999035547A3 (en) 1999-09-30

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Legal Events

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PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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18W Application withdrawn

Withdrawal date: 20010214