EP0977028A4 - Method of spectrochemical analysis of impurity in gas - Google Patents
Method of spectrochemical analysis of impurity in gasInfo
- Publication number
- EP0977028A4 EP0977028A4 EP99901876A EP99901876A EP0977028A4 EP 0977028 A4 EP0977028 A4 EP 0977028A4 EP 99901876 A EP99901876 A EP 99901876A EP 99901876 A EP99901876 A EP 99901876A EP 0977028 A4 EP0977028 A4 EP 0977028A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- impurity
- gas
- spectrochemical analysis
- spectrochemical
- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
- G01N2021/391—Intracavity sample
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1620198 | 1998-01-28 | ||
JP10016201A JPH11211658A (en) | 1998-01-28 | 1998-01-28 | Spectrochemical analysis method of impurity in gas |
PCT/JP1999/000323 WO1999039188A1 (en) | 1998-01-28 | 1999-01-27 | Method of spectrochemical analysis of impurity in gas |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0977028A1 EP0977028A1 (en) | 2000-02-02 |
EP0977028A4 true EP0977028A4 (en) | 2001-05-23 |
Family
ID=11909907
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99901876A Withdrawn EP0977028A4 (en) | 1998-01-28 | 1999-01-27 | Method of spectrochemical analysis of impurity in gas |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0977028A4 (en) |
JP (1) | JPH11211658A (en) |
KR (1) | KR100316487B1 (en) |
TW (1) | TW448291B (en) |
WO (1) | WO1999039188A1 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001070227A (en) | 1999-07-07 | 2001-03-21 | Fuji Photo Film Co Ltd | Fluorescent observing device |
JP2001078175A (en) * | 1999-07-07 | 2001-03-23 | Fuji Photo Film Co Ltd | Fluorescent observation device |
DE10147065B4 (en) * | 2001-09-25 | 2008-04-17 | Siemens Ag | Method for detecting absorption lines in absorption spectroscopy |
JP2008145104A (en) * | 2006-12-06 | 2008-06-26 | Yokogawa Electric Corp | Instrument for measuring wavelength characteristics |
JP5001664B2 (en) * | 2007-01-25 | 2012-08-15 | 株式会社小野測器 | Signal converter |
JP5176535B2 (en) * | 2007-02-02 | 2013-04-03 | 富士電機株式会社 | Laser gas analyzer |
JP2010237106A (en) * | 2009-03-31 | 2010-10-21 | Toyota Motor Corp | Exhaust gas analyzer |
JP5933972B2 (en) * | 2011-12-27 | 2016-06-15 | 株式会社堀場製作所 | Gas measuring device and wavelength modulation width setting method in gas measuring device. |
KR102490824B1 (en) | 2020-09-23 | 2023-01-20 | 국방과학연구소 | A methodology to measure separate absorption lines using a single laser in tunable diode laser absorption spectroscopy and measurment system of separate absorption lines |
KR102528187B1 (en) * | 2021-11-30 | 2023-05-03 | 한국생산기술연구원 | System and method for generating image quantified density of material in reaction region |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5834344A (en) * | 1981-08-24 | 1983-02-28 | Fujitsu Ltd | Driving system for semiconductor laser |
DE4000583A1 (en) * | 1990-01-10 | 1991-07-11 | Muetek Gmbh | METHOD FOR OPERATING A RADIATION ABSORPTION SPECTROMETER |
EP0449573A2 (en) * | 1990-03-27 | 1991-10-02 | Tokyo Gas Co., Ltd. | Gas detection device |
US5173749A (en) * | 1988-07-07 | 1992-12-22 | Altoptronic Ab | Method and apparatus for spectroscopic measurement of the concentration of a gas |
EP0706042A1 (en) * | 1994-03-25 | 1996-04-10 | Nippon Sanso Corporation | Infrared spectrochemical gas analysis and apparatus used for the same |
JPH08338805A (en) * | 1995-06-12 | 1996-12-24 | Tokyo Electric Power Co Inc:The | Method and apparatus for measuring concentration of gas |
US5637872A (en) * | 1995-08-24 | 1997-06-10 | Tulip; John | Gas detector |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5835441A (en) * | 1981-08-27 | 1983-03-02 | Fujitsu Ltd | Driving system for semiconductor laser |
US5020153A (en) * | 1989-02-08 | 1991-05-28 | At&T Bell Laboratories | Tunable narrowband receiver utilizing distributed Bragg reflector laser structure |
JPH10135553A (en) * | 1996-11-05 | 1998-05-22 | Mitsubishi Heavy Ind Ltd | Modulation and device for spectrophotometric laser |
-
1998
- 1998-01-28 JP JP10016201A patent/JPH11211658A/en active Pending
-
1999
- 1999-01-27 TW TW088101203A patent/TW448291B/en active
- 1999-01-27 WO PCT/JP1999/000323 patent/WO1999039188A1/en not_active Application Discontinuation
- 1999-01-27 KR KR1019997008855A patent/KR100316487B1/en not_active IP Right Cessation
- 1999-01-27 EP EP99901876A patent/EP0977028A4/en not_active Withdrawn
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5834344A (en) * | 1981-08-24 | 1983-02-28 | Fujitsu Ltd | Driving system for semiconductor laser |
US5173749A (en) * | 1988-07-07 | 1992-12-22 | Altoptronic Ab | Method and apparatus for spectroscopic measurement of the concentration of a gas |
DE4000583A1 (en) * | 1990-01-10 | 1991-07-11 | Muetek Gmbh | METHOD FOR OPERATING A RADIATION ABSORPTION SPECTROMETER |
EP0449573A2 (en) * | 1990-03-27 | 1991-10-02 | Tokyo Gas Co., Ltd. | Gas detection device |
EP0706042A1 (en) * | 1994-03-25 | 1996-04-10 | Nippon Sanso Corporation | Infrared spectrochemical gas analysis and apparatus used for the same |
JPH08338805A (en) * | 1995-06-12 | 1996-12-24 | Tokyo Electric Power Co Inc:The | Method and apparatus for measuring concentration of gas |
US5637872A (en) * | 1995-08-24 | 1997-06-10 | Tulip; John | Gas detector |
Non-Patent Citations (3)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 007, no. 113 (P - 197) 18 May 1983 (1983-05-18) * |
PATENT ABSTRACTS OF JAPAN vol. 1997, no. 04 30 April 1997 (1997-04-30) * |
See also references of WO9939188A1 * |
Also Published As
Publication number | Publication date |
---|---|
WO1999039188A1 (en) | 1999-08-05 |
KR20010005783A (en) | 2001-01-15 |
KR100316487B1 (en) | 2001-12-12 |
EP0977028A1 (en) | 2000-02-02 |
JPH11211658A (en) | 1999-08-06 |
TW448291B (en) | 2001-08-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 19991001 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE FR GB IT NL |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20010411 |
|
AK | Designated contracting states |
Kind code of ref document: A4 Designated state(s): DE FR GB IT NL |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20040803 |