EP0865607A4 - Double sided optical disc surface inspector - Google Patents
Double sided optical disc surface inspectorInfo
- Publication number
- EP0865607A4 EP0865607A4 EP97941166A EP97941166A EP0865607A4 EP 0865607 A4 EP0865607 A4 EP 0865607A4 EP 97941166 A EP97941166 A EP 97941166A EP 97941166 A EP97941166 A EP 97941166A EP 0865607 A4 EP0865607 A4 EP 0865607A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- optical disc
- double sided
- disc surface
- sided optical
- surface inspector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9506—Optical discs
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US70860896A | 1996-09-05 | 1996-09-05 | |
US708608 | 1996-09-05 | ||
PCT/IB1997/001231 WO1998010271A1 (en) | 1996-09-05 | 1997-09-05 | Double sided optical disc surface inspector |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0865607A1 EP0865607A1 (en) | 1998-09-23 |
EP0865607A4 true EP0865607A4 (en) | 1999-12-01 |
Family
ID=24846479
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP97941166A Withdrawn EP0865607A4 (en) | 1996-09-05 | 1997-09-05 | Double sided optical disc surface inspector |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0865607A4 (en) |
JP (1) | JPH11515108A (en) |
AU (1) | AU735879B2 (en) |
WO (1) | WO1998010271A1 (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3261362B2 (en) * | 1998-05-28 | 2002-02-25 | 株式会社アドバンテスト | Surface condition measuring method and device |
DE19929118C2 (en) * | 1999-06-25 | 2001-05-10 | Basler Ag | Method for the optical inspection of the intermediate layer of an at least three-layer flat object |
DE102004058126A1 (en) * | 2004-12-02 | 2006-06-08 | Leica Microsystems Jena Gmbh | Device for inspecting the front and back of a disc-shaped object |
EP1879019B1 (en) * | 2005-04-21 | 2015-02-25 | Sumitomo Electric Industries, Ltd. | Superconducting wire inspection device |
EP1850118B1 (en) * | 2006-04-24 | 2008-09-24 | Siemens Aktiengesellschaft | Method for detecting metallic particles |
JP5198189B2 (en) * | 2008-08-29 | 2013-05-15 | 富士フイルム株式会社 | Hard disk inspection device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4954723A (en) * | 1988-06-13 | 1990-09-04 | Fuji Photo Film Co., Ltd. | Disk surface inspection method and apparatus therefor |
US5381225A (en) * | 1991-02-28 | 1995-01-10 | Canon Kabushiki Kaisha | Surface-condition inspection apparatus |
JPH0743311A (en) * | 1993-07-29 | 1995-02-14 | Canon Inc | Surface inspection device and aligner with the device |
JPH07140089A (en) * | 1993-11-16 | 1995-06-02 | Hitachi Electron Eng Co Ltd | Device for detecting scratch flaw on magnetic disc |
US5581348A (en) * | 1993-07-29 | 1996-12-03 | Canon Kabushiki Kaisha | Surface inspecting device using bisected multi-mode laser beam and system having the same |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2559581B1 (en) * | 1984-02-10 | 1986-07-11 | Siderurgie Fse Inst Rech | METHOD AND INSTALLATION FOR DETECTING SURFACE DEFECTS ON A TAPE DURING TRIPPING |
JPS62173731A (en) * | 1986-01-28 | 1987-07-30 | Toshiba Corp | Inspection device for surface of article to be inspected |
-
1997
- 1997-09-05 AU AU43167/97A patent/AU735879B2/en not_active Ceased
- 1997-09-05 EP EP97941166A patent/EP0865607A4/en not_active Withdrawn
- 1997-09-05 JP JP10512426A patent/JPH11515108A/en active Pending
- 1997-09-05 WO PCT/IB1997/001231 patent/WO1998010271A1/en not_active Application Discontinuation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4954723A (en) * | 1988-06-13 | 1990-09-04 | Fuji Photo Film Co., Ltd. | Disk surface inspection method and apparatus therefor |
US5381225A (en) * | 1991-02-28 | 1995-01-10 | Canon Kabushiki Kaisha | Surface-condition inspection apparatus |
JPH0743311A (en) * | 1993-07-29 | 1995-02-14 | Canon Inc | Surface inspection device and aligner with the device |
US5581348A (en) * | 1993-07-29 | 1996-12-03 | Canon Kabushiki Kaisha | Surface inspecting device using bisected multi-mode laser beam and system having the same |
JPH07140089A (en) * | 1993-11-16 | 1995-06-02 | Hitachi Electron Eng Co Ltd | Device for detecting scratch flaw on magnetic disc |
Non-Patent Citations (1)
Title |
---|
See also references of WO9810271A1 * |
Also Published As
Publication number | Publication date |
---|---|
AU4316797A (en) | 1998-03-26 |
AU735879B2 (en) | 2001-07-19 |
EP0865607A1 (en) | 1998-09-23 |
JPH11515108A (en) | 1999-12-21 |
WO1998010271A1 (en) | 1998-03-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 19980605 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 19991020 |
|
AK | Designated contracting states |
Kind code of ref document: A4 Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
RIC1 | Information provided on ipc code assigned before grant |
Free format text: 6G 01N 21/88 A, 6G 11B 7/00 B |
|
17Q | First examination report despatched |
Effective date: 20030521 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20080401 |